IEEE STD 404-2012 Redline

Download as pdf or txt
Download as pdf or txt
You are on page 1of 89





IEEE Standard for Extruded and
Laminated Dielectric Shielded Cable
Joints Rated 2.5 kV to 500 kV


IEEE Power & Energy Society

INE
D L
RE
Sponsored by the
the
Insulated Conductors Committee r om
sf n!
 the prev n ge rsio
m io ha ve
o s c ious
fr ow
Sh pre
v
u

E
s
s
ct change

N
ve

LI
rsion!

ED
R
a
ex

IEEE
3 Park Avenue
s
w IEEE Std 404-2012
New York, NY 10016-5997 Sho (Revision of
USA IEEE Std 404-2006)

18 June 2012

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
This is a Redline Document produced by Techstreet, a business of
Thomson Reuters.

This document is intended to provide users with an indication of changes from one edition
to the next. It includes a full-text version of the new document, plus an indication of
changes from the previous version.

Redlines are designed to save time and improve efficiencies by using the latest software
technology to find and highlight document changes. More professionals are using valuable
new technologies like redlines, to help improve outcomes in a fastpaced global business
world.

Because it may not be technically possible to capture all changes accurately, it is


recommended that users consult previous editions as appropriate. In all cases, only the
current base version of this publication is to be considered the official document.

445 Hoes Lane, Piscataway, NJ 08854 USA | http://standards.ieee.org | Tel. +1 732-981-0060 Fax +1 732-562-1571

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.


Redline Processing Notes:

1. Red Text - Red strikethrough text denotes deletions.

2. Blue Text - Blue underlined text denotes modifications and additions.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
IEEE Std 404-2012
(Revision of
IEEE Std 404-2006)

IEEE Standard for Extruded and


Laminated Dielectric Shielded Cable
Joints Rated 2.5 kV to 500 kV

Sponsor

Insulated Conductors Committee


of the
IEEE Power & Energy Society

Approved 29 March 2012

IEEE-SA Standards Board

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Abstract: Electrical ratings and test requirements of cable joints used with extruded and
laminated dielectric shielded cable rated in preferred voltage steps from 2.5 kV to 500 kV are
established in this standard. In addition, test requirements for joint metallic-shield and jacketing
components are defined. A variety of common joint constructions are also defined. This standard
has been designed to provide uniform testing procedures that can be used by manufacturers and
users to evaluate the ability of underground power cable joints, and associated metallic-shields
and jacketing components, to perform reliably in service.
Keywords: basic insulation level (BIL), cable joints, dielectric integrity tests, extruded dielectric
cable, IEEE 404, laminated dielectric cable, sheath/shield sectionalizers, transition joints,
withstand voltage

The Institute of Electrical and Electronics Engineers, Inc.


3 Park Avenue, New York, NY 10016-5997, USA

Copyright 2012 by The Institute of Electrical and Electronics Engineers, Inc.


All rights reserved. Published 18 June 2012. Printed in the United States of America.

IEEE is a registered trademark in the U.S. Patent & Trademark Office, owned by The Institute of Electrical and Electronics
Engineers, Incorporated.

PDF: ISBN 978-0-7381-7267-5 STD97242


Print: ISBN 978-0-7381-7373-3 STDPD97242

IEEE prohibits discrimination, harassment, and bullying. For more information, visit http://www.ieee.org/web/aboutus/whatis/policies/p9-26.html.
No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission
of the publisher.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Notice and Disclaimer of Liability Concerning the Use of IEEE Documents: IEEE Standards documents are developed
within the IEEE Societies and the Standards Coordinating Committees of the IEEE Standards Association (IEEE-SA)
Standards Board. IEEE develops its standards through a consensus development process, approved by the American National
Standards Institute, which brings together volunteers representing varied viewpoints and interests to achieve the final product.
Volunteers are not necessarily members of the Institute and serve without compensation. While IEEE administers the process
and establishes rules to promote fairness in the consensus development process, IEEE does not independently evaluate, test, or
verify the accuracy of any of the information or the soundness of any judgments contained in its standards.

Use of an IEEE Standard is wholly voluntary. IEEE disclaims liability for any personal injury, property or other damage, of
any nature whatsoever, whether special, indirect, consequential, or compensatory, directly or indirectly resulting from the
publication, use of, or reliance upon any IEEE Standard document.

IEEE does not warrant or represent the accuracy or content of the material contained in its standards, and expressly disclaims
any express or implied warranty, including any implied warranty of merchantability or fitness for a specific purpose, or that
the use of the material contained in its standards is free from patent infringement. IEEE Standards documents are supplied "AS
IS."

The existence of an IEEE Standard does not imply that there are no other ways to produce, test, measure, purchase, market, or
provide other goods and services related to the scope of the IEEE standard. Furthermore, the viewpoint expressed at the time a
standard is approved and issued is subject to change brought about through developments in the state of the art and comments
received from users of the standard. Every IEEE standard is subjected to review at least every ten years. When a document is
more than ten years old and has not undergone a revision process, it is reasonable to conclude that its contents, although still of
some value, do not wholly reflect the present state of the art. Users are cautioned to check to determine that they have the
latest edition of any IEEE standard.

