GD25Q256C GigaDevice

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3.

3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C

GD25Q256C

DATASHEET

1
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Contents
CONTENTS ........................................................................................................................................................................ 2

1. FEATURES ................................................................................................................................................................ 4

2. GENERAL DESCRIPTION ...................................................................................................................................... 5

3. MEMORY ORGANIZATION .................................................................................................................................... 7

4. DEVICE OPERATION .............................................................................................................................................. 9

5. DATA PROTECTION .............................................................................................................................................. 11

5.1. BLOCK PROTECTION ........................................................................................................................................... 11

6. STATUS AND EXTENDED ADDRESS REGISTERS ....................................................................................... 12

6.1. STATUS REGISTERS ............................................................................................................................................ 12


6.2. EXTENDED ADDRESS REGISTER ......................................................................................................................... 15

7. COMMANDS DESCRIPTION ............................................................................................................................... 16

TABLE OF ID DEFINITIONS: ............................................................................................................................................. 21


7.1. WRITE ENABLE (WREN) (06H) ......................................................................................................................... 21
7.2. WRITE DISABLE (WRDI) (04H) ......................................................................................................................... 21
7.3. READ STATUS REGISTER (RDSR) (05H OR 35H OR 15H) .................................................................................. 22
7.4. WRITE STATUS REGISTER (WRSR) (01H OR 31H OR 11H) ................................................................................ 22
7.5. READ DATA BYTES (READ 03H OR 4READ 13H) ............................................................................................ 23
7.6. READ DATA BYTES AT HIGHER SPEED (FAST READ 0BH OR 4FAST READ 0CH) ............................................... 24
7.7. DUAL OUTPUT FAST READ (DOFR 3BH OR 4DOFR 3CH)................................................................................ 26
7.8. QUAD OUTPUT FAST READ (QOFR 6BH OR 4QOFR 6CH) ............................................................................... 28
7.9. DUAL I/O FAST READ (DIOFR BBH OR 4DIOFR BCH) ................................................................................... 30
7.10. QUAD I/O FAST READ (QIOFR EBH OR 4QIOFR ECH) ................................................................................... 34
7.11. SET BURST WITH WRAP (77H) ........................................................................................................................... 37
7.12. PAGE PROGRAM (PP 02H OR 4PP 12H) .............................................................................................................. 38
7.13. QUAD PAGE PROGRAM (QPP 32H OR 4QPP 3EH) ............................................................................................. 40
7.14. SECTOR ERASE (SE 20H OR 4SE 21H) ............................................................................................................... 42
7.15. 32KB BLOCK ERASE (BE32 52H OR 4BE32 5CH) ............................................................................................. 43
7.16. 64KB BLOCK ERASE (BE64 D8H OR 4BE64 DCH) ........................................................................................... 44
7.17. CHIP ERASE (CE) (60/C7H) ............................................................................................................................... 45
7.18. DEEP POWER-DOWN (DP) (B9H) ....................................................................................................................... 46
7.19. READ UNIQUE ID (4BH) .................................................................................................................................... 47
7.20. ENTER 4-BYTE ADDRESS MODE (B7H) .............................................................................................................. 48
7.21. EXIT 4-BYTE ADDRESS MODE (E9H) ................................................................................................................. 48
7.22. CLEAR SR FLAGS (30H) ..................................................................................................................................... 48
7.23. RELEASE FROM DEEP POWER-DOWN AND READ DEVICE ID (RDI) (ABH) ........................................................ 49
7.24. READ MANUFACTURE ID/ DEVICE ID (REMS) (90H)........................................................................................ 50
7.25. READ IDENTIFICATION (RDID) (9FH) ................................................................................................................ 50
7.26. PROGRAM/ERASE SUSPEND (PES) (75H) ........................................................................................................... 51

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Dual and Quad Serial Flash GD25Q256C
7.27. PROGRAM/ERASE RESUME (PER) (7AH) ........................................................................................................... 53
7.28. ERASE SECURITY REGISTERS (44H) ................................................................................................................... 53
7.29. PROGRAM SECURITY REGISTERS (42H).............................................................................................................. 54
7.30. READ SECURITY REGISTERS (48H)..................................................................................................................... 56
7.31. ENABLE RESET (66H) AND RESET (99H) ............................................................................................................ 57
7.32. READ SERIAL FLASH DISCOVERABLE PARAMETER (5AH) ................................................................................. 58

8. ELECTRICAL CHARACTERISTICS ................................................................................................................... 63

8.1. POWER-ON TIMING ....................................................................................................................................... 63


8.2. INITIAL DELIVERY STATE ........................................................................................................................... 63
8.3. DATA RETENTION AND ENDURANCE ...................................................................................................... 63
8.4. LATCH UP CHARACTERISTICS ................................................................................................................... 63
8.5. ABSOLUTE MAXIMUM RATINGS ............................................................................................................... 64
8.6. CAPACITANCE MEASUREMENT CONDITIONS ....................................................................................... 64
8.7. DC CHARACTERISTICS................................................................................................................................. 65
8.8. AC CHARACTERISTICS................................................................................................................................. 66

9. ORDERING INFORMATION ................................................................................................................................. 69

10. PACKAGE INFORMATION ............................................................................................................................... 70

10.1. PACKAGE SOP16 300MIL.................................................................................................................................. 70


10.2. PACKAGE WSON 8 (8*6MM) ............................................................................................................................. 71
10.3. PACKAGE TFBGA-24BALL (6*4 BALL ARRAY) ................................................................................................ 72
10.4. PACKAGE TFBGA-24BALL (5*5 BALL ARRAY) ................................................................................................ 73

11. REVISION HISTORY .......................................................................................................................................... 74

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3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
1. FEATURES

◆ 256M-bit Serial Flash ◆ Program/Erase Speed


-32M-byte -Page Program time: 0.6ms typical
-256 bytes per programmable page -Sector Erase time: 50ms typical
-Block Erase time: 0.2/0.3s typical
◆ Standard, Dual, Quad SPI -Chip Erase time: 100s typical
-Standard SPI: SCLK, CS#, SI, SO, WP#, HOLD#/ RESET#
-Dual SPI: SCLK, CS#, IO0, IO1, WP#, HOLD#/ RESET# ◆ Flexible Architecture
-Quad SPI: SCLK, CS#, IO0, IO1, IO2, IO3 -Sector of 4K-byte
-3 or 4-Byte Addressing Mode -Block of 32/64k-byte

◆ High Speed Clock Frequency ◆ Low Power Consumption


-Maximum 104MHz for fast read on 3.0 - 3.6V power supply -25mA maximum active current
◆ Dual I/O Data transfer up to 208Mbits/s -5uA maximum deep power down current
◆ Quad I/O Data transfer up to 416Mbits/s -30uA typical standby current
-Maximum 80MHz for fast read on 2.7 - 3.6V power supply
◆ Dual I/O Data transfer up to 160Mbits/s ◆ Advanced Security Features(1)
◆ Quad I/O Data transfer up to 320Mbits/s -3*256-Byte Security Registers With OTP Locks
-64-bit Unique ID
◆ Software/Hardware Write Protection -Serial Flash Discoverable parameters(SFDP) register
-Write protect all/portion of memory via software
-Enable/Disable protection with WP# Pin ◆ Single Power Supply Voltage
-Top or Bottom, Complement Block selection -Full voltage range:2.7~3.6V
-768-Byte (3*256-Byte) Security Registers With OTP Locks
◆ Package Information
-SOP16 (300mil)
◆ Cycling endurance and Data retention -WSON8 (6*8mm)
-Minimum 100,000 Program/Erase Cycles -TFBGA-24(5*5 ball array)
-20-year data retention typical -TFBGA-24(6*4 ball array)

Note: 1.Please contact GigaDevice for details.

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2. GENERAL DESCRIPTION

The GD25Q256C (256M-bit) Serial flash supports the standard Serial Peripheral Interface (SPI), and supports the
Dual/Quad SPI: Serial Clock, Chip Select, Serial Data I/O0 (SI), I/O1 (SO), I/O2 (WP#), and I/O3 (HOLD#/ RESET#).
The Dual I/O data is transferred with speed of 208Mbits/s and the Quad I/O & Quad output data is transferred with speed
of 320Mbits/s.

CONNECTION DIAGRAM
Figure 1 Connection Diagram

HOLD# 1 16 SCLK CS# 1 8 VCC

VCC 2 15 SI
SO 2 7 HOLD#/
Top View RESET#
RESET# 3 14 NC
WP# 3 6 SCLK
NC 4 13 NC
Top View
NC 5 12 NC VSS 4 5 SI

NC 6 11 NC 8–LEAD WSON
CS# 7 10 VSS

SO 8 9 WP#

16-LEAD SOP

Top View
Top View
5
NC NC NC NC NC 4
4 RESET# VCC WP# HOLD# VIO NC
/NC /IO2 /IO3 /NC
RESET# VCC WP#/VPP HOLD# NC 3
/NC /IO2 /IO3
3 NC VSS NC SI NC NC
/IO0
NC VSS NC SI/IO0 NC 2
2 NC SCLK CS# SO NC NC
/IO1
NC SCLK CS# SO/IO1 NC 1
1 NC NC NC NC NC NC
NC NC NC NC

A B C D E A B C D E F
24-BALL TFBGA (5x5 ball array) 24-BALL TFBGA (6x4 ball array)

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PIN DESCRIPTION
Table 1 Pin Description for WSON8 package
Pin Name I/O Description
CS# I Chip Select Input
SO (IO1) I/O Data Output (Data Input Output 1)
WP# (IO2) I/O Write Protect Input (Data Input Output 2)
VSS Ground
SI (IO0) I/O Data Input (Data Input Output 0)
SCLK I Serial Clock Input
HOLD#/RESET# (IO3) I/O Hold or Reset Input (Data Input Output 3)
VCC Power Supply

Table 2 Pin Description for SOP16 package and TFBGA24 package


Pin Name I/O Description
CS# I Chip Select Input
SO (IO1) I/O Data Output (Data Input Output 1)
WP# (IO2) I/O Write Protect Input (Data Input Output 2)
VSS Ground
SI (IO0) I/O Data Input (Data Input Output 0)
SCLK I Serial Clock Input
HOLD#/(IO3) I/O Hold Input (Data Input Output 3)
RESET# I Reset Input
VCC Power Supply

BLOCK DIAGRAM
Figure 2 Block Diagram

WP#(IO2) Write Control


Logic

Status
Write Protect Logic
and Row Decode

Register

HOLD# Flash
High Voltage
RESET#(IO3) Memory
Generators
SPI
SCLK Command &
Control Logic Page Address
CS# Latch/Counter

SI(IO0) Column Decode And


256-Byte Page Buffer
SO(IO1)
Byte Address
Latch/Counter

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3. MEMORY ORGANIZATION

GD25Q256C
Table 3 GD25Q256C Memory Organization
Each device has Each block has Each sector has Each page has
32M 64/32K 4K 256 bytes
128K 256/128 16 - pages
8192 16/8 - - sectors
512/1024 - - - blocks

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UNIFORM BLOCK SECTOR ARCHITECTURE
GD25Q256C
Table 4 GD25Q256C 64K Bytes Block Sector Architecture
Block Sector Address range Advanced Block
Protection unit
8191 01FF F000H 01FF FFFFH 4KB
511 …… …… …… ……
8176 01FF 0000H 01FF 0FFFH 4KB
8175 01FE F000H 01FE FFFFH
510 …… …… …… 64KB
8160 01FE 0000H 01FE 0FFFH
8159 01FD F000H 01FD FFFFH
509 …… …… …… 64KB
8144 01FD 0000H 01FD 0FFFH
…… …… ……
…… …… …… ……
…… …… ……
……
…… …… ……
…… …… …… ……
…… …… ……
47 0002 F000H 0002 FFFFH
2 …… …… …… 64KB
32 0002 0000H 0002 0FFFH
31 0001 F000H 0001 FFFFH
1 …… …… …… 64KB
16 0001 0000H 0001 0FFFH
15 0000 F000H 0000 FFFFH 4KB
0 …… …… …… ……
0 0000 0000H 0000 0FFFH 4KB
Note:
1. Advanced Block Protection unit for block 511 and block 0 is 4KB sector, while unit for block 1 to block 510 is 64KB blocks
(512Kbit).

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4. DEVICE OPERATION

SPI Mode
Standard SPI
The GD25Q256C features a serial peripheral interface on 4 signals bus: Serial Clock (SCLK), Chip Select (CS#),
Serial Data Input (SI) and Serial Data Output (SO). Both SPI bus mode 0 and 3 are supported. Input data is latched on the
rising edge of SCLK and data shifts out on the falling edge of SCLK.

Dual SPI
The GD25Q256C supports Dual SPI operation when using the “Dual Output Fast Read”, “Dual Output Fast Read with
4-byte address”, “Dual I/O Fast Read” and “Dual I/O Fast Read with 4-byte address” commands (3BH 3CH BBH and BCH).
These commands allow data to be transferred to or from the device at two times the rate of the standard SPI. When using
the Dual SPI command the SI and SO pins become bidirectional I/O pins: IO0 and IO1.

Quad SPI
The GD25Q256C supports Quad SPI operation when using the “Quad Output Fast Read”, “Quad Output Fast Read
with 4-byte address”, “Quad I/O Fast Read”, “Quad I/O Fast Read with 4-byte address” (6BH, 6CH, EBH and ECH)
commands. These commands allow data to be transferred to or from the device at four times the rate of the standard SPI.
When using the Quad SPI command the SI and SO pins become bidirectional I/O pins: IO0 and IO1, and WP# and
HOLD#/RESET# pins become IO2 and IO3. Quad SPI commands require the non-volatile Quad Enable bit (QE) in Status
Register to be set.

