Datasheet Intel Core 2 Duo
Datasheet Intel Core 2 Duo
Datasheet Intel Core 2 Duo
June 2009
2 Datasheet
Contents
1 Introduction .............................................................................................................. 9
1.1 Terminology ..................................................................................................... 10
1.1.1 Processor Terminology Definitions ............................................................ 10
1.2 References ....................................................................................................... 12
2 Electrical Specifications ........................................................................................... 13
2.1 Power and Ground Lands.................................................................................... 13
2.2 Decoupling Guidelines ........................................................................................ 13
2.2.1 VCC Decoupling ..................................................................................... 13
2.2.2 VTT Decoupling ...................................................................................... 13
2.2.3 FSB Decoupling...................................................................................... 14
2.3 Voltage Identification ......................................................................................... 14
2.4 Reserved, Unused, and TESTHI Signals ................................................................ 16
2.5 Power Segment Identifier (PSID)......................................................................... 16
2.6 Voltage and Current Specification ........................................................................ 17
2.6.1 Absolute Maximum and Minimum Ratings .................................................. 17
2.6.2 DC Voltage and Current Specification ........................................................ 18
2.6.3 VCC Overshoot ...................................................................................... 23
2.6.4 Die Voltage Validation ............................................................................. 24
2.7 Signaling Specifications...................................................................................... 24
2.7.1 FSB Signal Groups.................................................................................. 25
2.7.2 CMOS and Open Drain Signals ................................................................. 26
2.7.3 Processor DC Specifications ..................................................................... 27
2.7.3.1 Platform Environment Control Interface (PECI) DC Specifications..... 29
2.7.3.2 GTL+ Front Side Bus Specifications ............................................. 30
2.8 Clock Specifications ........................................................................................... 31
2.8.1 Front Side Bus Clock (BCLK[1:0]) and Processor Clocking ............................ 31
2.8.2 FSB Frequency Select Signals (BSEL[2:0])................................................. 32
2.8.3 Phase Lock Loop (PLL) and Filter .............................................................. 32
2.8.4 BCLK[1:0] Specifications ......................................................................... 32
3 Package Mechanical Specifications .......................................................................... 35
3.1 Package Mechanical Drawing............................................................................... 35
3.2 Processor Component Keep-Out Zones ................................................................. 39
3.3 Package Loading Specifications ........................................................................... 39
3.4 Package Handling Guidelines............................................................................... 39
3.5 Package Insertion Specifications.......................................................................... 40
3.6 Processor Mass Specification ............................................................................... 40
3.7 Processor Materials............................................................................................ 40
3.8 Processor Markings............................................................................................ 40
3.9 Processor Land Coordinates ................................................................................ 41
4 Land Listing and Signal Descriptions ....................................................................... 43
4.1 Processor Land Assignments ............................................................................... 43
4.2 Alphabetical Signals Reference ............................................................................ 66
5 Thermal Specifications and Design Considerations .................................................. 77
5.1 Processor Thermal Specifications ......................................................................... 77
5.1.1 Thermal Specifications ............................................................................ 77
5.1.2 Thermal Metrology ................................................................................. 81
5.2 Processor Thermal Features ................................................................................ 81
5.2.1 Thermal Monitor..................................................................................... 81
5.2.2 Thermal Monitor 2 .................................................................................. 82
5.2.3 On-Demand Mode .................................................................................. 83
5.2.4 PROCHOT# Signal .................................................................................. 84
5.2.5 THERMTRIP# Signal ............................................................................... 84
5.3 Platform Environment Control Interface (PECI) ...................................................... 85
5.3.1 Introduction .......................................................................................... 85
5.3.1.1 TCONTROL and TCC activation on PECI-Based Systems.................. 85
5.3.2 PECI Specifications ................................................................................. 86
5.3.2.1 PECI Device Address ................................................................. 86
Datasheet 3
5.3.2.2 PECI Command Support .............................................................86
5.3.2.3 PECI Fault Handling Requirements ...............................................86
5.3.2.4 PECI GetTemp0() Error Code Support ..........................................86
6 Features ..................................................................................................................87
6.1 Power-On Configuration Options ..........................................................................87
6.2 Clock Control and Low Power States .....................................................................87
6.2.1 Normal State .........................................................................................88
6.2.2 HALT and Extended HALT Powerdown States ..............................................88
6.2.2.1 HALT Powerdown State ..............................................................88
6.2.2.2 Extended HALT Powerdown State ................................................89
6.2.3 Stop Grant and Extended Stop Grant States ...............................................89
6.2.3.1 Stop-Grant State.......................................................................89
6.2.3.2 Extended Stop Grant State .........................................................90
6.2.4 Extended HALT Snoop State, HALT Snoop State, Extended
Stop Grant Snoop State, and Stop Grant Snoop State..................................90
6.2.4.1 HALT Snoop State, Stop Grant Snoop State ..................................90
6.2.4.2 Extended HALT Snoop State, Extended Stop Grant Snoop State.......90
6.2.5 Sleep State ............................................................................................90
6.2.6 Deep Sleep State....................................................................................91
6.2.7 Deeper Sleep State .................................................................................91
6.2.8 Enhanced Intel SpeedStep® Technology ....................................................92
6.3 Processor Power Status Indicator (PSI) Signal .......................................................92
7 Boxed Processor Specifications................................................................................93
7.1 Introduction ......................................................................................................93
7.2 Mechanical Specifications ....................................................................................94
7.2.1 Boxed Processor Cooling Solution Dimensions.............................................94
7.2.2 Boxed Processor Fan Heatsink Weight .......................................................95
7.2.3 Boxed Processor Retention Mechanism and Heatsink Attach Clip Assembly .....95
7.3 Electrical Requirements ......................................................................................95
7.3.1 Fan Heatsink Power Supply ......................................................................95
7.4 Thermal Specifications........................................................................................97
7.4.1 Boxed Processor Cooling Requirements......................................................97
7.4.2 Variable Speed Fan .................................................................................99
8 Debug Tools Specifications .................................................................................... 101
8.1 Logic Analyzer Interface (LAI) ........................................................................... 101
8.1.1 Mechanical Considerations ..................................................................... 101
8.1.2 Electrical Considerations ........................................................................ 101
4 Datasheet
Figures
1 Intel® Core™2 Duo Processor E8000 Series VCC Static and Transient Tolerance................ 21
2 Intel® Core™2 Duo Processor E7000 Series VCC Static and Transient Tolerance................ 23
3 VCC Overshoot Example Waveform ............................................................................. 24
4 Differential Clock Waveform ...................................................................................... 34
5 Measurement Points for Differential Clock Waveforms ................................................... 34
6 Processor Package Assembly Sketch ........................................................................... 35
7 Processor Package Drawing Sheet 1 of 3 ..................................................................... 36
8 Processor Package Drawing Sheet 2 of 3 ..................................................................... 37
9 Processor Package Drawing Sheet 3 of 3 ..................................................................... 38
10 Processor Top-Side Markings Example ........................................................................ 40
11 Processor Land Coordinates and Quadrants, Top View ................................................... 41
12 land-out Diagram (Top View – Left Side) ..................................................................... 44
13 land-out Diagram (Top View – Right Side) ................................................................... 45
14 Intel® Core™2 Duo Processor E8000 Series Thermal Profile ........................................... 79
15 Intel® Core™2 Duo Processor E7000 Series Thermal Profile ........................................... 80
16 Case Temperature (TC) Measurement Location ............................................................ 81
17 Thermal Monitor 2 Frequency and Voltage Ordering ...................................................... 83
