Dielectric Sensing by Charging Energy Modulation in A Nano-Granular Metal
Dielectric Sensing by Charging Energy Modulation in A Nano-Granular Metal
Dielectric Sensing by Charging Energy Modulation in A Nano-Granular Metal
A (2014) 117:1689–1696
DOI 10.1007/s00339-014-8631-9
Received: 11 March 2014 / Accepted: 15 July 2014 / Published online: 29 July 2014
Ó Springer-Verlag Berlin Heidelberg 2014
123
1690 M. Huth et al.
from weak to strong inter-grain tunnel coupling. The for- medium. In this case, the coupling constant g would also be
malism is sufficiently general to be applicable to other modified. This effect is not considered in the approach
dielectric sensing scenarios based on three-layer hetero- followed here, because it will be rather small for the het-
structures with one nano-granular layer. It has already been erostructures considered here. If the matrix were to be
successfully applied to analyze recent experimental find- replaced fully by a highly polarizable medium, or even a
ings on the strong conductance modulations observed in ferroelectric material, polarization-induced changes of g
nano-granular Pt(C) structures in close proximity to thin can become relevant, as was recently shown in a theoretical
layers of an organic ferroelectricum [7]. We can anticipate study [9].
that our work will be of interest for the area of dielectric or
local potential sensing in general and may inspire future 2.1 Transport regimes of nano-granular metals
work on the basis of highly miniaturized nano-granular
sensing layers prepared by FEBID or other thin-film For as-grown Pt(C) nano-granular FEBID structures, the
techniques. temperature-dependent conductivity follows a stretched
exponential behavior of the form
h i
rðTÞ ¼ r00 exp ðT0 =TÞ1=2 ð1Þ
2 Modeling approach
which was experimentally shown in several works (see,
FEBID structures prepared with organometallic precursors e.g., [4, 12]). This behavior was only recently theoretically
often show a nano-granular microstructure, i.e., metallic understood as a variant of variable range hopping (corre-
grains of a few nm of diameter are embedded in a carbo- lated VRH) governed by sequential inelastic co-tunneling
naceous matrix. As long as the metallic grains do not between the grains that takes disorder-induced, local
directly touch to form a percolating path through the background charges and the charging energy of the grains
sample, charge transport is governed by thermally assisted into account [8]. Here, the activation temperature T0 is
tunneling of the electrons. Recent theoretical work has governed by the inelastic co-tunneling range n as follows
shown that different transport regimes have to be dis-
criminated depending on the strength of the inter-grain be2 4R
kB T0 ¼ and nðTÞ ¼
tunnel coupling g and temperature T [8]. Here, the cou- 4p0 r n ln E =16pcin gðkB TÞ2
2
pling constant g is a dimensionless quantity measured in
ð2Þ
units of the spin-degenerate conductance quantum 2e2 =h.
For a material to qualify as a granular metal, the condition with E ¼ EC and cin ¼ 1 for simplicity (see [5] for details).
g g0 has to be fulfilled. g0 denotes the dimensionless kB denotes the Boltzmann constant.
conductance within a grain, which is assumed to be in the By post-growth electron irradiation of Pt(C) nano-
diffusive limit [8]. Due to the small size of the metallic granular FEBID structures, the tunnel coupling strength
grains, their charge capacity C is very small. Assuming a between the Pt grains can be strongly increased [10, 11] up
spherical grain of diameter 2R (R: radius), the capacitance to the point of an insulator–metal transition at a critical
amounts to 4p0 r R, with 0 and r the dielectric constants coupling strength gc 0:3 [12]. Experimentally one
of vacuum and the surrounding material, respectively. In observes, for couplings above gc , a logarithmic temperature
the tunneling process, each tunnel event is associated with dependence of the conductivity from room temperature
a charging energy which, for one grain in a matrix, is given down to about 10 to 20 K where it crosses over to an
pffiffiffiffi
by EC ¼ e2 =2C. It is the interplay of this charging energy, approximate T behavior [12]. Both of these temperature
possible finite size effects for very small grains (smaller dependences have also been theoretically predicted for a
than about 1 nm) and the microstructural disorder in the nano-granular metal modeled as a regular, three-dimen-
granular metals that leads to the different transport regimes sional array of metallic grains in the strong-coupling limit.