Hold
The HOLD/RST bit is used to determine whether HOLD# or RESET# function should be implemented on the
hardware pin for 8-pin packages. When HOLD/RST=0, the pin7 acts as HOLD#, the HOLD# function is only available when
QE=0, If QE=1, The HOLD# functions is disabled, the pin acts as dedicated data I/O pin.
The HOLD# signal goes low to stop any serial communications with the device, but doesn’t stop the operation of write
status register, programming, or erasing in progress.
The operation of HOLD, need CS# keep low, and starts on falling edge of the HOLD# signal, with SCLK signal being
low (if SCLK is not being low, HOLD operation will not start until SCLK being low). The HOLD condition ends on rising edge
of HOLD# signal with SCLK being low (If SCLK is not being low, HOLD operation will not end until SCLK being low).
The SO is high impedance, both SI and SCLK don’t care during the HOLD operation, if CS# drives high during
HOLD operation, it will reset the internal logic of the device. To re-start communication with chip, the HOLD# must be at
high and then CS# must be at low.
Figure 3 Hold Condition

CS#

SCLK

HOLD#

HOLD HOLD

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RESET
The RESET# pin allows the device to be reset by the control. For the WSON8 package, the pin7 can be configured as
a RESET# pin depending on the status register setting, which need QE=0 and HOLD/RST=1. On the SOP16 package, a
dedicated RESET# pin is provided and it is independent of QE bit setting.
The RESET# pin goes low for a period of tRLRH or longer will reset the flash. After reset cycle, the flash is at the
following states:
-Standby mode
-All the volatile bits will return to the default status as power on.
Figure 4 RESET Condition

CS#

RESET#

RESET

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5. DATA PROTECTION

The GD25Q256C provides the following data protection methods:


◆ Write Enable (WREN) command: The WREN command is set the Write Enable Latch bit (WEL). The WEL bit will
return to reset by the following situation:
-Power-Up
-Write Disable (WRDI)
-Write Status Register (WRSR)
-Page Program (PP)
-Quad Page Program (QPP)
-Sector Erase (SE) / Block Erase (BE) / Chip Erase (CE)
◆ Software Protection Mode:
-The Block Protect (BP3, BP2, BP1, and BP0) bits and Top Bottom (TB) bit define the section of the memory array
that can be read but not change.
◆ Hardware Protection Mode: WP# going low to protected the BP0~BP3 bits, TB bit and SRP bit.
◆ Deep Power-Down Mode: In Deep Power-Down Mode, all commands are ignored except the Release from Deep
Power-Down Mode command.
5.1. Block Protection
Table 5. GD25Q256C Protected area size (WPS=0)
Status Register Content Memory Content

TB BP3 BP2 BP1 BP0 Blocks Addresses Density Portion


X 0 0 0 0 NONE NONE NONE NONE
0 0 0 0 1 511 01FF0000H-01FFFFFFH 64KB Upper 1/512
0 0 0 1 0 510 to 511 01FE0000H-01FFFFFFH 128KB Upper 1/256
0 0 0 1 1 508 to 511 01FC0000H-01FFFFFFH 256KB Upper 1/128
0 0 1 0 0 504 to 511 01F80000H-01FFFFFFH 512KB Upper 1/64
0 0 1 0 1 496 to 511 01F00000H-01FFFFFFH 1MB Upper 1/32
0 0 1 1 0 480 to 511 01E00000H-01FFFFFFH 2MB Upper 1/16
0 0 1 1 1 448 to 511 01C00000H-01FFFFFFH 4MB Upper 1/8
0 1 0 0 0 384 to 511 01800000H-01FFFFFFH 8MB Upper 1/4
0 1 0 0 1 256 to 511 01000000H-01FFFFFFH 16MB Upper 1/2
1 0 0 0 1 0 00000000H-0000FFFFH 64KB Lower 1/512
1 0 0 1 0 0 to 1 00000000H-0001FFFFH 128KB Lower 1/256
1 0 0 1 1 0 to 3 00000000H-0003FFFFH 256KB Lower 1/128
1 0 1 0 0 0 to 7 00000000H-0007FFFFH 512KB Lower 1/64
1 0 1 0 1 0 to 15 00000000H-000FFFFFH 1MB Lower 1/32
1 0 1 1 0 0 to 31 00000000H-001FFFFFH 2MB Lower 1/16
1 0 1 1 1 0 to 63 00000000H-003FFFFFH 4MB Lower 1/8
1 1 0 0 0 0 to 127 00000000H-007FFFFFH 8MB Lower 1/4
1 1 0 0 1 0 to 255 00000000H-00FFFFFFH 16MB Lower 1/2
X 1 1 0 X ALL 00000000H-01FFFFFFH 32MB ALL
X 1 X 1 X ALL 00000000H-01FFFFFFH 32MB ALL

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6. STATUS AND EXTENDED ADDRESS REGISTERS

6.1. Status Registers


Table 6 Status Register-1
No. Bit Name Description Note

S0 WIP Erase/Write In Progress Volatile, read only

S1 WEL Write Enable Latch Volatile, read only

S2 BP0 Block Protect Bits Non-volatile writable

S3 BP1 Block Protect Bits Non-volatile writable

S4 BP2 Block Protect Bits Non-volatile writable

S5 BP3 Block Protect Bits Non-volatile writable

S6 QE Quad Enable Non-volatile writable

S7 SRP Status Register Protection Non-volatile writable

Table 7 Status Register-2


No. Bit Name Description Note

S8 DRV0 Output Driver Strength Non-volatile writable


S9 DRV1 Output Driver Strength Non-volatile writable
S10 HOLD/RST HOLD# or Reset# Function Non-volatile writable
S11 TB Top/Bottom Protect Bit Non-volatile writable
S12 ADP Power Up Address Mode Non-volatile writable

S13 ADS Current Address Mode Volatile, read only


S14 LC0 Latency Code 0 Non-volatile writable
S15 LC1 Latency Code 1 Non-volatile writable
Table 8 Status Register-3
No. Bit Name Description Note

S16 Reserved Reserved Non-volatile writable (OTP)

S17 Reserved Reserved Non-volatile writable (OTP)


S18 SUS_P Program Suspend Volatile, read only
S19 SUS_E Erase Suspend Volatile, read only
S20 Reserved Reserved Non-volatile writable (OTP)
S21 PE Program Error bit Volatile, read only
S22 EE Erase Error bit Volatile, read only

S23 WPS Write Protect Selection Non-volatile writable

The status and control bits of the Status Register are as follows:
WIP bit
The Write in Progress (WIP) bit indicates whether the memory is busy in program/erase/write status register progress.
When WIP bit sets to 1, means the device is busy in program/erase/write status register progress, when WIP bit sets 0,
means the device is not in program/erase/write status register progress.
WEL bit
The Write Enable Latch (WEL) bit indicates the status of the internal Write Enable Latch. When set to 1 the internal
Write Enable Latch is set, when set to 0 the internal Write Enable Latch is reset and no Write Status Register, Program or

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Dual and Quad Serial Flash GD25Q256C
Erase command is accepted.
TB bit
The Top Bottom (TB) bit is non-volatile (OTP). The Top/Bottom (TB) bit is used to configure the Block Protect area by
BP bit (BP3, BP2, BP1, and BP0), starting from Top or Bottom of the memory array. The TB bit is defaulted as “0”, which
means Top area protect. When it is set to “1”, the protect area will change to Bottom area of the memory device. This bit is
written with the Write Status Register (WRSR) command.
BP3, BP2, BP1, BP0 bits
The Block Protect (BP3, BP2, BP1, and BP0) bits are non-volatile. They define the size of the area to be software
protected against Program and Erase commands. These bits are written with the Write Status Register (WRSR) command.
When the Block Protect (BP4, BP3, BP2, BP1, BP0) bits are set to 1, the relevant memory area becomes protected against
Page Program (PP), Sector Erase (SE) and Block Erase (BE) commands. The Block Protect (BP4, BP3, BP2, BP1, and
BP0) bits can be written provided that the Hardware Protected mode has not been set. The Chip Erase (CE) command is
executed only if none sector or block is protected.
SRP bit
The Status Register Protect (SRP) bit is non-volatile Read/Write bits in the status register. The SRP bit controls the
method of write protection: software protection and hardware protection.
Table 9 Status Register Protect (SRP) bit
SRP #WP Status Register Description
The Status Register can be written to after a Write Enable
0 X Software Protected
command, WEL=1.(Default)
WP#=0, the Status Register locked and can not be written to.
1 0 Hardware Protected

WP#=1, the Status Register is unlocked and can be written to after


1 1 Hardware Unprotected
a Write Enable command, WEL=1.

QE bit
The Quad Enable (QE) bit is a non-volatile Read/Write bit in the Status Register that allows Quad operation. When
the QE bit is set to 0 (Default) the WP# pin and HOLD# / RESET# pin are enable. When the QE pin is set to 1, the Quad
IO2 and IO3 pins are enabled. (The QE bit should never be set to 1 during standard SPI or Dual SPI operation if the WP#
or HOLD# / RESET# pins are tied directly to the power supply or ground)
LB3, LB2, LB1, bits.
The LB3, LB2, LB1, bits are non-volatile One Time Program (OTP) bits in Status Register (S16, S17, S20) that
provide the write protect control and status to the Security Registers. The default state of LB3-LB1 are 0, the security
registers are unlocked. The LB3-LB1 bits can be set to 1 individually using the Write Register instruction. The LB3-LB1 bits
are One Time Programmable, once its set to 1, the Security Registers will become read-only permanently.
SUS_E, SUS_P bit
The SUS_E and SUS_P bit are read only bit in the status register (S18 and S19) that are set to 1 after executing an
Program/Erase Suspend (75H) command (The Erase Suspend will set the SUS_E to 1,and the Program Suspend will set
the SUS_P to 1). The SUS_E and SUS_P bit are cleared to 0 by Program/Erase Resume (7AH) command as well as a
power-down, power-up cycle.
WPS
The WPS Bit is used to select which Write Protect scheme should be used. When WPS=0, the device will use the
combination of TB, BP (3:0) bits to protect a specific area of the memory array. When WPS=1, the device will utilize the
Advanced Block Protection to protect any individual sector or blocks. The default value for all Individual Block Lock bits is 1

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Dual and Quad Serial Flash GD25Q256C
upon device power on or after reset.
DRV1/DRV0
The DRV1&DRV0 bits are used to determine the output driver strength for the Read operations.

Table 10 Driver Strength for Read Operations


DRV1,DRV0 Driver Strength
00 100%
01 75%
10 50% (Default)
11 25%
HOLD/RST
The HOLD/RST bit is used to determine whether HOLD# or RESET# function should be implemented on the hardware
pin for 8-pin packages. When HOLD/RST=0, the pin acts as HOLD#, When the HOLD/RST=1, the pin acts as RESET#.
However, the HOLD# or RESET# function are only available when QE=0, If QE=1, The HOLD# and RESET# functions are
disabled, the pin acts as dedicated data I/O pin.
PE
The Program Error (PE) bit is a read only bit that indicates a program failure. It will also be set when the user attempts
to program a protected array sector or access the locked OTP space.
Error bits must be reset by CLEAR FLAG STATUS REGISTER command (30H).
EE
The Erase Error (EE) bit is a read only bit that indicates an erase failure. It will also be set when the user attempts to
erase a protected array sector or access the locked OTP space.
Error bits must be reset by CLEAR FLAG STATUS REGISTER command (30H).
LC1, LC0 bits
The Latency Code (LC) selects the mode and number of dummy cycles between the end of address and the start of
read data output for all read commands.
Some read commands send mode bits following the address to indicate that the next command will be of the same
type with an implied, rather than an explicit, instruction. The next command thus does not provide an instruction byte, only
a new address and mode bits. This reduces the time needed to send each command when the same command type is
repeated in a sequence of commands.
Dummy cycles provide additional latency that is needed to complete the initial read access of the flash array before
data can be returned to the host system. Some read commands require additional latency cycles as the SCLK frequency is
increased.
The following latency code tables provide different latency settings that are configured by GigaDevice.

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Table 11 Latency Code and Frequency Table
Read Fast Read Read Dual Out Read Quad Out Dual I/O Read Quad I/O Read
Freq. Freq. Freq.
LC (03h, 13h) (0Bh, 0Ch) (3Bh, 3Ch) (6Bh, 6Ch) (BBh, BCh) (EBh, ECh)
(MHz) (MHz) (MHz)
Mode Dummy Mode Dummy Mode Dummy Mode Dummy Mode Dummy Mode Dummy
11 ≤50 0 0 ≤50 0 0 ≤80 0 6 0 6 4 0 2 4
00 ≤80 0 0 ≤104 0 8 ≤80 0 8 0 8 4 0 2 4
01 or 10 ≤104 - - ≤104 0 8 ≤104 0 8 0 8 4 2 2 6

Note:
1. The default value of latency code is 00.
2. Not 100% tested in production.
ADS
The Address Status (ADS) bit is a read only bit that indicates the current address mode the device is operating in.
The device is in 3-byte address mode when ADS=0 (default), and in 4-byte address mode when ADS=1.
ADP
The Address Power-up (ADP) bit is a non-volatile writable bit that determines the initial address mode when the
device is powered on or reset. This bit is only used during the power on or device reset initialization period. When
ADP=0(factory default), the device will power up into 3-byte address mode, the Extended Address Register must be used
to access memory regions beyond 128Mb. When ADP=1, the device will power up into 4-byte address mode directly.

6.2. Extended Address Register


Table 12 Extended Address Register
EA7 EA6 EA5 EA4 EA3 EA2 EA1 EA0
A31 A30 A29 A28 A27 A26 A25 A24
The extended address register is only used when the address mode is 3-byte mode, as to set the higher address.
When the device is 256Mb, A24 is the highest address bit. A31~A26 are reserved for higher density from 1Gb ~ 32Gb.

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7. COMMANDS DESCRIPTION

All commands, addresses and data are shifted in and out of the device, beginning with the most significant bit on the
first rising edge of SCLK after CS# is driven low. Then, the one-byte command code must be shifted in to the device, most
significant bit first on SI, each bit being latched on the rising edges of SCLK.
Every command sequence starts with a one-byte command code. Depending on the command, this might be
followed by address bytes, or by data bytes, or by both or none. CS# must be driven high after the last bit of the command
sequence has been shifted in. For the command of Read, Fast Read, Read Status Register or Release from Deep
Power-Down, and Read Device ID, the shifted-in command sequence is followed by a data-out sequence. CS# can be
driven high after any bit of the data-out sequence is being shifted out.
For the command of Page Program, Sector Erase, Block Erase, Chip Erase, Write Status Register, Write Enable,
Write Disable or Deep Power-Down command, CS# must be driven high exactly at a byte boundary, otherwise the
command is rejected, and is not executed. That is CS# must driven high when the number of clock pulses after CS# being
driven low is an exact multiple of eight. For Page Program, if at any time the input byte is not a full byte, nothing will happen
and WEL will not be reset.
When the device is in 3-byte address mode (ADS=0), please refer to command set in table13 & table14. When the
device is in 4-byte address mode (ADS=1), please refer to command set in table13 & table15.
Extended Address Register setting is effective to achieve A31-A24, accompanying A23-A0 within the instruction,
when commands listed in table14 are executed.
Extended Address Register setting is ignored when A31-A24 are given in the instruction listed in table 3 and some
specific instruction from table13 (13H, 0CH, 3CH, 6CH, BCH, ECH).
Table 13. Commands (Standard/Dual/Quad SPI, 3-byte & 4-byte address mode)
Command Add Byte 1 Byte 2 Byte 3 Byte 4 Byte 5 Byte 6 n-Bytes
Name Mode
Write Enable 3&4 06H
Write Disable 3&4 04H
Read Status 3&4
05H (S7-S0) (cont.)
Register-1
Read Status 3&4
35H (S15-S8) (cont.)
Register-2
Read Status 3&4
15H (S23-S16)
Register-3
Write Status 3&4
01H (S7-S0)
Register-1
Write Status 3&4
31H (S15-S8)
Register-2
Write Status 3&4
11H (S23-S16)
Register-3
Read 3&4
Extended C8H (EA7-EA0)
Addr. Register
Write 3&4
Extended C5H (EA7-EA0)
Addr. Register
Chip Erase 3&4 C7/60H
Enable Reset 3&4 66H
Reset 3&4 99H
Program/Erase 3&4 75H
Suspend