In publishing and making its standards available, IEEE is not suggesting or rendering professional or other services for, or on
behalf of, any person or entity. Nor is IEEE undertaking to perform any duty owed by any other person or entity to another.
Any person utilizing any IEEE Standards document, should rely upon his or her own independent judgment in the exercise of
reasonable care in any given circumstances or, as appropriate, seek the advice of a competent professional in determining the
appropriateness of a given IEEE standard.

Translations: The IEEE consensus development process involves the review of documents in English only. In the event that
an IEEE standard is translated, only the English version published by IEEE should be considered the approved IEEE standard.

Official Statements: A statement, written or oral, that is not processed in accordance with the IEEE-SA Standards Board
Operations Manual shall not be considered the official position of IEEE or any of its committees and shall not be considered to
be, nor be relied upon as, a formal position of IEEE. At lectures, symposia, seminars, or educational courses, an individual
presenting information on IEEE standards shall make it clear that his or her views should be considered the personal views of
that individual rather than the formal position of IEEE.

Comments on Standards: Comments for revision of IEEE Standards documents are welcome from any interested party,
regardless of membership affiliation with IEEE. However, IEEE does not provide consulting information or advice pertaining
to IEEE Standards documents. Suggestions for changes in documents should be in the form of a proposed change of text,
together with appropriate supporting comments. Since IEEE standards represent a consensus of concerned interests, it is
important to ensure that any responses to comments and questions also receive the concurrence of a balance of interests. For
this reason, IEEE and the members of its societies and Standards Coordinating Committees are not able to provide an instant
response to comments or questions except in those cases where the matter has previously been addressed. Any person who
would like to participate in evaluating comments or revisions to an IEEE standard is welcome to join the relevant IEEE
working group at http://standards.ieee.org/develop/wg/.

Comments on standards should be submitted to the following address:

Secretary, IEEE-SA Standards Board


445 Hoes Lane
Piscataway, NJ 08854
USA

Photocopies: Authorization to photocopy portions of any individual standard for internal or personal use is granted by The
Institute of Electrical and Electronics Engineers, Inc., provided that the appropriate fee is paid to Copyright Clearance Center.
To arrange for payment of licensing fee, please contact Copyright Clearance Center, Customer Service, 222 Rosewood Drive,
Danvers, MA 01923 USA; +1 978 750 8400. Permission to photocopy portions of any individual standard for educational
classroom use can also be obtained through the Copyright Clearance Center.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Notice to users

Laws and regulations


Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with
the provisions of any IEEE Standards document does not imply compliance to any applicable regulatory
requirements. Implementers of the standard are responsible for observing or referring to the applicable
regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not
in compliance with applicable laws, and these documents may not be construed as doing so.

Copyrights
This document is copyrighted by the IEEE. It is made available for a wide variety of both public and
private uses. These include both use, by reference, in laws and regulations, and use in private self-
regulation, standardization, and the promotion of engineering practices and methods. By making this
document available for use and adoption by public authorities and private users, the IEEE does not waive
any rights in copyright to this document.

Updating of IEEE documents


Users of IEEE Standards documents should be aware that these documents may be superseded at any time
by the issuance of new editions or may be amended from time to time through the issuance of amendments,
corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the
document together with any amendments, corrigenda, or errata then in effect. In order to determine whether
a given document is the current edition and whether it has been amended through the issuance of
amendments, corrigenda, or errata, visit the IEEE-SA Website at http://standards.ieee.org/index.html or
contact the IEEE at the address listed previously. For more information about the IEEE Standards
Association or the IEEE standards development process, visit IEEE-SA Website at
http://standards.ieee.org/index.html.

Errata
Errata, if any, for this and all other standards can be accessed at the following URL:
http://standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata
periodically.

Patents
Attention is called to the possibility that implementation of this standard may require use of subject matter
covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to
the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant
has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the
IEEE-SA Website at http://standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may
indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without
compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of
any unfair discrimination to applicants desiring to obtain such licenses.

iv
Copyright 2012 IEEE. All rights reserved.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not
responsible for identifying Essential Patent Claims for which a license may be required, for conducting
inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or
conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing
agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that
determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely
their own responsibility. Further information may be obtained from the IEEE Standards Association.

v
Copyright 2012 IEEE. All rights reserved.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Participants
At the time this IEEE standard was completed, the Revision of IEEE Cable Joint Standard 404 Working
Group had the following membership:

Glenn J. Luzzi, Chair


Saleman Alibhay, Vice Chair

Edward Bradley Mike Jackson Thomas J. Parker


Jim Braun Edward M. Jankowich Todd Richardson
Thomas C. Champion, III Margaret Jasek Tim Robeson
Philip Cox Farris Jibril Michael Smalley
David E. Crotty Ivan Jovanovic Gregory Stano
Frank DiGuglielmo Sherif Kamel Stan Szyszko
Mike Dyer Carlos Katz William Taylor
Chad Eckhardt Dan Kennedy Milan Uzelac
Jon Erickson Albert Kong Tim Wall
Robert Gear, Jr. John M. Makal Carl Wentzel
Richard L. Harp Shoji Mashio Jade Wong
Harry Hayes, III Tim McLaughlin Vitaliy Yaroslavskiy
Jeffrey Helzer Aaron Norris Harry Yaworski
David Hughes Neal Parker

The following members of the individual balloting committee voted on this standard. Balloters may have
voted for approval, disapproval, or abstention.

