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NOTICE OF CHANGE INCH-POUND

MIL-STD-202G
NOTICE 1
18 July 2003

DEPARTMENT OF DEFENSE

TEST METHOD STANDARD

ELECTRONIC AND ELECTRICAL COMPONENT PARTS

TO ALL HOLDERS OF MIL-STD-202G:

1. THE FOLLOWING PAGES OF MIL-STD-202G HAVE BEEN REVISED AND SUPERSEDE THE PAGES LISTED:

METHOD NEW PAGE DATE SUPERSEDED PAGE DATE

7 18 July 2003 7 8 February 2002

106G 1 8 February 2002 1 REPRINTED WITHOUT CHANGE
106G 2 18 July 2003 2 8 February 2002
107G 3 28 March 1984 3 REPRINTED WITHOUT CHANGE
107G 4 18 July 2003 4 28 March 1984
112E 7 18 July 2003 7 11 October 1988
112E 8 11 October 1988 8 REPRINTED WITHOUT CHANGE

2. THE FOLLOWING TEST METHODS OF MIL-STD-202G HAVE BEEN REVISED AND SUPERSEDE THE TEST
METHODS LISTED:

NEW METHOD DATE SUPERSEDED METHOD DATE

303A 18 July 2003 303 6 February 1956
305A 18 July 2003 305 24 October 1956

3. RETAIN THIS NOTICE PAGE AND INSERT BEFORE THE TABLE OF CONTENTS.

4. Holders of MIL-STD-202G will verify that the changes indicated above have been entered. This notice page will
be retained as a check sheet. This issuance, together with appended pages, is a separate publication. Each notice
is to be retained by stocking points until the standard is completely revised or canceled.

5. The margins of this notice are marked with asterisks to indicate where changes were made. This was done as a
convenience only and the Government assumes no liability whatsoever for any inaccuracies in these notations.
Bidders and contractors are cautioned to evaluate the requirements of this document based on the entire content
irrespective of the marginal notations and relationship to the last previous issue.

Custodians: Preparing activity:

Army - CR DLA - CC
Navy - EC
Air Force - 11 (Project 59GP-0186)

Review activities:
Army - AR, AT, AV, CR4, MI, SM, TE
Navy - AS, OS, SH
Air Force - 19, 99
NSA - NS

AMSC N/A FSC 59GP

DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
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MIL-STD-202G
NOTICE 1
18 July 2003

NUMERICAL INDEX OF TEST METHODS

Test Method Date Title

Number

Environmental tests (100 class)

101E 8 February 2002 Salt atmosphere (corrosion) (formerly called salt spray)
102A Cancelled Superseded by Method 107 (see note on Method 102)
103B 12 September 1963 Humidity (steady state)
104A 24 October 1956 Immersion
105C 12 September 1963 Barometric pressure (reduced)
106G 8 February 2002 Moisture resistance
107G 28 March 1984 Thermal shock
108A 12 September 1963 Life (at elevated ambient temperature)
109C 8 February 2002 Explosion
110A 16 April 1973 Sand and dust
111A 16 April 1973 Flammability (external flame)
112E 11 October 1988 Seal

Physical characteristics tests (200 class)

201A 24 October 1956 Vibration

202D Cancelled Superseded by Method 213 (see note on Method 202)
203C 8 February 2002 Random drop
204D 1 April 1980 Vibration, high frequency
205E Cancelled Superseded by Method 213 (see note on Method 205)
206 12 September 1963 Life (rotational)
207B 8 February 2002 High-impact shock
208H 31 January 1996 Solderability
209 18 May 1962 Radiographic inspection
210F 8 February 2002 Resistance to soldering heat
211A 14 April 1969 Terminal strength
212A 16 April 1973 Acceleration
213B 16 April 1973 Shock (specified pulse)
214A 28 March 1984 Random vibration
215K 8 February 2002 Resistance to solvents
216 Cancelled Superseded by Method 210 (see note on Method 216)
217A 8 February 2002 Particle impact noise detection (PIND)

Electrical characteristics tests (300 class)

301 6 February 1956 Dielectric withstanding voltage

302 6 February 1956 Insulation resistance
* 303A 18 July 2003 DC resistance
304 24 October 1956 Resistance temperature characteristic
* 305A 18 July 2003 Capacitance
306 24 October 1956 Quality factor (Q)
307 24 October 1956 Contact resistance
308 29 November 1961 Current-noise test for fixed resistors
309 27 May 1965 Voltage coefficient of resistance determination procedure
310 20 January 1967 Contact-chatter monitoring
311 14 April 1969 Life, low level switching
312 16 April 1973 Intermediate current switching