16
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Program/Erase 3&4 7AH
Resume
Set Burst with 3&4 77H dummy
Wrap (5) W7-W0
Release From 3&4 ABH
Deep
Power-Down
Read Device 3&4 ABH dummy dummy dummy (DID7-DID0) (cont.)
ID
Deep 3&4 B9H
Power-Down
Manufacturer/ 3&4 90H dummy dummy 00H (MID7-MID0) (DID7-DID0) (cont.)
Device ID
Read 3&4 (cont.)
9FH (MID7-MID0) (JDID15-JDID8) (JDID7-JDID0)
Identification
Enter 4-Byte 3&4
B7H
Address Mode
Exit 4-Byte 3&4
E9H
Address Mode
Read Data 3&4 13H A31-A24 A23-A16 A15-A8 A7-A0 (D7-D0)
with 4-Byte
Address
Fast Read with 3&4 0CH A31-A24 A23-A16 A15-A8 A7-A0 dummy (D7-D0)
4-Byte
Address
Fast Read 3&4 3CH A31-A24 A23-A16 A15-A8 A7-A0 dummy (D7-D0)
Dual Output
with 4-Byte
Address (1)
Fast Read 3&4 6CH A31-A24 A23-A16 A15-A8 A7-A0 dummy (D7-D0)
Quad Output
with 4-Byte
Address (3)
Fast Read 3&4 BCH A31-A24 A15-A8 M7-M0
Dual I/O with A23-A 16 A7-A0 (D7-D0)
4-Byte
Address (2)
Fast Read 3&4 ECH A31-A24 M7-M0
Quad I/O with A23-A 16 dummy
4-Byte A15-A8 dummy
Address (4) A7-A0 (D7-D0)
Page Program
Next
with 4-Byte 3&4 12H A31-A24 A23-A16 A15-A8 A7-A0 (D7-D0)
byte
Address
Quad Page
Program with
3&4 3EH A31-A24 A23-A16 A15-A8 A7-A0 (D7-D0)(3)
4-Byte
Address
Sector Erase
with 4-Byte 3&4 21H A31-A24 A23-A16 A15-A8 A7-A0
Address
Block
Erase(32K)
3&4 5CH A31-A24 A23-A16 A15-A8 A7-A0
with 4-Byte
Address
Block 3&4 DCH A31-A24 A23-A16 A15-A8 A7-A0

17
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Erase(64K)
with 4-Byte
Address
Clear SR Flags 3 & 4 30H

18
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Table 14 Commands (Standard/Dual/Quad SPI, 3-byte address)
Command Add
Byte 1 Byte 2 Byte 3 Byte 4 Byte 5 Byte 6 n-Bytes
Name Mode
Read Data 3 03H A23-A16 A15-A8 A7-A0 (D7-D0) (Next byte) (cont.)
Fast Read 3 0BH A23-A16 A15-A8 A7-A0 dummy (D7-D0) (cont.)
Dual Output
3 3BH A23-A16 A15-A8 A7-A0 dummy (D7-D0)(1) (cont.)
Fast Read (1)
Dual I/O A7-A0
3 BBH A23-A8(2) (D7-D0)(1) (cont.)
Fast Read (2) M7-M0(2)
Quad Output
3 6BH A23-A16 A15-A8 A7-A0 dummy (D7-D0)(3) (cont.)
Fast Read (3)
Quad I/O A23-A0
3 EBH dummy (D7-D0)(3) (cont.)
Fast Read (4) M7-M0(4)
Page Program 3 02H A23-A16 A15-A8 A7-A0 (D7-D0) Next byte
Quad Page
3 32H A23-A16 A15-A8 A7-A0 (D7-D0)(3)
Program
Sector Erase 3 20H A23-A16 A15-A8 A7-A0
Block
3 52H A23-A16 A15-A8 A7-A0
Erase(32K)
Block
3 D8H A23-A16 A15-A8 A7-A0
Erase(64K)
Read Serial
Flash
3 5AH A23-A16 A15-A8 A7-A0 dummy (D7-D0) (cont.)
Discoverable
Parameter
Read Unique
3 4BH dummy dummy dummy dummy (UID63-UID0)
ID
Erase Security
3 44H A23-A16 A15-A8 A7-A0
Registers (6)
Program
Security 3 42H A23-A16 A15-A8 A7-A0 (D7-D0) (D7-D0)
Registers (6)
Read Security
3 48H A23-A16 A15-A8 A7-A0 dummy (D7-D0)
Registers (6)

Table 15. Commands (Standard/Dual/Quad SPI, 4-byte address)


Command Add Byte
Byte 2 Byte 3 Byte 4 Byte 5 Byte 6 Bytes-7 n-Bytes
Name Mode 1
Read Data 4 03H A31-A24 A23-A16 A15-A8 A7-A0 (D7-D0) (cont.)
Fast Read 4 0BH A31-A24 A23-A16 A15-A8 A7-A0 dummy (D7-D0) (cont.)
Dual Output
4 3BH A31-A24 A23-A16 A15-A8 A7-A0 dummy (D7-D0)(1) (cont.)
Fast Read (1)
Dual I/O A31-A24 A15-A8 M7-M0(2)
4 BBH (D7-D0)(1)
Fast Read (2) A23-A16 A7-A0 dummy
Quad Output
4 6BH A31-A24 A23-A16 A15-A8 A7-A0 dummy (D7-D0)(1) (cont.)
Fast Read (3)
A31-A24 M7-M0(4)
Quad I/O A23-A16 dummy
4 EBH (cont.)
Fast Read (4) A15-A8 dummy
A7-A0 (D7-D0)(3)
Page Program 4 02H A31-A24 A23-A16 A15-A8 A7-A0 (D7-D0) (D7-D0) (cont.)
Quad Page
4 32H A31-A24 A23-A16 A15-A8 A7-A0 (D7-D0)(3) (cont.)
Program
Sector Erase 4 20H A31-A24 A23-A16 A15-A8 A7-A0

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3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Block
4 52H A31-A24 A23-A16 A15-A8 A7-A0
Erase(32K)
Block
4 D8H A31-A24 A23-A16 A15-A8 A7-A0
Erase(64K)
Read Serial
Flash
4 5AH A31-A24 A23-A16 A15-A8 A7-A0 dummy (D7-D0) (cont.)
Discoverable
Parameter
Read Unique
4 4BH dummy dummy dummy dummy dummy (UID63-UID0)
ID
Erase Security
4 44H A31-A24 A23-A16 A15-A8 A7-A0
Registers (6)
Program
Security 4 42H A31-A24 A23-A16 A15-A8 A7-A0 (D7-D0) (D7-D0) (cont.)
Registers (6)
Read Security
4 48H A31-A24 A23-A16 A15-A8 A7-A0 dummy (D7-D0) (cont.)
Registers (6)
NOTE:
1. Dual Output data
IO0 = (D6, D4, D2, D0)
IO1 = (D7, D5, D3, D1)
2. Dual Input Address
IO0 = A22, A20, A18, A16, A14, A12, A10, A8 A6, A4, A2, A0, M6, M4, M2, M0
IO1 = A23, A21, A19, A17, A15, A13, A11, A9 A7, A5, A3, A1, M7, M5, M3, M1
3. Quad Output Data
IO0 = (D4, D0, …..)
IO1 = (D5, D1, …..)
IO2 = (D6, D2, …..)
IO3 = (D7, D3,…..)
4. Quad Input Address
IO0 = A20, A16, A12, A8, A4, A0, M4, M0
IO1 = A21, A17, A13, A9, A5, A1, M5, M1
IO2 = A22, A18, A14, A10, A6, A2, M6, M2
IO3 = A23, A19, A15, A11, A7, A3, M7, M3
5. Dummy bits and Wrap Bits
IO0 = (x, x, x, x, x, x, W4, x)
IO1 = (x, x, x, x, x, x, W5, x)
IO2 = (x, x, x, x, x, x, W6, x)
IO3 = (x, x, x, x, x, x, W7, x)
6. Security Registers Address
Security Register1: A23-A16=00H, A15-A8=10H, A7-A0= Byte Address;
Security Register2: A23-A16=00H, A15-A8=20H, A7-A0= Byte Address;
Security Register3: A23-A16=00H, A15-A8=30H, A7-A0= Byte Address.

20
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Table of ID Definitions:

GD25Q256C
Operation Code MID7-MID0 ID15-ID8 ID7-ID0
9FH C8 40 19
90H C8 18
ABH 18

7.1. Write Enable (WREN) (06H)


The Write Enable (WREN) command is for setting the Write Enable Latch (WEL) bit. The Write Enable Latch (WEL)
bit must be set prior to every Page Program (PP), Quad Page Program (QPP), Sector Erase (SE), Block Erase (BE), Chip
Erase (CE), Write Status Register (WRSR). The Write Enable (WREN) command sequence: CS# goes low  sending the
Write Enable command  CS# goes high.
Figure 5 Write Enable Sequence Diagram

CS#

0 1 2 3 4 5 6 7
SCLK

Command
SI
06H
High-Z
SO

7.2. Write Disable (WRDI) (04H)


The Write Disable command is for resetting the Write Enable Latch (WEL) bit. The Write Enable Latch (WEL) bit may
be set to a 0 by issuing the Write Disable (WRDI) command to disable Page Program (PP), Quad Page Program (QPP),
Sector Erase (SE), Block Erase (BE), Chip Erase (CE), Write Status Register (WRSR), that require WEL be set to 1 for
execution. The WRDI command can be used by the user to protect memory areas against inadvertent writes that can
possibly corrupt the contents of the memory. The WRDI command is ignored during an embedded operation while WIP bit
=1.
The WEL bit is reset by following condition: Write Disable command (WRDI), Power-up, and upon completion of the
Write Status Register, Page Program, Sector Erase, Block Erase and Chip Erase commands.
The Write Disable command sequence: CS# goes low Sending the Write Disable command CS# goes high.
21
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C

Figure 6 Write Disable Sequence Diagram

CS#

0 1 2 3 4 5 6 7
SCLK

Command
SI
04H
High-Z
SO

7.3. Read Status Register (RDSR) (05H or 35H or 15H)


The Read Status Register (RDSR) command is for reading the Status Register. The Status Register may be read at
any time, even while a Program, Erase or Write Status Register cycle is in progress. When one of these cycles is in
progress, it is recommended to check the Write in Progress (WIP) bit before sending a new command to the device. It is
also possible to read the Status Register continuously. For command code “05H” / “35H” / “15H”, the SO will output Status
Register bits S7~S0 / S15-S8 / S16-S23.
Figure 7 Read Status Register Sequence Diagram

CS#
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
SCLK

Command
SI
05H or 35H or 15H
Register0/1/2 Register0/1/2
SO High-Z
7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0 7
MSB MSB

7.4. Write Status Register (WRSR) (01H or 31H or 11H)


The Write Status Register (WRSR) command allows new values to be written to the Status Register. Before it can be
accepted, a Write Enable (WREN) command must previously have been executed. After the Write Enable (WREN)
command has been decoded and executed, the device sets the Write Enable Latch (WEL).
The Write Status Register (WRSR) command has no effect on S22, S21, S19, S18, S13, S1 and S0 of the Status
Register. CS# must be driven high after the eighth of the data byte has been latched in. If not, the Write Status Register
(WRSR) command is not executed. As soon as CS# is driven high, the self-timed Write Status Register cycle (whose
duration is tW) is initiated. While the Write Status Register cycle is in progress, the Status Register may still be read to
check the value of the Write In Progress (WIP) bit. The Write In Progress (WIP) bit is 1 during the self-timed Write Status
Register cycle, and is 0 when it is completed. When the cycle is completed, the Write Enable Latch (WEL) is reset.
The Write Status Register (WRSR) command allows the user to change the values of the Block Protect (BP4, BP3,
BP2, BP1, and BP0) bits, to define the size of the area that is to be treated as read-only. The Write Status Register (WRSR)
command also allows the user to set or reset the Status Register Protect (SRP) bits in accordance with the Write Protect
(WP#) signal. The Status Register Protect (SRP) bits and Write Protect (WP#) signal allow the device to be put in the
Hardware Protected Mode. The Write Status Register (WRSR) command is not executed once the Hardware Protected
Mode is entered.

22
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Figure 8 Write Status Register Sequence Diagram

CS#
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
SCLK

Command Status Register in


SI 01H/31H/11H 7 6 5 4 3 2 1 0
MSB High-Z
SO

7.5. Read Data Bytes (READ 03H or 4READ 13H)


The Read Data Bytes (READ) command is followed by a 3-byte address (A23-A0), each bit being latched-in during
the rising edge of SCLK. Then the memory content, at that address, is shifted out on SO, each bit being shifted out, at a
Max frequency fR, during the falling edge of SCLK. The first byte addressed can be at any location. The address is
automatically incremented to the next higher address after each byte of data is shifted out. The whole memory can,
therefore, be read with a single Read Data Bytes (READ) command. Any Read Data Bytes (READ) command, while an
Erase, Program or Write cycle is in progress, is rejected without having any effects on the cycle that is in progress.
Figure 9 Read Data Bytes Sequence Diagram (ADS=0)

CS#
0 1 2 3 4 5 6 7 8 9 10 28 29 30 31 32 33 34 35 36 37 38 39
SCLK

Command 24-bit address


SI
03H 23 22 21 3 2 1 0
MSB Data Out1 Data Out2
SO High-Z
7 6 5 4 3 2 1 0
MSB

Figure 10 Read Data Bytes Sequence Diagram (ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 10 36 37 38 39 40 41 42 43 44 45 46 47
SCLK

Command 32-bit address


SI
03H 31 30 29 3 2 1 0
MSB Data Out1 Data Out2
SO High-Z
7 6 5 4 3 2 1 0
MSB

Figure 11 Read Data with 4-Byte Address Sequence Diagram (ADS=0 or ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 10 36 37 38 39 40 41 42 43 44 45 46 47
SCLK

Command 32-bit address


SI
13H 31 30 29 3 2 1 0
MSB Data Out1 Data Out2
SO High-Z 23
7 6 5 4 3 2 1 0
MSB
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C

7.6. Read Data Bytes at Higher Speed (Fast Read 0BH or 4Fast Read 0CH)
The Read Data Bytes at Higher Speed (Fast Read) command is for quickly reading data out. It is followed by a 3-byte
address (A23-A0) and a dummy byte, each bit being latched-in during the rising edge of SCLK. Then the memory content,
at that address, is shifted out on SO, each bit being shifted out, at a Max frequency fC, during the falling edge of SCLK. The
first byte addressed can be at any location. The address is automatically incremented to the next higher address after each
byte of data is shifted out.

24
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Figure 12 Read Data Bytes at Higher Speed Sequence Diagram (ADS=0)

CS#
0 1 2 3 4 5 6 7 8 9 10 28 29 30 31
SCLK

Command 24-bit address


SI
0BH 23 22 21 3 2 1 0

SO High-Z

CS#
32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47
SCLK
Dummy Byte
SI 7 6 5 4 3 2 1 0
Data Out1 Data Out2
SO 7 6 5 4 3 2 1 0 7 6 5
MSB MSB

Note:
1. The dummy clock number is configurable.

Figure 13 Read Data Bytes at Higher Speed Sequence Diagram (ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 10 36 37 38 39
SCLK

Command 32-bit address


SI
0BH 31 30 29 3 2 1 0

SO High-Z

CS#
40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55
SCLK
Dummy Byte
SI 7 6 5 4 3 2 1 0
Data Out1 Data Out2
SO 7 6 5 4 3 2 1 0 7 6 5
MSB MSB

Note:
1. The dummy clock number is configurable.

25
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Figure 14 Fast Read with 4-Byte Address Sequence Diagram (ADS=0 or ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 10 36 37 38 39
SCLK

Command 32-bit address


SI
0CH 31 30 29 3 2 1 0

SO High-Z

CS#
40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55
SCLK
Dummy Byte
SI 7 6 5 4 3 2 1 0
Data Out1 Data Out2
SO 7 6 5 4 3 2 1 0 7 6 5
MSB MSB

Note:
1. The dummy clock number is configurable.