[8]. According to theory, the logarithmic temperature-depen-
In order to develop a model that can account for the dent correction to the diffusive conductivity r0 is given by
change of the conductivity of a thin nano-granular metal Eq. 3 (three-dimensional case) [8]
prepared in contact with a polarizable medium, such as an
1 gEc
adsorbed water layer or a dielectric thin film, the influence rðTÞ ¼ r0 1 ln ð3Þ
6pg kB T
of the polarizable medium on the charging energy has to be
considered. In principle, also the attenuation length of the It is important to note that within the critical region itself
electronic wave function at the surface of the grains could (g gc ), theory is not able to provide a conclusive answer
be influenced by the presence of the nearby polarizable to the temperature dependence of the conductivity.
123
Dielectric sensing by charging energy modulation in a nano-granular metal 1691
Fig. 1 Geometric
representation of the three-layer
heterostructure scenarios (A)
and (B). a The nano-granular
metal layer (2) is sandwiched
between the dielectric layers 1
and 3. b The nano-granular
metal layer forms the bottom
layer (1) on top of which a
polarizable adsorbate layer (2)
and a nonpolarizable layer or
weakly polarizable layer (3) are
assumed. c One grain of the
nano-granular metal together
with six point sources at
positions rQ;i (at half-radius
positions) and collocation points
rC;i (on surface). See text for
details. The lower part of
c represents the geometry for
scenario (B) in side view
2.2 Layer geometry of modeling approach the grain capacitance, if the thickness of layer 2 changes.
This scenario is used here to study the effects of an
In order to make progress in understanding the observed adsorbed layer, such as water, on the conductance of the
conductance changes of the nano-granular metal in prox- nano-granular metal. At this point, one may criticize that
imity to an electrically polarizable medium, we introduce the second scenario does not take the finite thickness of the
the three-layer model structure depicted in Fig. 1. It con- nano-granular layer into account which is itself deposited
sists of a layer with index 2 of thickness d2 and dielectric on a different dielectric half-space (substrate). This is a
constant 2 embedded in two layers of infinite thickness valid point. However, as will be shown next, the three-layer
with dielectric constants 1 and 3 . We wish to calculate the approach followed here allows for a transparent analytic
change of the capacitance of a spherical metal grain of solution of the capacitance problem and is appropriate for
diameter 2R embedded in layer 2 or 1 (see Fig. 1a or b). describing the adsorbate effects without introducing too
The spherical grain is one out of a regular array of grains much computational complexity. Also, the conceptual
for which we assume the same diameter. A nano-granular steps in this derivation can be extended to more complex
metal layer of given thickness dG is now formed by layer structures.
stacking several of these arrays in such a way that all
neighbored grains are coupled by the same coupling con- 2.3 Capacitance calculation for single grain
stant g. We discriminate two scenarios: (A) The nano-
granular metal layer is surrounded by two dielectric half We now turn to the capacitance calculation for a spherical
spaces (Fig. 1a). Half-space 1 represents the substrate and grain embedded either in layer 1 or layer 2. Here, two steps
half-space 3 a highly polarizable layer of rather large are needed. In the first step, we wish to get a closed
thickness. In this case, any change of the thickness of layer expression for the Coulomb potential at any given point
3 will not lead to changes in the capacitance of a grain in r ¼ ðx; y; zÞ in layer 1 or 2, if a point charge Q is placed at
layer 2. (B) The nano-granular metal layer represents layer any other point r0 in the same layer. Without loss of gen-
1 and is covered by two additional layers. We assume that erality, we set r0 ¼ ð0; 0; z0 Þ. In the next step, we use this
layer 2 is strongly polarizable, whereas layer 3 could be result to calculate the capacitance of a spherical grain
vacuum or air. In this case, we are interested in changes of employing the source point collocation method [13].