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MIL-STD-202G
NOTICE 1
18 July 2003

METHOD 106G

MOISTURE RESISTANCE

1. PURPOSE. The moisture resistance test is performed for the purpose of evaluating, in an accelerated manner,
the resistance of component parts and constituent materials to the deteriorative effects of the high-humidity and heat
conditions typical of tropical environments. Most tropical degradation results directly or indirectly from absorption of
moisture vapor and films by vulnerable insulating materials, and from surface wetting of metals and insulation.
These phenomena produce many types of deterioration, including corrosion of metals, physical distortion and
decomposition of organic materials, leaching out and spending of constituents of materials; and detrimental changes
in electrical properties. This test differs from the steady-state humidity test (method 103 of this standard) and
derives its added effectiveness in its employment of temperature cycling, which provides alternate periods of
condensation and drying essential to the development of the corrosion processes and, in addition, produces a
"breathing" action of moisture into partially sealed containers. Increased effectiveness is also obtained by use of a
higher temperature, which intensifies the effects of humidity. The test includes low temperature and vibration
subcycles (when applicable, see 3.4.2) that act as accelerants to reveal otherwise indiscernible evidence of
deterioration since stresses caused by freezing moisture and accentuated by vibration tend to widen cracks and
fissures. As a result, the deterioration can be detected by the measurement of electrical characteristics (including
such tests as dielectric withstanding voltage and insulation resistance) or by performance of a test for sealing.
Provision is made for the application of a polarizing voltage across insulation to investigate the possibility of
electrolysis, which can promote eventual dielectric breakdown. This test also provides for electrical loading of
certain components, if desired, in order to determine the resistance of current-carrying components, especially fine
wires and contacts, to electro-chemical corrosion. Results obtained with this test are reproducible and have been
confirmed by investigations of field failures. This test has proven reliable for indicating those parts which are
unsuited for tropical field use.

2. APPARATUS.

2.1 Chamber. A test chamber shall be used which can meet the temperature and humidity cycling specified on
figure 106-1. The material used to fabricate the platforms and standoffs, which support the specimens, shall be non-
reactive in high humidity. Wood or plywood shall not be used because they are resiniferous. Materials shall not be
used if they contain formaldehyde or phenol in their composition. Provisions shall be made to prevent condensate
from the chamber ceiling dripping onto the test specimens.

2.1.1 Opening of the chamber door. During the periods when the humidity is ascending or descending, the
chamber door should not be opened. If the chamber door must be opened, it should be opened during the 16th hour
through the 24th hour of an individual cycle. While the chamber is at 25°C (77°F), and the relative humidity
tolerance must be maintained, the chamber door should be opened only for a short period of time.

2.1.2 Water. Steam, or distilled and demineralized, or deionized water, having a pH value between 6.0 and 7.2 at
23°C (73.4°F) shall be used to obtain the specified humidity. No rust or corrosive contaminants shall be imposed on
the test specimens by the test facility.

3. PROCEDURE.

3.1 Mounting. Specimens shall be mounted by their normal mounting means, in their normal mounting position,
but shall be positioned so that they do not contact each other, and so that each specimen receives essentially the
same degree of humidity.

3.2 Initial measurements. Prior to step 1 of the first cycle, the specified initial measurements shall be made at
room ambient conditions, or as specified.

REPRINTED WITHOUT CHANGE METHOD 106G

8 February 2002
1 of 4
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MIL-STD-202G
NOTICE 1
18 July 2003

NOTES:
1. Allowance of 100 percent RH is intended to avoid problems in reading values close to 100 percent RH, but
actual chamber operation shall be such so as to avoid condensation.
2. Unless otherwise specified, the steady state temperature tolerance is ±2°C at all points within the immediate
vicinity of the specimens and the chamber surfaces.
3. Rate of change of temperature is unspecified; however, specimens shall not be subjected to radiant heat from
chamber-conditioning processes.
4. Circulation of air in the chamber shall be at a minimum cubic rate per minute equivalent to 5 times the volume
of the chamber.

FIGURE 106-1. Graphical representation of moisture-resistance test.

Supersedes page 2 of MIL-STD-202G

METHOD 106G
8 February 2002
2
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MIL-STD-202G
NOTICE 1
18 July 2003

TABLE 107-II. Exposure time in air at temperature extremes.