7.7. Dual Output Fast Read (DOFR 3BH or 4DOFR 3CH)


The Dual Output Fast Read command is followed by 3-byte address (A23-A0) and a dummy byte, each bit being
latched in during the rising edge of SCLK, then the memory contents are shifted out 2-bit per clock cycle from SI and SO.
The command sequence is shown in followed Figure 16. The first byte addressed can be at any location. The address is
automatically incremented to the next higher address after each byte of data is shifted out.
Figure 15 Dual Output Fast Read Sequence Diagram (ADS=0)

CS#
0 1 2 3 4 5 6 7 8 9 10 28 29 30 31
SCLK

Command 24-bit address


SI
3BH 23 22 21 3 2 1 0

SO High-Z

CS#
32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47
SCLK
Dummy Clocks
SI 6 4 2 0 6 4 2 0 6
Data Out1 Data Out2
SO 7 5 3 1 7 5 3 1 7
MSB MSB

Note:
1. The dummy clock number is configurable.

26
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Figure 16 Dual Output Fast Read Sequence Diagram (ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 10 36 37 38 39
SCLK

Command 32-bit address


SI
3BH 31 30 29 3 2 1 0

SO High-Z

CS#
40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55
SCLK
Dummy Byte
SI 7 6 5 4 3 2 1 0 6 4 2 0 6 4 2 0 6
Data Out1 Data Out2
SO 7 5 3 1 7 5 3 1 7
MSB MSB

Note:
1. The dummy clock number is configurable.

Figure 17 Dual Output Fast Read with 4-Byte Address Sequence Diagram (ADS=0 or ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 10 36 37 38 39
SCLK

Command 32-bit address


SI
3CH 31 30 29 3 2 1 0

SO High-Z

CS#
40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55
SCLK
Dummy Byte
SI 7 6 5 4 3 2 1 0 6 4 2 0 6 4 2 0 6
Data Out1 Data Out2
SO 7 5 3 1 7 5 3 1 7
MSB MSB

Note:
1. The dummy clock number is configurable.

27
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
7.8. Quad Output Fast Read (QOFR 6BH or 4QOFR 6CH)
The Quad Output Fast Read command is followed by 3-byte address (A23-A0) and a dummy byte, each bit being
latched in during the rising edge of SCLK, then the memory contents are shifted out 4-bit per clock cycle from IO3, IO2, IO1
and IO0. The command sequence is shown in followed Figure19. The first byte addressed can be at any location. The
address is automatically incremented to the next higher address after each byte of data is shifted out.
Figure 18 Quad Output Fast Read Sequence Diagram (ADS=0)

CS#
0 1 2 3 4 5 6 7 8 9 10 28 29 30 31
SCLK

Command 24-bit address


SI(IO0) 6BH 23 22 21 3 2 1 0
SO(IO1) High-Z
WP#(IO2) High-Z
HOLD#(IO3) High-Z

CS#
32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47
SCLK
Dummy Clocks
SI(IO0) 4 0 4 0 4 0 4 0 4

SO(IO1) 5 1 5 1 5 1 5 1 5

WP#(IO2) 6 2 6 2 6 2 6 2 6

HOLD#(IO3) 7 3 7 3 7 3 7 3 7
Byte1 Byte2 Byte3 Byte4

Note:
1. The dummy clock number is configurable.

28
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Figure 19 Quad Output Fast Read Sequence Diagram (ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 10 36 37 38 39
SCLK

Command 32-bit address


SI(IO0) 6BH 31 30 29 3 2 1 0
SO(IO1) High-Z
WP#(IO2) High-Z
HOLD#(IO3) High-Z

CS#
40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55
SCLK
Dummy Clocks
SI(IO0) 4 0 4 0 4 0 4 0 4

SO(IO1) 5 1 5 1 5 1 5 1 5

WP#(IO2) 6 2 6 2 6 2 6 2 6

HOLD#(IO3) 7 3 7 3 7 3 7 3 7
Byte1 Byte2 Byte3 Byte4

Note:
1. The dummy clock number is configurable.

29
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Figure 20 Fast Read Quad Output with 4-Byte Address Sequence Diagram (ADS=0 or ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 10 36 37 38 39
SCLK

Command 32-bit address


SI(IO0) 6CH 31 30 29 3 2 1 0
SO(IO1) High-Z
WP#(IO2) High-Z
HOLD#(IO3) High-Z

CS#
40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55
SCLK
Dummy Clocks
SI(IO0) 4 0 4 0 4 0 4 0 4

SO(IO1) 5 1 5 1 5 1 5 1 5

WP#(IO2) 6 2 6 2 6 2 6 2 6

HOLD#(IO3) 7 3 7 3 7 3 7 3 7
Byte1 Byte2 Byte3 Byte4

Note:
1. The dummy clock number is configurable.

7.9. Dual I/O Fast Read (DIOFR BBH or 4DIOFR BCH)


The Dual I/O Fast Read command is similar to the Dual Output Fast Read command but with the capability to input
the 3-byte address (A23-0) and a “Continuous Read Mode” byte 2-bit per clock by SI and SO, each bit being latched in
during the rising edge of SCLK, then the memory contents are shifted out 2-bit per clock cycle from SI and SO. The
command sequence is shown in followed Figure22. The first byte addressed can be at any location. The address is
automatically incremented to the next higher address after each byte of data is shifted out.
Dual I/O Fast Read with “Continuous Read Mode”
The Dual I/O Fast Read command can further reduce command overhead through setting the “Continuous Read
Mode” bits (M7-4) after the input 3-byte address (A23-A0). If the “Continuous Read Mode” bits (M5-4) = (1, 0), then the next
Dual I/O Fast Read command (after CS# is raised and then lowered) does not require the BBH command code. The
command sequence is shown in followed Figure23. If the “Continuous Read Mode” bits (M5-4) do not equal (1, 0), the next
command requires the first BBH command code, thus returning to normal operation. A Reset command can be used to
reset (M5-4) before issuing normal command.

30
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Figure 21 Dual I/O Fast Read Sequence Diagram (M5-4≠ (1, 0), ADS=0)

CS#
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23
SCLK

Command
SI(IO0) BBH 6 4 2 0 6 4 2 0 6 4 2 0 6 4 2 0

SO(IO1) 7 5 3 1 7 5 3 1 7 5 3 1 7 53 1
A23-16 A15-8 A7-0 M7-4 M3-0
CS#
23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39
SCLK

SI(IO0) 6 4 2 0 6 4 2 0 6 4 2 0 6 4 2 0 6

SO(IO1) 7 5 3 1 7 5 3 1 7 5 3 1 7 5 3 1 7
Byte1 Byte2 Byte3 Byte4

Note:
1. The dummy clock number is configurable.

Figure 22 Dual I/O Fast Read Sequence Diagram (M5-4= (1, 0), ADS=0)

CS#
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
SCLK

6 4 2 0 6 4 2 0 6 4 2 0 6 4 2 0

7 5 3 1 7 5 3 1 7 5 3 1 7 5 3 1
A23-16 A15-8 A7-0 M7-4 M3-0
CS#
15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31
SCLK

SI(IO0) 6 4 2 0 6 4 2 0 6 4 2 0 6 4 2 0 6

SO(IO1) 7 5 3 1 7 5 3 1 7 5 3 1 7 5 3 1 7
Byte1 Byte2 Byte3 Byte4

Note:
1. The dummy clock number is configurable.

31
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Figure 23 Dual I/O Fast Read Sequence Diagram (M5-4≠ (1, 0), ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23
SCLK

Command
SI(IO0) BBH 6 4 2 0 6 4 2 0 6 4 2 0 6 4 2 0

SO(IO1) 7 5 3 1 7 5 3 1 7 5 3 1 7 5 3 1
A31-24 A23-16 A15-8 A7-0
CS#
24 25 26 27 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39
SCLK

SI(IO0) 6 4 2 0 6 4 2 0 6 4 2 0 6 4 2 0 6 4 2 0 6

SO(IO1) 7 5 3 1 7 5 3 1 7 5 3 1 7 5 3 1 7 5 3 1 7
M7-4 M3-0 Byte1 Byte2 Byte3 Byte4

Note:
1. The dummy clock number is configurable.

Figure 24 Dual I/O Fast Read Sequence Diagram (M5-4= (1, 0) ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
SCLK

6 4 2 0 6 4 2 0 6 4 2 0 6 4 2 0 6 4 2 0

7 5 3 1 7 5 3 1 7 5 3 1 7 5 3 1 7 5 3 1
A31-24 A23-16 A15-8 A7-0 M7-4 M3-0
CS#
20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35
SCLK

SI(IO0) 6 4 2 0 6 4 2 0 6 4 2 0 6 4 2 0 6

SO(IO1) 7 5 3 1 7 5 3 1 7 5 3 1 7 5 3 1 7
Byte1 Byte2 Byte3 Byte4

Note:
1. The dummy clock number is configurable.

32
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Figure 25 Dual I/O Fast Read with 4-Byte Address Sequence Diagram (M5-4≠ (1, 0), ADS=0 or ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23
SCLK

Command
SI(IO0) BCH 6 4 2 0 6 4 2 0 6 4 2 0 6 4 2 0

SO(IO1) 7 5 3 1 7 5 3 1 7 5 3 1 7 5 3 1
A31-24 A23-16 A15-8 A7-0
CS#
24 25 26 27 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39
SCLK

SI(IO0) 6 4 2 0 6 4 2 0 6 4 2 0 6 4 2 0 6 4 2 0 6

SO(IO1) 7 5 3 1 7 5 3 1 7 5 3 1 7 5 3 1 7 5 3 1 7
M7-4 M3-0 Byte1 Byte2 Byte3 Byte4

Note:
1. The dummy clock number is configurable.

Figure 26 Dual I/O Fast Read with 4-Byte Address Sequence Diagram (M5-4= (1, 0) ADS=0 or ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
SCLK

6 4 2 0 6 4 2 0 6 4 2 0 6 4 2 0 6 4 2 0

7 5 3 1 7 5 3 1 7 5 3 1 7 5 3 1 7 5 3 1
A31-24 A23-16 A15-8 A7-0 M7-4 M3-0
CS#
20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35
SCLK

SI(IO0) 6 4 2 0 6 4 2 0 6 4 2 0 6 4 2 0 6

SO(IO1) 7 5 3 1 7 5 3 1 7 5 3 1 7 5 3 1 7
Byte1 Byte2 Byte3 Byte4

Note:
1. The dummy clock number is configurable.

33
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
7.10. Quad I/O Fast Read (QIOFR EBH or 4QIOFR ECH)
The Quad I/O Fast Read command is similar to the Dual I/O Fast Read command but with the capability to input the
3-byte address (A23-0) and a “Continuous Read Mode” byte and 4-dummy clock 4-bit per clock by IO0, IO1, IO2, IO3, each
bit being latched in during the rising edge of SCLK, then the memory contents are shifted out 4-bit per clock cycle from IO0,
IO1, IO2, IO3. The first byte addressed can be at any location. The address is automatically incremented to the next higher
address after each byte of data is shifted out. The Quad Enable bit (QE) of Status Register (S6) must be set to enable for
the Quad I/O Fast read command.
Quad I/O Fast Read with “Continuous Read Mode”
The Quad I/O Fast Read command can further reduce command overhead through setting the “Continuous Read
Mode” bits (M7-0) after the input 3-byte address (A23-A0). If the “Continuous Read Mode” bits (M5-4) = (1, 0), then the next
Quad I/O Fast Read command (after CS# is raised and then lowered) does not require the EBH command code. If the
“Continuous Read Mode” bits (M5-4) do not equal to (1, 0), the next command requires the first EBH command code, thus
returning to normal operation. A Reset command can be used to reset (M5-4) before issuing normal command.
Figure 27 Quad I/O Fast Read Sequence Diagram (M5-4≠ (1, 0), ADS=0)

CS#
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23
SCLK

Command
SI(IO0) EBH 4 0 4 0 4 0 4 0 4 0 4 0 4

SO(IO1) 5 1 5 1 5 1 5 1 5 1 5 1 5

WP#(IO2) 6 2 6 2 6 2 6 2 6 2 6 2 6

HOLD#(IO3) 7 3 7 3 7 3 7 3 7 3 7 3 7
A23-16 A15-8 A7-0 M7-0 Dummy Byte1 Byte2

Note:
1. The dummy clock number is configurable.

34
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Figure 28 Quad I/O Fast Read Sequence Diagram (M5-4= (1, 0), ADS=0)

CS#
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
SCLK

SI(IO0) 4 0 4 0 4 0 4 0 4 0 4 0 4

SO(IO1) 5 1 5 1 5 1 5 1 5 1 5 1 5

WP#(IO2) 6 2 6 2 6 2 6 2 6 2 6 2 6

HOLD#(IO3) 7 3 7 3 7 3 7 3 7 3 7 3 7
A23-16 A15-8 A7-0 M7-0 Dummy Byte1 Byte2

Note:
1. The dummy clock number is configurable.

Figure 29 Quad I/O Fast Read Sequence Diagram (M5-4≠ (1, 0), ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25
SCLK

Command
SI(IO0) EBH 4 0 4 0 4 0 4 0 4 0 4 0 4 0 4

SO(IO1) 5 1 5 1 5 1 5 1 5 1 5 1 5 1 5

WP#(IO2) 6 2 6 2 6 2 6 2 6 2 6 2 6 2 6

HOLD#(IO3) 7 3 7 3 7 3 7 3 7 3 7 3 7 3 7
A31-24A23-16A15-8 A7-0 M7-0 Dummy Byte1 Byte2

Note:
1. The dummy clock number is configurable.

35
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Figure 30 Quad I/O Fast Read Sequence Diagram (M5-4= (1, 0), ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17
SCLK

SI(IO0) 4 0 4 0 4 0 4 0 4 0 4 0 4 0 4

SO(IO1) 5 1 5 1 5 1 5 1 5 1 5 1 5 1 5

WP#(IO2) 6 2 6 2 6 2 6 2 6 2 6 2 6 2 6

HOLD#(IO3) 7 3 7 3 7 3 7 3 7 3 7 3 7 3 7
A31-24 A23-16 A15-8 A7-0 M7-0 Dummy Byte1 Byte2

Note:
1. The dummy clock number is configurable.

Figure 31 Quad I/O Fast Read with 4-Byte Address Sequence Diagram (M5-4≠ (1, 0), ADS=0 or ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25
SCLK

Command
SI(IO0) ECH 4 0 4 0 4 0 4 0 4 0 4 0 4 0 4

SO(IO1) 5 1 5 1 5 1 5 1 5 1 5 1 5 1 5

WP#(IO2) 6 2 6 2 6 2 6 2 6 2 6 2 6 2 6

HOLD#(IO3) 7 3 7 3 7 3 7 3 7 3 7 3 7 3 7
A31-24A23-16A15-8 A7-0 M7-0 Dummy Byte1 Byte2

Note:
1. The dummy clock number is configurable.

36
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Figure 32 Quad I/O Fast Read with 4-Byte Address Sequence Diagram (M5-4= (1, 0), ADS=0 or ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17
SCLK

SI(IO0) 4 0 4 0 4 0 4 0 4 0 4 0 4 0 4

SO(IO1) 5 1 5 1 5 1 5 1 5 1 5 1 5 1 5

WP#(IO2) 6 2 6 2 6 2 6 2 6 2 6 2 6 2 6

HOLD#(IO3) 7 3 7 3 7 3 7 3 7 3 7 3 7 3 7
A31-24 A23-16 A15-8 A7-0 M7-0 Dummy Byte1 Byte2

Note:
1. The dummy clock number is configurable.

