ISO 16750 Part 2 Electrical Load

INTERNATIONAL ISO
STANDARD 16750-2
Second edition
2006-08-01
Road vehicles — Environmental

conditions and testing for electrical
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and electronic equipment —
Part 2:
Electrical loads
Véhicules routiers — Spécifications d'environnement et essais
de l'équipement électrique et électronique —
Partie 2: Contraintes électriques
Reference number
ISO 16750-2:2006(E)
Copyright International Organization for Standardization © ISO 2006

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ISO 16750-2:2006(E)
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ISO 16750-2:2006(E)
Contents Page
Foreword............................................................................................................................................................ iv
1 Scope ..................................................................................................................................................... 1
2 Normative references ........................................................................................................................... 1
3 Terms and definitions........................................................................................................................... 1
4 Tests and requirements ....................................................................................................................... 1
4.1 General................................................................................................................................................... 1
4.2 D.C. supply voltage............................................................................................................................... 2
4.3 Overvoltage ........................................................................................................................................... 3
4.4 Superimposed alternating voltage...................................................................................................... 4
4.5 Slow decrease and increase of supply voltage ................................................................................. 6
4.6 Discontinuities in supply voltage........................................................................................................ 6
4.7 Reversed voltage ................................................................................................................................ 10
4.8 Ground reference and supply offset................................................................................................. 11
4.9 Open circuit tests................................................................................................................................ 12
4.10 Short circuit protection ...................................................................................................................... 12
4.11 Withstand voltage ............................................................................................................................... 13
4.12 Insulation resistance .......................................................................................................................... 14
4.13 Electromagnetic compatibility........................................................................................................... 15
5 Documentation.................................................................................................................................... 15
Bibliography ..................................................................................................................................................... 16
© ISO 2006 – All rights reserved iii

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Copyright International Organization for Standardization

ISO 16750-2:2006(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies
(ISO member bodies). The work of preparing International Standards is normally carried out through ISO
technical committees. Each member body interested in a subject for which a technical committee has been
established has the right to be represented on that committee. International organizations, governmental and
non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the
International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.
The main task of technical committees is to prepare International Standards. Draft International Standards
adopted by the technical committees are circulated to the member bodies for voting. Publication as an
International Standard requires approval by at least 75 % of the member bodies casting a vote.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. ISO shall not be held responsible for identifying any or all such patent rights.
ISO 16750-2 was prepared by Technical Committee ISO/TC 22, Road vehicles, Subcommittee SC 3,
Electrical and electronic equipment.
This second edition cancels and replaces the first edition (ISO 16750-2:2003), which has been technically
revised.
ISO 16750 consists of the following parts, under the general title Road vehicles — Environmental conditions
and testing for electrical and electronic equipment:
⎯ Part 1: General
⎯ Part 2: Electrical loads
⎯ Part 3: Mechanical loads
⎯ Part 4: Climatic loads
⎯ Part 5: Chemical loads
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iv
INTERNATIONAL STANDARD ISO 16750-2:2006(E)
Road vehicles — Environmental conditions and testing

for electrical and electronic equipment —
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Part 2:
Electrical loads
1 Scope
This part of ISO 16750 applies to electric and electronic systems/components for vehicles. It describes the
potential environmental stresses and specifies tests and requirements recommended for the specific mounting
location on/in the vehicle.
This part of ISO 16750 describes the electrical loads. Electromagnetic compatibility (EMC) is not covered by
this part of ISO 16750. Electrical loads are independent from the mounting location, but may vary due to the
electrical resistance in the vehicle wiring harness and connection system.
2 Normative references
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
ISO 8820 (all parts); Road vehicles — Fuse-links
ISO 16750-1:2003, Road vehicles — Environmental conditions and testing for electrical and electronic
equipment — Part 1: General
ISO 16750-4:2003, Road vehicles — Environmental conditions and testing for electrical and electronic
equipment — Part 4: Climatic loads
3 Terms and definitions