Weight of specimen Minimum time

(for steps 1 and 3)

Hours
1 ounce (28 grams and below) 1/4 (or as specified)
Above 1 ounce (28 grams) to .3 pound (136 grams), inclusive ½
Above .3 pounds (136 grams) to 3 pounds (1.36 kilograms), inclusive 1
Above 3 pounds (1.36 kilograms) to 30 pounds (13.6 kilograms), inclusive 2
Above 30 pounds (13.6 kilograms) to 300 pounds (136 kilograms), inclusive 4
Above 300 pounds (136 kilograms) 8

TABLE 107-III. Thermal shock conditions (liquid).

Test Number Test Number Test Number Test Number

condition of cycles condition of cycles condition of cycles condition of cycles
Step AA 5 BB 5 CC 5 DD 5
AA-1 15 BB-1 15 CC-1 15 DD-1 15
AA-2 25 BB-2 25 CC-2 25 DD-2 25
Temperature Time Temperature Time Temperature Time Temperature Time

°C °C °C °C

1 -0 +2, -10 See table -65 +0, -10 See table -65 +0, -10 See table -65 +0, -10 See table
107-V 107-V 107-V 107-V
2 100 +10, -2 See table 125 +10, -0 See table 150 +10, -0 See table 200 +10, -0 See table
107-V 107-V 107-V 107-V

REPRINTED WITHOUT CHANGE METHOD 107G

28 March 1984
3
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MIL-STD-202G
NOTICE 1
18 July 2003

TABLE 107-IV. Suggested thermal fluids. 1/ 2/

Test AA, AA-1, AA-2 BB, BB-1, BB-2 CC, CC-1, CC-2 DD, DD-1, DD-2
condition fluids Fluids fluids fluids

Step 1 FC40 4/ or FC77 4/ FC77 4/ FC77 4/

Water 3/

D02 D02 D02 D02

D02-TS 6/ D02-TS 6/ D02-TS 6/ D02-TS 6/
D/80 D/80 D/80 D/80

Step 2 FC40 4/ FC70 FC70 FC70 4/

Water 3/ FC40 4/ FC40 4/

UCON-WS 5/ UCON-WS 5/ UCON-WS} 5/

D02 D02 D02 D05

D02-TS 6/ D02-TS 6/ D02-TS 6/ LS/230 6/
D03 D03 D03 LS/215

1/ See 2.2.

2/ Ethylene glycol shall not be used as a thermal shock test fluid.

3/ Tap water is indicated as an acceptable fluid for this temperature range. Its suitability chemically shall be
established prior to use. A mixture of water and alcohol may be used to prevent freezing at the low
temperature extreme. The water shall not be allowed to boil at the upper temperature extreme.

4/ FC77, FC70, FC40 are the registered trademark of 3M.

5/ UCON-WS process fluid is the registered trademark of Union Carbide Corporation.

6/ D02, D02-TS, D03, D05, D/80, LS/215 and LS/230 are the registered trademark of Ausimont (Division of
Montedison).

TABLE 107-V. Exposure time in liquid at temperature extremes.

Weight of specimen Minimum time

(for steps 1 and 2)
Minutes
*
.05 ounce (1.4 grams) and below ½
Above .05 ounce (1.4 grams) to .5 ounce (14 grams) 2
Above .5 ounce (14 grams) to 5 ounces (140 grams) 5

Supersedes page 4 of MIL-STD-202G

METHOD 107G
28 March 1984
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MIL-STD-202G
NOTICE 1
18 July 2003

5.4.3.2.1 Procedure IIIa. The device(s) shall be tested using the appropriate conditions specified in table I for the
internal cavity volume of the package under test. The time (t) is the time under pressure and time (tz) is the
maximum time allowed after release of pressure before the device(s) shall be read. This method shall not be used if
the maximum equivalent standard leak rate limit given in the procurement document is less than the limits specified
herein for procedure IIIc. Upon completion of this procedure, the specimen shall be checked for gross leaks by
subjecting the specimen either to test condition A, B, or D. Water, at room ambient temperature and a pressure of
2.5 inches (63.5 mm) of mercury, may be used in place of silicone oil, if test condition B is used to verify gross leaks.

TABLE I. Fixed conditions procedure IIIa.