Quad I/O Fast Read with “8/16/32/64-Byte Wrap Around” in Standard SPI mode
The Quad I/O Fast Read command can be used to access a specific portion within a page by issuing “Set Burst with
Wrap” (77H) commands prior to EBH or ECH. The “Set Burst with Wrap” (77H) command can either enable or disable the
“Wrap Around” feature for the following EBH or ECH commands. When “Wrap Around” is enabled, the data being accessed
can be limited to either an 8/16/32/64-byte section of a 256-byte page. The output data starts at the initial address specified
in the command, once it reaches the ending boundary of the 8/16/32/64-byte section, the output will wrap around the
beginning boundary automatically until CS# is pulled high to terminate the command.
The Burst with Wrap feature allows applications that use cache to quickly fetch a critical address and then fill the
cache afterwards within a fixed length (8/16/32/64-byte) of data without issuing multiple read commands. The “Set Burst
with Wrap” command allows three “Wrap Bits” W6-W4 to be set. The W4 bit is used to enable or disable the “Wrap Around”
operation while W6-W5 is used to specify the length of the wrap around section within a page.

7.11. Set Burst with Wrap (77H)


The Set Burst with Wrap command is used in conjunction with “Quad I/O Fast Read” command to access a fixed
length of 8/16/32/64-byte section within a 256-byte page, in standard SPI mode.
The Set Burst with Wrap command sequence: CS# goes low  Send Set Burst with Wrap command  Send 24
dummy bits  Send 8 bits “Wrap bits”  CS# goes high.
Table 16 Set Burst with Wrap configuration
W4=0 W4=1 (default)
W6,W5
Wrap Around Wrap Length Wrap Around Wrap Length
0, 0 Yes 8-byte No N/A
0, 1 Yes 16-byte No N/A
1, 0 Yes 32-byte No N/A
1, 1 Yes 64-byte No N/A
If the W6-W4 bits are set by the Set Burst with Wrap command, all the following “Quad I/O Fast Read” command will
use the W6-W4 setting to access the 8/16/32/64-byte section within any page. To exit the “Wrap Around” function and

37
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
return to normal read operation, another Set Burst with Wrap command should be issued to set W4=1.
Figure 33 Set Burst with Wrap Sequence Diagram

CS#
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
SCLK

Command
SI(IO0) 77H x x x x x x 4 x

SO(IO1) x x x x x x 5 x

WP#(IO2) x x x x x x 6 x

HOLD#(IO3) x x x x x x x x
W6-W4

7.12. Page Program (PP 02H or 4PP 12H)


The Page Program (PP) command is for programming the memory. A Write Enable (WREN) command must
previously have been executed to set the Write Enable Latch (WEL) bit before sending the Page Program command.
The Page Program (PP) command is entered by driving CS# Low, followed by the command code, three address
bytes and at least one data byte on SI. If the 8 least significant address bits (A7-A0) are not all zero, all transmitted data
that goes beyond the end of the current page are programmed from the start address of the same page (from the address
whose 8 least significant bits (A7-A0) are all zero). CS# must be driven low for the entire duration of the sequence. The
Page Program command sequence: CS# goes low  sending Page Program command  3-byte address on SI  at least
1 byte data on SI  CS# goes high. If more than 256 bytes are sent to the device, previously latched data are discarded
and the last 256 data bytes are guaranteed to be programmed correctly within the same page. If less than 256 data bytes
are sent to device, they are correctly programmed at the requested addresses without having any effects on the other
bytes of the same page. CS# must be driven high after the eighth bit of the last data byte has been latched in; otherwise the
Page Program (PP) command is not executed.
As soon as CS# is driven high, the self-timed Page Program cycle (whose duration is tPP) is initiated. While the Page
Program cycle is in progress, the Status Register may be read to check the value of the Write in Progress (WIP) bit. The
Write in Progress (WIP) bit is 1 during the self-timed Page Program cycle, and is 0 when it is completed. At some
unspecified time before the cycle is completed, the Write Enable Latch (WEL) bit is reset.
A Page Program (PP) command applied to a page which is protected by the Block Protect (BP4, BP3, BP2, BP1, and
BP0) is not executed.

38
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Figure 34 Page Program Sequence Diagram (ADS=0)

CS#
0 1 2 3 4 5 6 7 8 9 10 28 29 30 31 32 33 34 35 36 37 38 39
SCLK

Command 24-bit address Data Byte 1


SI
02H 23 22 21 3 2 1 0 7 6 5 4 3 2 1 0
MSB MSB
CS#

2073

2075
2076

2078
2072

2074

2077

2079
40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55
SCLK

Data Byte 2 Data Byte 3 Data Byte 256


SI 7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0
MSB MSB MSB

Figure 35 Page Program Sequence Diagram (ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 10 36 37 38 39 40 41 42 43 44 45 46 47
SCLK

Command 32-bit address Data Byte 1


SI
02H 31 30 29 3 2 1 0 7 6 5 4 3 2 1 0
MSB MSB
CS#
2081

2083
2084

2086
2080

2082

2085

2087
48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63
SCLK

Data Byte 2 Data Byte 3 Data Byte 256


SI 7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0
MSB MSB MSB

Figure 36 Page Program with 4-Byte Address Sequence Diagram (ADS=0 or ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 10 36 37 38 39 40 41 42 43 44 45 46 47
SCLK

Command 32-bit address Data Byte 1


SI
12H 31 30 29 3 2 1 0 7 6 5 4 3 2 1 0
MSB MSB
CS#
2081

2083
2084

2086
2080

2082

2085

2087

48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63
SCLK

Data Byte 2 Data Byte 3 Data Byte 256


SI 7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0
MSB MSB MSB

39
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
7.13. Quad Page Program (QPP 32H or 4QPP 3EH)
The Quad Page Program command is for programming the memory using four pins: IO0, IO1, IO2, and IO3. To use
Quad Page Program the Quad enable in status register Bit6 must be set (QE=1). A Write Enable (WREN) command must
previously have been executed to set the Write Enable Latch (WEL) bit before sending the Page Program command. The
quad Page Program command is entered by driving CS# Low, followed by the command code (32H), three address bytes
and at least one data byte on IO pins.
The command sequence is shown below. If more than 256 bytes are sent to the device, previously latched data are
discarded and the last 256 data bytes are guaranteed to be programmed correctly within the same page. If less than 256
data bytes are sent to device, they are correctly programmed at the requested addresses without having any effects on the
other bytes of the same page. CS# must be driven high after the eighth bit of the last data byte has been latched in;
otherwise the Quad Page Program (PP) command is not executed.
As soon as CS# is driven high, the self-timed Quad Page Program cycle (whose duration is tPP) is initiated. While the
Quad Page Program cycle is in progress, the Status Register may be read to check the value of the Write In Progress (WIP)
bit. The Write in Progress (WIP) bit is 1 during the self-timed Quad Page Program cycle, and is 0 when it is completed. At
some unspecified time before the cycle is completed, the Write Enable Latch (WEL) bit is reset.
A Quad Page Program command applied to a page which is protected by the Block Protect (BP4, BP3, BP2, BP1,
and BP0) is not executed.
Figure 37 Quad Page Program Sequence Diagram (ADS=0)

CS#
0 1 2 3 4 5 6 7 8 9 10 28 29 30 31 32 33 34 35 36 37 38 39
SCLK

Command 24-bit address Byte1 Byte2


SI(IO0) 32H 23 22 21 3 2 1 0 4 0 4 0 4 0 4 0
MSB
SO(IO1) 5 1 5 1 5 1 5 1

WP#(IO2) 6 2 6 2 6 2 6 2

HOLD#(IO3) 7 3 7 3 7 3 7 3

CS#
537

539
540

542
536

538

541

543

40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55
SCLK

Byte11Byte12 Byte253 Byte256


SI(IO0) 4 0 4 0 4 0 4 0 4 0 4 0 4 0 4 0 4 0 4 0 4 0 4 0

SO(IO1) 5 1 5 1 5 1 5 1 5 1 5 1 5 1 5 1 5 1 5 1 5 1 5 1

WP#(IO2) 6 2 6 2 6 2 6 2 6 2 6 2 6 2 6 2 6 2 6 2 6 2 6 2

HOLD#(IO3) 7 3 7 3 7 3 7 3 7 3 7 3 7 3 7 3 7 3 7 3 7 3 7 3

40
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Figure 38 Quad Page Program Sequence Diagram (ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 10 36 37 38 39 40 41 42 43 44 45 46 47
SCLK

Command 32-bit address Byte1 Byte2


SI(IO0) 32H 31 30 29 3 2 1 0 4 0 4 0 4 0 4 0
MSB
SO(IO1) 5 1 5 1 5 1 5 1

WP#(IO2) 6 2 6 2 6 2 6 2

HOLD#(IO3) 7 3 7 3 7 3 7 3

CS#

545

547
548

550
544

546

549

551
48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63
SCLK

Byte11 Byte12 Byte253 Byte256


SI(IO0) 4 0 4 0 4 0 4 0 4 0 4 0 4 0 4 0 4 0 4 0 4 0 4 0

SO(IO1) 5 1 5 1 5 1 5 1 5 1 5 1 5 1 5 1 5 1 5 1 5 1 5 1

WP#(IO2) 6 2 6 2 6 2 6 2 6 2 6 2 6 2 6 2 6 2 6 2 6 2 6 2

HOLD#(IO3) 7 3 7 3 7 3 7 3 7 3 7 3 7 3 7 3 7 3 7 3 7 3 7 3

41
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Figure 39 Quad Page Program with 4-Byte Address Sequence Diagram (ADS=0 or ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 10 36 37 38 39 40 41 42 43 44 45 46 47
SCLK

Command 32-bit address Byte1 Byte2


SI(IO0) 3EH 31 30 29 3 2 1 0 4 0 4 0 4 0 4 0
MSB
SO(IO1) 5 1 5 1 5 1 5 1

WP#(IO2) 6 2 6 2 6 2 6 2

HOLD#(IO3) 7 3 7 3 7 3 7 3

CS#

545

547
548

550
544

546

549

551
48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63
SCLK

Byte11 Byte12 Byte253 Byte256


SI(IO0) 4 0 4 0 4 0 4 0 4 0 4 0 4 0 4 0 4 0 4 0 4 0 4 0

SO(IO1) 5 1 5 1 5 1 5 1 5 1 5 1 5 1 5 1 5 1 5 1 5 1 5 1

WP#(IO2) 6 2 6 2 6 2 6 2 6 2 6 2 6 2 6 2 6 2 6 2 6 2 6 2

HOLD#(IO3) 7 3 7 3 7 3 7 3 7 3 7 3 7 3 7 3 7 3 7 3 7 3 7 3

7.14. Sector Erase (SE 20H or 4SE 21H)


The Sector Erase (SE) command is erased the all data of the chosen sector. A Write Enable (WREN) command must
previously have been executed to set the Write Enable Latch (WEL) bit. The Sector Erase (SE) command is entered by
driving CS# low, followed by the command code, and 3-address byte on SI. Any address inside the sector is a valid
address for the Sector Erase (SE) command. CS# must be driven low for the entire duration of the sequence.
The Sector Erase command sequence: CS# goes low  sending Sector Erase command  3-byte address on SI 
CS# goes high. CS# must be driven high after the eighth bit of the last address byte has been latched in; otherwise the
Sector Erase (SE) command is not executed. As soon as CS# is driven high, the self-timed Sector Erase cycle (whose
duration is tSE) is initiated. While the Sector Erase cycle is in progress, the Status Register may be read to check the value
of the Write in Progress (WIP) bit. The Write in Progress (WIP) bit is 1 during the self-timed Sector Erase cycle, and is 0
when it is completed. At some unspecified time before the cycle is completed, the Write Enable Latch (WEL) bit is reset. A
Sector Erase (SE) command applied to a sector which is protected by the Block Protect (BP4, BP3, BP2, BP1, and BP0) bit
is not executed.

42
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Figure 40 Sector Erase Sequence Diagram (ADS=0)

CS#
0 1 2 3 4 5 6 7 8 9 29 30 31
SCLK

Command 24 Bits Address


SI
20H 23 22 2 1 0
MSB

Figure 41 Sector Erase Sequence Diagram (ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 37 38 39
SCLK

Command 32 Bits Address


SI
20H 31 30 2 1 0
MSB

Figure 42 Sector Erase with 4-Byte Address Sequence Diagram (ADS=0 or ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 37 38 39
SCLK

Command 32 Bits Address


SI
21H 31 30 2 1 0
MSB

7.15. 32KB Block Erase (BE32 52H or 4BE32 5CH)


The 32KB Block Erase (BE) command is erased the all data of the chosen block. A Write Enable (WREN) command
must previously have been executed to set the Write Enable Latch (WEL) bit. The 32KB Block Erase (BE) command is
entered by driving CS# low, followed by the command code, and three address bytes on SI. Any address inside the block is
a valid address for the 32KB Block Erase (BE) command. CS# must be driven low for the entire duration of the sequence.
The 32KB Block Erase command sequence: CS# goes low  sending 32KB Block Erase command  3-byte
address on SI  CS# goes high. CS# must be driven high after the eighth bit of the last address byte has been latched in;
otherwise the 32KB Block Erase (BE) command is not executed. As soon as CS# is driven high, the self-timed Block Erase
cycle (whose duration is tBE) is initiated. While the Block Erase cycle is in progress, the Status Register may be read to
check the value of the Write in Progress (WIP) bit. The Write in Progress (WIP) bit is 1 during the self-timed Block Erase
cycle, and is 0 when it is completed. At some unspecified time before the cycle is completed, the Write Enable Latch (WEL)
bit is reset. A 32KB Block Erase (BE) command applied to a block which is protected by the Block Protect (BP4, BP3, BP2,
BP1, and BP0) bits is not executed.

43
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Figure 43 32KB Block Erase Sequence Diagram (ADS=0)

CS#
0 1 2 3 4 5 6 7 8 9 29 30 31
SCLK

Command 24 Bits Address


SI
52H 23 22 2 1 0
MSB

Figure 44 32KB Block Erase Sequence Diagram (ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 37 38 39
SCLK

Command 32 Bits Address


SI
52H 31 30 2 1 0
MSB

Figure 45 32KB Block Erase with 4-Byte Address Sequence Diagram (ADS=0 or ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 37 38 39
SCLK

Command 32 Bits Address


SI
5CH 31 30 2 1 0
MSB

7.16. 64KB Block Erase (BE64 D8H or 4BE64 DCH)


The 64KB Block Erase (BE) command is erased the all data of the chosen block. A Write Enable (WREN) command
must previously have been executed to set the Write Enable Latch (WEL) bit. The 64KB Block Erase (BE) command is
entered by driving CS# low, followed by the command code, and three address bytes on SI. Any address inside the block is
a valid address for the 64KB Block Erase (BE) command. CS# must be driven low for the entire duration of the sequence.
The 64KB Block Erase command sequence: CS# goes low  sending 64KB Block Erase command  3-byte
address on SI  CS# goes high. CS# must be driven high after the eighth bit of the last address byte has been latched in;
otherwise the 64KB Block Erase (BE) command is not executed. As soon as CS# is driven high, the self-timed Block Erase
cycle (whose duration is tBE) is initiated. While the Block Erase cycle is in progress, the Status Register may be read to
check the value of the Write in Progress (WIP) bit. The Write in Progress (WIP) bit is 1 during the self-timed Block Erase
cycle, and is 0 when it is completed. At some unspecified time before the cycle is completed, the Write Enable Latch (WEL)
bit is reset. A 64KB Block Erase (BE) command applied to a block which is protected by the Block Protect (BP4, BP3, BP2,
BP1, and BP0) bits is not executed.