123
1692 M. Huth et al.
2.3.1 Coulomb potential of point charge in three-layer In order to ensure an equipotential surface on the spherical
medium grain, we replace the sphere by n point charges at prede-
fined fixed positions frQ;i g within the sphere volume. This
For the three-layer medium, the method of image charges is exemplarily shown for n ¼ 6 in Fig. 1c. The point
can be used to calculate the Coulomb potential in a charges Qi have to be determined such that the potential /0
straightforward way, if a\z0 \a and a\z\a (see on the n collocation points frC;i g on the surface of the
Fig. 1a, c) [14]. This is also possible for the case z0 \ a sphere is constant (see also Fig. 1c). From this, the fol-
or z0 [ a, as was shown in [15]. A substantial reduction of lowing system of linear equations results ðj ¼ 1; . . .nÞ
complexity can be reached by Fourier transforming the X n
1 Qi
expressions for the Coulomb potential in x and y /0 ¼ ð8Þ
4p0 r jrQ;i rC;j j
(R ¼ ðx; yÞ). Here, we collect the expressions relevant in i¼1
the present case following [15]: from which the unknown point charges Qi are obtained by
Scenario (A): a\z0 \a; a\z\a matrix inversion. The sought for capacitance then follows
Q 2p h kjzz0 j 0 directly from
Vðk; z; z0 Þ ¼ e DfL12 ekjzþz þDj Pn
4p0 2 k
i Qi
0
þ L32 ekjzþz Dj 2L12 L32 cosh ðkjz z0 jÞg C ¼ i¼1 ð9Þ
/0
ð4Þ In Fig. 2, we show the result of capacitance calculations
0
Scenario (B): z \ a; z\ a within scenario (B) performed with n ¼ 6 and with varying
thickness of layer 2, simulating an adsorbate layer of water.
Q 2 22 2p h kjzz0 j The simulation parameters used are already chosen with a
Vðk; z; z0 Þ ¼ e
4p0 2 þ 3 2 þ 1 k ð5Þ view to using the results for modeling the experimentally
0 0
i
ekðjzjþjz jÞ þ Dekðjzjþjz jÞ observed conductance modulations of Pt(C) FEBID struc-
tures exposed to water under controlled relative humidity
with levels, which will be presented in the discussion section.
The simulation parameters are listed in Table 1. In all
i 2 1
Li2 and D ð6Þ cases, we assume a dielectric constant of 2 ¼ A ¼ 80 for
i þ 2 1 L12 L32 e2kD
the adsorbate layer, like for bulk liquid water [18]. We
and D ¼ 2a. comment on this simplifying assumption in the discussion
By back transforming into R-space, a closed integral section. With regard to the relevant thickness range, we
expression for the electrostatic potential is obtained take from literature results from scanning probe micros-
Z copy (SPM) and dynamic force spectroscopy (DFS)
1 1
VðR; z; z0 Þ ¼ kJ0 ðkRÞVðk; z; z0 Þdk ð7Þ experiments on the coverage of different surfaces with
2p 0
water films under different conditions of relative humidity
J0 ðkRÞ denotes the zero-order Bessel function of the first [19, 20]. From these experiments, we identify the suitable
kind. This integral has to be evaluated numerically and thickness range for dA to be from 0.25 nm, corresponding
yields the electrostatic potential for a given point charge to one monolayer of water, to 5 nm, as is observed at room
distribution, which is needed in the capacitance calculation temperature for relative humidity levels up to 90 %. Since
described next. the thickness of the water film depends on the substrate
material, we took values which were found for graphite
2.3.2 Capacitance calculation using source point [20]. This should be representative for the Pt(C) FEBID
collocation method structures employed here, if we assume that the surface
termination layer of the nano-granular metal is amorphous
The source point collocation method for capacitance cal- carbon. From these calculations, we deduce as the most
culations of arbitrarily shaped metallic electrodes in a relevant results: (1) with increasing adsorbate layer thick-
dielectric medium uses the fact that the surface of a metal ness, the capacitance of a spherical grain close to the
electrode is an equipotential surface. In the present case, interface between layer 1 and 2 increases. This effect
the metallic electrode is a spherical grain and the dielectric grows with increasing adsorbate layer thickness and tends
medium is formed by the surrounding granular metal, to saturate for larger thicknesses. (2) The capacitance
which is treated within an effective medium theory increase drops off for larger distances to the interface and
according to Maxwell and Garnett [16, 17]. This is tends to saturate for distances above about 20 nm. From
appropriate within the mean-field treatment of the problem. this, we can conclude that nano-granular metal layers are