Volume of Bomb condition R1

3 2
package (cm ) 1bf/in Exposure time Maximum Reject limit
3
gage hours dwell hours (atm cm /s He)
-8
V < 0.40 60 ±2 2 +0.2, -0 1 5 x 10
-7
V > 0.40 60 ±2 2 +0.2, -0 1 2 x 10
-7
* V > 0.40 30 ±2 4 +0.4, -0 1 1 x 10

5.4.3.2.2 Procedure IIIb.

5.4.3.2.2.1 Activation parameters. The activation pressure and soak time shall be determined in accordance with
the following equation:

R
Q =
s skT Pt

The parameters of equation (1) are defined as follows:

3
QS = The maximum calculated leak rate allowable, in atm cm /sKr, for the devices to be tested.

R = Counts per minute above the ambient background after activation if the device leak rate were exactly
equal to QS. This is the reject count above the background of both the counting equipment and the
component, if it has been through prior radioactive leak tests.

s = The specific activity, in microcuries per atmospheric cubic centimeter, of the krypton 85 tracer gas in
the activation system.

k = The overall counting efficiency of the scintillation crystal in counts per minute per microcurie of krypton
85 in the internal void of the specific component being evaluated. This factor depends upon
component configuration and dimensions of the scintillation crystal. The counting efficiency shall be
determined in accordance with 5.4.3.2.2.2.

T = Soak time, in hours, that the devices are to be activated.

_
2 2
P = Pe - Pi , where Pe is the activation pressure in atmospheres absolute and Pi is the original internal
pressure of the devices in atmospheres absolute. The activation pressure (Pe) may be established by
specification or if a convenient soak time (T) has been established, the activation pressure (Pe) can be
adjusted to satisfy equation (1).

t = Conversion of hours to seconds and is equal to 3,600 seconds per hour.

Supersedes page 7 of MIL-STD-202G

METHOD 112E
11 October 1988
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MIL-STD-202G
NOTICE 1
18 July 2003

5.4.3.2.2.2 Determination of counting efficiency (k). The counting efficiency (k) of equation in 5.4.3.2.2.1 shall be
determined as follows:

a. Five representative units of the device type being tested shall be tubulated and the internal void of the
device shall be backfilled through the tubulation with a known volume and known specific activity of krypton
85 tracer gas and the tubulation shall be sealed off.

b. The counts per minute shall be directly read in the shielded scintillation crystal of the counting station in
which the devices are read. From this value, the counting efficiency, in counts per minute per microcurie,
shall be calculated.

5.4.3.2.2.3 Evaluation of surface sorption. All device encapsulations consisting of glass, metal, and ceramic or
combinations thereof, including coatings and external sealants, shall be evaluated for surface sorption of krypton 85
before establishing the leak test parameters. Representative samples of the questionable material shall be
subjected to the predetermined pressure and time conditions established for the device configuration as specified by
5.4.3.2.2.1. The samples shall then be counted every 10 minutes, with count rate noted, until the count rate
becomes asymptotic with time. (This is the point in time at which surface sorption is no longer a problem.) This time
lapse shall be noted and shall determine the "wait time" specified in 5.4.3.2.2.4.

5.4.3.2.2.4 Specific procedure IIIb. The devices shall be placed in radioactive tracer gas activation tank. The
activation chamber may be partially filled with inert material to reduce pumpdown time. The tank shall be evacuated
to 0.5 torr. The devices shall be subjected to a minimum of 2 atmospheres absolute pressure of krypton 85/dry
nitrogen mixture for the time necessary to satisfy the equation. Actual pressure and soak time shall be determined
in accordance with 5.4.3.2.2.1. The R value in counts per minute shall be not less than 600 above ambient
background. The krypton 85/dry nitrogen gas mixture shall be evacuated to storage until 0.5 torr vacuum exists in
the activation tank. This evacuation shall be completed within 3 minutes maximum. The activation tank shall then
be backfilled with air (air wash). The devices shall then be removed from the activation tank and leak tested within 1
hour after gas exposure with a scintillation-crystal-equipped counting station. Device encapsulations that come
under the requirements of 5.4.3.2.2.3 shall be exposed to ambient air for a time not less than the "wait time"
determined by 5.4.3.2.2.3. In no case will the time between removal from the activation chamber and test exceed 1
hour. This exposure shall be performed after gas exposure but before determining leak rate with the counting
station. Device encapsulations that do not come under the requirements of 5.4.3.2.2.3 may be tested without a "wait
time". (The number of devices removed from pressurization for leak testing shall be limited such that the test of the
last device can be completed within 1 hour.) The actual leak rate of the component shall be calculated with the
following equation:

( ACTUAL READOUT IN NET COUNTS PER MINUTE ) X Q S

Q =
R

3
Where Q = Actual leak rate in atm cm /s, and QS and R are defined in 5.4.3.2.2.1.
-8
Unless otherwise specified, devices that exhibit a leak rate equal to or greater than 1 x 10 atmospheric cubic
centimeters of krypton 85 per second shall be considered a failure.

