Chemical Vapour Deposition

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CHEMICAL VAPOUR

DEPOSITION

KARTHIK SAMPATHKUMAR
20763
CONTENTS

INTRODUCTION
How CVD Works?
CLASSIFICATION
ILLUSTRATION
LIMITATIONS
CONCLUSION
INTRODUCTION
Vapor deposition refers to any process through which
material, in vapor state, is condensed through
condensation, chemical reaction or conversion to form
solid material deposit on the surface of the substrate.

Vapor deposit can be classified majorly into


Chemical Vapor Deposit(CVD) and
Physical Vapor Deposit(PVD)

Chemical Vapor Deposition is a process in which two or


more chemical precursors are introduced in a reaction
chamber, at vapour phase (i.e. either low or high
pressures based on the process), where the precursors
react to form coating on the heated substrate.
How CVD Works?
The CVD Mechanism involves the following steps

Precursors (chemical reactants) gas phase


decomposition:
In this step the reactants in gas phase is injected
inside a gas chamber.
Diffusion to the surface:
At this stage the injected gas phase reactants react
to form the coating material along with the by-products
and are diffused on the substrate surface.
Physical adsorption:
The diffused product adheres along the substrate
surface.
Surface decomposition:
The adhered product forms a thin layer on the
surface and the by-products are desorbed.
CLASSIFICATION
The CVD process can be classified as follows
Based on operating pressure
1. Atmospheric pressure CVD
2. Low pressure CVD
3. Ultrahigh Vacuum CVD
Based on physical characteristics of vapor
1. Aerosol assisted CVD
2. Direct liquid injection CVD

Plasma enhanced CVD


Atomic layer CVD
Metalorganic CVD
Combustion CVD
Photo initiated CVD
ILLUSTRATION
There has been increasing interest in lead zirconate
titanate (PZT) thin films due to many applications such as
surface acoustic wave (SAW) devices, infrared sensors,
many other microelectromechanical systems (MEMS) and
especially nonvolatile ferroelectric random access
memories (FeRAMs). FeRAMs have potential to substitute
present commercialized nonvolatile memories such as
flash ROM or EEPROM, because of their lower writing
voltage and faster writing speed. PZT is one of the most
promising ferroelectric materials for fabrication of FeRAM
because of its higher remnant polarization and lower
process temperature than others. So far, metal organic
chemical vapour deposition (MOCVD), radio-frequency
magnetron sputtering, pulsed laser deposition (PLD),
metal-organic decomposition (MOD) and sol gel (SG)
methods have been reported for preparation of PZT films.
Due to the demand of high-density integration, FeRAMs
will be required to have three-dimensional (3D)
ferroelectric capacitors.

Why MOCVD process is used?


Good conformal step coverage
Controllability of composition
High deposition rate and
Compatibility with current Si processes.
The conventional bubbling MOCVD of PZT thin film is not
suitable for mass production because many PZT precursors
have lower vapour pressure and therefore need higher
bubbler temperature. Precursor degradation over the time at
high bubbler temperature becomes a problem. MOCVD with
liquid delivery system is suggested as a solution, in which
precursors are dissolved in solvent during transportation and
are vaporized in a vaporizer before coming into reaction
chamber.

PROCESS
The liquid solutions of each precursor were injected
separately into vaporizer with N 2 as carrier gas. O 2 was
used as oxidant, and was mixed with precursor vapor in
showerhead and then flowed into reaction chamber. Lead
bis(2,2,6,6,-tetramethyl 3,5-heptanedionate) [Pb(thd) 2 ],
Zirconium bis(isopropoxy) bis(1-methoxy-2-methyl-2-
propoxy) [Zr(OiPr) 2 (mmp) 2 ], and Titanium bis(isopropoxy)
bis(1- methoxy-2-methyl-2-propoxide) [Ti(OiPr) 2 (mmp) 2 ]
were used as precursors. The three precursors are dissolved
in octane of 0.1mol/L concentration. Several substrate
temperatures between 450C and 550C were used for PZT
deposition and the pressure was from 0.5mbar to 5mbar.

MEASUREMENTS
Film thickness was measured using a spectroscopic
ellipsometer. The compositional analysis of PZT films was
performed using X-ray photoelectron spectroscopy (XPS).
Crystal structure of the thin films and their crystallographic
orientation were examined by X-ray diffraction (XRD) using
Cu-K . Surface morphologies of the PZT films were
investigated using a scanning electron microscope (SEM) and
atomic force microscope (AFM).
LIMITATIONS
CVD operates at high temperatures and high
vacuum (some cases).
Surface preparation is required for the substrate
since the substrate is heated.
Selection of precursors for specific application is
difficult since the process requires more research
and development to select the best alternative
available.
Skilled labor and high operating cost is involved
because the amount of deposition is to be
controlled and surface measurement is often done
with high end devices such as atomic electron
microscope.

CONCLUSION
In thin film semi conductor coating, MetalOrganic CVD
coating is one of the best method to manufacture and
efficient process.
REFERENCES
http://www.pob.manchester.ac.uk/research.html
https://www.researchgate.net
https://en.wikipedia.org
http://www.asminternational.org/
http://www.indium.com/

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