123
Dielectric sensing by charging energy modulation in a nano-granular metal 1693
123
1694 M. Huth et al.
123
Dielectric sensing by charging energy modulation in a nano-granular metal 1695
123
1696 M. Huth et al.
prepared by FEBID. Due to the excellent down-scaling 6. F. Kolb, K. Schmoltner, M. Huth, A. Hohenau, J. Krenn, A. Klug,
capabilities of FEBID, spatially resolved sensor structures E.J.W. List, H. Plank, Nanotechnology 24, 305501 (2013)
7. M. Huth, A. Rippert, R. Sachser, L. Keller, submitted to Nano-
can be realized. Our findings suggest that the correlated technology (2014), arXiv:1404.7669
variable range hopping, i.e., weak-coupling, regime is most 8. I.S. Beloborodov, A.V. Lopatin, V.M. Vinokur, K.B. Efetov,
sensitive to dielectric modulation effects. Assuming a Rev. Mod. Phys. 79, 469 (2007)
typical inelastic co-tunneling range of about 20 nm, the 9. O.G. Udalov, N.M. Chtchelkatchev, A. Glatz, I.S. Beloborodov,
Phys. Rev. B 89, 054203 (2014)
working principle introduced here for nano-granular sensor 10. F. Porrati, R. Sachser, C.H. Schwalb, A. Frangakis, M. Huth, J.
structures should scale down gracefully to the sub-50 nm Appl. Phys. 109, 063715 (2011)
range. 11. H. Plank, G. Kothleitner, F. Hofer, S.G. Michelitsch, C. Gspan,
A. Hohenau, J. Krenn, J. Vac. Sci. Technol. A 29, 051801 (2011)
Acknowledgments M. H. thanks the Deutsche Forschungsgeme- 12. R. Sachser, F. Porrati, ChH Schwalb, M. Huth, Phys. Rev. Lett.
inschaft for financial support through the Collaborative Research 107, 206803 (2011)
Centre SFB/TR 49. 13. C. Wasshuber, Computational Single-Electronics, 139ff
(Springer, Wien, 2001)
14. N. Anderson, Am. J. Phys. 38, 1483 (1970)
15. R.G. Barrera, O. Guzman, B. Balaguer, Am. J. Phys. 46, 1172
References (1978)
16. J.C. Garnett, Philos. Trans. R. Soc. Lond. 203, 385 (1904); 205,
1. G. Boero, I. Utke, T. Bret, N. Quack, M. Todorova, S. Mouaziz, 237 (1906)
P. Kejik, J. Brugger, R.S. Popovic, P. Hoffmann, Appl. Phys. 17. X.C. Zeng, D.J. Bergmann, P.M. Hui, D. Stroud, Phys. Rev. B 38,
Lett. 86, 042503 (2005) 10970 (1988)
2. M. Gabureac, L. Bernau, I. Utke, G. Boero, Nanotechnology 21, 18. M. Uematsu, E.U. Frank, J. Phys. Chem. Ref. Data 9, 1291 (1980)
115503 (2010) 19. A. Gil, J. Colchero, M. Luna, J. Gomez-Herrero, A.M. Baro,
3. C.H. Schwalb, C. Grimm, M. Baranowski, R. Sachser, F. Porrati, Langmuir 16, 5086 (2000)
H. Reith, P. Das, J. Mller, F. Vlklein, A. Kaya, M. Huth, Sensors 20. A. Opitz, M. Scherge, S.I.-U. Ahmed, J.A. Schaefer, J. Appl.
10, 9847 (2010) Phys. 101, 064310 (2007)
4. M. Huth, F. Porrati, C.H. Schwalb, M. Winhold, R. Sachser, M. 21. L.P. Gor’kov, G.M. Eliashberg, Sov. Phys. JETP 21, 940 (1965)
Dukic, J. Adams, G. Fantner, Beilstein J. Nanotechnol. 3, 597 22. M. Strässler, M.J. Rice, P. Wyder, Phys. Rev. B 6, 2575 (1972)
(2012) 23. S.K. Saha, Phys. Rev. B 69, 125416 (2004)
5. M. Huth, J. Appl. Phys. 107, 113709 (2010) 24. A.A. Middleton, N.S. Wingreen, Phys. Rev. Lett. 71, 3198 (1993)
123