Roy Alexander Werner Hoelzl Bartien Sayogo


Saleman Alibhay David Hughes Dennis Schlender
Martin Baur Edward M. Jankowich Gil Shultz
Michael Bayer A. S. Jones Michael Smalley
Vern Buchholz John Kay Jerry Smith
William Byrd Dan Kennedy Gregory Stano
Thomas C. Champion, III Gael Kennedy Gary Stoedter
Robert Christman Joesph L. Koepfinger William Taylor
David E. Crotty Robert Konnik Peter Tirinzoni
Gary Donner Jim Kulchisky Nijam Uddin
Donald Dunn Chung-Yiu Lam John Vergis
Gary Engmann Michael Lauxman Martin Von Herrmann
Michael Faulkenberry Glenn J. Luzzi Carl Wall
James Fitzgerald Jeff Madden Mark Walton
Robert Gear, Jr. Arturo Maldonado Yingli Wen
Steven Graham Gary Michel Carl Wentzel
Randall Groves Jerry Murphy Kenneth White
Frank DiGuglielmo Michael S. Newman Jian Yu
Richard L. Harp Joe Nims Dawn Zhao
Jeffrey Hartenberger Lorraine Padden Tiebin Zhao
Timothy Hayden Serge Pelissou J. Zimnoch
Jeffrey Helzer Johannes Rickmann
Lauri Hiivala Michael Roberts

vi
Copyright 2012 IEEE. All rights reserved.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
When the IEEE-SA Standards Board approved this standard on 29 March 2012, it had the following
membership:

Richard H. Hulett, Chair


John Kulick, Vice Chair
Robert M. Grow, Past President
Judith Gorman, Secretary

Satish Aggarwal Alexander Gelman Oleg Logvinov


Masayuki Ariyoshi Paul Houz Ted Olsen
Peter Balma Jim Hughes Gary Robinson
William Bartley Young Kyun Kim Jon Walter Rosdahl
Ted Burse Joseph L. Koepfinger* Mike Seavey
Clint Chaplin John Kulick Yatin Trivedi
Wael Diab David J. Law Phil Winston
Jean-Philippe Faure Thomas Lee Yu Yuan
Hung Ling

*Member Emeritus

Also included are the following nonvoting IEEE-SA Standards Board liaisons:

Richard DeBlasio, DOE Representative


Michael Janezic, NIST Representative

Julie Alessi
IEEE Standards Program Manager, Document Development

Malia Zaman
IEEE Standards Program Manager, Technical Program Development

vii
Copyright 2012 IEEE. All rights reserved.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Introduction

This introduction is not part of IEEE Std 404-2012, IEEE Standard for Extruded and Laminated Dielectric Shielded
Cable Joints Rated 2.5 kV to 500 kV.

This standard provides manufacturers and users with a consistent set of qualification test requirements for
all cable joints. It also provides production test requirements for many cable joints used on extruded
dielectric cables. Material properties and sampling rates are included for joint designs not easily production
tested in their final form.

This revision of the standard provides closer harmonization to international standards for those cable joints
used on extruded dielectric cables rated 69 kV and above.

It provides more applicable testing protocols to verify appropriate joint operation in the field for extruded
dielectric cable joints in a joint-series. A joint-series is a family of joints designed and manufactured to
cover a wide range of cable including various conductor sizes and materials as well as various extruded
insulation thicknesses and materials.

It changes the format of the design test sequence tables to provide a more clear and concise format to
eliminate interpretation errors.

viii
Copyright 2012 IEEE. All rights reserved.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Contents

1. Overview .................................................................................................................................................... 1
1.1 Scope ................................................................................................................................................... 1

2. Normative references.................................................................................................................................. 1

3. Definitions .................................................................................................................................................. 3
3.1 Cable joint categories .......................................................................................................................... 3
3.2 Joint constructions ............................................................................................................................... 3
3.3 Other terms .......................................................................................................................................... 4

4. Service conditions ...................................................................................................................................... 4

5. Ratings........................................................................................................................................................ 5
5.1 Voltage ................................................................................................................................................ 5
5.2 Current and temperature ...................................................................................................................... 5

6. General requirements.................................................................................................................................. 7
6.1 Identification........................................................................................................................................ 7
6.2 Shielding.............................................................................................................................................. 8
6.2.1 Semiconducting shield...................................................................................................................... 8
6.3 Jacket seal............................................................................................................................................ 8
6.4 Sheath/shield sectionalizers ................................................................................................................. 8

7. Design testing ............................................................................................................................................. 8


