Irg4bc20ud S
Irg4bc20ud S
Irg4bc20ud S
IRG4BC20UD-S
INSULATED GATE BIPOLAR TRANSISTOR WITH UltraFast CoPack IGBT
ULTRAFAST SOFT RECOVERY DIODE
Features C
Thermal Resistance
Parameter Typ. Max. Units
RθJC Junction-to-Case ––– 2.1
RθCS Case-to-Sink, Flat, Greased Surface 0.5 ––– °C/W
RθJA Junction-to-Ambient, typical socket mount ––– 40
Wt Weight 1.44 ––– g (oz)
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1/12/01
IRG4BC20UD-S
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V(BR)CES Collector-to-Emitter Breakdown Voltage 600 ––– ––– V VGE = 0V, IC = 250µA
∆V(BR)CES/∆TJ Temperature Coeff. of Breakdown Voltage ––– 0.69 ––– V/°C VGE = 0V, IC = 1.0mA
VCE(on) Collector-to-Emitter Saturation Voltage ––– 1.85 2.1 IC = 6.5A VGE = 15V
––– 2.27 ––– V IC = 13A See Fig. 2, 5
––– 1.87 ––– IC = 6.5A, TJ = 150°C
VGE(th) Gate Threshold Voltage 3.0 ––– 6.0 VCE = VGE, IC = 250µA
∆VGE(th)/∆TJ Temperature Coeff. of Threshold Voltage ––– -11 ––– mV/°C VCE = VGE, IC = 250µA
gfe Forward Transconductance 1.4 4.3 ––– S VCE = 100V, IC = 6.5A
ICES Zero Gate Voltage Collector Current ––– ––– 250 µA VGE = 0V, VCE = 600V
––– ––– 1700 VGE = 0V, VCE = 600V, TJ = 150°C
VFM Diode Forward Voltage Drop ––– 1.4 1.7 V IC = 8.0A See Fig. 13
––– 1.3 1.6 IC = 8.0A, TJ = 150°C
IGES Gate-to-Emitter Leakage Current ––– ––– ±100 nA VGE = ±20V
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IRG4BC20UD-S
12
D u ty c y c le : 5 0 %
T J = 1 2 5 °C
10 T s in k = 9 0 °C
G a te d riv e a s s p e c ifie d
T u rn -o n los s e s in c lu d e
e ffe c ts o f re v e rs e r e c o v e ry
L oa d C u rre n t (A )
6 0% o f ra te d
6 v oltag e
0 A
0.1 1 10 100
f, F re q u e n c y (k H z )
100 100
I C , C ollec tor-to-E m itte r C u rre nt (A )
I C , Collector-to-Emitter Current (A)
T J = 25°C
T J = 150°C
TJ = 1 5 0°C
10 10
TJ = 25 °C
1 1
V G E = 15V V C C = 10 V
20µs PULSE WIDTH 5 µs P U L S E W IDTH A
0.1 0.1
0.1 1 10 4 6 8 10 12
VC E , Collector-to-Emitter Voltage (V) VG E , Ga te -to-Em itter Volta ge (V)
2.2
10
8
1.8
I C = 6 .5A
6
4
1.4
I C = 3.3 A
2
0 1.0 A
25 50 75 100 125 150 -60 -40 -20 0 20 40 60 80 100 120 140 160
10
Therm al Response (Z thJ C )
1 D = 0.50
0 .2 0
0 .10
PD M
0.0 5
0 .1
0.0 2 t
0 .01 SIN G LE P U LS E 1
(T H ER M AL R E SP O N SE ) t2
N o te s :
1 . D u ty fa c to r D = t / t
1 2
2 . P e a k TJ = P D M x Z th J C + T C
0 .0 1
0 .0 0 0 0 1 0 .0 0 0 1 0 .0 0 1 0 .0 1 0 .1 1 10
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IRG4BC20UD-S
1000 20
V GE = 0V , f = 1M H z VCE = 400V
C ie s
600 12
C oes
400 8
C re s
200 4
0 A 0 A
1 10 100 0 5 10 15 20 25 30
0.32 10
V CC = 480V R G = 50 Ω
VGE = 15V V GE = 15V
TJ = 25 °C V CC = 4 8 0 V
Total S witching Los se s (m J)
Total Switching Losses (m J)
IC = 6 .5A
0.31
IC = 1 3 A
1
I C = 6 .5 A
0.30
I C = 3 .3 A
0.29 A A
0.1
0 10 20 30 40 50 60 -60 -40 -20 0 20 40 60 80 100 120 140 160
Fig. 9 - Typical Switching Losses vs. Gate Fig. 10 - Typical Switching Losses vs.
