Fabrication Review Murry R PDF
Fabrication Review Murry R PDF
Fabrication Review Murry R PDF
Process
Murry Raditya. ST
• PhotoLithography
• Etching
• Diffusion
• Ion Implantation
• Film Deposition
• Review of Chipset Fabrication
Fabrication technique
Photolithography
• Optical Lithography
• Electron Beam Lithography
• Extreme UV Lithography
• X-Ray Lithography
• Ion Beam Lithography
Techniques
Optical Lithography
https://www.memsnet.org/
Electron Beam Lithography
Antony D. Han , University of Waterloo, 2006
Extreme UV
Lithography
Dr. J. Ruzyllo, Penn State University, 2006
• Same as Ultraviolet lithography
X-Ray
Lithography
Matt Shofnos, An-Jou Hsiung
• Ion beam sources:
SmallHMolecule
+, He+, Ga+
Additives
Negative
Substrate
Ion Beam
Lithography
Brian Ellis
Etching
Wet Chemical Etching
Chemical
Etching
Variances
• Sillicon Etching
• Sillicon Diode Etching
• Sillicon Nitride and Polysillicon Etching
• Aluminium Etching
• Galium Arsenide Etching
Sillicon Etching
Sillicon Dioxide Etching
• Plasma
• Reactive Ion Etching (RIE)
• High Density Plasma (HDP) Etching
Plasma Etching
Reactive Ion Etching
Use remote, non-capacitively coupled
plasma source (Electron cyclotron
resonance - ECR, or inductively coupled
plasma source - ICP).
• Use separate RF source as wafer bias.
This separates the plasma power (density),
from the wafer bias (ion accelerating
field).
• Very high density plasmas (1011-1012 ion
cm-3) can be achieved (faster etching).
• Lower pressures (1-10 mtorr range) can be
utilized due to higher ionization efficiency
(longer mean free path and ∴ more
anisotropic etching).
• These systems produce high etch rates,
decent selectivity, and good directionality,
High Density Plasma
while keeping ion energy and damage low.
Etching
Diffusion
• Basic Process
• Extrinsic Diffusion
• Lateral Diffusion
Diffusion
Predeposition : doping often
proceeds by an initial
predep step to introduce the
required dose of dopant into
the substrate.
Drive-In : a subsequent
drive-in anneal then
redistributes the dopant
giving the required junction
depth and surface
concentration.
Basic Concept
Methodes
Fick’s Laws ( First and Second)
Ion Implantation
• Independently control dopant profile (ion
energy) and dopant concentration (ion
current times implantation time)
• Anisotropic dopant profile
• Easy to achieve high concentration dope of
heavy dopant atom such as phosphorus and
arsenic.
Ion Implanttation
SiO2 Poly Si P+
n+ n+
P-type Silicon
Electrodeposition
A number of gases are introduced in an induction heated reactor where only the substrate is
heated. The temperature of the substrate typically must be at least 50% of the melting point
of the material to be deposited.
Evaporation
The substrate is placed in a vacuum chamber with the source material, named a target, and an
inert gas (such as argon) is introduced at low pressure. A gas plasma is struck using an RF
power source, causing the gas to become ionized. The ions are accelerated towards the surface
of the target, causing atoms of the source material to break off from the target in vapor form
and condense on all surfaces including the substrate.
Sputtering
In this process the material to be deposited is dissolved in liquid form in a
solvent. The material can be applied to the substrate by spraying or spinning.
Once the solvent is evaporated, a thin film of the material remains on the
substrate.
Casting
Review of IC
Fabrication
http://casualzone.blogspot.com/2009/12/how-chip-is-made-from-sand-to-silicon.html
Sand Ingot Wafer
Slicing
Photoresist
Exposure
Ion Implantation
Electrplating
Processor
Packaging
• “e-Beam Lithography”, Antony D Han
• “Ion Beam Lithography “, Brian Ellis
• “Extreme Ultra-Violet Lithography”, Matt Smith
References