For the purpose of this document, the terms and definitions given in ISO 16750-1 apply.
4 Tests and requirements
4.1 General
If not otherwise specified, the following tolerances shall apply:
⎯ frequency and time: ± 5 %;
⎯ voltages: ± 0,2 V;
⎯ resistance: ± 10 %.
Copyright International Organization for Standardization© ISO 2006 – All rights reserved 1
ISO 16750-2:2006(E)
4.2 D.C. supply voltage
4.2.1 Purpose
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The purpose of this test is to verify equipment functionality at minimum and maximum supply voltage.
4.2.2 Test
Set the supply voltage as specified in Table 1 or Table 2 to all relevant inputs of the device under test (DUT).
Operating modes are specified in ISO 16750-1.
Measure all voltages at the relevant terminals of the DUT.
The voltages which are listed in Table 1 or Table 2 are relevant within the operating temperature range as
specified in ISO 16750-4, without time limits.
Table 1 — Supply voltage for UN = 12 V system devices
Supply voltage
Code V
US min US max
A 6 16
B 8 16
C 9 16
D 10,5 16
Table 2 — Supply voltage for UN = 24 V system devices
Supply voltage
Code V
US min US max
E 10 32
F 16 32
G 22 32
4.2.3 Requirement
All DUT functions shall remain class A, as defined in ISO 16750-1, when tested in the supply voltage ranges
given in Table 1 or Table 2, respectively.
2
ISO 16750-2:2006(E)
4.3 Overvoltage
4.3.1 UN = 12 V systems
4.3.1.1 Test at T = (Tmax –20 °C)
4.3.1.1.1 Purpose
This test simulates the condition where the generator regulator fails so that the output voltage of the generator
rises above normal values.
4.3.1.1.2 Test
Heat the DUT in a hot air oven to a temperature of T = (Tmax –20 °C). Apply a voltage of 18 V for 60 min to all
relevant inputs of the DUT.
4.3.1.1.3 Requirement
The functional status for the DUT shall be minimum class C as defined in ISO 16750-1. Functional status shall
be class A where more stringent requirements are necessary.
4.3.1.2 Test at room temperature
4.3.1.2.1 Purpose
This test simulates a jump start.
4.3.1.2.2 Test
Ensure that the DUT has stabilized at room temperature. Apply a voltage of 24 V for 60 s ± 10 % to all
4.3.1.2.3 Requirement
The functional status shall be minimum class D as defined in ISO 16750-1. Functional status shall be class C
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where more stringent requirements are necessary.
4.3.2 UN = 24 V systems
4.3.2.1 Purpose
This test simulates the condition where the generator regulator fails so that the output voltage of the generator
rises above normal values.
4.3.2.2 Test at T = (Tmax –20 °C)
Heat the DUT in a hot air oven to a temperature of T = (Tmax –20 °C). Apply a voltage of 36 V for 60 min to all
4.3.2.3 Requirement
The functional status shall be minimum class C as defined in ISO 16750-1. Functional status shall be class A
© ISO 2006 – All rights reserved