18 Conceptual Fan Control Diagram on PECI-Based Platforms............................................. 85
19 Processor Low Power State Machine ........................................................................... 88
20 Mechanical Representation of the Boxed Processor ....................................................... 93
21 Space Requirements for the Boxed Processor (Side View).............................................. 94
22 Space Requirements for the Boxed Processor (Top View)............................................... 94
23 Overall View Space Requirements for the Boxed Processor............................................. 95
24 Boxed Processor Fan Heatsink Power Cable Connector Description .................................. 96
25 Baseboard Power Header Placement Relative to Processor Socket ................................... 97
26 Boxed Processor Fan Heatsink Airspace Keepout Requirements (side 1 view) ................... 98
27 Boxed Processor Fan Heatsink Airspace Keepout Requirements (side 2 view) ................... 98
28 Boxed Processor Fan Heatsink Set Points..................................................................... 99
Datasheet 5
Tables
1 References ..............................................................................................................12
2 Voltage Identification Definition ..................................................................................15
3 Absolute Maximum and Minimum Ratings ....................................................................17
4 Voltage and Current Specifications..............................................................................18
5 Intel® Core™2 Duo Processor E8000 Series VCC Static and Transient Tolerance ................20
6 Intel® Core™2 Duo Processor E7000 Series VCC Static and Transient Tolerance ................22
7 VCC Overshoot Specifications......................................................................................23
8 FSB Signal Groups ....................................................................................................25
9 Signal Characteristics................................................................................................26
10 Signal Reference Voltages .........................................................................................26
11 GTL+ Signal Group DC Specifications ..........................................................................27
12 Open Drain and TAP Output Signal Group DC Specifications ...........................................27
13 CMOS Signal Group DC Specifications..........................................................................28
14 PECI DC Electrical Limits ...........................................................................................29
15 GTL+ Bus Voltage Definitions .....................................................................................30
16 Core Frequency to FSB Multiplier Configuration.............................................................31
17 BSEL[2:0] Frequency Table for BCLK[1:0] ...................................................................32
18 Front Side Bus Differential BCLK Specifications .............................................................32
19 FSB Differential Clock Specifications (1333 MHz FSB) ....................................................33
20 FSB Differential Clock Specifications (1066 MHz FSB) ....................................................33
21 Processor Loading Specifications.................................................................................39
22 Package Handling Guidelines......................................................................................39
23 Processor Materials ...................................................................................................40
24 Alphabetical Land Assignments...................................................................................46
25 Numerical Land Assignment .......................................................................................56
26 Signal Description.....................................................................................................66
27 Processor Thermal Specifications ................................................................................78
28 Intel® Core™2 Duo Processor E8000 Series Thermal Profile ...........................................79
29 Intel® Core™2 Duo Processor E7000 Series Thermal Profile ...........................................80
30 GetTemp0() Error Codes ...........................................................................................86
31 Power-On Configuration Option Signals .......................................................................87
32 Fan Heatsink Power and Signal Specifications ...............................................................96
33 Fan Heatsink Power and Signal Specifications ............................................................. 100
6 Datasheet
Intel® Core™2 Duo Processor E8000
and E7000 Series Features
• Available at 3.33 GHz, 3.16 GHz, 3.00 GHz, • Advance Dynamic Execution
2.83 GHz, and 2.66 GHz for the Intel • Very deep out-of-order execution
Core™2 Duo processor E8000 series
• Enhanced branch prediction
• Available at 3.06 GHz, 2.93 GHz, 2.80 GHz, • Optimized for 32-bit applications running on
2.66 GHz, and 2.53 GHz for the Intel advanced 32-bit operating systems
Core™2 Duo processor E7000 series
• Intel® Advanced Smart Cache
• Enhanced Intel Speedstep® Technology
• 6 MB Level 2 cache (Intel Core™2 Duo
• Supports Intel® 64Φ architecture processor E8000 series only)
• Supports Intel® Virtualization Technology • 3 MB Level 2 cache (Intel Core™2 Duo
(Intel® VT) (Intel Core™2 Duo processors processor E7000 series only)
E8600, E8500, E8400, E8300, E8200 and
E7600 only) • Intel® Advanced Digital Media Boost
• Enhanced floating point and multimedia unit
• Supports Intel® Trusted Execution
for enhanced video, audio, encryption, and
Technology (Intel® TXT) (Intel Core™2 Duo
3D performance
processors E8600, E8500, E8400, E8300,
and E8200 only) • Power Management capabilities
• Supports Execute Disable Bit capability • System Management mode
• Multiple low-power states
• FSB frequency at 1333 MHz
• 8-way cache associativity provides improved
• FSB frequency at 1066 MHz (Intel Core™2 cache hit rate on load/store operations
Duo processor E7000 series only)
• 775-land Package
• Binary compatible with applications running
on previous members of the Intel
microprocessor line
The Intel® Core™2 Duo processor E8000 and E7000 series are based on the Enhanced Intel® Core™
microarchitecture. The Enhanced Intel® Core™ microarchitecture combines the performance across
applications and usages where end-users can truly appreciate and experience the performance. These
applications include Internet audio and streaming video, image processing, video content creation,
speech, 3D, CAD, games, multimedia, and multitasking user environments.
Intel® 64Φ architecture enables the processor to execute operating systems and applications written
to take advantage of the Intel 64 architecture. The processor, supporting Enhanced Intel Speedstep®
technology, allows tradeoffs to be made between performance and power consumption.
The Intel Core™2 Duo processor E8000 and E7000 series also includes the Execute Disable Bit
capability. This feature, combined with a supported operating system, allows memory to be marked
as executable or non-executable.
Virtualization Technology provides silicon-based functionality that works together with compatible
Virtual Machine Monitor (VMM) software to improve on software-only solutions.
The Intel® Trusted Execution Technology (Intel TXT) is a key element in Intel's safer computing
initiative that defines a set of hardware enhancements that interoperate with an Intel TXT enabled
operating system to help protect against software-based attacks. It creates a hardware foundation
that builds on Intel's Virtualization Technology to help protect the confidentiality and integrity of data
stored/created on the client PC.
Datasheet 7
Revision History
Revision
Description Revision Date
Number
§§
8 Datasheet
Introduction
1 Introduction
The Intel® Core™2 Duo processor E8000 and E7000 series is based on the Enhanced
Intel® Core™ microarchitecture. The Intel Enhanced Core™ microarchitecture combines
the performance of previous generation Desktop products with the power efficiencies of
a low-power microarchitecture to enable smaller, quieter systems. The Intel® Core™2
Duo processor E8000 and E7000 series are 64-bit processors that maintain
compatibility with IA-32 software.
Note: In this document, the Intel® Core™2 Duo processor E8000 and E7000 series may be
referred to as "the processor."
Note: In this document, unless otherwise specified, the Intel® Core™2 Duo processor E8000
series refers to the Intel® Core™2 Duo processors E8600, E8500, E8400, E8300,
E8200, and E8190.
Note: In this document, unless otherwise specified, the Intel® Core™2 Duo processor E7000
series refers to the Intel® Core™2 Duo processors E7600, E7500, E7400, E7300 and
E7200.
The processors use Flip-Chip Land Grid Array (FC-LGA8) package technology, and plugs
into a 775-land surface mount, Land Grid Array (LGA) socket, referred to as the
LGA775 socket.
The processors are based on 45 nm process technology. The processors feature the
Intel Advanced Smart Cache, a shared multi-core optimized cache that significantly
reduces latency to frequently used data. The Intel Core™2 Duo processor E8000 series
features a 1333 MHz front side bus (FSB) and 6 MB of L2 cache. The Intel Core™2 Duo
processor E7000 series features a 1333 MHz and 1066 MHz front side bus (FSB) and
3 MB of L2 cache. The processors support all the existing Streaming SIMD Extensions 2
(SSE2), Streaming SIMD Extensions 3 (SSE3), Supplemental Streaming SIMD
Extension 3 (SSSE3), and the Streaming SIMD Extensions 4.1 (SSE4.1). The
processors support several Advanced Technologies: Execute Disable Bit, Intel 64
architecture, and Enhanced Intel SpeedStep® Technology. The Intel Core™2 Duo
processor E8600, E8500, E8400, E8300, and E8200 support Intel Trusted Execution
Technology (Intel TXT) and Intel Virtualization Technology (Intel VT). The Intel Core™2
Duo processor E7600 supports Intel Virtualization Technology (Intel VT).
The processor's front side bus (FSB) use a split-transaction, deferred reply protocol.
The FSB uses Source-Synchronous Transfer of address and data to improve
performance by transferring data four times per bus clock (4X data transfer rate).
Along with the 4X data bus, the address bus can deliver addresses two times per bus
clock and is referred to as a "double-clocked" or 2X address bus. Working together, the
4X data bus and 2X address bus provide a data bus bandwidth of up to 10.7 GB/s.
Intel has enabled support components for the processor including heatsink, heatsink
retention mechanism, and socket. Manufacturability is a high priority; hence,
mechanical assembly may be completed from the top of the baseboard and should not
require any special tooling.
Datasheet 9
Introduction
1.1 Terminology
A ‘#’ symbol after a signal name refers to an active low signal, indicating a signal is in
the active state when driven to a low level. For example, when RESET# is low, a reset
has been requested. Conversely, when NMI is high, a nonmaskable interrupt has
occurred. In the case of signals where the name does not imply an active state but
describes part of a binary sequence (such as address or data), the ‘#’ symbol implies
that the signal is inverted. For example, D[3:0] = ‘HLHL’ refers to a hex ‘A’, and
D[3:0]# = ‘LHLH’ also refers to a hex ‘A’ (H= High logic level, L= Low logic level).
“Front Side Bus” refers to the interface between the processor and system core logic
(a.k.a. the chipset components). The FSB is a multiprocessing interface to processors,
memory, and I/O.
10 Datasheet
Introduction
Datasheet 11
Introduction
1.2 References
Material and concepts available in the following documents may be beneficial when
reading this document.
