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    DES-SE01 Reliability Test Report 20160413

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    Edgar Franco Peralta
    This QA test report summarizes reliability testing of the DES-SE01 product. Thermal stress testing was performed from 65C to 150C and the product passed. Power on/off testing was also conducted at 25C over 1000 cycles to evaluate the function in different environments. The product powered on and off correctly each time without failures, damage or degradation. All tests were completed from April 6-12, 2016 at the Advantech QA laboratory and the DES-SE01 was found to maintain stable operation under thermal stress and power cycling conditions.

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    DES-SE01 Reliability Test Report 20160413

    Uploaded by

    Edgar Franco Peralta
    104 views9 pages
    This QA test report summarizes reliability testing of the DES-SE01 product. Thermal stress testing was performed from 65C to 150C and the product passed. Power on/off testing was also conducted at 25C over 1000 cycles to evaluate the function in different environments. The product powered on and off correctly each time without failures, damage or degradation. All tests were completed from April 6-12, 2016 at the Advantech QA laboratory and the DES-SE01 was found to maintain stable operation under thermal stress and power cycling conditions.

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    DES-SE01 reliability test report 20160413

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    DES-SE01 reliability test report 20160413

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    This QA test report summarizes reliability testing of the DES-SE01 product. Thermal stress testing was performed from 65C to 150C and the product passed. Power on/off testing was also conducted at 25C over 1000 cycles to evaluate the function in different environments. The product powered on and off correctly each time without failures, damage or degradation. All tests were completed from April 6-12, 2016 at the Advantech QA laboratory and the DES-SE01 was found to maintain stable operation under thermal stress and power cycling conditions.

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
    104 views9 pages

    DES-SE01 Reliability Test Report 20160413

    Uploaded by

    Edgar Franco Peralta
    This QA test report summarizes reliability testing of the DES-SE01 product. Thermal stress testing was performed from 65C to 150C and the product passed. Power on/off testing was also conducted at 25C over 1000 cycles to evaluate the function in different environments. The product powered on and off correctly each time without failures, damage or degradation. All tests were completed from April 6-12, 2016 at the Advantech QA laboratory and the DES-SE01 was found to maintain stable operation under thermal stress and power cycling conditions.

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    © All Rights Reserved
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    You are on page 1of 9

    ISO-9001 Certified

    ISO-14000 Certified
    ISO-17025 Certified
    ADVANTECH CO., LTD.

    QA Test Report
    DES-SE01

    (Product Reliability Test)

    Report Date: Apr 13, 2016

    _______________________ _____________________ ___________________


    Elton Wang Allen.Hung Willie,Wu
    Manager Approval Test Engineer
    1.01 Thermal Stress Test
    Test Date: Apr 08~11, 2016
    Test Site: Advantech QA Laboratory
    Performed By: Willie.Wu

    1.01.1.01 Test Purpose:


    Evaluate the design limit of the EUT with thermal stress test to maintain operated stable.

    1.01.1.02 Test Standard:


    Reference to the Advantech HALT SOP (Doc. QAL-PC028)

    1.01.1.03 Test Equipment:


    1. Programmable Temperature & Humidity Chamber
    K.SON Co. Ltd
    Model: THS-D4T-150
    S/N: 5629K
    Date of Calibration: 2016/01/21
    Next Calibration date: 2017/01/20

    1.01.1.04 Sample Configuration & Quantity Under Test:


    Using One piece of DES-SE01 with the following options installed:
    1. M/B: DES-SE01 Rev.A101-2
    2. CPU: Intel N270 1.6GHz
    3. RAM:Apacer 1GB DDR2 533
    4. CFast: SQF-P10S2-8G-ETE
    5. BIOS: V1.13
    6. Power adapter: S-150-24 (DC24V)
    7. Display:ViewSonic (connected with one sample and put outside the chamber)

    1.01.1.05 Test Condition:


    1. High temperature: 65C ( the highest to 150C of chamber ability)
    2. Temperature gradient: 0.5C/min
    3. OS: WinXP 32bit
    4. Test software : Running PassMark Burn-in test 7.0 (2D,3D,serial port, usb, CPU,
    RAM,video play back, disk and network 100% loading).
    5. External Loading : +12V /2.0A

    2
    Test Result : Pass

    3
    1.02 Thermal Stress Test
    Test Date: Apr 11~12, 2016
    Test Site: Advantech QA Laboratory
    Performed By: Willie.Wu

    1.02.1.01 Test Purpose:


    Evaluate the design limit of the EUT with thermal stress test to maintain operated stable.

