Characterization of An Atmospheric Pressure Plasma Jet
Characterization of An Atmospheric Pressure Plasma Jet
Characterization of An Atmospheric Pressure Plasma Jet
Abstract. In this paper, an experimental study is presented to characterize a commercially available atmo-
spheric pressure plasma jet (APPJ) kINPen which can be used for local surface modification, e.g. changing
the wettability as well as for thin film deposition with silicon-organic and metal-organic precursors to
enhance scratch resistance or to lower the gas permeability. Characterization of the jet discharge has been
carried out by three methods: (i) measurement of the energy influx from the jet plasma to a substrate by a
calorimetric probe, (ii) spatial resolved investigation of the plasma beam by optical emission spectroscopy
(OES) and (iii) observation of the plasma jet by video imaging. The deposited SiOx and AlOx films were
analyzed by XPS measurements.
(fps) and the exposure time was 0.5 ms. The observed area
was a field of 72 × 96 pixel, e.g. 72 pixels in vertical (ax-
ial) direction and 96 pixels in radial (horizontal) direction.
The calibration of this field of view centered around the
jet results in an observation window of 5.14 × 6.86 mm.
This area is large enough to monitor the plasma jet out-
side the nozzle and in front of an insulating (glass plate) or
conductive (copper plate) material, respectively. By this
way it is possible to study the formation and expansion
of filaments in front of the surface material. The recorded
video file was cut into single frames and analyzed with a
c
MatLab program to observe the motion of the plasma
jet and the processed surface in detail.
Fig. 2. Schema of the experimental setup for the calorimet- The precursors (HMDSO and ATI) were heated in a wa-
ric probe measurements (a) and the optical emission spec- ter or oil bath at 63 ◦ C and 155 ◦ C, respectively, and then
troscopy (b). The calorimetric probe as well as the optical fibre fed via an argon flow into the cap, which was mounted
for OES could be moved in axial direction. For observation by on top of the jet-system (see Fig. 2d). The chemical com-
video imaging (c) the camera was mounted side-on. For the de- position in case of thin film deposition (SiOx , AlOx ) has
position experiments the precursor was mixed into the plasma been studied by XPS [30]. For the XPS measurements the
jet by using a small gas box surrounding the jet (d). substrates were cut into square pieces with a edge length
of 1 by 1 cm. After plasma deposition the probes were
the large heat capacity of the shield, the expression within analyzed with a XPS spectrometer which used a Al-K-
the brackets of equation (3) is a quantity proportional to X-ray source (1486.6 eV). The spectrometer energy scale
the thermal power at the substrate, if the slopes dTS /dt was calibrated in respect to the C1S (C–C, C–H) compo-
are determined at the same environmental temperature nents set at 285 eV. For the analysis of the XPS spectra
Tenv . In order to obtain absolute values of Qin the specific the CASA XSP software [31] was employed.
heat capacity of the calorimetric probe has been deter-
mined by a known thermal power, e.g. diode laser radia-
tion. For the used calorimetric probe (copper) we obtained 3 Results and discussion
a value for CS = mc of 0.16 J/K.
3.1 Calorimetric probe
2.3 Optical emission spectroscopy The energy influx from the plasma jet to a substrate has
been measured by the calorimetric probe.
For the purpose of the optical diagnostic of the plasma The integral energy influx Qin obtained by the proce-
jet a commercial spectrometer (HVR 2000+) was used. dure described above has been measured at different axial
The emitted light from the plasma jet is collected by an distances from the nozzle, see Figure 3 (top).
optical fibre. This apparatus allows to study emission lines The measurements of the total energy influx started
in the range between 280 and 1100 nm. The sensitivity at a distance of 25 mm from the nozzle. In this rather far
is 75 photons/count at 400 nm and the optical resolution distance the plume of the plasma jet could not been de-
is 1 nm FWHM. The used spectrometer and the analysis tected by naked eyes and an energy influx was just able to
software is a commercial equipment by Ocean Optics. The measure. About 14 mm from the orifice the visible plasma
fiber optics is mounted side-on by a movable holder. By jet ends (see Fig. 1). Up to this position the total energy
this construction it is possible to measure the emission influx is in the order of about 20 mW/cm2 . When the
lines at different vertical and horizontal distances from calorimetric probe was moved closer to the nozzle along
the jet, see Figure 2b. Only relative intensities of related the plasma jet the total energy influx slowly increases and
lines have been measured in order to compare the axial at a distance of 11 mm the mean value of the energy influx
distribution of the several gas species. is ca. 50 mW/cm2 .