Table 1. References
Document Location
www.intel.com/design/
Intel® Core™2 Duo Processor E8000 and E7000 Series Specification
processor/specupdt/
Update
318733.htm
Intel® Core™2 Duo Processor E8000 and E7000 Series and Intel® www.intel.com/design/
Pentium Dual-Core Processor E6000 and E5000 Series Thermal and processor/designex/
Mechanical Design Guidelines 318734.htm
http://www.intel.com/
Voltage Regulator-Down (VRD) 11.0 Processor Power Delivery Design
design/processor/
Guidelines For Desktop LGA775 Socket
applnots/313214.htm
http://intel.com/design/
LGA775 Socket Mechanical Design Guide Pentium4/guides/
302666.htm
Intel® 64 and IA-32 Intel Architecture Software Developer's Manuals
Volume 1: Basic Architecture
Volume 2A: Instruction Set Reference, A-M
http://www.intel.com/
Volume 2B: Instruction Set Reference, N-Z products/processor/
manuals/
Volume 3A: System Programming Guide, Part 1
Volume 3B: System Programming Guide, Part 2
12 Datasheet
Electrical Specifications
2 Electrical Specifications
This chapter describes the electrical characteristics of the processor interfaces and
signals. DC electrical characteristics are provided.
The signals denoted as VTT provide termination for the front side bus and power to the
I/O buffers. A separate supply must be implemented for these lands, that meets the
VTT specifications outlined in Table 4.
Datasheet 13
Electrical Specifications
Note: To support the Deeper Sleep State the platform must use a VRD 11.1 compliant
solution. The Deeper Sleep State also requires additional platform support.
Individual processor VID values may be calibrated during manufacturing such that two
devices at the same core speed may have different default VID settings. This is
reflected by the VID Range values provided in Table 4. Refer to the Intel® Core™2 Duo
Processor E8000 and E7000 Series Specification Update for further details on specific
valid core frequency and VID values of the processor. Note that this differs from the
VID employed by the processor during a power management event (Thermal Monitor 2,
Enhanced Intel SpeedStep® technology, or Extended HALT State).
The processor uses eight voltage identification signals, VID[7:0], to support automatic
selection of power supply voltages. Table 2 specifies the voltage level corresponding to
the state of VID[7:0]. A ‘1’ in this table refers to a high voltage level and a ‘0’ refers to
a low voltage level. If the processor socket is empty (VID[7:0] = 11111110), or the
voltage regulation circuit cannot supply the voltage that is requested, it must disable
itself.
The processor provides the ability to operate while transitioning to an adjacent VID and
its associated processor core voltage (VCC). This will represent a DC shift in the load
line. It should be noted that a low-to-high or high-to-low voltage state change may
result in as many VID transitions as necessary to reach the target core voltage.
Transitions above the specified VID are not permitted. Table 4 includes VID step sizes
and DC shift ranges. Minimum and maximum voltages must be maintained as shown in
Table 5, Figure 1, Table 6, and Figure 2, as measured across the VCC_SENSE and
VSS_SENSE lands.
The VRM or VRD utilized must be capable of regulating its output to the value defined
by the new VID. DC specifications for dynamic VID transitions are included in Table 4
and Table 5. Refer to the Voltage Regulator Design Guide for further details.
14 Datasheet
Electrical Specifications
Datasheet 15
Electrical Specifications
In a system level design, on-die termination has been included by the processor to
allow signals to be terminated within the processor silicon. Most unused GTL+ inputs
should be left as no connects as GTL+ termination is provided on the processor silicon.
However, see Table 8 for details on GTL+ signals that do not include on-die termination.
Unused active high inputs, should be connected through a resistor to ground (VSS).
Unused outputs can be left unconnected, however this may interfere with some TAP
functions, complicate debug probing, and prevent boundary scan testing. A resistor
must be used when tying bidirectional signals to power or ground. When tying any
signal to power or ground, a resistor will also allow for system testability. Resistor
values should be within ± 20% of the impedance of the motherboard trace for front
side bus signals. For unused GTL+ input or I/O signals, use pull-up resistors of the
same value as the on-die termination resistors (RTT). For details see Table 15.
TAP and CMOS signals do not include on-die termination. Inputs and utilized outputs
must be terminated on the motherboard. Unused outputs may be terminated on the
motherboard or left unconnected. Note that leaving unused outputs unterminated may
interfere with some TAP functions, complicate debug probing, and prevent boundary
scan testing.
The TESTHI signals may use individual pull-up resistors or be grouped together as
detailed below. A matched resistor must be used for each group:
• TESTHI[1:0]
• TESTHI[7:2]
• TESTHI8/FC42 – cannot be grouped with other TESTHI signals
• TESTHI9/FC43 – cannot be grouped with other TESTHI signals
• TESTHI10 – cannot be grouped with other TESTHI signals
• TESTHI12/FC44 – cannot be grouped with other TESTHI signals
Terminating multiple TESTHI pins together with a single pull-up resistor is not
recommended for designs supporting boundary scan for proper Boundary Scan testing
of the TESTHI signals. For optimum noise margin, all pull-up resistor values used for
TESTHI[12,10:0] lands should have a resistance value within ± 20% of the impedance
of the board transmission line traces. For example, if the nominal trace impedance is
50 Ω, then a value between 40 Ω and 60 Ω should be used.
16 Datasheet
Electrical Specifications
Although the processor contains protective circuitry to resist damage from static
electric discharge, precautions should always be taken to avoid high static voltages or
electric fields.
NOTES:
1. For functional operation, all processor electrical, signal quality, mechanical and thermal
specifications must be satisfied.
2. Excessive overshoot or undershoot on any signal will likely result in permanent damage to
the processor.
3. Storage temperature is applicable to storage conditions only. In this scenario, the
processor must not receive a clock, and no lands can be connected to a voltage bias.
Storage within these limits will not affect the long-term reliability of the device. For
functional operation, refer to the processor case temperature specifications.
4. This rating applies to the processor and does not include any tray or packaging.
5. Failure to adhere to this specification can affect the long term reliability of the processor.
Datasheet 17
Electrical Specifications
18 Datasheet
Electrical Specifications
NOTES:
1. Each processor is programmed with a maximum valid voltage identification value (VID),
which is set at manufacturing and can not be altered. Individual maximum VID values are
calibrated during manufacturing such that two processors at the same frequency may have
different settings within the VID range. Note that this differs from the VID employed by the
processor during a power management event (Thermal Monitor 2, Enhanced Intel
SpeedStep® technology, or Extended HALT State).
2. Unless otherwise noted, all specifications in this table are based on estimates and
simulations or empirical data. These specifications will be updated with characterized data
from silicon measurements at a later date.
3. These voltages are targets only. A variable voltage source should exist on systems in the
event that a different voltage is required. See Section 2.3 and Table 2 for more
information.
4. The voltage specification requirements are measured across VCC_SENSE and VSS_SENSE
lands at the socket with a 100 MHz bandwidth oscilloscope, 1.5 pF maximum probe
capacitance, and 1 MΩ minimum impedance. The maximum length of ground wire on the
probe should be less than 5 mm. Ensure external noise from the system is not coupled into
the oscilloscope probe.
5. Refer to Table 5, Figure 1, Table 6, and Figure 2 for the minimum, typical, and maximum
VCC allowed for a given current. The processor should not be subjected to any VCC and ICC
combination wherein VCC exceeds VCC_MAX for a given current.
6. ICC_MAX specification is based on VCC_MAX loadline. Refer to Figure 1 for details.
7. VTT must be provided using a separate voltage source and not be connected to VCC. This
specification is measured at the land.
8. Baseboard bandwidth is limited to 20 MHz.
9. This is the maximum total current drawn from the VTT plane by only the processor. This
specification does not include the current coming from on-board termination (RTT),
through the signal line. Refer to the Voltage Regulator Design Guide to determine the total
ITT drawn by the system. This parameter is based on design characterization and is not
tested.
10. Adherence to the voltage specifications for the processor are required to ensure reliable
processor operation.
Datasheet 19
Electrical Specifications
Table 5. Intel® Core™2 Duo Processor E8000 Series VCC Static and Transient
Tolerance
Voltage Deviation from VID Setting (V)1, 2, 3, 4
ICC (A) Maximum Voltage Typical Voltage Minimum Voltage
1.40 mΩ 1.48 mΩ 1.55 mΩ
0 0.000 -0.019 -0.038
5 -0.007 -0.026 -0.046
10 -0.014 -0.034 -0.054
15 -0.021 -0.041 -0.061
20 -0.028 -0.049 -0.069
25 -0.035 -0.056 -0.077
30 -0.042 -0.063 -0.085
35 -0.049 -0.071 -0.092
40 -0.056 -0.078 -0.100
45 -0.063 -0.085 -0.108
50 -0.070 -0.093 -0.116
55 -0.077 -0.100 -0.123
60 -0.084 -0.108 -0.131
65 -0.091 -0.115 -0.139
70 -0.098 -0.122 -0.147
75 -0.105 -0.130 -0.154
NOTES:
1. The loadline specification includes both static and transient limits except for overshoot
allowed as shown in Section 2.6.3.