7.1 Design tests and testing sequence for all joint types............................................................................ 9
7.2 Design test conditions.......................................................................................................................... 9
7.3 Dielectric integrity tests..................................................................................................................... 11
7.4 Voltage tests ...................................................................................................................................... 15
7.5 Short-time current test ....................................................................................................................... 17
7.6 Cyclic aging test for extruded dielectric and transition joints............................................................ 17
7.7 High-voltage time test........................................................................................................................ 20
7.8 Sectionalizer tests .............................................................................................................................. 20
7.9 Shielding test ..................................................................................................................................... 21
7.10 Joint metallic-shield and jacketing components .............................................................................. 22
7.11 Connector thermal and mechanical tests.......................................................................................... 25

8. Routine production testing........................................................................................................................ 25


8.1 Premolded and single-component cold-shrink joints......................................................................... 26
8.2 Heat-shrink and multi-component cold-shrink joints ........................................................................ 26
8.3 Elastomeric taped joint components .................................................................................................. 27

Annex A (informative) Typical values of heat-shrinkable and multi-component cold-shrink joint


component tests and sampling rates ............................................................................................................. 30

Annex B (informative) Typical values of elastomeric taped joint component tests and sampling rates ..... 31

Annex C (informative) DC test voltage reference ....................................................................................... 32

Annex D (informative) Bibliography .......................................................................................................... 34

ix
Copyright 2012 IEEE. All rights reserved.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
x
Copyright 2012 IEEE. All rights reserved.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
IEEE Standard for Extruded and Laminated Dielectric Shielded Cable
Joints Rated 2.5 2500 kV to 500 000 kV

IMPORTANT NOTICE: IEEE Standards documents are not intended to ensure safety, health, or

environmental protection, or ensure against interference with or from other devices or networks.

Implementers of IEEE Standards documents are responsible for determining and complying with all

appropriate safety, security, environmental, health, and interference protection practices and all

applicable laws and regulations.

This IEEE document is made available for use subject to important notices and legal

disclaimers. These notices and disclaimers appear in all publications containing this document and

may be found under the heading Important Notice or Important Notices and Disclaimers

Concerning IEEE Documents. They can also be obtained on request from IEEE or viewed at

http://standards.ieee.org/IPR/disclaimers.html.

1. Overview

1.1 Scope

This standard establishes electrical ratings and test requirements of cable joints used with extruded

and laminated dielectric shielded cables rated in preferred voltage steps from 2.5 2500 kV to 500000

kV. In addition, it defines test requirements for joint cable jacket seal devices and joint metallic-

cable shield restoration devices.

This standard also defines a variety of common joint constructions.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Joints that connect more than two cables or connect cables with two different conductor sizes are not

covered by this standard. However, manufacturers and users are encouraged to use appropriate

parts of this standard to evaluate these joints.

2. Normative references

The following referenced documents are indispensable for the application of this document (i.e.,

they must be understood and used, so each referenced document is cited in text and its relationship

to this document is explained). For dated references, only the edition cited applies. For undated

references, the latest edition of the referenced document (including any amendments or corrigenda)

applies.

AEIC CS1, Specification for Impregnated Paper-Insulated Metallic-Sheathed Cable, Solid Type. 1

AEIC CS2, Specification for Impregnated Paper and Laminated Paper Polypropylene Insulated

Cable, High Pressure Pipe Type.

AEIC CS3, Specification for Impregnated-Paper-Insulated Metallic Sheathed Cable, Low Pressure

Gas- Filled Type.

AEIC CS4, Specification for Impregnated-Paper-Insulated Low and Medium Pressure Self-Contained

Liquid Filled Cable.

1 AEIC public ations are available from the Assoc iation of Edison Illuminating Companies, 600 N. 18th S treet, P.O. Box 2641,

Birmingham, AL 35291-0992, US A (http://www.aeic .org/). AEIC public ations are also available from Global Engineering

Doc uments, 15 Inverness Way East, Englewood, CO 80112-5704, US A (http://global.ihs.c o m/).

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
AEIC CS6, Specifications for Ethylene Propylene Rubber Insulated Shielded Power Cables Rated

5 Through 69 kV.

AEIC CS7, Specifications for Crosslinked Polyethylene Insulated Shielded Power Cables Rated 69

Through 138 kV.

AEIC CS8, Specification for Extruded Dielectric Shielded Power Cables Rated 5 Through 46 kV.

AEIC CS9, Specification for Extruded Insulation Power Cables and Their Accessories Rated Above
46 kV Through 345 kV ac.

ANSI C119.4, Electric ConnectorsConnectors to for Use Between Aluminum-to-Aluminum or

Aluminum- to-Copper Conductors Bare Overhead Connectors. 2

ASTM D149-97a, Standard Test Method for Dielectric Breakdown Voltage and Dielectric

3
Strength of Solid Electrical Insulating Materials at Commercial Power Frequencies.

ASTM D412-98, Standard Test Methods for Vulcanized Rubber and Thermoplastic Elastomers.

ASTM D991-89, Standard Test Method for Rubber Property-Volume Resistivity of Electrically

Conductive and Antistatic Products.

ASTM D4325-08 02, Standard Test Methods for Nonmetallic Semi-Conducting and Electrically

Insulating Rubber Tapes.

2 ANS I public ations are available from the S ales Department, Americ an National S tandards Institute, 25 West 43rd S treet, 4th

Floor, New York, NY 10036, US A (http://www.ansi.org/).