44
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Figure 46 64KB Block Erase Sequence Diagram (ADS=0)

CS#
0 1 2 3 4 5 6 7 8 9 29 30 31
SCLK

Command 24 Bits Address


SI
D8H 23 22 2 1 0
MSB

Figure 47 64KB Block Erase Sequence Diagram (ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 37 38 39
SCLK

Command 32 Bits Address


SI
D8H 31 30 2 1 0
MSB

Figure 48 64KB Block Erase with 4-Byte Address Sequence Diagram (ADS=0 or ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 37 38 39
SCLK

Command 32 Bits Address


SI
DCH 31 30 2 1 0
MSB

7.17. Chip Erase (CE) (60/C7H)


The Chip Erase (CE) command is erased the all data of the chip. A Write Enable (WREN) command must previously
have been executed to set the Write Enable Latch (WEL) bit .The Chip Erase (CE) command is entered by driving CS#
Low, followed by the command code on Serial Data Input (SI). CS# must be driven Low for the entire duration of the
sequence.
The Chip Erase command sequence: CS# goes low  sending Chip Erase command  CS# goes high. CS# must
be driven high after the eighth bit of the command code has been latched in; otherwise the Chip Erase command is not
executed. As soon as CS# is driven high, the self-timed Chip Erase cycle (whose duration is tCE) is initiated. While the Chip
Erase cycle is in progress, the Status Register may be read to check the value of the Write in Progress (WIP) bit. The Write
in Progress (WIP) bit is 1 during the self-timed Chip Erase cycle, and is 0 when it is completed. At some unspecified time
before the cycle is completed, the Write Enable Latch (WEL) bit is reset. The Chip Erase (CE) command is ignored if one or
more sectors/blocks are protected.
Figure 49 Chip Erase Sequence Diagram

CS#

0 1 2 3 4 5 6 7
SCLK

Command
SI
60H or C7H

45
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
7.18. Deep Power-Down (DP) (B9H)
Executing the Deep Power-Down (DP) command is the only way to put the device in the lowest consumption mode
(the Deep Power-Down Mode). It can also be used as an extra software protection mechanism, while the device is not in
active use, since in this mode, the device ignores all Write, Program and Erase commands. Driving CS# high deselects the
device, and puts the device in the Standby Mode (if there is no internal cycle currently in progress). But this mode is not the
Deep Power-Down Mode. The Deep Power-Down Mode can only be entered by executing the Deep Power-Down (DP)
command. Once the device has entered the Deep Power-Down Mode, all commands are ignored except the Release from
Deep Power-Down and Read Device ID (RDI) command. This releases the device from this mode. The Release from Deep
Power-Down and Read Device ID (RDI) command also allows the Device ID of the device to be output on SO.
The Deep Power-Down Mode automatically stops at Power-Down, and the device always Power-Up in the Standby
Mode. The Deep Power-Down (DP) command is entered by driving CS# low, followed by the command code on SI. CS#
must be driven low for the entire duration of the sequence.
The Deep Power-Down command sequence: CS# goes low  sending Deep Power-Down command  CS# goes
high. CS# must be driven high after the eighth bit of the command code has been latched in; otherwise the Deep
Power-Down (DP) command is not executed. As soon as CS# is driven high, it requires a delay of tDP before the supply
current is reduced to ICC2 and the Deep Power-Down Mode is entered. Any Deep Power-Down (DP) command, while an
Erase, Program or Write cycle is in progress, is rejected without having any effects on the cycle that is in progress.
Figure 50 Deep Power-Down Sequence Diagram

CS#

0 1 2 3 4 5 6 7 tDP
SCLK

Command Stand-by mode Deep Power-down mode


SI
B9H

46
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
7.19. Read Unique ID (4BH)
The Read Unique ID command accesses a factory-set read-only 128bit number that is unique to each device. The Unique
ID can be used in conjunction with user software methods to help prevent copying or cloning of a system.
The Read Unique ID command sequence in 3 byte mode (ADS=0): CS# goes low  sending Read Unique ID command
Dummy Byte1 Dummy Byte2 Dummy Byte3 Dummy Byte4128bit Unique ID Out CS# goes high.
The Read Unique ID command sequence in 4 byte mode (ADS=0): CS# goes low  sending Read Unique ID command
Dummy Byte1 Dummy Byte2 Dummy Byte3 Dummy Byte4 Dummy Byte5128bit Unique ID Out CS# goes
high.
Figure 51 Read Unique ID Sequence Diagram (ADS=0)

CS#
0 1 2 3 4 5 6 7 8 9 10 36 37 38 39
SCLK

Command 4-Byte Dummy


SI
4BH 7 6 5 3 2 1 0

SO High-Z

CS#
40 41 42 43 44 45 46 47
SCLK

SI

Data Out1 Data Out2


SO 7 6 5 4 3 2 1 0 7 6 5
MSB MSB

Figure 52 Read Unique ID Sequence Diagram (ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 10 44 45 46 47
SCLK

Command 5-Byte Dummy


SI
4BH 7 6 5 3 2 1 0

SO High-Z

CS#
48 49 50 51 52 53 54 55
SCLK

SI

Data Out1 Data Out2


SO 7 6 5 4 3 2 1 0 7 6 5
MSB MSB

47
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
7.20. Enter 4-Byte Address Mode (B7H)
The Enter 4-byte Address Mode command enables accessing the address length of 32-bit for the memory area of higher
density (larger than 128Mb). The device default is in 24-bit address mode; after sending out the EN4B instruction, the bit13
(ADS bit) of status register will be automatically set to “1” to indicate the 4-byte address mode has been enabled. Once the
4-byte address mode is enabled, the address length becomes 32-bit instead of the default 24-bit.
All instructions are accepted normally, and just the address bit is changed from 24-bit to 32-bit.
The sequence of issuing EN4B instruction is: CS# goes low  sending Enter 4-byte mode command CS# goes high.

Figure 53 Enter 4-Byte Address Mode Sequence Diagram

CS#

0 1 2 3 4 5 6 7
SCLK

Command
SI
B7H
High-Z
SO

7.21. Exit 4-Byte Address Mode (E9H)


The Exit 4-byte Address Mode command is executed to exit the 4-byte address mode and return to the default 3-byte
address mode. After sending out the EX4B instruction, the bit13 (ADS bit) of status register will be cleared to “0” to indicate
the exit of the 4-byte address mode. Once exiting the 4-byte address mode, the address length will return to 24-bit.
The sequence of issuing EN4B instruction is: CS# goes low  sending Exit 4-byte Address Mode command CS# goes
high.
Figure 54 Exit 4-Byte Address Mode Sequence Diagram

CS#

0 1 2 3 4 5 6 7
SCLK

Command
SI
E9H
High-Z
SO

7.22. Clear SR Flags (30H)


The Clear Status Register Flags command resets bit S21 (Program Error bit) and S22 (Erase Error bit) from status register.
It is not necessary to set the WEL bit before the Clear Status Register command is executed. The Clear SR command will
be accepted even when the device remains busy with WIP set to 1, as the device does remain busy when either error bit is
set. The WEL bit will be unchanged after this command is executed.

48
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Figure 55 Clear Status Register Flags Sequence Diagram

CS#

0 1 2 3 4 5 6 7
SCLK

Command
SI
30H
High-Z
SO

7.23. Release from Deep Power-Down and Read Device ID (RDI) (ABH)
The Release from Power-Down and Read Device ID command is a multi-purpose command. It can be used to release
the device from the Power-Down state or obtain the devices electronic identification (ID) number.
To release the device from the Power-Down state, the command is issued by driving the CS# pin low, shifting the
instruction code “ABH” and driving CS# high as shown below. Release from Power-Down will take the time duration of
tRES1 (See AC Characteristics) before the device will resume normal operation and other command are accepted. The
CS# pin must remain high during the tRES1 time duration.
When used only to obtain the Device ID while not in the Power-Down state, the command is initiated by driving the
CS# pin low and shifting the instruction code “ABH” followed by 3-dummy byte. The Device ID bits are then shifted out on
the falling edge of SCLK with most significant bit (MSB) first as shown below. The Device ID value for the GD25Q256C is
listed in Manufacturer and Device Identification table. The Device ID can be read continuously. The command is
completed by driving CS# high.
When used to release the device from the Power-Down state and obtain the Device ID, the command is the same
as previously described, except that after CS# is driven high it must remain high for a time duration of tRES2 (See AC
Characteristics). After this time duration the device will resume normal operation and other command will be accepted. If
the Release from Power-Down / Device ID command is issued while an Erase, Program or Write cycle is in process
(when WIP equal 1) the command is ignored and will not have any effects on the current cycle.
Figure 56 Release Power-Down Sequence Diagram

CS#

0 1 2 3 4 5 6 7 t RES1
SCLK

Command
SI
ABH

Deep Power-down mode Stand-by mode

49
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Figure 57 Release Power-Down/Read Device ID Sequence Diagram

CS#
0 1 2 3 4 5 6 7 8 9 29 30 31 32 33 34 35 36 37 38
SCLK

Command 3 Dummy Bytes t RES2


SI ABH 23 22 2 1 0
MSB Device ID
SO High-Z
7 6 5 4 3 2 1 0
MSB
Deep Power-down Mode Stand-by Mode

7.24. Read Manufacture ID/ Device ID (REMS) (90H)


The Read Manufacturer/Device ID command is an alternative to the Release from Power-Down / Device ID
command that provides both the JEDEC assigned Manufacturer ID and the specific Device ID.
The command is initiated by driving the CS# pin low and shifting the command code “90H” followed by a 24-bit
address (A23-A0) of 000000H. After which, the Manufacturer ID and the Device ID are shifted out on the falling edge of
SCLK with most significant bit (MSB) first as shown below.
Figure 58 Read Manufacture ID/ Device ID Sequence Diagram

CS#
0 1 2 3 4 5 6 7 8 9 10 28 29 30 31
SCLK

Command 24-bit address


SI
90H 23 22 21 3 2 1 0
SO High-Z

CS#
32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47
SCLK

SI

Manufacturer ID Device ID
SO 7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0
MSB MSB

7.25. Read Identification (RDID) (9FH)


The Read Identification (RDID) command allows the 8-bit manufacturer identification to be read, followed by two
bytes of device identification. The device identification indicates the memory type in the first byte, and the memory capacity
of the device in the second byte. The Read Identification (RDID) command while an Erase or Program cycle is in progress
is not decoded, and has no effect on the cycle that is in progress. The Read Identification (RDID) command should not be
issued while the device is in Deep Power-Down Mode.

50
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
The device is first selected by driving CS# to low. Then, the 8-bit command code for the command is shifted in. This
is followed by the 24-bit device identification, stored in the memory, being shifted out on Serial Data Output, each bit being
shifted out during the falling edge of Serial Clock. The Read Identification (RDID) command is terminated by driving CS# to
high at any time during data output. When CS# is driven high, the device is put in the Standby Mode. Once in the Standby
Mode, the device waits to be selected, so that it can receive, decode and execute commands.
Figure 59 Read Identification ID Sequence Diagram

CS#
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
SCLK

SI 9FH
Command Manufacturer ID
SO 7 6 5 4 3 2 1 0
MSB
CS#
16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31
SCLK

SI

SO 7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0
Memory Type Capacity
MSB JDID15-JDID8 MSB JDID7-JDID0
7.26. Program/Erase Suspend (PES) (75H)
The Program/Erase Suspend command “75H”, allows the system to interrupt a page program or sector/block erase
operation and then read data from any other sector or block. The Write Status Register command (01H/31H/11H) and
Erase commands (20H, 52H, D8H, C7H, 60H) and Page Program command (02H / 32H) are not allowed during
Program/Erase suspend. Program/Erase Suspend is valid only during the page program or sector/block erase operation.
A maximum of time of “tsus” (See AC Characteristics) is required to suspend the program/erase operation.
Table 17 Commands Allowed During Program or Erase Suspend
Allowed Allowed
Code During During
Command Name Comment
(Hex) Erase Program
Suspend Suspend

Write Enable 06 Yes Required for program command within erase suspend.

Read Status Register-1 05 Yes Yes Needed to read WIP to determine end of suspend process.

Needed to read suspend status to determine whether the operation


Read Status Register-2 35 Yes Yes
is suspended or complete.
Needed to read suspend status to determine whether the operation
Read Status Register-3 15 Yes Yes
is suspended or complete.

Read Extended Addr. Extended Addr. Register may need to be changed during a suspend
C8 Yes Yes
Register to reach a sector needed for read or program.

51
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Write Extended Addr. Extended Addr. Register may need to be changed during a suspend
C5 Yes Yes
Register to reach a sector needed for read or program.

Read 03 Yes Yes All array reads allowed in suspend.


4Read 13 Yes Yes All array reads allowed in suspend.
Fast Read 0B Yes Yes All array reads allowed in suspend.
4Fast Read 0C Yes Yes All array reads allowed in suspend.
Dual I/O Fast Read BB Yes Yes All array reads allowed in suspend.
4Dual I/O Fast Read BC Yes Yes All array reads allowed in suspend.
Dual Output Fast Read 3B Yes Yes All array reads allowed in suspend.
4Dual Output Fast Read 3C Yes Yes All array reads allowed in suspend.
Quad I/O Fast Read EB Yes Yes All array reads allowed in suspend.
4Quad I/O Fast Read EC Yes Yes All array reads allowed in suspend.
Quad Output Fast Read 6B Yes Yes All array reads allowed in suspend.
4Quad Output Fast
6C Yes Yes All array reads allowed in suspend.
Read
Page Program 02 Yes Required for array program during erase suspend.
4Page Program 12 Yes Required for array program during erase suspend.
Quad Page Program 32 Yes Required for array program during erase suspend.
4Quad Page Program 3E Yes Required for array program during erase suspend.
Program/Erase
75 Yes Program suspend allowed during erase suspend.
Suspend
Program/Erase Resume 7A Yes Required to resume from erase/program suspend.
Enable Reset 66 Yes Yes Reset allowed anytime.
Reset 99 Yes Yes Reset allowed anytime.
The Program/Erase Suspend command will be accepted by the device only if the SUS_P/SUS_E bit in the Status
Register equal to 0 and WIP bit equal to 1 while a Page Program or a Sector or Block Erase operation is on-going. If the
SUS_P/SUS_E bit equal to 1 or WIP bit equal to 0, the Suspend command will be ignored by the device. The WIP bit will
be cleared from 1 to 0 within “tsus” and the SUS_P/SUS_E bit will be set from 0 to 1 immediately after Program/Erase
Suspend. A power-off during the suspend period will reset the device and release the suspend state.