2. This table is intended to aid in reading discrete points on Figure 1.
3. The loadlines specify voltage limits at the die measured at the VCC_SENSE and
VSS_SENSE lands. Voltage regulation feedback for voltage regulator circuits must be taken
from processor VCC and VSS lands. Refer to the Voltage Regulator Design Guide for socket
loadline guidelines and VR implementation details.
4. Adherence to this loadline specification is required to ensure reliable processor operation.
20 Datasheet
Electrical Specifications
Figure 1. Intel® Core™2 Duo Processor E8000 Series VCC Static and Transient
Tolerance
Icc [A]
0 5 10 15 20 25 30 35 40 45 50 55 60 65 70 75
VID - 0.000
VID - 0.013
VID - 0.038
VID - 0.050
VID - 0.063
VID - 0.088
VID - 0.100
Vcc Minimum
VID - 0.113
VID - 0.125
VID - 0.138
VID - 0.150
VID - 0.163
NOTES:
1. The loadline specification includes both static and transient limits except for overshoot
allowed as shown in Section 2.6.3.
2. This loadline specification shows the deviation from the VID set point.
3. The loadlines specify voltage limits at the die measured at the VCC_SENSE and
VSS_SENSE lands. Voltage regulation feedback for voltage regulator circuits must be taken
from processor VCC and VSS lands. Refer to the Voltage Regulator Design Guide for socket
loadline guidelines and VR implementation details.
Datasheet 21
Electrical Specifications
Table 6. Intel® Core™2 Duo Processor E7000 Series VCC Static and Transient
Tolerance
Voltage Deviation from VID Setting (V)1, 2, 3, 4
ICC (A)
Maximum Voltage Typical Voltage Minimum Voltage
1.65 mΩ 1.73 mΩ 1.80 mΩ
22 Datasheet
Electrical Specifications
Figure 2. Intel® Core™2 Duo Processor E7000 Series VCC Static and Transient
Tolerance
Icc [A]
0 5 10 15 20 25 30 35 40 45 50 55 60 65 70 75
VID - 0.000
VID - 0.013
VID - 0.025
Vcc Maximum
VID - 0.038
VID - 0.050
VID - 0.063
VID - 0.075
VID - 0.100
VID - 0.113
VID - 0.138
VID - 0.150
VID - 0.163
VID - 0.175
VID - 0.188
NOTES:
1. The loadline specification includes both static and transient limits except for overshoot allowed as shown in
Section 2.6.3.
2. This loadline specification shows the deviation from the VID set point.
3. The loadlines specify voltage limits at the die measured at the VCC_SENSE and VSS_SENSE lands. Voltage
regulation feedback for voltage regulator circuits must be taken from processor VCC and VSS lands. Refer
to the Voltage Regulator Design Guide for socket loadline guidelines and VR implementation details.
Datasheet 23
Electrical Specifications
VID - 0.000
TOS
0 5 10 15 20 25
Time [us]
NOTES:
1. VOS is measured overshoot voltage.
2. TOS is measured time duration above VID.
The GTL+ inputs require a reference voltage (GTLREF) which is used by the receivers to
determine if a signal is a logical 0 or a logical 1. GTLREF must be generated on the
motherboard (see Table 15 for GTLREF specifications). Termination resistors (RTT) for
GTL+ signals are provided on the processor silicon and are terminated to VTT. Intel
chipsets will also provide on-die termination, thus eliminating the need to terminate the
bus on the motherboard for most GTL+ signals.
24 Datasheet
Electrical Specifications
With the implementation of a source synchronous data bus comes the need to specify
two sets of timing parameters. One set is for common clock signals which are
dependent upon the rising edge of BCLK0 (ADS#, HIT#, HITM#, etc.) and the second
set is for the source synchronous signals which are relative to their respective strobe
lines (data and address) as well as the rising edge of BCLK0. Asychronous signals are
still present (A20M#, IGNNE#, etc.) and can become active at any time during the
clock cycle. Table 8 identifies which signals are common clock, source synchronous,
and asynchronous.
Table 8. FSB Signal Groups
Signal Group Type Signals1
Synchronous to
GTL+ Strobes ADSTB[1:0]#, DSTBP[3:0]#, DSTBN[3:0]#
BCLK[1:0]
A20M#, DPRSTP#. DPSLP#, IGNNE#, INIT#, LINT0/
CMOS INTR, LINT1/NMI, SMI#3, STPCLK#, PWRGOOD, SLP#,
TCK, TDI, TMS, TRST#, BSEL[2:0], VID[7:0], PSI#
Open Drain Output FERR#/PBE#, IERR#, THERMTRIP#, TDO
Open Drain Input/
PROCHOT#4
Output
FSB Clock Clock BCLK[1:0], ITP_CLK[1:0]2
VCC, VTT, VCCA, VCCIOPLL, VCCPLL, VSS, VSSA,
GTLREF[1:0], COMP[8,3:0], RESERVED,
TESTHI[12,10:0], VCC_SENSE,
Power/Other
VCC_MB_REGULATION, VSS_SENSE,
VSS_MB_REGULATION, DBR#2, VTT_OUT_LEFT,
VTT_OUT_RIGHT, VTT_SEL, FCx, PECI, MSID[1:0]
NOTES:
1. Refer to Section 4.2 for signal descriptions.
2. In processor systems where no debug port is implemented on the system board, these
signals are used to support a debug port interposer. In systems with the debug port
implemented on the system board, these signals are no connects.
Datasheet 25
Electrical Specifications
3. The value of these signals during the active-to-inactive edge of RESET# defines the
processor configuration options. See Section 6.1 for details.
4. PROCHOT# signal type is open drain output and CMOS input.
.
NOTES:
1. Signals that do not have RTT, nor are actively driven to their high-voltage level.
GTLREF VTT/2
NOTE:
1. See Table 12 for more information.
26 Datasheet
Electrical Specifications
NOTES:
1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2. VIL is defined as the voltage range at a receiving agent that will be interpreted as a logical
low value.
3. VIH is defined as the voltage range at a receiving agent that will be interpreted as a logical
high value.
4. VIH and VOH may experience excursions above VTT.
5. The VTT referred to in these specifications is the instantaneous VTT.
6. Leakage to VSS with land held at VTT.
7. Leakage to VTT with land held at 300 mV.
Table 12. Open Drain and TAP Output Signal Group DC Specifications
NOTES:
1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2. Measured at VTT * 0.2 V.
3. For Vin between 0 and VOH.
Datasheet 27
Electrical Specifications
Symb
Parameter Min Max Unit Notes1
ol
NOTES:
1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2. All outputs are open drain.
3. VIL is defined as the voltage range at a receiving agent that will be interpreted as a logical
low value.
4. VIH is defined as the voltage range at a receiving agent that will be interpreted as a logical
high value.
5. VIH and VOH may experience excursions above VTT.
6. The VTT referred to in these specifications refers to instantaneous VTT.
7. IOL is measured at 0.10 * VTT. IOH is measured at 0.90 * VTT.
8. Leakage to VSS with land held at VTT.
9. Leakage to VTT with land held at 300 mV.
28 Datasheet
Electrical Specifications
Datasheet 29
Electrical Specifications
Valid high and low levels are determined by the input buffers by comparing with a
reference voltage called GTLREF. Table 15 lists the GTLREF specifications. The GTL+
reference voltage (GTLREF) should be generated on the system board using high
precision voltage divider circuits.
NOTES:
1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2. GTLREF is to be generated from VTT by a voltage divider of 1% resistors. If an Adjustable
GTLREF circuit is used on the board (for Quad-Core processors compatibility), the two
GTLREF lands connected to the Adjustable GTLREF circuit require the following:
GTLREF_PU = 50 Ω, GTLREF_PD = 100 Ω.
3. RTT is the on-die termination resistance measured at VTT/3 of the GTL+ output driver.
4. COMP resistance must be provided on the system board with 1% resistors. COMP[3:0] and
COMP8 resistors are to VSS.
30 Datasheet
Electrical Specifications
The processor uses a differential clocking implementation. For more information on the
processor clocking, contact your Intel field representative.
NOTES:
1. Individual processors operate only at or below the rated frequency.
2. Listed frequencies are not necessarily committed production frequencies.
Datasheet 31
Electrical Specifications
The Intel® Core™2 Duo processor E7000 series operates at a 1333 MHz FSB and
1066 MHz FSB frequency (selected by a 333 MHz BCLK[1:0] or 266 MHz BCLK[1:0]
frequency). The Intel® Core™2 Duo processor E8000 series operates at a 1333 MHz
FSB frequency (selected by a 333 MHz BCLK[1:0] frequency). Individual processors will
only operate at their specified FSB frequency.