3 AS TM public ations are available from the Americ an S oc iety for Testing and Materials, 100 Barr Harbor Drive, West

Conshohoc ken, PA 19428-2959, US A (http://www.astm.org/).

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
ASTM D4496-04, Standard Test Method for DC Resistance or Conductance of Moderately

Conductive Materials.

ICEA P-32-382, Short-Circuit Characteristics of Insulated Cable. 4

ICEA P-45-482, Short-Circuit Performance of Metallic-shields and Sheaths on Insulated Cable.

IEEE Std 4, IEEE Standard Techniques for High-Voltage Testing. 5, 6

IEEE Std 82, IEEE Standard Test Procedure for Impulse Voltage Tests on Insulated Conductors.

IEEE Std 575-1988, IEEE Guide for the Application of Sheath-Bonding Methods for Single-
7
Conductor Cables and the Calculation of Induced Voltages and Currents in Cable Sheaths.

IEEE Std 592, IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints

and Separable Insulated Connectors.

IEEE Std C37.09, IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers Rated

on a Symmetrical Current Basis.

4 ICEA public ations are available from ICEA,, P.O. Box 1568, Carrollton, GA 30112, the Insulated Cable Engineers Association, P.O.

Box 20048, Minneapolis, MN 55420 US A (http://www.ic ea.net/).

5 IEEE public ations are available from The Institute of Elec tric al and Elec tronics Engineers, 445 Hoes Lane, Piscataway, NJ 088545-

1331 US A (http://standards.ieee.org/).

6 The IEEE standards or produc ts referred to in this c lause are trademarks of The Institute of Elec tric al and Elec tronic s Engineers,

Inc .

7 IEEE S td 575-1988 has been withdrawn; however, c opies c an be obtained from Global Engineering, 15 Inverness Way East,

Englewood, CO 80112-5704, US A, tel. (303) 792-2181 (http://global.ihs.c om/).

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
NEMA WC4/ICEA S-65-375, Varnished-Cloth-Insulated Wire and Cable for the Transmission and

Distribution of Electrical Energy. 8

IEEE Std 592, IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints

and Separable Insulated Connectors.

IEEE Std C37.09, IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers Rated

on a Symmetrical Current Basis.

3. Definitions

For the purposes of this document, standard the following terms and definitions apply. The
Authoritative Dictionary of IEEE Standards Dictionary Online Terms [B7]9 should be consulted

referenced for terms not defined in this clause. 8

8 IEEE Sta nda rds Dictiona ry Online subsc ription is available at

http://www.ieee.org/portal/innovate/produc ts/standard/standards_dic tionary.html.

8 NEMA public ations are available from Global Engineering Documents, 15 Inverness Way East, Englewood, CO 80112, US A

(http://global.ihs.c om/).

9 The numbers in brac kets c orrespond to those of the bibliography in Annex C

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
3.1 Cable joint categories

Cable joints are generally described by one of the categories that follow. These descriptive categories

are provided only for convenience. They are not intended to cover all possible joint constructions.

Some joint constructions may incorporate characteristics of two or more of the design categories

listed.

extruded: A joint in which both cables are insulated with extruded dielectric materials rated 2.5 kV

to 500 kV.

laminated: A joint in which both cables have a dielectric that consists of fluid-impregnated paper or

paper/synthetic laminated tape, or varnished cloth.

transition: A joint that connects an extruded dielectric cable to a laminated dielectric cable.

3.2 Joint constructions

field vulcanized: A joint constructed in the field using externally applied heat and pressure to

cross-link the joint polymeric materials dielectric.

filled: A joint consisting of an outer shell that is filled with an insulating material to occupy the

space around the individual insulated conductor(s).

heat-shrink: A joint provided to the end user as consisting of one or more expanded polymeric

components extruded tubes or molded parts that undergo thermally activated recovery when

heated to an appropriate temperature. Production electrical testing cannot be performed on this

type of joint because the stress control, insulation, and shield layers are not integrated during the

molding or extrusion process.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
multi-component cold-shrink: A joint provided to the end user as two or more expanded

individual components, excluding the metallic splice, and the cable shield and jacket restoration

components that are applied over a prepared cable and reduced in diameter without the use of heat

by removal of the supporting cores. Production electrical testing cannot be performed on this type of
joint because the stress control, insulation, and shield layers are not integrated during the molding

or extrusion process. See also: single-component cold-shrink.

premolded: A joint that is factory molded in the shape that it will take when installed. Installation is

performed by sliding the joint over a prepared cable. The use of heat is not a part of the installation

procedure. Production electrical testing can be performed on this type of joint because the stress

control, insulation, and shield layers are integrated during the molding process.

single-component cold-shrink: A joint provided to the end user as an expanded single component

device excluding the metallic splice, and the cable shield and jacket restoration components, that is
applied over a prepared cable and reduced in diameter without the use of heat a by removal of

supporting core. Production electrical testing can be performed on this type of joint because the

stress control, insulation, and shielding layers are integrated during the molding or extrusion
process. See also: multi-component cold-shrink.

taped: A joint constructed in the field with the use of one or more tapes that are applied over the

cable layers. Heat may or may not be applied as part of the installation procedure. Production

electrical testing cannot be performed on this type of joint.