Upon completion of this procedure, the specimen shall be checked for gross leaks by subjecting the specimen either
to test condition A, B, or D. Water, at room ambient temperature and a pressure of 2.5 inches (63.5 mm) of mercury,
may be used in place of silicone oil, if test condition B is used to verify gross leaks.

5.4.3.2.2.5 Personnel precautions. A Nuclear Regulatory Commission (NRC) license is necessary for possession
and use of the krypton 85 leak-test equipment. In the use of gas, code of Federal regulations Nuclear Regulatory
Commission Rules and Regulations, Title 10, Chapters 1, 20, 30, 31, and 32 should be followed and the maximum
permissible tolerance levels prescribed by the National Committee on Radiological Protection should be observed.

REPRINTED WITHOUT CHANGE

METHOD 112E
11 October 1988
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MIL-STD-202G
NOTICE 1
18 July 2003

METHOD 303A

DC RESISTANCE

1. PURPOSE. The purpose of this test is to measure the direct-current (dc) resistance of resistors,
electromagnetic windings of components, and conductors. It is not intended that this test apply to the measurement
of contact resistance.

1.1. Precautions. The temperature at which the dc resistance measurement is made will affect the final value of
resistance. In addition, resistance values may vary with the measuring voltage.

2. PROCEDURE. DC resistance shall be measured with a resistance bridge or other suitable test equipment.
The limit of error in the bridge or other test equipment shall not exceed one-tenth of the specified tolerance on the
measured resistance (for example, the limit of error in the bridge or other test equipment shall not exceed ± 0.5
percent if the specified tolerance on the measured resistance is ± 5 percent), unless otherwise specified. For inplant
quality conformance testing, the accuracy of the measurement shall be such to insure that the resistance value is
within the required tolerance. If a plus or minus tolerance is not specified, the limit of error in the bridge or other test
equipment shall not exceed ± 2 percent. The test current through the specimen shall be as small as practical
considering the sensitivity of the indicating instruments, unless the test current or voltage is specified. When it is
important that the temperature of the specimen shall not rise appreciably during the measurement, the test voltage
shall be applied uninterruptedly for as short a time as practicable, but in no case for more than 5 seconds, unless
* otherwise specified. Unless otherwise specified, the measurement shall be made at a temperature of 25°C ± 5°C.
In the case of measurement dispute, dc resistance measurements shall be made at or corrected to 25°C.

3. SUMMARY. The following details are to be specified in the individual specification:

a. Limit of error of measuring apparatus, if other than one-tenth of specified tolerance (see 2).

b. Test voltage or current, if applicable (see 2).

c. Maximum period of uninterrupted test-voltage application, if other than 5 seconds (see 2).

d. Test temperature, if other than that specified (see 2).

*

METHOD 303A
18 July 2003

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MIL-STD-202G
NOTICE 1
18 July 2003

METHOD 305A

CAPACITANCE

1. PURPOSE. The purpose of this test is to measure the capacitance of component parts. Preferred test
* frequencies for this measurement are 60 Hz, 100 Hz, 120 Hz, 1 kHz, 100 kHz, and 1 MHz.

2. PROCEDURE. The capacitance of the specimen shall be measured with a capacitance bridge or other suitable
method at the frequency specified. Unless otherwise specified, the measurement shall be made at a temperature of
* 25°C ± 5°C. In the case of measurement dispute, capacitance measurements shall be made at or corrected to 25°C.
The inherent accuracy of the measurement shall be ±(0.5 percent +0.2 picofarad) unless otherwise specified. Suitable
measurement technique shall be used to minimize errors due to the connections between the measuring apparatus
and the specimen. The alternating-current (ac) voltage actually impressed across the specimen shall be as low as
practicable. When a direct-current (dc) polarizing voltage is required, it shall be as specified and shall exceed the
peak ac voltage impressed across the specimen; however, the sum of the peak ac and the dc voltages shall not
exceed the voltage rating of the specimen.

SUMMARY. The following details are to be specified in the individual specification:

a. Test frequency (see 2).

b. Test temperature, if other than that specified (see 2).

*
c. Limit of accuracy, if other than that specified (see 2).

d. Magnitude of polarizing voltage, if applicable (see 2).

e. Magnitude of AC rms test signal, if applicable (see 2).

METHOD 305A
18 July 2003