In order to asses and to measure the effect of free
charge carriers (electrons, ions) which may exist in the
2.4 Video imaging plasma jet plume and which contribute to the energy bal-
ance the calorimetric probe has been biased (70 V, 0 V,
In order to observe the behavior of the plasma jet in front −70 V). By probe biasing either the electrons (+70 V) are
of substrates (metal plate, insulating glass) a high speed accelerated and the ions are repelled or vice versa (−70 V).
camera (PixeLINK) which was mounted side-on has been We assume that in a rather long distance from the noz-
used (Fig. 2c). The frame rate was 1000 frames per seconds zle only very few free electrons and ions exist. However,
656 The European Physical Journal D
4
10 Ar (763 nm) A detailed description of the profiles and the con-
O (777 nm)
OH (308 nm)
volution procedure may be found in [33,34]. In general,
N (337 nm)
2
two tendencies can be observed. The maximum of ar-
gon, oxygen and OH lines is immediately at the nozzle
intensity [arb. units]
3
10
of the plasma jet. With increasing distance these sig-
nals decrease. The signal of O and OH lines vanishes at
ca. 11 mm. In comparison with visual observation (Fig. 1)
also a change in the light of the plasma jet is observable
at that position. The beam becomes smaller and the color
2
10 changes from white to light blue.
The nitrogen lines show a quite different behavior.
At the nozzle the nitrogen intensity is in the order of
40 counts ±20. The signal increases with increasing dis-
1 tance and reaches a maximum of ca. 1000 counts at about
10
0 2 4 6 8 10 12 14 16 9 mm from the nozzle. At this point the signal also de-
distance from nozzle [mm]
creases as well as any other intensities. The detectable
Fig. 4. Relative intensities of selected species, e.g. Ar, O, OH intensity for argon and nitrogen lines ends at a distance
and N2 in dependence on the distance between the spectrom- of about 14 mm. We assume that the excited (metastable)
eter and the nozzle of the plasma jet. argon atoms and the UV-radiation interact with the mole-
cules of the surrounding air. The excitation and dissoci-
ation of oxygen and water molecules is due to the UV-
50 mW/cm2 for a comparable plasma jet. For wave- radiation similar to the formation of the ozonosphere on
lengths between 115 and 200 nm a spectral radiance up earth [35]. In contrast, the nitrogen molecules are mainly
to 880 µW/mm2 sr was reported. With these results we excited due to collisions with the metastable argon atoms.
calculated an energy influx by the VUV/UV radiation to Hence, the nitrogen molecules have to diffuse into the
the calorimetric probe of 17 mW for the used probe area plasma jet from the surrounding air. Because of these
of 0.19 cm2 . The comparison between the values by Foest different mechanisms the different evolution of the axial
and our measurements shows a good agreement. line intensities can be explained. The analysis of the ar-
The maximum temperature which has been obtained gon line intensity confirmed the measurements by Foest
at the calorimetric probe under our experimental condi- et al. [2] where the formation of an argon channel is de-
tions was 55 ◦ C. The knowledge of the maximum tem- scribed which hardly interacts with the environment.
perature is very important for applications of the plasma The behavior of excitation and interaction of the am-
jet, e.g. modification of temperature sensitive surfaces or bient nitrogen with the Ar metastables has to be consid-
biomedical materials. ered for the injection of other molecular gases/precursors
into the plasma jet regarding technological application,
e.g. thin film deposition. Obviously, it is possible to inject
3.2 Optical emission spectroscopy (OES) such species into the jet at a certain distance from the
nozzle to prevent the electrode from erosion and keep the
capillary free from film growth, which may happen by a
A lot of effort has already been made in spectral charac- direct injection together with the working gas. This fact
terization of the discharge [2,7]. The most intensive argon can enhance the life time and reduces maintenance costs,
lines can be found in the spectral region between 670 and which is desired for industrial use.