3.3 Other terms

family of joints: A group of two or more joints designed for use on extruded and/or laminated

dielectric cables rated 2.5 kV to 46 kV. All joints within the family shall have the same insulation

and conductive materials, conductive shield thickness, and maximum electrical stresses within the

insulation and along the joint/cable interfaces.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
fingerprinting: Tests made to establish and subsequently confirm the properties of materials or

components used in cable accessories. The samples used for the initial tests shall be from the same

batch as those used in the accessory design tests. For the purposes of this standard, this only applies

to field- fabricated joint constructions such as heat shrinkable, multi-component cold-shrink joints,

field vulcanized, and taped joints.

sectionalizer: A sectionalizer is used to minimize induced current in the cable sheath/shield by

electrically interrupting the semiconducting shield and conducting metallic sheath or shield of the

two cable lengths that are joined together. Sectionalizers are primarily used on cable systems

operating at 60 kV and above as described in IEEE Std 57510-1988.

splice body: The component in a power cable joint kit that provides the dielectric insulation and

may or may not contain the stress control and shielding as integral components.

4. Service conditions

Todays Current cable joint designs are considered suitable for use under the following service

conditions. However, it should be understood that this list was compiled based more on user

and manufacturer experience than on specific requirements of this standard actual design testing. It

is not meant, in any way, to imply that any or all of these conditions are fully verified in this

standard. For specific questions regarding these or other service conditions, the manufacturer

should be consulted.

a) Alternating currents

b) In-air, including exposure to direct sunlight

10 For information on referenc es, see Clause 2.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
c) Buried in earth

d) Intermittently or continuously submerged in water at a depth not exceeding 7 m (23 ft)

e) Environmental temperatures within the range of 30 C to +50 C for joints used on fluid-

filled and laminated dielectric cables. All other cable joints are suitable for use at

temperatures within the range of -40 C to +65 C.

f) In underground chambers, tunnels, conduits, manholes, and vaults

g) Approximately horizontal installation of laminated dielectric joints rated 69 kV to 500 kV

5. Ratings

5.1 Voltage

The voltage ratings and test levels of cable joints shall be in accordance with Table 1 through Table 4.

5.2 Current and temperature

The current and temperature ratings of the cable joint shall be equal to or greater than those of the

cable for which it is designed as verified in 7.5, 7.6, 7.11, and the basic insulation level (BIL) test

conducted at emergency operating temperature in test of 7.4.3. For transition joints, the maximum

temperature rating is based on the cable with the lower temperature rating limit.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Table 1 Voltage ratings and design test levels for extruded dielectric
cable joints rated 2.5 kV to 46 kV
Voltage Basic AC voltage design tests Minimum
Voltage Column D
rating insulation Column A partial DC
rating Column B Column C 1-min AC
phase-to- level (BIL) cyclic discharge withstand
phase-to- 5-min at 4.5 5 h at 3.5 withstand
ground, and full aging voltage level, voltage
phase, U U0 (kV U0 (kV voltage (kV
U0 (kV wave voltage 1.5 U0 15 min (kV)
a rms) rms) rms)
(kV rms)
rms)b (kV crest) (kV rms) (kV rms)c

2.5 1.4 60 4 6 5 9 2 30

5 2.9 75 9 13 10 18 45 35

8 4.6 95 14 21 16 23 7 45

15 8.7 110 26 39 31 35 13 75

25 14.4 150 43 65 50 52 22 105

35 20.2 200 61 91 71 69 30 140

46 26.6 250 67 c 100 c 80 c 80 40 172

a For use with 100% insulation level cable as defined in the applic able AEIC CS6 or AEIC CS 8.
To obtain test values for voltage

c lasses that are not listed, use linear interpolation between the next higher and lower listed values and round off to the nearest
whole kilovolt.

b
For grounded systems.

c
Theses values are interpolated between 35 kV and 69 kV c lass and not as multipliers of U0 .

c
Based on a sensitivity of 5 pC.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Table 2 Voltage ratings and design test levels for extruded dielectric
cable joints rated 69 kV to 500 kV

Basic AC voltage tests Minimum


DC
Voltage Voltage insulation Column A partial
Column B withstand
rating phase- rating phase- level (BIL) 15 min discharge
6 h HV time voltage
to- phase, U to- ground, and full withstand voltage level,
test at 2.5 U0 15 min
b wave (kV 1.5 U0 (kV
(kV rms) a U0 (kV rms) test at 3 U0
(kV rms) (kV)
crest) (kV rms) rms)c