Copyright International Organization for Standardization 3
ISO 16750-2:2006(E)
4.4 Superimposed alternating voltage
4.4.1 Purpose
This test simulates a residual a.c. on the d.c. supply.
4.4.2 Test
Connect the DUT as shown in Figure 1. Apply the following test simultaneously to all applicable inputs
(connections) of the DUT. The severity 1, 2 or 3 shall be chosen according to the application.
⎯ Test voltage US max (see Figure 2): 16 V for UN = 12 V systems;
32 V for UN = 24 V systems;
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⎯ a.c. voltage (sinusoidal): Severity 1: UPP = 1 V for UN = 12 V and 24 V;
Severity 2: UPP = 4 V for UN = 12 V and 24 V;
Severity 3: UPP = 10 V for UN = 24 V systems only.
⎯ Internal resistance of the power supply: 50 mΩ to 100 mΩ;
⎯ Frequency range (see Figure 3): 50 Hz to 20 kHz;
⎯ Type of frequency sweep (see Figure 3): Triangular, logarithmic;
⎯ Sweep duration (see Figure 3): 120 s;
⎯ Number of sweeps: 5 (continuously).
Key
1 sweep generator
2 power supply unit capable of being modulated
3 DUT
4 positive
5 ground or return
Figure 1 — Test set-up to superimpose a.c. voltage on component power supply lines
4
ISO 16750-2:2006(E)
Figure 2 — Test voltage with superimposed sinusoidal a.c. voltage
Key
1 one cycle
f frequency, Hz (logarithmic scale)
t time, s
Figure 3 — Frequency sweep
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© ISO for
Copyright International Organization 2006 – All rights reserved
Standardization 5
ISO 16750-2:2006(E)
4.4.3 Requirement
The functional status shall be class A as defined in ISO 16750-1.
4.5 Slow decrease and increase of supply voltage
4.5.1 Purpose
This test simulates a gradual discharge and recharge of the battery.
4.5.2 Test
Apply the following test simultaneously to all applicable inputs (connections) of the DUT.
Decrease the supply voltage from US max to 0 V and increase it from 0 V to US max, applying a change rate of
(0,5 ± 0,1) V per minute.
4.5.3 Requirement
The functional status inside the supply voltage range (Table 1 or Table 2) shall be as in 4.2.3. Outside that
range, it shall be minimum class D as defined in ISO 16750-1. Functional status of class C may be specified
4.6 Discontinuities in supply voltage
4.6.1 Momentary drop in supply voltage
4.6.1.1 Purpose
This test simulates the effect when a conventional fuse element melts in another circuit.
4.6.1.2 Test
Apply the test pulse (see Figures 4 and 5) simultaneously to all relevant inputs (connections) of the DUT. The
rise time and fall time shall be u 10 ms.
Key
U voltage, V
t time, s
Figure 4 — Short voltage drop (UN = 12 V systems)
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6
ISO 16750-2:2006(E)
Key
U voltage, V
t time, s
Figure 5 — Short voltage drop (UN = 24 V systems)
4.6.1.3 Requirement
Functional status shall be class B as defined in ISO 16750-1. Reset is permitted upon agreement.
4.6.2 Reset behaviour at voltage drop
4.6.2.1 Purpose
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This test verifies the reset behaviour of the DUT at different voltage drops. This test is applicable to equipment
with reset function [e.g. equipment containing microcontroller(s)].
4.6.2.2 Test
Apply the test pulse simultaneously in Figure 6 to all relevant inputs (connections) and check the reset
behaviour of the DUT.
Decrease the supply voltage by 5 % from US min to 0,95 US min. Hold this voltage for 5 s. Raise the voltage to
US min. Hold US min for at least 10 s and perform a functional test. Then decrease the voltage to 0,9 US min, etc.
Continue with steps of 5 % of US min, as shown in Figure 6, until the lower value has reached 0 V. Then raise
the voltage to US min again.
Copyright International Organization for Standardization© ISO 2006 – All rights reserved 7
ISO 16750-2:2006(E)
Key
US min minimum supply voltage
t time, s
Figure 6 — Supply voltage profile for the reset test
4.6.2.3 Requirement
Functional status shall be class C as defined in ISO 16750-1.
4.6.3 Starting profile
4.6.3.1 Purpose
This test verifies the behaviour of a DUT during and after cranking.
4.6.3.2 Test
Apply 10 times the starting profile, as specified in Figure 7 and Table 3 or Table 4, simultaneously to all
relevant inputs (connections) of the DUT. A break of 1 to 2 s between the starting cycles is recommended.
One or more profiles, as described in Table 3 and Table 4, shall be chosen according to the application.
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8
ISO 16750-2:2006(E)
a f = 2 Hz,
Figure 7 — Starting profile
Table 3 — Values for UN = 12 V system devices
Levels/voltages/duration of starting profile
I II III IV Tolerances
US = 8 V US = 4,5 V US = 3 V US = 6 V
+ 0,2 V
UA = 9,5 V UA = 6,5 V UA = 5 V UA = 6,5 V
tr = 5 ms
t6 = 15 ms
t7 = 50 ms ± 10 %
Supply voltage t8 = 1 s t8 = 10 s t8 = 1 s t8 = 10 s
V tf = 40 ms tf = 100 ms tf = 100 ms tf = 100 ms
Code
US min US max Functional status
A 6 16 A B B A
B 8 16 A B C B —
C 9 16 B C C C
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D 10,5 16 B C C C