970 nm. Few argon lines with a much lower intensity in
the spectra can be found at 415 and 420 nm. In addition
to the argon lines spectral lines from nitrogen, oxygen,
hydrogen and hydroxyl groups can be identified, e.g. the 3.3 Video imaging
Hα line at 656.28 nm or the hydroxyl group at 308 nm, re-
spectively. These lines are resulting from dissociation and During the visual observation of the plasma jet it was fig-
ionization (due to the plasma jet) of the surrounding at- ured out that the beam looks quite homogeneously when
mosphere which contains nitrogen, oxygen and water. The the free jet does not interact with any surfaces. In contrast,
reference lines (or wavenumbers) are taken from the NIST when the plasma jet interacts with a surface a broaden-
database [32]. ing of the plasma plume was observed. Figure 5 illustrates
As expected the intensity of the spectral lines varies such behavior of the plasma jet. In case of a free jet (left
along the plasma jet. In Figure 4 the most intensive lines photograph) a small plasma needle is formed. In case of
for argon, nitrogen, oxygen and the hydroxyl group in de- substrate material in front of the plasma jet (right photo-
pendence on the distance between the spectrometer and graph) it grows wider and the formation of filaments can
the plasma jet nozzle are shown. be observed. Note that the photos taken with a common
The Hα line is not plotted in Figure 4 because of its photo camera.
marginal intensity in front of the plasma jet orifice. At a For better visibility the region of the interaction be-
larger distance this line cannot be identified clearly. tween the plasma and the surface has been observed with
658 The European Physical Journal D
a high speed camera. The left series in Figure 6 shows Fig. 6. Temporal evolution of the plasma jet in front of a
the time evolution of the plasma beam in front of a metal conductor (copper plate) on the left and in front of an insulator
(copper) plate. The formation of some discharge channels (glass wall) on the right. The substrate is always located at
(filaments) can be clearly observed. In the right series in the bottom of the photographs. The dashed line indicates the
Figure 6 the behavior of the plasma jet in front of an insu- position of the measured light intensities evaluated in Figure 7.
lating material (glass) is shown. Here we can find a rather
quiet discharge without visible filaments. It looks like the
undisturbed free plasma jet. in a larger horizontal plane, e.g. between 5 and 80 pixels.
For deeper understanding of the plasma discharge the The formation of filaments is a common feature in opera-
c
images from the movies were analyzed by a MatLab pro- tion of microplasmas [36].
gram and plotted in color code diagrams. To get an im-
pression of the temporal evolution the single photographs
are combined to a series of e.g. 60 frames, respectively 3.4 Thin film deposition in precursor-containing
60 ms. The intensity distribution at every millisecond has atmosphere
been recorded along the line indicated in Figure 6. By
this procedure the differences in the time-dependent be- The APPJ has been designed for surface treatment, e.g.
havior of the plasma jet in front of the surfaces can be for change of wettability etc. An interesting feature is the
identified very easily. In Figure 7a the plasma jet inter- use of the APPJ for thin film deposition of slica or alu-
acts with a glass surface. The relative light intensity of mina layers, respectively, in order to protect polymer sub-
the jet is about 40% (normalized to the maximum light strates. For this purpose, silicon-containing (HMDSO) or
intensity for the metal plate). Therefore, the photograph aluminum-containing (ATI) precursors have been added
is not so bright than for the case in front of a metal plate to the jet plasma.
(Fig. 7b). The light intensity is mainly distributed between During the plasma process the HMDSO molecules dis-
25 and 55 pixels, respectively between 1.8 and 3.9 mm in sociate into C5 H15 OSi+
2 radicals and CH3 groups [3]. The
horizontal plane. This region corresponds with the region radicals can be deposited onto the substrate surface and
where the plasma beam is located (center of the jet is at form thin films. The properties of the films (hardness,
40 pixels). In contrast, in front of the copper plate (see transparency etc.) depend on the stoichiometry, e.g. on
Fig. 7b) the maximum relative intensity is 100% (normal- the composition and the percentage of SiOx . During the
ized). The position of the maximum peaks is more ran- film deposition hydrocarbon groups and carbon atoms are
domly distributed in time. also incorporated into the films. The reason for this is that
The intensity fluctuations and position of the plasma the precursor is commonly only partly dissociated. With
jet in front of the copper plate are justified by the forma- additional oxygen the ratio between silicon and oxygen
tion of small filaments (discharge channels) which “jump” in the SiOx film can be varied from polymer-like (1:1)
S. Bornholdt et al.: Characterization of an APPJ for surface modification and thin film deposition 659
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