Figure 60 Program/Erase Suspend Sequence Diagram

CS#

0 1 2 3 4 5 6 7 tSUS
SCLK

Command
SI
75H
High-Z
SO
Accept read command

52
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
7.27. Program/Erase Resume (PER) (7AH)
The Program/Erase Resume command must be written to resume the program or sector/block erase operation after
a Program/Erase Suspend command. The Program/Erase command will be accepted by the device only if the
SUS_P/SUS_E bit equal to 1 and the WIP bit equal to 0. After issued the SUS_P/SUS_E bit in the status register will be
cleared from 1 to 0 immediately, the WIP bit will be set from 0 to 1 within 200ns and the Sector or Block will complete the
erase operation or the page will complete the program operation. The Program/Erase Resume command will be ignored
unless a Program/Erase Suspend is active.
Figure 61 Program/Erase Resume Sequence Diagram

CS#

0 1 2 3 4 5 6 7
SCLK

Command
SI
7AH

SO Resume Erase/Program

7.28. Erase Security Registers (44H)


The GD25Q256C provides three 256-byte Security Registers which can be erased and programmed individually.
These registers may be used by the system manufacturers to store security and other important information separately
from the main memory array.
The Erase Security Registers command is similar to Sector/Block Erase command. A Write Enable (WREN)
command must previously have been executed to set the Write Enable Latch (WEL) bit.
The Erase Security Registers command sequence: CS# goes low  sending Erase Security Registers command 
CS# goes high. CS# must be driven high after the eighth bit of the command code has been latched in; otherwise the Erase
Security Registers command is not executed. As soon as CS# is driven high, the self-timed Erase Security Registers cycle
(whose duration is tSE) is initiated. While the Erase Security Registers cycle is in progress, the Status Register may be read
to check the value of the Write in Progress (WIP) bit. The Write in Progress (WIP) bit is 1 during the self-timed Erase
Security Registers cycle, and is 0 when it is completed. At some unspecified time before the cycle is completed, the Write
Enable Latch (WEL) bit is reset. The Security Registers Lock Bit (LB3-1) in the Status Register can be used to OTP protect
the security registers. Once the LB bit is set to 1, the Security Registers will be permanently locked; the Erase Security
Registers command will be ignored.
Table 18 Security Registers
Address A23-16 A15-12 A11-8 A7-0
Security Register #1 00H 0001 0000 Do not care
Security Register #2 00H 0010 0000 Do not care
Security Register #3 00H 0011 0000 Do not care
Figure 62 Erase Security Registers command Sequence Diagram (ADS=0)

CS#
0 1 2 3 4 5 6 7 8 9 29 30 31
SCLK

Command 24 Bits Address


SI 44H 23 22 2 1 0
MSB

53
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Figure 63 Erase Security Registers command Sequence Diagram (ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 37 38 39
SCLK

Command 32 Bits Address


SI 44H 31 30 2 1 0
MSB

7.29. Program Security Registers (42H)


The Program Security Registers command is similar to the Page Program command. It allows from 1 to 256 bytes
Security Registers data to be programmed. A Write Enable (WREN) command must previously have been executed to set
the Write Enable Latch (WEL) bit before sending the Program Security Registers command. The Program Security
Registers command is entered by driving CS# Low, followed by the command code (42H), three address bytes and at least
one data byte on SI. As soon as CS# is driven high, the self-timed Program Security Registers cycle (whose duration is tPP)
is initiated. While the Program Security Registers cycle is in progress, the Status Register may be read to check the value
of the Write in Progress (WIP) bit. The Write in Progress (WIP) bit is 1 during the self-timed Program Security Registers
cycle, and is 0 when it is completed. At some unspecified time before the cycle is completed, the Write Enable Latch (WEL)
bit is reset.
If the Security Registers Lock Bit (LB3-1) is set to 1, the Security Registers will be permanently locked. Program
Security Registers command will be ignored.
Table 19 Security Registers
Address A23-16 A15-12 A11-8 A7-0
Security Register #1 00H 0001 0000 Byte Address
Security Register #2 00H 0010 0000 Byte Address
Security Register #3 00H 0011 0000 Byte Address
Figure 64 Program Security Registers command Sequence Diagram (ADS=0)

CS#
0 1 2 3 4 5 6 7 8 9 10 28 29 30 31 32 33 34 35 36 37 38 39
SCLK

Command 24-bit address Data Byte 1


SI
42H 23 22 21 3 2 1 0 7 6 5 4 3 2 1 0
MSB MSB
CS#
2073

2075
2076

2078
2072

2074

2077

2079

40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55
SCLK

Data Byte 2 Data Byte 3 Data Byte 256


SI 7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0
MSB MSB MSB

Figure 65 Program Security Registers command Sequence Diagram (ADS=1)

54
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
CS#
0 1 2 3 4 5 6 7 8 9 10 36 37 38 39 40 41 42 43 44 45 46 47
SCLK

Command 32-bit address Data Byte 1


SI
42H 31 30 29 3 2 1 0 7 6 5 4 3 2 1 0
MSB MSB
CS#

2081

2083
2084

2086
2080

2082

2085

2087
48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63
SCLK

Data Byte 2 Data Byte 3 Data Byte 256


SI 7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0
MSB MSB MSB

55
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
7.30. Read Security Registers (48H)
The Read Security Registers command is similar to Fast Read command. The command i is followed by a 3-byte
address (A23-A0) or 4-byte address (A31-A0) and a dummy byte, each bit being latched-in during the rising edge of SCLK.
Then the memory content, at that address, is shifted out on SO, each bit being shifted out, at a Max frequency f C, during the
falling edge of SCLK. The first byte addressed can be at any location. The address is automatically incremented to the next
higher address after each byte of data is shifted out. Once the A7-A0 address reaches the last byte of the register (Byte
0FFH), it will reset to 000H, the command is completed by driving CS# high.
Table 20 Security Registers
Address A23-16 A15-12 A11-8 A7-0
Security Register #1 00H 0001 0000 Byte Address
Security Register #2 00H 0010 0000 Byte Address
Security Register #3 00H 0011 0000 Byte Address
Figure 66 Read Security Registers command Sequence Diagram (ADS=0)

CS#
0 1 2 3 4 5 6 7 8 9 10 28 29 30 31
SCLK

Command 24-bit address


SI
48H 23 22 21 3 2 1 0

SO High-Z

CS#
32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47
SCLK
Dummy Byte
SI 7 6 5 4 3 2 1 0
Data Out1 Data Out2
SO 7 6 5 4 3 2 1 0 7 6 5
MSB MSB

56
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Figure 67 Read Security Registers command Sequence Diagram (ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 10 36 37 38 39
SCLK

Command 32-bit address


SI
48H 31 30 29 3 2 1 0

SO High-Z

CS#
40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55
SCLK
Dummy Byte
SI 7 6 5 4 3 2 1 0
Data Out1 Data Out2
SO 7 6 5 4 3 2 1 0 7 6 5
MSB MSB

7.31. Enable Reset (66H) and Reset (99H)


If the Reset command is accepted, any on-going internal operation will be terminated and the device will return to its
default power-on state and lose all the current volatile settings, such as Volatile Status Register bits, Write Enable Latch
status (WEL), Program/Erase Suspend status, Continuous Read Mode bit setting (M7-M0) and Wrap Bit Setting (W6-W4).
The “Enable Reset (66H)” and the “Reset (99H)” commands can be issued in SPI mode. The “Reset (99H)”
command sequence as follow: CS# goes low  Sending Enable Reset command  CS# goes high  CS# goes low 
Sending Reset command  CS# goes high. Once the Reset command is accepted by the device, the device will take
approximately tRST =60us to reset. During this period, no command will be accepted. Data corruption may happen if there is
an on-going or suspended internal Erase or Program operation when Reset command sequence is accepted by the device.
It is recommended to check the BUSY bit and the SUS bit in Status Register before issuing the Reset command sequence.
Figure 68 Enable Reset and Reset command Sequence Diagram

CS#

0 1 2 3 4 5 6 7 0 1 2 3 4 5 6 7
SCLK

Command Command
SI
66H 99H

SO High-Z

57
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
7.32. Read Serial Flash Discoverable Parameter (5AH)
The Serial Flash Discoverable Parameter (SFDP) standard provides a consistent method of describing the
functional and feature capabilities of serial flash devices in a standard set of internal parameter tables. These parameter
tables can be interrogated by host system software to enable adjustments needed to accommodate divergent features
from multiple vendors. The concept is similar to the one found in the Introduction of JEDEC Standard, JESD68 on CFI.
SFDP is a standard of JEDEC Standard No.216.
Figure 69 Read Serial Flash Discoverable Parameter command Sequence Diagram (ADS=0)

CS#
0 1 2 3 4 5 6 7 8 9 10 28 29 30 31
SCLK

Command 24-bit address


SI
5AH 23 22 21 3 2 1 0

SO High-Z

CS#
32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47
SCLK
Dummy Byte
SI 7 6 5 4 3 2 1 0
Data Out1 Data Out2
SO 7 6 5 4 3 2 1 0 7 6 5
MSB MSB

Figure 70 Read Serial Flash Discoverable Parameter command Sequence Diagram (ADS=1)

CS#
0 1 2 3 4 5 6 7 8 9 10 36 37 38 39
SCLK

Command 32-bit address


SI
5AH 31 30 29 3 2 1 0

SO High-Z

CS#
40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55
SCLK
Dummy Byte
SI 7 6 5 4 3 2 1 0
Data Out1 Data Out2
SO 7 6 5 4 3 2 1 0 7 6 5
MSB MSB

58
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Table 21 Signature and Parameter Identification Data Values
Description Comment Add(H) DW Add Data Data
(Byte) (Bit)
SFDP Signature Fixed:50444653H 00H 07:00 53H 53H
01H 15:08 46H 46H
02H 23:16 44H 44H
03H 31:24 50H 50H
SFDP Minor Revision Number Start from 00H 04H 07:00 00H 00H
SFDP Major Revision Number Start from 01H 05H 15:08 01H 01H
Number of Parameters Headers Start from 00H 06H 23:16 01H 01H
Unused Contains 0xFFH and can never be 07H 31:24 FFH FFH
changed
ID number (JEDEC) 00H: It indicates a JEDEC specified 08H 07:00 00H 00H
header
Parameter Table Minor Revision Start from 0x00H 09H 15:08 00H 00H
Number
Parameter Table Major Revision Start from 0x01H 0AH 23:16 01H 01H
Number
Parameter Table Length How many DWORDs in the 0BH 31:24 09H 09H
(in double word) Parameter table
Parameter Table Pointer (PTP) First address of JEDEC Flash 0CH 07:00 30H 30H
Parameter table 0DH 15:08 00H 00H
0EH 23:16 00H 00H
Unused Contains 0xFFH and can never be 0FH 31:24 FFH FFH
changed
ID Number It is indicates GigaDevice 10H 07:00 C8H C8H
(GigaDevice Manufacturer ID) manufacturer ID
Parameter Table Minor Revision Start from 0x00H 11H 15:08 00H 00H
Number
Parameter Table Major Revision Start from 0x01H 12H 23:16 01H 01H
Number
Parameter Table Length How many DWORDs in the 13H 31:24 03H 03H
(in double word) Parameter table
Parameter Table Pointer (PTP) First address of GigaDevice Flash 14H 07:00 60H 60H
Parameter table 15H 15:08 00H 00H
16H 23:16 00H 00H
Unused Contains 0xFFH and can never be 17H 31:24 FFH FFH
changed

59
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Table 22 Parameter Table (0): JEDEC Flash Parameter Tables
Description Comment Add(H) DW Add Data Data
(Byte) (Bit)
00: Reserved; 01: 4KB erase;
Block/Sector Erase Size 10: Reserved; 01:00 01b
11: not support 4KB erase
Write Granularity 0: 1Byte, 1: 64Byte or larger 02 1b
Write Enable Instruction 0: Nonvolatile status bit
Requested for Writing to Volatile 1: Volatile status bit 03 0b
Status Registers (BP status register bit)
30H E5H
0: Use 50H Opcode,
Write Enable Opcode Select for 1: Use 06H Opcode,
Writing to Volatile Status Note: If target flash status register is 04 0b
Registers Nonvolatile, then bits 3 and 4 must
be set to 00b.
Contains 111b and can never be
Unused 07:05 111b
changed
4KB Erase Opcode 31H 15:08 20H 20H
(1-1-2) Fast Read 0=Not support, 1=Support 16 1b
Address Bytes Number used in 00: 3Byte only, 01: 3 or 4Byte,
18:17 01b
addressing flash array 10: 4Byte only, 11: Reserved
Double Transfer Rate (DTR)
0=Not support, 1=Support 19 0b
clocking 32H F3H
(1-2-2) Fast Read 0=Not support, 1=Support 20 1b
(1-4-4) Fast Read 0=Not support, 1=Support 21 1b

(1-1-4) Fast Read 0=Not support, 1=Support 22 1b


Unused 23 1b
Unused 33H 31:24 FFH FFH
Flash Memory Density 37H:34H 31:00 0FFFFFFFH
(1-4-4) Fast Read Number of Wait 0 0000b: Wait states (Dummy
04:00 00100b
states Clocks) not support
38H 44H
(1-4-4) Fast Read Number of
000b:Mode Bits not support 07:05 010b
Mode Bits
(1-4-4) Fast Read Opcode 39H 15:08 EBH EBH
(1-1-4) Fast Read Number of Wait 0 0000b: Wait states (Dummy
20:16 01000b
states Clocks) not support
3AH 08H
(1-1-4) Fast Read Number of
000b:Mode Bits not support 23:21 000b
Mode Bits
(1-1-4) Fast Read Opcode 3BH 31:24 6BH 6BH

60
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Add(H) DW Add
Description Comment Data Data
(Byte) (Bit)
(1-1-2) Fast Read Number of Wait 0 0000b: Wait states (Dummy
04:00 01000b
states Clocks) not support
3CH 08H
(1-1-2) Fast Read Number
000b: Mode Bits not support 07:05 000b
of Mode Bits
(1-1-2) Fast Read Opcode 3DH 15:08 3BH 3BH
(1-2-2) Fast Read Number 0 0000b: Wait states (Dummy
20:16 00010b
of Wait states Clocks) not support
3EH 42H
(1-2-2) Fast Read Number
000b: Mode Bits not support 23:21 010b
of Mode Bits
(1-2-2) Fast Read Opcode 3FH 31:24 BBH BBH
(2-2-2) Fast Read 0=not support 1=support 00 0b
Unused 03:01 111b
40H EEH
(4-4-4) Fast Read 0=not support 1=support 04 0b
Unused 07:05 111b
Unused 43H:41H 31:08 0xFFH 0xFFH
Unused 45H:44H 15:00 0xFFH 0xFFH
(2-2-2) Fast Read Number 0 0000b: Wait states (Dummy
20:16 00000b
of Wait states Clocks) not support
46H 00H
(2-2-2) Fast Read Number
000b: Mode Bits not support 23:21 000b
of Mode Bits
(2-2-2) Fast Read Opcode 47H 31:24 FFH FFH
Unused 49H:48H 15:00 0xFFH 0xFFH
(4-4-4) Fast Read Number of Wait 0 0000b: Wait states (Dummy
20:16 00000b
states Clocks) not support
4AH 00H
(4-4-4) Fast Read Number
000b: Mode Bits not support 23:21 000b
of Mode Bits
(4-4-4) Fast Read Opcode 4BH 31:24 FFH FFH
Sector/block size=2^N bytes
Sector Type 1 Size 4CH 07:00 0CH 0CH
0x00b: this sector type don’t exist
Sector Type 1 erase Opcode 4DH 15:08 20H 20H
Sector/block size=2^N bytes
Sector Type 2 Size 4EH 23:16 0FH 0FH
0x00b: this sector type don’t exist
Sector Type 2 erase Opcode 4FH 31:24 52H 52H
Sector/block size=2^N bytes
Sector Type 3 Size 50H 07:00 10H 10H
0x00b: this sector type don’t exist
Sector Type 3 erase Opcode 51H 15:08 D8H D8H
Sector/block size=2^N bytes
Sector Type 4 Size 52H 23:16 00H 00H
0x00b: this sector type don’t exist
Sector Type 4 erase Opcode 53H 31:24 FFH FFH