L L L 266 MHz
L L H Reserved
L H H Reserved
L H L Reserved
H H L Reserved
H H H Reserved
H L H Reserved
H L L 333 MHz
NOTES:
1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2. Crossing voltage is defined as the instantaneous voltage value when the rising edge of
BCLK0 equals the falling edge of BCLK1.
3. “Steady state” voltage, not including overshoot or undershoot.
32 Datasheet
Electrical Specifications
4. Overshoot is defined as the absolute value of the maximum voltage. Undershoot is defined
as the absolute value of the minimum voltage.
5. Measurement taken from differential waveform.
NOTES:
1. Unless otherwise noted, all specifications in this table apply to all processor core
frequencies based on a 333 MHz BCLK[1:0].
2. The period specified here is the average period. A given period may vary from this
specification as governed by the period stability specification (T2). The Min period
specification is based on -300 PPM deviation from a 3 ns period. The Max period
specification is based on the summation of +300 PPM deviation from a 3 ns period and a
+0.5% maximum variance due to spread spectrum clocking.
3. In this context, period stability is defined as the worst case timing difference between
successive crossover voltages. In other words, the largest absolute difference between
adjacent clock periods must be less than the period stability.
4. Slew rate is measured through the VSWING voltage range centered about differential zero.
Measurement taken from differential waveform.
5. Matching applies to rising edge rate for Clock and falling edge rate for Clock#. It is
measured using a ±75 mV window centered on the average cross point where Clock rising
meets Clock# falling. The median cross point is used to calculate the voltage thresholds
the oscilloscope is to use for the edge rate calculations.
6. Duty Cycle (High time/Period) must be between 40 and 60%
NOTES:
1. Unless otherwise noted, all specifications in this table apply to all processor core
frequencies based on a 266 MHz BCLK[1:0].
2. The period specified here is the average period. A given period may vary from this
specification as governed by the period stability specification (T2). The Min period
specification is based on -300 PPM deviation from a 3.75 ns period. The Max period
specification is based on the summation of +300 PPM deviation from a 3.75 ns period and
a +0.5% maximum variance due to spread spectrum clocking.
3. In this context, period stability is defined as the worst case timing difference between
successive crossover voltages. In other words, the largest absolute difference between
adjacent clock periods must be less than the period stability.
4. Slew rate is measured through the VSWING voltage range centered about differential zero.
Measurement taken from differential waveform.
Datasheet 33
Electrical Specifications
5. Matching applies to rising edge rate for Clock and falling edge rate for Clock#. It is
measured using a ±75 mV window centered on the average cross point where Clock rising
meets Clock# falling. The median cross point is used to calculate the voltage thresholds
the oscilloscope is to use for the edge rate calculations.
6. Duty Cycle (High time/Period) must be between 40 and 60%
Tph
Overshoot
BCLK1 VH
Rising Edge
Ringback
Ringback
Threshold V CROSS (ABS) V CROSS (ABS) Margin
Region
Falling Edge
Ringback
BCLK0
VL
Undershoot
Tpl
Tp
+150 mV +150mV
-150 mV -150mV
Diff
T5 = BCLK[1:0] rise and fall time through the swing region
§§
34 Datasheet
Package Mechanical Specifications
3 Package Mechanical
Specifications
The processor is packaged in a Flip-Chip Land Grid Array (FC-LGA8) package that
interfaces with the motherboard using an LGA775 socket. The package consists of a
processor core mounted on a substrate land-carrier. An integrated heat spreader (IHS)
is attached to the package substrate and core and serves as the mating surface for
processor component thermal solutions, such as a heatsink. Figure 6 shows a sketch of
the processor package components and how they are assembled together. Refer to the
LGA775 Socket Mechanical Design Guide for complete details on the LGA775 socket.
Capacitors
LGA775 Socket
System Board
Processor_Pkg_Assembly_775
NOTE:
1. Socket and motherboard are included for reference and are not part of processor package.
Datasheet 35
Package Mechanical Specifications
36 Datasheet
Package Mechanical Specifications
Datasheet 37
Package Mechanical Specifications
38 Datasheet
Package Mechanical Specifications
NOTES:
1. These specifications apply to uniform compressive loading in a direction normal to the
processor IHS.
2. This is the maximum force that can be applied by a heatsink retention clip. The clip must
also provide the minimum specified load on the processor package.
3. These specifications are based on limited testing for design characterization. Loading limits
are for the package only and do not include the limits of the processor socket.
4. Dynamic loading is defined as an 11 ms duration average load superimposed on the static
load requirement.
NOTES:
1. A shear load is defined as a load applied to the IHS in a direction parallel to the IHS top
surface.
2. A tensile load is defined as a pulling load applied to the IHS in a direction normal to the
IHS surface.
3. A torque load is defined as a twisting load applied to the IHS in an axis of rotation normal
to the IHS top surface.
4. These guidelines are based on limited testing for design characterization.
Datasheet 39
Package Mechanical Specifications
Component Material
ATPO
S/N
40 Datasheet
Package Mechanical Specifications
VCC / VSS
30 29 28 27 26 25 24 23 22 21 20 19 18 17 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1
AN AN
AM AM
AL AL
AK AK
AJ AJ
AH AH
AG AG
AF AF
AE AE
AD AD
AC AC
AB AB
AA AA
Y Y
W W Address/
V
U
Socket 775 V
U
Common Clock/
T
R
Quadrants T
R
Async
P
N
Top View P
N
M M
L L
K K
J J
H H
G G
F F
E E
D D
C C
B B
A A
30 29 28 27 26 25 24 23 22 21 20 19 18 17 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1
Datasheet 41
Package Mechanical Specifications
42 Datasheet
Land Listing and Signal Descriptions
Datasheet 43
Land Listing and Signal Descriptions
AN
VCC VCC VSS VSS VCC VCC VSS VSS VCC VCC VSS VCC VCC VSS VSS VCC
AM VCC VCC VSS VSS VCC VCC VSS VSS VCC VCC VSS VCC VCC VSS VSS VCC
AL VCC VCC VSS VSS VCC VCC VSS VSS VCC VCC VSS VCC VCC VSS VSS VCC
AK VSS VSS VSS VSS VCC VCC VSS VSS VCC VCC VSS VCC VCC VSS VSS VCC
AJ VSS VSS VSS VSS VCC VCC VSS VSS VCC VCC VSS VCC VCC VSS VSS VCC
AH VCC VCC VCC VCC VCC VCC VSS VSS VCC VCC VSS VCC VCC VSS VSS VCC
AG VCC VCC VCC VCC VCC VCC VSS VSS VCC VCC VSS VCC VCC VSS VSS VCC
AF VSS VSS VSS VSS VSS VSS VSS VSS VCC VCC VSS VCC VCC VSS VSS VCC
AE VSS VSS VSS VSS VSS VSS VSS VCC VCC VCC VSS VCC VCC VSS VSS VCC
J
VCC VCC VCC VCC VCC VCC VCC VCC VCC VCC VCC VCC VCC FC34 FC31 VCC
H
BSEL1 FC15 VSS VSS VSS VSS VSS VSS VSS VSS VSS VSS VSS VSS FC33 FC32
G BSEL2 BSEL0 BCLK1 TESTHI4 TESTHI5 TESTHI3 TESTHI6 RESET# D47# D44# DSTBN2# DSTBP2# D35# D36# D32# D31#
F RSVD BCLK0 VTT_SEL TESTHI0 TESTHI2 TESTHI7 RSVD VSS D43# D41# VSS D38# D37# VSS D30#
E FC26 VSS VSS VSS VSS FC10 RSVD D45# D42# VSS D40# D39# VSS D34# D33#
D VTT VTT VTT VTT VTT VTT VSS VCCPLL D46# VSS D48# DBI2# VSS D49# RSVD VSS
VCCIO
C VTT VTT VTT VTT VTT VTT VSS VSS D58# DBI3# VSS D54# DSTBP3# VSS D51#
PLL
B VTT VTT VTT VTT VTT VTT VSS VSSA D63# D59# VSS D60# D57# VSS D55# D53#