ISO 16750-2:2006(E)
Table 4 — Values for UN = 24 V system devices
Levels/voltages/duration of starting profile
I II III Tolerances
US = 10 V US = 8 V US = 6 V
+ 0,2 V
UA = 20 V UA = 15 V UA = 10 V
tr = 10 ms
t6 = 50 ms
t7 = 50 ms ± 10 %
Supply voltage t8 = 1 s t8 = 10 s t8 = 1 s
V tf = 40 ms tf = 100 ms tf = 40 ms
Code
US min US max Functional status
E 10 32 A B B
—
F 16 32 B C C
G 22 32 B C C
4.6.3.3 Requirement
Functions of the DUT that are relevant to vehicle operation during cranking shall be class A, all other functions
of the DUT shall be according to Table 3 and/or Table 4.
4.7 Reversed voltage
4.7.1 Purpose
This test checks the resistance of a device against the connection of a reversed battery in case of using an
auxiliary starting device.
This test is not applicable to
⎯ generators, or
⎯ relays with clamping diodes without external reverse polarity protection device.
4.7.2 Test
4.7.2.1 General
Connect and fuse the DUT as in the real vehicle, but without generator and battery. Choose the applicable
voltages from the following cases and apply them simultaneously to all relevant power terminals with reversed
polarity.
4.7.2.2 Case 1
If the DUT is used in a vehicle in which the alternator circuit is not fused and the rectifier diodes withstand a
reversed voltage for 60 s, apply a test voltage of 4 V for UN = 12 V systems with reversed polarity
simultaneously to all relevant inputs (terminals) of the DUT for a duration of 60 s ± 10 %. This test is not
applicable for UN = 24 V systems.
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10
ISO 16750-2:2006(E)
4.7.2.3 Case 2
In all other cases, apply the test voltage UA (see Table 5 and ISO 16750-1) with reversed polarity
simultaneously to all relevant inputs (terminals) of the DUT for a duration of 60 s ± 10 %.
Table 5 — Voltage ranges
Nominal voltage, UN UA
V V
12 14
24 28
4.7.3 Requirement
After replacing all blown fuse links, the functional status shall be class C as defined in ISO 16750-1.
4.8 Ground reference and supply offset
4.8.1 Purpose
This test shall be agreed between customer and supplier.
This test serves to verify reliable operation of a component if two or more power supply paths exist. For
instance, a component may have a power ground and a signal ground that are outputs on different circuits.
4.8.2 Test
All inputs and outputs shall be connected to representative loads or networks to simulate the in-vehicle
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configuration. Apply UA to the DUT and confirm normal operation.
The ground/supply offset test applies to ground/supply lines. The offset shall be applied to each ground/supply
line and between each ground/supply line separately in sequence.
For all DUTs, the offset voltage shall be 1,0 V.
a) Apply UA to the DUT.
b) Subject ground/supply line to the offset voltage relative to the DUT ground/supply line.
c) Perform a functional test under this condition.
d) Repeat No. 3 for each next ground/supply line combination.
Repeat the test with reverse offset voltage.
4.8.3 Requirement
Functional performance status class A for all functional groups: there shall be no malfunction or latch-up of the
DUT.