Resistance Junction Temperature
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IRG4BC20UD-S
1.2 1000
RG = 50 Ω VGGE E= 2 0V
TJ = 1 5 0 °C
V GE = 15V
0.9 100
S A FE O P E R A TIN G A R E A
0.6 10
0.3 1
0.0 A 0 .1
0 2 4 6 8 10 12 14 1 10 100 1000
I C , C o lle cto r-to -E m itte r C u rre n t (A ) V C E , Collecto r-to-E m itter V oltage (V )
10
TJ = 1 50 °C
TJ = 1 25 °C
TJ = 25 °C
1
0.1
0.4 0.8 1.2 1.6 2.0 2.4 2.8 3.2
F o rw a rd V o lta g e D ro p - V F M (V )
Fig. 13 - Maximum Forward Voltage Drop vs. Instantaneous Forward Current
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IRG4BC20UD-S
100 100
VR = 2 0 0 V VR = 2 0 0 V
T J = 1 2 5 °C T J = 1 2 5 °C
T J = 2 5 °C T J = 2 5 °C
80
IF = 16 A
I IR R M - (A )
60
t rr - (ns)
I F = 8 .0A
I F = 1 6A
10
IF = 8 .0 A
40
I F = 4.0 A
I F = 4 .0 A
20
0 1
100 1000 100 1000
d i f /d t - (A /µ s) di f /dt - (A /µs)
Fig. 14 - Typical Reverse Recovery vs. dif/dt Fig. 15 - Typical Recovery Current vs. dif/dt
500 10000
VR = 2 0 0 V VR = 2 0 0 V
T J = 1 2 5 °C T J = 1 2 5 °C
T J = 2 5 °C T J = 2 5 °C
400
di(rec)M/dt - (A /µ s)
Q R R - (nC )
300
I F = 16 A I F = 4 .0A
1000
I F = 8.0 A
200
I F = 16 A
I F = 8 .0A
100
IF = 4.0 A
0 100
100 1000 100 1000
di f /dt - (A /µs) di f /dt - (A /µs)
Fig. 16 - Typical Stored Charge vs. dif/dt Fig. 17 - Typical di(rec)M/dt vs. dif/dt
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IRG4BC20UD-S
Same ty pe
device as
D .U.T.
90%
Vge 10%
430µF
80% VC
of Vce D .U .T. 90%
td(off)
10%
IC 5%
tr tf
t d(on) t=5µs
E on E off
Fig. 18a - Test Circuit for Measurement of
E ts = (Eon +Eoff )
ILM, Eon, Eoff(diode), trr, Qrr, Irr, td(on), tr, td(off), tf
∫
trr
G A T E V O L T A G E D .U .T . trr
Q rr = id d t
Ic
tx
1 0 % +V g
+Vg
tx
1 0 % Irr
10% Vcc
V cc
D UT VO LTAG E
Vce
AN D CU RRE NT V pk
Irr
1 0 % Ic
Vcc Ip k
9 0 % Ic
Ic
D IO D E R E C O V E R Y
W A V E FO R M S
5% Vce
td (o n ) tr
∫
t2
∫
E o n = V ce ie d t t4
t1 E re c = V d id d t
t3
t1 t2 D IO D E R E V E R S E
REC OVERY ENER GY
t3 t4
Fig. 18c - Test Waveforms for Circuit of Fig. 18a, Fig. 18d - Test Waveforms for Circuit of Fig. 18a,
Defining Eon, td(on), tr Defining Erec, trr, Qrr, Irr
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IRG4BC20UD-S
V g G A T E S IG N A L
D E V IC E U N D E R T E S T
C U R R E N T D .U .T .
V O L T A G E IN D .U .T .
C U R R E N T IN D 1
t0 t1 t2
L D.U.T. 480V
RL=
4 X IC @25°C
1000V Vc*
0 - 480V
50V
6000µ F
100 V
Figure 19. Clamped Inductive Load Test Circuit Figure 20. Pulsed Collector Current
Test Circuit
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IRG4BC20UD-S
8.8 9 (.3 50 )
1.40 (.0 55) 1.3 9 (.0 5 5) R E F.
3X
1.14 (.0 45) 0 .93 (.03 7 ) 0.5 5 (.022 ) 1.1 4 (.0 4 5)
3X 0.4 6 (.018 )
0 .69 (.02 7 )
5 .08 (.20 0) 0 .25 (.01 0 ) M B A M M IN IM U M R E CO M M E ND E D F O O TP R IN T
1 1.43 (.4 50 )
NO TE S: LE A D A SS IG N M E N TS 8.89 (.3 50 )
1 D IM EN S IO N S A FTER SO L D ER D IP. 1 - G A TE
2 - D R AIN 17 .78 (.70 0)
2 D IM EN S IO N IN G & TO LE RA N C IN G PE R A N S I Y1 4.5M , 198 2.
3 - S O U RC E
3 C O N TRO L LIN G D IM EN SIO N : IN C H .
4 H E ATSINK & L EA D D IM EN S IO N S D O N O T IN C LU D E B UR R S.
3 .8 1 (.15 0)
2.5 4 (.100 )
2 .08 (.08 2) 2X
2X
A
IN TE R N A TIO N A L PART NUM BER
R E C T IF IE R
F530S
LO G O
9 24 6
9B 1M DATE CODE
(Y YW W )
A S S E M B LY
YY = Y E A R
LO T C O D E
W W = W EEK
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IRG4BC20UD-S
D2Pak Tape & Reel Information
TR R
1 .6 0 (.0 6 3 )
1 .5 0 (.0 5 9 )
1.60 (.06 3)
4 .1 0 (.16 1 ) 1.50 (.05 9)
3 .9 0 (.15 3 ) 0.3 68 (.01 45 )
0.3 42 (.01 35 )
F E E D D IR E C T IO N
30.40 (1.197)
N OT ES : M AX.
1. C O MF OR MS TO EIA-418. 26.40 (1.0 39) 4
2. C O NTR O LLIN G DIM EN SIO N: M ILLIM ET ER. 24.40 (.96 1)
3. D IM ENSIO N M EAS UR ED @ HU B.
3
4. IN CLU D ES F LAN G E D ISTO RT IO N @ O UT ER ED GE.
Notes:
Repetitive rating: VGE=20V; pulse width limited by maximum junction tem-
perature (Figure 20)
VCC=80%(VCES), VGE=20V, L=10µH, RG = 50Ω (Figure 19)
Pulse width ≤ 80µs; duty factor ≤ 0.1%.
Pulse width 5.0µs, single shot.
Data and specifications subject to change without notice.
This product has been designed and qualified for the Industrial market.
Qualification Standards can be found on IR’s Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.1/01
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Note: For the most current drawings please refer to the IR website at:
http://www.irf.com/package/