61
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Table 23 Parameter Table (1): GigaDevice Flash Parameter Tables
Add(H) DW Add
Description Comment Data Data
(Byte) (Bit)
2000H=2.000V
Vcc Supply Maximum Voltage 2700H=2.700V 61H:60H 15:00 3600H 3600H
3600H=3.600V
1650H=1.650V
2250H=2.250V
Vcc Supply Minimum Voltage 63H:62H 31:16 2700H 2700H
2350H=2.350V
2700H=2.700V
HW Reset# pin 0=not support 1=support 00 1b
HW Hold# pin 0=not support 1=support 01 1b
Deep Power Down Mode 0=not support 1=support 02 1b
SW Reset 0=not support 1=support 03 1b
Should be issue Reset
1001 1001b
SW Reset Opcode Enable(66H) 65H:64H 11:04 F99FH
(99H)
before Reset cmd.
Program Suspend/Resume 0=not support 1=support 12 1b
Erase Suspend/Resume 0=not support 1=support 13 1b
Unused 14 1b
Wrap-Around Read mode 0=not support 1=support 15 1b
Wrap-Around Read mode
66H 23:16 77H 77H
Opcode
08H:support 8B wrap-around read
16H:8B&16B
Wrap-Around Read data length 67H 31:24 64H 64H
32H:8B&16B&32B
64H:8B&16B&32B&64B
Individual block lock 0=not support 1=support 00 1b
Individual block lock bit
0=Volatile 1=Nonvolatile 01 1b
(Volatile/Nonvolatile)
Individual block lock Opcode 09:02 E3H
Individual block lock Volatile
0=protect 1=unprotect 10 1b C78FH
protect bit default protect status 6BH:68H
Secured OTP 0=not support 1=support 11 0b
Read Lock 0=not support 1=support 12 0b
Permanent Lock 0=not support 1=support 13 0b
Unused 15:14 11b
Unused 31:16 FFH FFH

62
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
8. ELECTRICAL CHARACTERISTICS

8.1. POWER-ON TIMING


Figure 71 Power-on Timing

Vcc(max)
Program, Erase and Write command are ignored
Chip Selection is not allowed
Vcc(min)
tVSL Read command Device is fully
Reset is allowed accessible
State
VWI
tPUW

Time

Table 24 Power-Up Timing and Write Inhibit Threshold


Symbol Parameter Min Max Unit
tVSL VCC(min) To CS# Low 10 us
tPUW Time Delay Before Write Instruction 1 10 ms
VWI Write Inhibit Voltage 1 2.5 V

8.2. INITIAL DELIVERY STATE


The device is delivered with the memory array erased: all bits are set to 1(each byte contains FFH). The Status
Register bits are set to 0, except DRV1 bit (S9) is set to 1.

8.3. DATA RETENTION AND ENDURANCE


Table 25 Data Retention and Endurance
Parameter Test Condition Min Units

150℃ 10 Years
Minimum Pattern Data Retention Time
125℃ 20 Years
Erase/Program Endurance -40 to 85℃ 100K Cycles

8.4. LATCH UP CHARACTERISTICS


Table 26 Latch up Characteristics
Parameter Min Max

Input Voltage Respect To VSS On I/O Pins -1.0V VCC+1.0V


VCC Current -100mA 100mA

63
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
8.5. ABSOLUTE MAXIMUM RATINGS
Table 27 Absolute Maximum Ratings
Parameter Value Unit
Ambient Operating Temperature -40 to 85 ℃
Storage Temperature -65 to 150 ℃
Output Short Circuit Current 200 mA
Applied Input/Output Voltage -0.5 to 4.0 V
VCC -0.5 to 4.0 V

Figure 72 Input/Output Timing Reference Level

Input timing reference level Output timing reference level


0.8VCC 0.7VCC
AC Measurement Level 0.5VCC
0.1VCC 0.2VCC

Note: Input pulse rise and fall time are<5ns

8.6. CAPACITANCE MEASUREMENT CONDITIONS


Table 28 Capacitance Measurement Conditions
Symbol Parameter Min Typ Max Unit Conditions
CIN Input Capacitance 6 pF VIN=0V
COUT Output Capacitance 8 pF VOUT=0V
CL Load Capacitance 30 pF
Input Rise And Fall time 5 ns
Input Pulse Voltage 0.1VCC to 0.8VCC V
Input Timing Reference Voltage 0.2VCC to 0.7VCC V
Output Timing Reference Voltage 0.5VCC V

Figure 73 Input Test Waveform and Measurement Level

Maximum Negative Overshoot Waveform Maximum Positive Overshoot Waveform

20ns 20ns
20ns
Vss
Vcc + 2.0V

Vss-2.0V
20ns Vcc
20ns 20ns

64
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
8.7. DC CHARACTERISTICS
Table 29 DC CHARACTERISTICS (T= -40℃~85℃, VCC=2.7~3.6V)
Symbol Parameter Test Condition Min. Typ Max. Unit.
ILI Input Leakage Current ±2 μA
ILO Output Leakage Current ±2 μA
ICC1 Standby Current CS#=VCC, 30 100 μA
VIN=VCC or VSS
ICC2 Deep Power-Down Current CS#=VCC, 1 5 μA
VIN=VCC or VSS
CLK=0.1VCC / 0.9VCC
at 104MHz, 15 20 mA
Q=Open(*1,*2,*4 I/O)
ICC3 Operating Current (Read)
CLK=0.1VCC / 0.9VCC
at 80MHz, 13 18 mA
Q=Open(*1,*2,*4 I/O)
ICC4 Operating Current (PP) CS#=VCC 20 mA
ICC5 Operating Current(WRSR) CS#=VCC 20 mA
ICC6 Operating Current (SE) CS#=VCC 20 mA
ICC7 Operating Current (BE) CS#=VCC 20 mA
VIL Input Low Voltage -0.5 0.2VCC V
VIH Input High Voltage 0.7VCC VCC+0.4 V
VOL Output Low Voltage IOL =100uA 0.2 V
VOH Output High Voltage IOH =-100μA VCC-0.2 V
Note:
1. Not 100% tested in production.
2.Tested on sample basis and specified through design and characterization data. T=25℃, VCC=3.0V.

65
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
8.8. AC CHARACTERISTICS
Table 30 AC CHARACTERISTICS (T= -40℃~85℃, VCC=2.7~3.6V, CL=30pf)
Symbol Parameter Min. Typ. Max. Unit.
fC Serial Clock Frequency for All Instructions Except Read DC. 104 MHz
Serial Clock Frequency for Dual I/O (BBH, BCH), Quad I/O
(EBH, ECH), Dual Output(3BH, 3CH), Quad Output(6BH,
fC1 DC. 104 MHz
6CH), Fast Read (0BH, 0CH) Instructions, on 3.0 - 3.6V power
supply
Serial Clock Frequency for Dual I/O (BBH, BCH), Quad I/O
(EBH, ECH), Dual Output(3BH, 3CH), Quad Output(6BH,
fC2 DC. 80 MHz
6CH), Fast Read (0BH, 0CH) Instructions, on 2.7 - 3.0V power
supply
fR Serial Clock Frequency For: Read(03H, 13H) DC. 80 MHz
tCLH Serial Clock High Time 3.7 ns
tCLL Serial Clock Low Time 3.7 ns
tCLCH Serial Clock Rise Time (Slew Rate) 0.2 V/ns
tCHCL Serial Clock Fall Time (Slew Rate) 0.2 V/ns
tSLCH CS# Active Setup Time 8 ns
tCHSH CS# Active Hold Time 5 ns
tSHCH CS# Not Active Setup Time 5 ns
tCHSL CS# Not Active Hold Time 5 ns
tSHSL CS# High Time (read/write) 20 ns
tSHQZ Output Disable Time 6 ns
tCLQX Output Hold Time 1.2 ns
tDVCH Data In Setup Time 2 ns
tCHDX Data In Hold Time 2 ns
tHLCH HOLD# Low Setup Time (relative to Clock) 5 ns
tHHCH HOLD# High Setup Time (relative to Clock) 5 ns
tCHHL HOLD# High Hold Time (relative to Clock) 5 ns
tCHHH HOLD# Low Hold Time (relative to Clock) 5 ns
tHLQZ HOLD# Low To High-Z Output 6 ns
tHHQX HOLD# Low To Low-Z Output 8 ns
tCLQV Clock Low To Output Valid 7 ns
tWHSL Write Protect Setup Time Before CS# Low 20 ns
tSHWL Write Protect Hold Time After CS# High 100 ns
tDP CS# High To Deep Power-Down Mode 20 μs
CS# High To Standby Mode Without Electronic Signature
tRES1 30 μs
Read
tRES2 CS# High To Standby Mode With Electronic Signature Read 30 μs
tSUS CS# High To Next Command After Suspend 20 us
tRST CS# High To Next Command After Reset 60 us
tW Write Status Register Cycle Time 5 30 ms

66
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
tBP1 Byte Program Time( First Byte) 30 50 us
tBP2 Additional Byte Program Time ( After First Byte) 2.5 12 us
tPP Page Programming Time 0.6 2.4 ms
tSE Sector Erase Time 50 300 ms
tBE Block Erase Time(32K Bytes) 0.2 1.0 s
tBE Block Erase Time(64K Bytes) 0.3 1.2 s
tCE Chip Erase Time(GD25Q256C) 100 200 s
Note:
1. Not 100% tested in production.
2. Tested on sample basis and specified through design and characterization data. T=25℃, VCC=3.0V.

Figure 74 Serial Input Timing

tSHSL
CS#

tCHSL tSLCH tCHSH tSHCH


SCLK
tDVCH tCHCL
tCHDX tCLCH

SI MSB LSB

SO High-Z

Figure 75 Output Timing

CS#
tCLH tSHQZ
SCLK
tCLQV tCLQV tCLL
tCLQX tCLQX
SO LSB

SI
Least significant address bit (LIB) in

Figure 76 Hold Timing

CS#

tCHHL tHLCH tHHCH


SCLK

tCHHH
tHLQZ tHHQX
SO

HOLD#

SI do not care during HOLD operation.

67
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
Figure 77 RESET Timing

CS# tRB

RESET#

tRLRH tRHSL

Table 31 Reset Timing


Symbol Parameter Setup Speed Unit.
tRLRH Reset pulse width MIN 1 us
tRHSL Reset high time before read MIN 50 ns
tRB Reset recovery time MAX 60 us

68
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
9. ORDERING INFORMATION

GD XX X XX X X X X X
Packing Type
Y:Tray
R:Tape & Reel

Green Code
G:Pb Free & Halogen Free Green Package
Temperature Range
I:Industrial(-40℃ to +85℃)
Package Type
F: SOP16 300mil
Y: WSON8 (8*6mm)
Z:TFBGA24 (6*4 Ball Array)
B:TFBGA24 (5*5 Ball Array)

Generation
A: A Version
B: B Version
C: C Version

Density
256: 256Mb

Series
Q:3V,4KB Uniform Sector

Product Family
25:SPI Interface Flash

69
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
10. PACKAGE INFORMATION

10.1. Package SOP16 300MIL

16 9 θ

E1 E

L1
L
1 8
C
D

A2 A

b A1
e

Dimensions
Symbol
A A1 A2 b C D E E1 e L L1 θ
Unit
Min 2.36 0.10 2.24 0.36 0.20 10.10 10.10 7.42 0.40 1.31 0
mm Nom 2.55 0.20 2.34 0.41 0.25 10.30 10.35 7.52 1.27 0.84 1.44 5
Max 2.75 0.30 2.44 0.51 0.30 10.50 10.60 7.60 1.27 1.57 8
Min 0.093 0.004 0.088 0.014 0.008 0.397 0.397 0.292 0.016 0.052 0
Inch Nom 0.100 0.008 0.092 0.016 0.010 0.405 0.407 0.296 0.050 0.033 0.057 5
Max 0.108 0.012 0.096 0.020 0.012 0.413 0.417 0.299 0.050 0.062 8
Note:Both package length and width do not include mold flash.

70
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C

10.2. Package WSON 8 (8*6mm)

D
A2

A1
A
Top View Side View
L D1

b 1

e E1

Bottom View
Dimensions
Symbol
A A1 A2 b D D1 E E1 e K L
Unit
Min 0.70 0.35 7.90 3.25 5.90 4.15 0.55
mm Nom 0.75 0.20BSC 0.40 8.00 3.42 6.00 4.30 1.27BSC 1.80 0.60
Max 0.80 0.05 0.45 8.10 3.50 6.10 4.40 0.65
Min 0.028 0.014 0.311 0.128 0.232 0.163 0.022
Inch Nom 0.030 0.008BSC 0.016 0.315 0.135 0.236 0.169 0.050BSC 0.071 0.024
Max 0.031 0.002 0.018 0.319 0.138 0.240 0.173 0.027
Note:
1. Both package length and width do not include mold flash.
2. The exposed metal pad area on the bottom of the package is connected to device ground (GND pin),
so both Floating and connecting GND of exposed pad are also available.

71
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
10.3. Package TFBGA-24BALL (6*4 ball array)

1 2 3 4 4 3 2 1

A A
e
B B

C C
E E1
D D

E E

F F

D e
Φb D1
A2
A
A1

Dimensions
Symbol
A A1 A2 b D D1 E E1 e
Unit
Min 0.25 0.35 5.90 7.90
mm Nom 0.30 0.85 0.40 6.00 3.00 8.00 5.00 1.00
Max 1.20 0.35 0.45 6.10 8.10
Min 0.010 0.014 0.232 0.311
Inch Nom 0.012 0.033 0.016 0.236 0.120 0.315 0.200 0.039
Max 0.047 0.014 0.018 0.240 0.319
Note:Both package length and width do not include mold flash.

72
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
10.4. Package TFBGA-24BALL (5*5 ball array)

1 2 3 4 5 5 4 3 2 1

A A
e
B B

E C C
E1

D D

E E

e
D Φb
D1
A2
A
A1

Dimensions
Symbol
A A1 A2 b D D1 E E1 e
Unit
Min 0.25 0.35 5.90 7.90
mm Nom 0.30 0.40 6.00 4.00 8.00 4.00 1.00
Max 1.20 0.35 0.45 6.10 8.10
Min 0.010 0.033 0.014 0.232 0.311
Inch Nom 0.012 0.016 0.236 0.157 0.315 0.157 0.039
Max 0.047 0.014 0.018 0.240 0.319
Note:Both package length and width do not include mold flash.

73
3.3V Uniform Sector
Dual and Quad Serial Flash GD25Q256C
11. REVISION HISTORY

Version No Description Date


0.0 Initial Preliminary Release 2014-7-2
0.1 Modify Package WSON8 8x6mm 2014-8-4
0.2 Modify Command Description table number 2014-9-19
Add OTP description and command 42H, 44H, 48H
Add Read Manufacturer ID/device ID(90H) and Read Identification(ABH)
Modify DC CHARACTERISTICS:Icc4~7 max 10mA change to 20mA
Modify DC CHARACTERISTICS: VIL max 0.3Vcc change to 0.2Vcc
Modify AC CHARACTERISTICS: tHHQX max 6us change to 8us
Modify AC CHARACTERISTICS: tCE typ 80s/160s change to 100s/180s
0.3 2014-11-4
Modify Unique ID length to 8 byte
Modify AC CHARACTERISTICS: tRB1 and tRB2 combine to tRB max 60us
Modify Input/Output Timing Reference Level
Modify Latency Code and Frequency Table
Add note on DC/AC Characteristics Table and Latency Code and Frequency
Table
Initial Release
1.0 2014-12-19
Modify AC CHARACTERISTICS: tSLCH min 5ns change to 8ns
Modify Package SOP16 300MIL
1.1 Modify Package TFBGA-24BALL (6*4 ball array) 2015-7-23
Modify Package TFBGA-24BALL (5*5 ball array)

74

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