ISO 16750-2:2006(E)
4.9 Open circuit tests
4.9.1 Single line interruption
4.9.1.1 Purpose
This test simulates an open contact condition.
NOTE This is not a test for connectors.
4.9.1.2 Test
Connect and operate the DUT as intended. Open one circuit of the DUT/system interface. Then restore the
connection. Observe the device behaviour during and after the interruption.
Repeat for each circuit of the DUT/system interface.
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⎯ Interruption time: 10 s ± 10 %.
⎯ Open circuit resistance: W 10 MΩ.
4.9.1.3 Requirement
4.9.2 Multiple line interruption
4.9.2.1 Purpose
The purpose of this test to ensure functional status as defined in the specification of the DUT when the DUT is
subjected to a rapid multiple line interruption.
NOTE This is not a test for connectors.
4.9.2.2 Test
Disconnect the DUT, then restore the connection. Observe the device behaviour during and after the
interruption.
⎯ Interruption time: 10 s ± 10 %.
⎯ Open circuit resistance: W 10 MΩ.
For multi-connector devices, each possible connection shall be tested.
4.9.2.3 Requirement
4.10 Short circuit protection
4.10.1 Purpose
These tests simulate short circuits to the inputs and outputs of a device.
12
ISO 16750-2:2006(E)
4.10.2 Signal circuits
4.10.2.1 Test
Connect all relevant inputs and outputs of the DUT in sequence for a duration of 60 s ± 10 % to US max
(US max: see Tables 1 and 2) and to ground. All other inputs and outputs remain open or as agreed upon.
Perform this test with:
⎯ connected supply voltage and ground terminals:
1) outputs active,
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2) outputs inactive;
⎯ disconnected supply voltage terminals;
⎯ disconnected ground terminals.
All unused inputs shall remain open unless otherwise agreed between customer and supplier.
4.10.2.2 Requirement
4.10.3 Load circuits
4.10.3.1 Test
Connect the DUT to the power supply. The load circuits shall be in operation. For test duration, the
appropriate part of ISO 8820 (operating time rating) shall be used considering the upper tolerance plus 10 %.
If protection other than fuses is used (e.g. electronic protection), the test duration shall be agreed between
manufacturer and user.
4.10.3.2 Requirements
All electronically protected outputs shall withstand the currents as ensured by the corresponding protection
and shall return to normal operation upon removal of the short circuit current (minimum class C as defined in
ISO 16750-1).
All conventional fuse protected outputs shall withstand the currents as ensured by the corresponding
protection and shall return to normal operation upon replacement of the conventional fuse (minimum class D
as defined in ISO 16750-1).
All unprotected outputs may be damaged by the test current (functional status class E as defined in
ISO 16750-1) provided that the materials in the DUT are compliant with the flammability requirements of
UL94-V0 (see Bibliography [1]).
4.11 Withstand voltage
4.11.1 Purpose
This test ensures the dielectric withstand voltage capability of circuits with galvanic isolation. This test is
required only for systems/components which contain inductive elements (e.g. relays, motors, coils) or are
connected to circuits with inductive load.

ISO 16750-2:2006(E)
The deliberate overvoltage between the galvanically isolated current carrying parts of the DUT could have a
negative effect on insulation performance caused by the electrical field. This test stresses the insulation
system and checks the ability of the dielectric material to withstand a higher voltage caused by switching off
inductive loads.
4.11.2 Test
Perform a “Test 1: damp heat cyclic” test in accordance with ISO 16750-4.
System/components shall remain 0,5 h at room temperature (RT) after the damp heat test.
Apply a sinusoidal test voltage of 500 V rms (50 Hz to 60 Hz) to devices in UN = 12 V and 24 V systems for a
duration of 60 s, as follows:
⎯ between terminals with galvanic isolation;
⎯ between terminals and housing with electrically conductive surface with galvanic isolation;
⎯ between terminals and an electrode wrapped around the housing (for example metal foil, sphere bath) in
the case of plastic housing.
4.11.3 Requirement
The functional status shall be class C as defined in ISO 16750-1. Neither dielectric breakdown nor flash-over
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shall occur during the test.
4.12 Insulation resistance
4.12.1 Purpose
This test ensures a minimum value of ohmic resistance required to avoid current between galvanically isolated
circuits and conductive parts of the DUT.
The test gives an indication of the relative quality of the insulation system and material.
4.12.2 Test
Perform a “Test 1: damp heat cyclic” test in accordance with ISO 16750-4.
System/components shall remain 0,5 h at RT after the damp heat test.
Apply a test voltage of 500 V d.c. to the DUT for 60 s, as follows:
⎯ between terminals with galvanic isolation;
⎯ between terminals and housing with electrically conductive surface with galvanic isolation;
⎯ between terminals and an electrode wrapped around the housing (for example metal foil) in the case of
plastic material housing.
For particular application, the test voltage can be reduced to 100 V d.c. if agreed between customer and
supplier.
4.12.3 Requirement
The insulation resistance shall be >10 MΩ.
14
ISO 16750-2:2006(E)
4.13 Electromagnetic compatibility
EMC specifications are given in the Bibliography (see [2] to [8]) for information only. Performance
measurements based on these specifications are not included in the scope of ISO 16750.
5 Documentation
For documentation, the designations according to ISO 16750-1 shall be used.
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ISO 16750-2:2006(E)
Bibliography
[1] UL94, Tests for flammability of plastic materials for parts in devices and appliances
[2] ISO 7637 (all parts), Road vehicles — Electrical disturbances by conduction and coupling
[3] ISO/TR 10305 (all parts), Road vehicles — Calibration of electromagnetic field strength measuring
devices
[4] ISO 10605, Road vehicles — Test methods for electrical disturbances from electrostatic discharges
[5] ISO 11451 (all parts), Road vehicles — Vehicle test methods for electrical disturbances by narrowband
radiated electromagnetic energy
[6] ISO 11452 (all parts), Road vehicles — Component test methods for electrical disturbances from
narrowband radiated electromagnetic energy
[7] CISPR 12, Vehicles, boats, and internal combustion engine-driven devices — Radio disturbance
characteristics — Limits and methods of measurement
[8] CISPR 25, Limits and methods of measurement of radio disturbance characteristics for the protection
of receivers used on board vehicles
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16
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ISO 16750-2:2006(E)
ICS 43.040.10
Price based on 16 pages
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INTERNATIONAL ISO