    1.02.1.02 Test Standard:


    Reference to the Advantech HALT SOP (Doc. QAL-PC028)

    1.02.1.03 Test Equipment:


    1. Programmable Temperature & Humidity Chamber
    K.SON Co. Ltd
    Model: THS-D4T-150
    S/N: 5629K
    Date of Calibration: 2016/01/21
    Next Calibration date: 2017/01/20

    1.02.1.04 Sample Configuration & Quantity Under Test:


    Using One piece of DES-SE01 with the following options installed:
    1. M/B: DES-SE01 Rev.A101-2
    2. CPU: Intel N270 1.6GHz
    3. RAM:Apacer 1GB DDR2 533
    4. CFast: SQF-P10S2-8G-ETE
    5. BIOS: V1.13
    6. Power adapter: S-150-12 (DC12V)
    7. Display: ViewSonic (connected with one sample and put outside the chamber)

    1.02.1.05 Test Condition:


    1. High temperature: 65C ( the highest to 150C of chamber ability)
    2. Temperature gradient: 0.5C/min
    3. OS: WinXP 32bit
    4. Test software : Running PassMark Burn-in test 7.0 (2D,3D,serial port, usb, CPU,
    RAM,video play back, disk and network 100% loading)
    5. External Loading : +12V /2.0A

    4
    1.02.1.06 Test Result : Pass

    5
    1.03 Power ON/OFF Test
    Test Date:Apr 6~7, 2016
    Test Site: Advantech QA Laboratory
    Performed By: Willie.Wu

    1.03.1.01 Test Purpose:


    Evaluate whether the power ON/OFF functions are maintained in a stable condition in
    different environment condition.

    1.03.1.02 Test Standard:


    Please refer to the following documents:
    1. IEC 60068-2-1 Testing procedures Test Ab: Cold Test.
    2. IEC 60068-2-2 Testing procedure Test Bb: Dry Heat Test.

    1.03.1.03 Sample Configuration & Quantity Under Test:


    Using One piece of DES-SE01 with the following options installed:
    1. M/B: DES-SE01 Rev.A101-2
    2. CPU: Intel N270 1.6GHz
    3. RAM:Apacer 1GB DDR2 533
    4. CFast: SQF-P10S2-8G-ETE
    5. BIOS: V1.13
    6. Power adapter: S-150-24 (DC24V)
    7. Display: ViewSonic

    1.03.1.04 Test Condition:


    1. Test temperature: 25C
    2. Total test time: each temperature 1000 times
    3. OS: DOS
    4. Power ON / OFF time interval curve
    5. External Loading : Dynamic +12V /0.5A~4.0A

    Power ON

    Power OFF

    Power ON time Power ON time

    Power OFF time Power OFF time

    1.03.1.05 Evaluation Criteria:


    1. The system continues to operate as intended after the test
    2. There should be no any time failed during 1000 times testing.

    1.03.1.06 Test Result: Pass

    6
    Test temperature Test times Test Result
    25 ℃ 1000 times 1000 times pass
    1. There is no any time failure during testing.
    2. There is no damage in electronic and mechanical functions.
    3. Degradation has not been found.
    4. Performance is maintained with no incurable physical damage or degradation.

    1.03.1.07 Conclusion: Passed

    7
    1.04 Power ON/OFF Test
    Test Date:Apr 7~8, 2016
    Test Site: Advantech QA Laboratory
    Performed By: Willie.Wu

    1.04.1.01 Test Purpose:


    Evaluate whether the power ON/OFF functions are maintained in a stable condition in
    different environment condition.

    1.04.1.02 Test Standard:


    Please refer to the following documents:
    1. IEC 60068-2-1 Testing procedures Test Ab: Cold Test.
    2. IEC 60068-2-2 Testing procedure Test Bb: Dry Heat Test.

    1.04.1.03 Sample Configuration & Quantity Under Test:


    Using One piece of DES-SE01 with the following options installed:
    1. M/B: DES-SE01 Rev.A101-2
    2. CPU: Intel N270 1.6GHz
    3. RAM:Apacer 1GB DDR2 533
    4. CFast: SQF-P10S2-8G-ETE
    5. BIOS: V1.13
    6. Power adapter: S-150-12 (DC12V)
    7. Display: ViewSonic

    1.04.1.04 Test Condition:


    1. Test temperature: 25C
    2. Total test time: each temperature 1000 times
    3. OS: DOS
    4. Power ON / OFF time interval curve
    5. External Loading : Dynamic +12V /0.5A~4.0A

    Power ON

    Power OFF

    Power ON time Power ON time

    Power OFF time Power OFF time

    1.04.1.05 Evaluation Criteria:


    1. The system continues to operate as intended after the test
    2. There should be no any time failed during 1000 times testing.

    1.04.1.06 Test Result: Pass


    Test temperature Test times Test Result

    8
    25 ℃ 1000 times 1000 times pass
    1. There is no any time failure during testing.
    2. There is no damage in electronic and mechanical functions.
    3. Degradation has not been found.
    4. Performance is maintained with no incurable physical damage or degradation.

    1.04.1.07 Conclusion: Passed

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