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    Flyer XRF Analysis-Restch and Horiba-Jakarta PDF

    Uploaded by

    Amanah Watii
    The document describes the procedure for XRF (X-ray fluorescence) analysis. It involves crushing or milling samples to below 100 microns, pelletizing the samples, and then performing XRF analysis. The sample size before analysis needs to be small enough to allow for complete penetration of electromagnetic rays, typically ranging from 60-100 microns. Pellets need a smooth surface and strength for analysis. The document also provides specifications for various XRF instruments and their applications in analyzing hazardous elements, energy dispersive analysis, and halogen-free analysis.

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    Flyer XRF Analysis-Restch and Horiba-Jakarta PDF

    Uploaded by

    Amanah Watii
    98 views3 pages
    The document describes the procedure for XRF (X-ray fluorescence) analysis. It involves crushing or milling samples to below 100 microns, pelletizing the samples, and then performing XRF analysis. The sample size before analysis needs to be small enough to allow for complete penetration of electromagnetic rays, typically ranging from 60-100 microns. Pellets need a smooth surface and strength for analysis. The document also provides specifications for various XRF instruments and their applications in analyzing hazardous elements, energy dispersive analysis, and halogen-free analysis.

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    Flyer XRF Analysis-Restch and Horiba-Jakarta.pdf

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    The document describes the procedure for XRF (X-ray fluorescence) analysis. It involves crushing or milling samples to below 100 microns, pelletizing the samples, and then performing XRF analysis. The sample size before analysis needs to be small enough to allow for complete penetration of electromagnetic rays, typically ranging from 60-100 microns. Pellets need a smooth surface and strength for analysis. The document also provides specifications for various XRF instruments and their applications in analyzing hazardous elements, energy dispersive analysis, and halogen-free analysis.

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
    98 views3 pages

    Flyer XRF Analysis-Restch and Horiba-Jakarta PDF

    Uploaded by

    Amanah Watii
    The document describes the procedure for XRF (X-ray fluorescence) analysis. It involves crushing or milling samples to below 100 microns, pelletizing the samples, and then performing XRF analysis. The sample size before analysis needs to be small enough to allow for complete penetration of electromagnetic rays, typically ranging from 60-100 microns. Pellets need a smooth surface and strength for analysis. The document also provides specifications for various XRF instruments and their applications in analyzing hazardous elements, energy dispersive analysis, and halogen-free analysis.

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    PROCEDURE OF XRF ANALYSIS:

    JAKARTA
    Jalan Boulevard Artha Gading
    Sentra Bisnis Artha Gading
    Blok A-6A, No.3 & 5, Kelapa SAMPLE
    Gading 14240

    CRUSHING / MILLING

     + (62) 21 451 6222  / 45874600 below 100 micron


    + (62) 31 732 3630 / 7323631 PELLETING

    [email protected]

    xrf analysis
    www.its-indonesia.com
    SPECIFICATION
     Sample volume  15 - 250 ml VIBRATORY DISC MILL APPLICATION SAMPLE
    RS 200
    Feed size 15 mm
    Final size  20 µm

    For medium-hard, hard,


    brittle, fibrous material

    Fineness from  MIXER MILL


    ≤ 8 mm  change to  ~ 5 µm MM 400
    ABOUT THE SAMPLE SIZE
    For hard, medium-hard, soft, BEFORE YOU DO THE XRF
    brittle, elastic and fibrous material ANALYSIS
    The penetration depth
    Sample volume 2x20 mL
    is the maximum depth from which the
    electromagnetic ray can exit from the

    PELLET PRESS surface

    PP 35 Preparation of pellets for


    In the case of
    spectral analyses
    XRF spectroscopy in a range below 100
    microns to guarantee complete penetration
    Automatic press

    For the pressed pellet :


    The particle size should range 60 - 100 µm
    Pressure force  0 - 35 t (0 - 343 kN)
    Also needs a smooth surface and a certain
    strength
    SPECIFICATION MESA-50
    XRF FROM HORIBA

    ROHS APPLICATION
    There are 4 filters are included, a
    with EDXRF, we get 
    unique filter allows 7 hazardous
    easier maintenance
    elements (identification of RoHS) to
    and  shorter
    be detected simultaneously including
    measuring time
    Pb, Cd, Hg, Cr, Br, Sb and As.

    EDXRF
    (ENERGY DISPERSIVE X-RAY
    HALO-FREE APPLICATION
    FLUORESENCE SPECTROMETRY)
    Optimized for high
    sensitivity Cl analysis. Measuring elements   
    The MESA-50 doesn't require a 3Al-92U
    vacuum pump for Cl measurement.

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