A VTT VTT VTT VTT VTT VTT FC23 VCCA D62# VSS RSVD D61# VSS D56# DSTBN3# VSS
30 29 28 27 26 25 24 23 22 21 20 19 18 17 16 15
44 Datasheet
Land Listing and Signal Descriptions
VCC VSS VCC VCC VSS VCC VCC VID7 FC40 VID6 VSS VID2 VID0 VSS AM
VCC VSS VCC VCC VSS VCC VCC VSS VID3 VID1 VID5 VRDSEL PROCHOT# FC25 AL
VCC VSS VCC VCC VSS VCC VCC VSS FC8 VSS VID4 ITP_CLK0 VSS FC24 AK
VCC VSS VCC VCC VSS VCC VCC VSS A35# A34# VSS ITP_CLK1 BPM0# BPM1# AJ
VCC VSS VCC VCC VSS VCC VCC VSS VSS A33# A32# VSS RSVD VSS AH
VCC VSS VCC VCC VSS VCC VCC VSS A29# A31# A30# BPM5# BPM3# TRST# AG
VCC VSS VCC VCC VSS VCC VCC VSS VSS A27# A28# VSS BPM4# TDO AF
VCC VSS VCC VCC VSS VCC SKTOCC# VSS RSVD VSS RSVD FC18 VSS TCK AE
VTT_OUT_
VCC VSS VSS A23# A21# VSS FC39 AA
RIGHT
FC0/
VCC VSS A19# VSS A20# PSII# VSS Y
BOOTSELECT
TESTHI12/
VCC VSS A18# A16# VSS TESTHI1 MSID0 W
FC44
FERR#/
VCC VSS ADSTB0# VSS A8# VSS COMP3 R
PBE#
VTT_OUT_
VCC VCC VCC VCC VCC VCC VCC VSS REQ4# REQ1# VSS FC22 FC3 J
LEFT
H
VSS VSS VSS VSS VSS VSS VSS VSS VSS TESTHI10 FC35 VSS GTLREF1 GTLREF0
TESTHI9/ TESTHI8/
D29# D27# DSTBN1# DBI1# FC38 D16# BPRI# DEFER# RSVD PECI COMP2 FC27 G
FC43 FC42
D28# VSS D24# D23# VSS D18# D17# VSS FC21 RS1# VSS BR0# FC5 F
VSS D26# DSTBP1# VSS D21# D19# VSS RSVD RSVD FC20 HITM# TRDY# VSS E
RSVD D25# VSS D15# D22# VSS D12# D20# VSS VSS HIT# VSS ADS# RSVD D
C
D52# VSS D14# D11# VSS FC41 DSTBN0# VSS D3# D1# VSS LOCK# BNR# DRDY#
VSS COMP8 D13# VSS D10# DSTBP0# VSS D6# D5# VSS D0# RS0# DBSY# VSS B
D50# COMP0 VSS D9# D8# VSS DBI0# D7# VSS D4# D2# RS2# VSS A
14 13 12 11 10 9 8 7 6 5 4 3 2 1
Datasheet 45
Land Listing and Signal Descriptions
A28# AF4 Source Synch Input/Output D8# A10 Source Synch Input/Output
A29# AG6 Source Synch Input/Output D9# A11 Source Synch Input/Output
A30# AG4 Source Synch Input/Output D10# B10 Source Synch Input/Output
A31# AG5 Source Synch Input/Output D11# C11 Source Synch Input/Output
A33# AH5 Source Synch Input/Output D13# B12 Source Synch Input/Output
A34# AJ5 Source Synch Input/Output D14# C12 Source Synch Input/Output
A35# AJ6 Source Synch Input/Output D15# D11 Source Synch Input/Output
46 Datasheet
Land Listing and Signal Descriptions
D22# D10 Source Synch Input/Output D61# A19 Source Synch Input/Output
D23# F11 Source Synch Input/Output D62# A22 Source Synch Input/Output
D24# F12 Source Synch Input/Output D63# B22 Source Synch Input/Output
D26# E13 Source Synch Input/Output DBI1# G11 Source Synch Input/Output
D27# G13 Source Synch Input/Output DBI2# D19 Source Synch Input/Output
D28# F14 Source Synch Input/Output DBI3# C20 Source Synch Input/Output
D36# G17 Source Synch Input/Output DSTBN1# G12 Source Synch Input/Output
D37# F17 Source Synch Input/Output DSTBN2# G20 Source Synch Input/Output
D38# F18 Source Synch Input/Output DSTBN3# A16 Source Synch Input/Output
D40# E19 Source Synch Input/Output DSTBP1# E12 Source Synch Input/Output
D41# F20 Source Synch Input/Output DSTBP2# G19 Source Synch Input/Output
D42# E21 Source Synch Input/Output DSTBP3# C17 Source Synch Input/Output
Datasheet 47
Land Listing and Signal Descriptions
48 Datasheet
Land Listing and Signal Descriptions
Datasheet 49
Land Listing and Signal Descriptions
50 Datasheet
Land Listing and Signal Descriptions
Datasheet 51
Land Listing and Signal Descriptions
52 Datasheet
Land Listing and Signal Descriptions
Datasheet 53
Land Listing and Signal Descriptions
54 Datasheet
Land Listing and Signal Descriptions
VSS V6 Power/Other
VSS V7 Power/Other
VSS W4 Power/Other
Datasheet 55
Land Listing and Signal Descriptions
A10 D08# Source Synch Input/Output B19 D60# Source Synch Input/Output
56 Datasheet
Land Listing and Signal Descriptions
D11 D15# Source Synch Input/Output E21 D42# Source Synch Input/Output
Datasheet 57
Land Listing and Signal Descriptions
F11 D23# Source Synch Input/Output G20 DSTBN2# Source Synch Input/Output
F12 D24# Source Synch Input/Output G21 D44# Source Synch Input/Output
F14 D28# Source Synch Input/Output G23 RESET# Common Clock Input
F20 D41# Source Synch Input/Output G29 BSEL0 Asynch CMOS Output
F21 D43# Source Synch Input/Output G30 BSEL2 Asynch CMOS Output
58 Datasheet
Land Listing and Signal Descriptions
Datasheet 59
Land Listing and Signal Descriptions
60 Datasheet
Land Listing and Signal Descriptions
Datasheet 61
Land Listing and Signal Descriptions
62 Datasheet
Land Listing and Signal Descriptions
Datasheet 63
Land Listing and Signal Descriptions
64 Datasheet
Land Listing and Signal Descriptions
Datasheet 65
Land Listing and Signal Descriptions
66 Datasheet
Land Listing and Signal Descriptions
Datasheet 67
Land Listing and Signal Descriptions
D[63:0]# (Data) are the data signals. These signals provide a 64-
bit data path between the processor FSB agents, and must connect
the appropriate pins/lands on all such agents. The data driver
asserts DRDY# to indicate a valid data transfer.
D[63:0]# are quad-pumped signals and will, thus, be driven four
times in a common clock period. D[63:0]# are latched off the
falling edge of both DSTBP[3:0]# and DSTBN[3:0]#. Each group of
16 data signals correspond to a pair of one DSTBP# and one
DSTBN#. The following table shows the grouping of data signals to
data strobes and DBI#.
D[15:0]# 0 0
D[31:16]# 1 1
D[47:32]# 2 2
D[63:48]# 3 3
DBI3# D[63:48]#
DBI2# D[47:32]#
DBI1# D[31:16]#
DBI0# D[15:0]#
68 Datasheet
Land Listing and Signal Descriptions
Datasheet 69
Land Listing and Signal Descriptions
70 Datasheet
Land Listing and Signal Descriptions
Datasheet 71
Land Listing and Signal Descriptions
72 Datasheet
Land Listing and Signal Descriptions
Datasheet 73
Land Listing and Signal Descriptions
74 Datasheet
Land Listing and Signal Descriptions
The VTT_SEL signal is used to select the correct VTT voltage level
VTT_SEL Output for the processor. This land is connected internally in the package
to VSS.
75 Datasheet
Land Listing and Signal Descriptions
76 Datasheet
Thermal Specifications and Design Considerations
A complete thermal solution includes both component and system level thermal
management features. Component level thermal solutions can include active or passive
heatsinks attached to the processor Integrated Heat Spreader (IHS). Typical system
level thermal solutions may consist of system fans combined with ducting and venting.
For more information on designing a component level thermal solution, refer to the
appropriate Thermal and Mechanical Design Guidelines (see Section 1.2).
Note: The boxed processor will ship with a component thermal solution. Refer to Chapter 7
for details on the boxed processor.
Datasheet 77
Thermal Specifications and Design Considerations
The case temperature is defined at the geometric top center of the processor. Analysis
indicates that real applications are unlikely to cause the processor to consume
maximum power dissipation for sustained time periods. Intel recommends that
complete thermal solution designs target the Thermal Design Power (TDP) indicated in
Table 27 instead of the maximum processor power consumption. The Thermal Monitor
feature is designed to protect the processor in the unlikely event that an application
exceeds the TDP recommendation for a sustained periods of time. For more details on
the usage of this feature, refer to Section 5.2. In all cases the Thermal Monitor or
Thermal Monitor 2 feature must be enabled for the processor to remain within
specification.