69 39.8 350 120 100 240 60

115 66.4 550 200 166 300 100

138 79.7 650 240 200 315 120

161 93.0 750 280 232 375 140

230 132.8 1050 400 332 525 200

345 199.2 1300 600 500 650 300

500 288.7 1550 870 725 775 435


a For use with 100% insulation level c able as defined in the applic able AEIC CS 6 or AEIC CS 7.
To obtain test values for voltage

c lasses that are not listed, use linear interpolation between the next higher and lower listed values and round off to the nearest

whole kilovolt.
b
For grounded systems.
c Based on a sensitivity of 5 pC.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Table 3 Voltage ratings and design test levels for transition cable joints
Voltage AC withstand test AC HV time test DC
Voltage rating Basic
rating 1-min ac withstand
phase- to- insulation
phase-to- Time withstand Time Voltage voltage
phase, U (kV level (BIL)
ground, U0 (min) voltage (h) (kV rms) 15 min
rms) a (kV crest)
(kV rms) b (kV rms) (kV) c

2.5 1.4 60 1 8 6 8 30

5.0 2.9 75 1 16 6 16 38

8.7 5.0 95 1 20 6 20 48

15 8.7 110 1 35 6 35 55

25 14.4 150 1 58 6 58 75

35 20.2 200 1 80 6 80 100

46 26.6 250 1 100 6 100 125

69 39.8 350 1 100 24 100 175

115 66.4 450 1 170 24 170 225

120 69.3 550 1 170 24 170 275

138 79.7 650 1 200 24 200 325

161 93.0 750 1 230 24 230 375

230 132.8 1050 1 330 24 330 525

345 199.2 1300 1 500 24 500 650

500 288.7 1550 1 720 24 720 775


a For use with 100% insulation level c able as defined in the applic able AEIC CS 1, AEIC CS 2, AEIC CS 3, or AEIC CS 4.
To obtain

test values for voltage classes that are not listed, use linear interpolation between the next higher and lower listed values and round
off to the nearest whole kilovolt.

b
For grounded systems.
c Voltages represent 0.5 times the BIL.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Table 4 Voltage ratings and test levels for laminated cable joints
Voltage rating Voltage rating Basic insulation AC withstand test c DC withstand
phase- to-phase, phase-to- ground, level (BIL) and full voltage 15 min
Time Voltage
U (kV rms) a U0 (kV rms) b wave (kV crest) (h) (kV rms) (kV) d

2.5 1.4 60 6 8 30

5.0 2.9 75 6 16 38

8.7 5.0 95 6 20 48

15 8.7 110 6 35 55

25 14.4 150 6 58 75

35 20.2 200 6 80 100

46 26.6 250 6 100110 125

69 39.8 350 24 100 175

115 66.4 550450 24 170 225

120 69.3 550 24 170 275

138 79.7 650 24 200 325

161 93.0 750 24 230 375

230 132.8 1050 24 330 525

345 199.2 1300 24 500 650

500 288.7 1550 24 720 775


a For use with 100% insulation level c able as defined in the applic able AEIC CS 1, AEIC CS2, AEIC CS3, or AEIC CS4.
To obtain test

values for voltage classes that are not listed, use linear interpolation between the next higher and lower listed values and round
off to the nearest whole kilovolt.
b
For grounded systems.

c
Where this test voltage or test proc edure differs from the applic able AEIC spec ific ation, the latter shall apply.
d
Voltages represent 0.5 times the BIL.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
6. General requirements Construction

6.1 Identification

Cable joints should be permanently and legibly identified with the following information:

a) Company name or logo

b) Part identification

c) Date of manufacture (month and year)

Joints that cannot accommodate this information should be supplied with a label that contains this

information. The manufacturer should also provide a method of securely attaching the label to the

outside of the joint after it is assembled in the field unless otherwise specified by the user. In all

cases, the identification should be legible for the life of the joint.

In addition, the following information shall be contained on either the joint, joint components, or the

packaging material:

d) Use before date and storage conditions, if applicable

e) Maximum phase-to-phase or phase-to-ground voltage rating

f) Cable insulation diameter range

If the joint consists of a kit that contains a variety of materials manufactured at different times,

then the date of manufacture should be the date that the kit is packaged.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
6.2 Shielding

Cable joints should have a shielding system that is capable of maintaining the outer surface of the

joint effectively at ground potential as well as initiating fault current The shielding shall comply

with the requirements of IEEE Std 592.

6.2.1 Semiconducting shield

Joints with exposed semiconductive shields rated 15 to 35 kV, which operate with minimal or no

metallic- shielding directly contacting the semiconductive shield, shall comply with 7.9.

6.2.2 Metallic-shield

Metallic-shielding component systems supplied with joints or as an integral part of a joint design

shall comply with 7.10. Subclause 7.10 shall also be used to qualify stand-alone metallic-shielding

components which are not supplied with a complete joint.

6.3 Jacket seal

Environmental-seal component systems supplied with joints or as an integral part of a joint design

shall comply with 7.10. Subclause 7.10 shall also be used to qualify stand-alone environmental seal

components which are not supplied with a complete joint.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
6.4 Sheath/shield sectionalizers

The sheath/shield sectionalizer shall meet the requirements of 7.8 to verify it is ensure they are

capable of withstanding ac and lightning voltages conditions.

Sectionalizers need to must also be impervious to moisture entry to be functional. The


requirements of 7.10.2 are used to verify the moisture integrity of a sectionalizer design.

Sectionalizers shall also be mechanically rugged.