Road vehicles — Environmental

Copyright International Organization for Standardization © ISO 2006

© ISO 2006 – All rights reserved iii

Copyright International Organization for Standardization

⎯ Part 2: Electrical loads

⎯ Part 3: Mechanical loads

⎯ Part 4: Climatic loads

⎯ Part 5: Chemical loads

Road vehicles — Environmental conditions and testing

ISO 8820 (all parts); Road vehicles — Fuse-links

3 Terms and definitions

4 Tests and requirements

If not otherwise specified, the following tolerances shall apply:

⎯ frequency and time: ± 5 %;

4.2 D.C. supply voltage

Measure all voltages at the relevant terminals of the DUT.

Table 1 — Supply voltage for UN = 12 V system devices

Table 2 — Supply voltage for UN = 24 V system devices

4.3.1.1 Test at T = (Tmax –20 °C)

4.3.1.2 Test at room temperature

This test simulates a jump start.

4.3.2.2 Test at T = (Tmax –20 °C)

© ISO 2006 – All rights reserved

4.4 Superimposed alternating voltage

This test simulates a residual a.c. on the d.c. supply.

⎯ Test voltage US max (see Figure 2): 16 V for UN = 12 V systems;

Severity 2: UPP = 4 V for UN = 12 V and 24 V;

Severity 3: UPP = 10 V for UN = 24 V systems only.

⎯ Internal resistance of the power supply: 50 mΩ to 100 mΩ;

⎯ Frequency range (see Figure 3): 50 Hz to 20 kHz;

⎯ Type of frequency sweep (see Figure 3): Triangular, logarithmic;

⎯ Sweep duration (see Figure 3): 120 s;

⎯ Number of sweeps: 5 (continuously).

Figure 2 — Test voltage with superimposed sinusoidal a.c. voltage

Figure 3 — Frequency sweep

The functional status shall be class A as defined in ISO 16750-1.

4.5 Slow decrease and increase of supply voltage

This test simulates a gradual discharge and recharge of the battery.

4.6 Discontinuities in supply voltage

4.6.1 Momentary drop in supply voltage

Figure 4 — Short voltage drop (UN = 12 V systems)

Figure 5 — Short voltage drop (UN = 24 V systems)

4.6.2 Reset behaviour at voltage drop

Figure 6 — Supply voltage profile for the reset test

Functional status shall be class C as defined in ISO 16750-1.

4.6.3 Starting profile

Figure 7 — Starting profile

Table 3 — Values for UN = 12 V system devices

Levels/voltages/duration of starting profile

© ISO 2006 – All rights reserved

Table 4 — Values for UN = 24 V system devices

Levels/voltages/duration of starting profile

4.7 Reversed voltage

This test is not applicable to

Table 5 — Voltage ranges

4.8 Ground reference and supply offset

This test shall be agreed between customer and supplier.

For all DUTs, the offset voltage shall be 1,0 V.

a) Apply UA to the DUT.