NOTES:
1. Specification is at 36 °C TC and minimum voltage loadline. Specification is ensured by
design characterization and not 100% tested.
2. Specification is at 34 °C TC and minimum voltage loadline. Specification is ensured by
design characterization and not 100% tested.
3. Thermal Design Power (TDP) should be used for processor thermal solution design targets.
The TDP is not the maximum power that the processor can dissipate.
4. This table shows the maximum TDP for a given frequency range. Individual processors
may have a lower TDP. Therefore, the maximum TC will vary depending on the TDP of the
individual processor. Refer to thermal profile figure and associated table for the allowed
combinations of power and TC.
5. 775_VR_CONFIG_06 guidelines provide a design target for meeting future thermal
requirements.
78 Datasheet
Thermal Specifications and Design Considerations
Table 28. Intel® Core™2 Duo Processor E8000 Series Thermal Profile
Figure 14. Intel® Core™2 Duo Processor E8000 Series Thermal Profile
72.0
68.0
64.0
y = 0.42x + 45.1
60.0
Tcase (C)
56.0
52.0
48.0
44.0
0 10 20 30 40 50 60
Power (W)
Datasheet 79
Thermal Specifications and Design Considerations
Table 29. Intel® Core™2 Duo Processor E7000 Series Thermal Profile
Maximum Tc Maximum Tc Maximum Tc
Power (W) Power Power
(°C) (°C) (°C)
20 53.9 44 64.7
22 54.8 46 65.6
Figure 15. Intel® Core™2 Duo Processor E7000 Series Thermal Profile
72.0
68.0
64.0
y = 0.45x + 44.9
Tcase (C)
60.0
56.0
52.0
48.0
44.0
0 10 20 30 40 50 60
Power (W)
80 Datasheet
Thermal Specifications and Design Considerations
37.5 mm
When the Thermal Monitor feature is enabled, and a high temperature situation exists
(i.e., TCC is active), the clocks will be modulated by alternately turning the clocks off
and on at a duty cycle specific to the processor (typically 30–50%). Clocks often will
not be off for more than 3.0 microseconds when the TCC is active. Cycle times are
processor speed dependent and will decrease as processor core frequencies increase. A
small amount of hysteresis has been included to prevent rapid active/inactive
transitions of the TCC when the processor temperature is near its maximum operating
temperature. Once the temperature has dropped below the maximum operating
temperature, and the hysteresis timer has expired, the TCC goes inactive and clock
modulation ceases.
With a properly designed and characterized thermal solution, it is anticipated that the
TCC would only be activated for very short periods of time when running the most
power intensive applications. The processor performance impact due to these brief
Datasheet 81
Thermal Specifications and Design Considerations
The duty cycle for the TCC, when activated by the Thermal Monitor, is factory
configured and cannot be modified. The Thermal Monitor does not require any
additional hardware, software drivers, or interrupt handling routines.
When Thermal Monitor 2 is enabled, and a high temperature situation is detected, the
Thermal Control Circuit (TCC) will be activated. The TCC causes the processor to adjust
its operating frequency (using the bus multiplier) and input voltage (using the VID
signals). This combination of reduced frequency and VID results in a reduction to the
processor power consumption.
A processor enabled for Thermal Monitor 2 includes two operating points, each
consisting of a specific operating frequency and voltage. The first operating point
represents the normal operating condition for the processor. Under this condition, the
core-frequency-to-FSB multiple used by the processor is that contained in the
CLK_GEYSIII_STAT MSR and the VID is that specified in Table 4. These parameters
represent normal system operation.
The second operating point consists of both a lower operating frequency and voltage.
When the TCC is activated, the processor automatically transitions to the new
frequency. This transition occurs very rapidly (on the order of 5 μs). During the
frequency transition, the processor is unable to service any bus requests, and
consequently, all bus traffic is blocked. Edge-triggered interrupts will be latched and
kept pending until the processor resumes operation at the new frequency.
Once the new operating frequency is engaged, the processor will transition to the new
core operating voltage by issuing a new VID code to the voltage regulator. The voltage
regulator must support dynamic VID steps in order to support Thermal Monitor 2.
During the voltage change, it will be necessary to transition through multiple VID codes
to reach the target operating voltage. Each step will likely be one VID table entry (see
Table 4). The processor continues to execute instructions during the voltage transition.
Operation at the lower voltage reduces the power consumption of the processor.
82 Datasheet
Thermal Specifications and Design Considerations
TTM2 Temperature
fMAX
fTM2
Frequency
VID
VIDTM2
VID
PROCHOT#
It should be noted that the Thermal Monitor 2 TCC cannot be activated using the on-
demand mode. The Thermal Monitor TCC, however, can be activated through the use of
the on-demand mode.
Datasheet 83
Thermal Specifications and Design Considerations
Note: PROCHOT# will not be asserted (as an output) or observed (as an input) when the
processor is in the Stop Grant, Sleep, Deep Sleep, and Deeper Sleep low-power states,
hence the thermal solution must be designed to ensure the processor remains within
specification. If the processor enters one of the above low-power states with
PROCHOT# already asserted, PROCHOT# will remain asserted until the processor exits
the low-power state and the processor DTS temperature drops below the thermal trip
point.
84 Datasheet
Thermal Specifications and Design Considerations
The relative temperature value reported over PECI represents the delta below the onset
of thermal control circuit (TCC) activation as indicated by PROCHOT# assertions. As the
temperature approaches TCC activation, the PECI value approaches zero. TCC activates
at a PECI count of zero.
Datasheet 85
Thermal Specifications and Design Considerations
Prior to a power-on RESET# and during RESET# assertion, PECI is not assured to
provide reliable thermal data. System designs should implement a default power-on
condition that ensures proper processor operation during the time frame when reliable
data is not available using PECI.
§§
86 Datasheet
Features
6 Features
6.1 Power-On Configuration Options
Several configuration options can be configured by hardware. The processor samples
the hardware configuration at reset, on the active-to-inactive transition of RESET#. For
specifications on these options, refer to Table 31.
The sampled information configures the processor for subsequent operation. These
configuration options cannot be changed except by another reset. All resets reconfigure
the processor; for configuration purposes, the processor does not distinguish between
a "warm" reset and a "power-on" reset.
NOTE:
1. Asserting this signal during RESET# will select the corresponding option.
2. Address signals not identified in this table as configuration options should not be asserted
during RESET#.
3. Disabling of any of the cores within the processors must be handled by configuring the
EXT_CONFIG Model Specific Register (MSR). This MSR will allow for the disabling of a
single core per die within the processor package.
Datasheet 87
Features
Snoop Snoop
Event Event
STPCLK# STPCLK# Occurs Serviced
Asserted De-asserted
STPCLK#
STPCLK# De-asserted
Asserted
SLP# SLP#
Asserted De-asserted
DPSLP# DPRSTP#
Asserted Asserted Deeper Sleep State
Sleep State Deep Sleep State
- BCLK running - BCLK can be stopped
- BCLK can be stopped
- No Snoops or - No Snoops or
- No Snoops or
interrupts allowed interrupts allowed
interrupts allowed
- PECI unavailable in DPSLP# - PECI unavailable in
- PECI unavailable in DPRSTP#
this state De-asserted this state
this state De-asserted
The Extended HALT state is a lower power state as compared to the Stop Grant State.
If Extended HALT is not enabled, the default powerdown state entered will be HALT.
Refer to the sections below for details about the HALT and Extended HALT states.
88 Datasheet
Features
The return from a System Management Interrupt (SMI) handler can be to either
Normal Mode or the HALT powerdown state. See the Intel Architecture Software
Developer's Manual, Volume 3B: System Programming Guide, Part 2 for more
information.
The system can generate a STPCLK# while the processor is in the HALT powerdown
state. When the system de-asserts the STPCLK# interrupt, the processor will return
execution to the HALT state.
While in HALT powerdown state, the processor will process bus snoops.
The processor will automatically transition to a lower frequency and voltage operating
point before entering the Extended HALT state. Note that the processor FSB frequency
is not altered; only the internal core frequency is changed. When entering the low
power state, the processor will first switch to the lower bus ratio and then transition to
the lower VID.
While in Extended HALT state, the processor will process bus snoops.
The processor exits the Extended HALT state when a break event occurs. When the
processor exits the Extended HALT state, it will resume operation at the lower
frequency, transition the VID to the original value, and then change the bus ratio back
to the original value.
Datasheet 89
Features
The processor will automatically transition to a lower frequency and voltage operating
point before entering the Extended Stop Grant state. When entering the low power
state, the processor will first switch to the lower bus ratio and then transition to the
lower VID.
The processor exits the Extended Stop Grant state when a break event occurs. When
the processor exits the Extended Stop Grant state, it will resume operation at the lower
frequency, transition the VID to the original value, and then change the bus ratio back
to the original value.
