EMI EMC Brochure
EMI EMC Brochure
EMI EMC Brochure
TECHNICAL
CENTRE
EMI / EMC FACILITY
SPARK MINDA TECHNICAL CENTRE
Electronic Hardware
Product Development
Advance Engg / Research
Hardware / Design Simulation
RF Design
Product Validation
EMI / EMC Testing
HIL / SIL Testing
Product / Design Validation
Embedded Software
Production Software Architecture
Model based Systems Engineering & Controls
Integration, Verification and Validation
Alignment to Functional Safety Standards
EMC SOLUTIONS
Testing
EMC
Solutions Simulation
Design & Development
Hardware Simulation
Hardware Design Design Simulation
PCB Design DV / PV
Hardware Architecture Endurance
Verification / Validation Signal Integrity / Power Integrity
EMI / EMC
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Requirements & Architecture System Verification & Validation
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Detailed Design Integration, Test & Verification
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product design & development
- High level and Low level Hardware Design taking into account EMI/EMC performance
We help the board designers to detect and correct EMI/EMC related design flaws early in the
life-cycle when their PCB and schematic design is ready on computer. The soft-compliance is based
on a simulation driven approach where a 3D solver evaluates EMI/EMC performance of various circuit
blocks/PCB nets. This points out the culprit nets which may require PCB re-routing / hardware
design fine-tuning in respective CAD files. This therefore leads to fast design iteration enhancing EMI/
EMC performance early in design cycle, in a more cost-effective way.
The figure below depicts a real life case based on evaluation of a proof of concept Blue-tooth
application board. The above soft-compliance approach correctly points to the culprit nets exhibiting
higher than allowed radiation levels. The culprit nets were then re-routed on computer to resolve the
problem in a speedy manner.
Bulk Current Injection
Soft Compliance
Generally designers face problems in anticipating EMI/EMC performance of their units during Bulk
Current Injection tests (BCI). This is due to the impact of various external factors involved in such
test viz:
Conventional approach involves physical testing to expose required design improvements, leading to
length/costly design iterations.
The 3D model of the BCI probe accurately reproduces the results published in the cited paper.
Emission Conducted
CISPR 25
Immunity
ISO 7637
Emission
CISPR 25
Electrical
Disturbances
ISO 16750
EMI/EMC
ESD
ISO 10605
Radiated
Immunity
ISO 11452
WORLD CLASS TESTING / DESIGN EXPERTISE
TEST FACILITIES ARE COMPATIBLE WITH ALL MAJOR INTERNATIONAL AUTOMOBILE TEST NORMS
Radiated
Emission
Conducted
Emission
Bulk Current
Injection