6.2.4.2 Extended HALT Snoop State, Extended Stop Grant Snoop State
The processor will remain in the lower bus ratio and VID operating point of the
Extended HALT state or Extended Stop Grant state.
While in the Extended HALT Snoop State or Extended Stop Grant Snoop State, snoops
are handled the same way as in the HALT Snoop State or Stop Grant Snoop State. After
the snoop is serviced the processor will return to the Extended HALT state or Extended
Stop Grant state.
90 Datasheet
Features
Sleep state will cause unpredictable behavior. Any transition on an input signal before
the processor has returned to the Stop-Grant state will result in unpredictable
behavior.If RESET# is driven active while the processor is in the Sleep state, and held
active as specified in the RESET# pin specification, then the processor will reset itself,
ignoring the transition through the Stop-Grant state.
If RESET# is driven active while the processor is in the Sleep state, the SLP# and
STPCLK# signals should be de-asserted immediately after RESET# is asserted to
ensure the processor correctly executes the Reset sequence.
While in the Sleep state, the processor is capable of entering an even lower power
state, the Deep Sleep state, by asserting the DPSLP# pin (See Section Section 6.2.6).
While the processor is in the Sleep state, the SLP# pin must be de-asserted if another
asynchronous FSB event needs to occur. PECI is not available and will not respond
while in the Sleep State. Refer to the appropriate Thermal and Mechanical Design
Guidelines (see Section 1.2) for guidance on how to ensure PECI thermal data is
available when the Sleep State is enabled.
To re-enter the Sleep state, the DPSLP# pin must be de-asserted. BCLK can be
restarted after DPSLP# de-assertion as described above. A period of 15 microseconds
(to allow for PLL stabilization) must occur before the processor can be considered to be
in the Sleep state. Once in the Sleep state, the SLP# pin must be de-asserted to re-
enter the Stop-Grant state.
While in the Deep Sleep state the processor is incapable of responding to snoop
transactions or latching interrupt signals. No transitions of signals are allowed on the
FSB while the processor is in the Deep Sleep state. When the processor is in the Deep
Sleep state it will not respond to interrupts or snoop transactions. Any transition on an
input signal before the processor has returned to the Stop-Grant state will result in
unpredictable behavior. PECI is not available and will not respond while in the Deep
Sleep State. Refer to the appropriate Thermal and Mechanical Design Guidelines (see
Section 1.2) for guidance on how to ensure PECI thermal data is available when the
Deep Sleep State is enabled.
Datasheet 91
Features
In response to entering Deeper Sleep, the processor drives the VID code corresponding
to the Deeper Sleep core voltage on the VID pins. Unlike typical Dynamic VID changes
(where the steps are single VID steps) the processor will perform a VID jump on the
order of 100 mV. To support the Deeper Sleep State the platform must use a VRD 11.1
compliant solution.
PSI# may be asserted only when the processor is in the Deeper Sleep state.
92 Datasheet
Boxed Processor Specifications
Note: Unless otherwise noted, all figures in this chapter are dimensioned in millimeters and
inches [in brackets]. Figure 20 shows a mechanical representation of a boxed
processor.
Note: Drawings in this section reflect only the specifications on the Intel boxed processor
product. These dimensions should not be used as a generic keep-out zone for all
cooling solutions. It is the system designers’ responsibility to consider their proprietary
cooling solution when designing to the required keep-out zone on their system
platforms and chassis. Refer to the appropriate Thermal and Mechanical Design
Guidelines (see Section 1.2) for further guidance. Contact your local Intel Sales
Representative for this document.
NOTE: The airflow of the fan heatsink is into the center and out of the sides of the fan heatsink.
Datasheet 93
Boxed Processor Specifications
Clearance is required around the fan heatsink to ensure unimpeded airflow for proper
cooling. The physical space requirements and dimensions for the boxed processor with
assembled fan heatsink are shown in Figure 21 (Side View), and Figure 22 (Top View).
The airspace requirements for the boxed processor fan heatsink must also be
incorporated into new baseboard and system designs. Airspace requirements are
shown in Figure 26 and Figure 27. Note that some figures have centerlines shown
(marked with alphabetic designations) to clarify relative dimensioning.
Figure 21. Space Requirements for the Boxed Processor (Side View)
95.0
[3.74]
81.3
[3.2]
10.0 25.0
[0.39] [0.98]
B d P Sid Vi
Figure 22. Space Requirements for the Boxed Processor (Top View)
95.0
[3.74]
95.0
[3.74]
NOTES:
1. Diagram does not show the attached hardware for the clip design and is provided only as a
mechanical representation.
94 Datasheet
Boxed Processor Specifications
Figure 23. Overall View Space Requirements for the Boxed Processor
The fan heatsink outputs a SENSE signal, which is an open- collector output that pulses
at a rate of 2 pulses per fan revolution. A baseboard pull-up resistor provides VOH to
match the system board-mounted fan speed monitor requirements, if applicable. Use of
the SENSE signal is optional. If the SENSE signal is not used, pin 3 of the connector
should be tied to GND.
The fan heatsink receives a PWM signal from the motherboard from the 4th pin of the
connector labeled as CONTROL.
Datasheet 95
Boxed Processor Specifications
The boxed processor's fanheat sink requires a constant +12 V supplied to pin 2 and
does not support variable voltage control or 3-pin PWM control.
The power header on the baseboard must be positioned to allow the fan heatsink power
cable to reach it. The power header identification and location should be documented in
the platform documentation, or on the system board itself. Figure 25 shows the
location of the fan power connector relative to the processor socket. The baseboard
power header should be positioned within 110 mm [4.33 inches] from the center of the
processor socket.
Figure 24. Boxed Processor Fan Heatsink Power Cable Connector Description
1 2 3 4
96 Datasheet
Boxed Processor Specifications
R110
[4.33]
B
Datasheet 97
Boxed Processor Specifications
Figure 26. Boxed Processor Fan Heatsink Airspace Keepout Requirements (side 1 view)
Figure 27. Boxed Processor Fan Heatsink Airspace Keepout Requirements (side 2 view)
98 Datasheet
Boxed Processor Specifications
The boxed processor fan will operate at different speeds over a short range of
internal chassis temperatures. This allows the processor fan to operate at a lower
speed and noise level, while internal chassis temperatures are low. If internal
chassis temperature increases beyond a lower set point, the fan speed will rise
linearly with the internal temperature until the higher set point is reached. At that
point, the fan speed is at its maximum. As fan speed increases, so does fan noise
levels. Systems should be designed to provide adequate air around the boxed
processor fan heatsink that remains cooler then lower set point. These set points,
represented in Figure 28 and Table 33, can vary by a few degrees from fan heatsink
to fan heatsink. The internal chassis temperature should be kept below 38 ºC.
Meeting the processor's temperature specification (see Chapter 5) is the
responsibility of the system integrator.
The motherboard must supply a constant +12 V to the processor's power header to
ensure proper operation of the variable speed fan for the boxed processor. Refer to
Table 32 for the specific requirements.
Increasing Fan
Speed & Noise
X Y Z
Datasheet 99
Boxed Processor Specifications
Boxed Processor
Fan Heatsink Set Boxed Processor Fan Speed Notes
Point (°C)
As processor power has increased the required thermal solutions have generated
increasingly more noise. Intel has added an option to the boxed processor that allows
system integrators to have a quieter system in the most common usage.
The 4th wire PWM solution provides better control over chassis acoustics. This is
achieved by more accurate measurement of processor die temperature through the
processor's Digital Thermal Sensors (DTS) and PECI. Fan RPM is modulated through the
use of an ASIC located on the motherboard that sends out a PWM control signal to the
4th pin of the connector labeled as CONTROL. The fan speed is based on actual
processor temperature instead of internal ambient chassis temperatures.
If the new 4-pin active fan heat sink solution is connected to an older 3-pin baseboard
processor fan header, it will default back to a thermistor controlled mode, allowing
compatibility with existing 3-pin baseboard designs. Under thermistor controlled mode,
the fan RPM is automatically varied based on the Tinlet temperature measured by a
thermistor located at the fan inlet.
For more details on specific motherboard requirements for 4-wire based fan speed
control, refer to the appropriate Thermal and Mechanical Design Guidelines (see
Section 1.2).
100 Datasheet
Debug Tools Specifications
Due to the complexity of Intel Core™2 Duo processor E8000 and E7000 series systems,
the LAI is critical in providing the ability to probe and capture FSB signals. There are
two sets of considerations to keep in mind when designing an Intel Core™2 Duo
processor E8000 and E7000 series system that can make use of an LAI: mechanical
and electrical.
Datasheet 101
Debug Tools Specifications
102 Datasheet