7. Design testing

Design tests are performed to qualify a particular product design, materials, and production process

for the general purpose or application covered in this standard. Design tests shall be performed on

prototype and preproduction units to shake out problems, but shall be performed on final

production units for the purpose of certifying that the process, as well as the materials and design,

comply with the requirements of this standard. Once a product design is qualified to the design test

requirements, quality is maintained, at a minimum, through the application of the production tests.

To claim conformance to this standard, a cable joint manufacturer shall :

a) Qualify the particular joint design, including the specific joint insulating and conductive

materials, and manufacturers installation material and construction details, according to

the design tests of Clause 7.4 and also

b) Meet the general requirements of Clause 6

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
c) Satisfactorily complete the testing sequences of the applicable flowcharts:

1) Flowchart 1 for extruded dielectric cable joints, 2.5 kV to 46 kV

2) Flowchart 2 for extruded dielectric cable joints, 69 kV to 500 kV

3) Flowchart 3 for all transition cable joints

4) Flowchart 4 for all laminated dielectric cable joints

d) For all cable joints designed for use on extruded dielectric cables rated 2.5 kV to 46 kV:

1) Satisfactorily complete the design tests on aluminum conductor cable in order to

claim the design is suitable for use on aluminum or copper conductor cable. A

cable joint design, qualified on copper conductor cable, can be rated for

application only on copper conductor cables.

2) Satisfactorily complete the design tests on cable insulated with the material of

Table 5 to claim conformance on the particular cable insulation material

referenced.

e) For cable joints 69 kV to 500 kV the user should consult the manufacturer for applicability

of the design test report data regarding the cable conductor material and insulation

materials as it pertains to the specific application;

f) Perform the production tests according to the requirements of Clause 8 7.1, 7.2, or 7.3

for that particular joint design category.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Table 5 Range of conforming cable insulation materials
Cable insulation material used for design Joint design conformance for these cable

testing insulation materials

XLPE XLPE, EPR

EPR EPR

7.1 Design tests and testing sequence for all joint types

Figure 1, Figure 2, Figure 3, and Figure 4 Table 5, Table 6 and Table 7 list the of design tests and

sequences required by this standard. Each sequence group column in each of the flowcharts tables

represents one test sequence. These design tests shall be performed on extruded, transition, and

laminated dielectric cable joints, respectively. All design tests shall be performed on production

units (or production materials if the joints are fabricated in the field) to demonstrate compliance of

the design with this standard. The results of these tests shall be recorded in the form of a report

certifying that a joint design meets the requirements of this standard, including the cable conductor

and insulation materials used for qualification testing. The report shall be available from the

manufacturer upon request.

7.2 Design test conditions

The following design test conditions shall apply unless otherwise specified:

a) Cable joints shall be properly assembled with actual production components according

to the manufacturers instructions. All parts that are normally grounded shall be

connected to the ground of the test circuit.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
b) Ambient air temperature shall be between 10 C and 40 C.

c) All ac voltages shall have a frequency of 47 Hz to 63 Hz 60 Hz 5% or 50 Hz 5%, and a

sine wave shape of acceptable commercial standards as defined in IEEE Std 4.

d) Voltages shall be measured in accordance with IEEE Std 4.

e) The cable used in these tests should conform to the applicable AEIC specification.

Insulation thickness should be in accordance with the latest revision of AEIC

specifications or ANSI/ICEA standards for the 100% insulation level. Unless otherwise

stated, the smallest nominal diameter cable for which the cable joint is designed

should be used, if practical. The exception to this is the short-time current test (see

7.8), in which case the largest nominal conductor for which the cable joint is designed

should be used, if practical. If testing is performed on cable not non-conforming cable to

AEIC specification it is incumbent on the manufacturer to verify ensure that the tests are

at least as severe on the joint as would be the case on the appropriate AEIC cable. In this

case The cable construction and corresponding cable specification shall be referenced in

the joint test report. The cable conductor type and the cable insulation materials shall be

as described in Clause 7.

f) The cable conductor size, cable insulation material, as well as the specific splice body

size in a family of joints used in these design tests can significantly affect the outcome of

certain tests. The following requirements shall be followed:

1) Sequence 1 of Figure 1 or Figure 2, shall be performed as follows:

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
i) For joints rated 2.5 kV to 46 kV, Figure 1, Sequence 1, sample number 1

through number 6, testing shall be performed on the smallest available conductor

cable as well as the largest available conductor cable for which the joint is

designed. To qualify a family of joints the smallest splice body in the family shall

be tested on the smallest available conductor size cable for which it is designed

and the largest splice body in the family shall be tested on the largest available

conductor size cable for which it is designed.

ii) For joints rated 69 kV to 500 kV, Figure 2, Sequence 1, sample number 1

through number 4, testing shall be performed on the largest nominal conductor

size cable for which the joint is designed.

2) The short-time current test of 7.5 shall be performed on the largest available size

cable conductor for which the joint is designed. When qualifying a family of joints, use

the splice body size that accommodates a cable size rated as close as possible to 40 kA,

0.17 s.

3) For extruded dielectric cable joints rated 15 kV to 35 kV, the semiconducting shield
must meet the resistance and fault current initiation tests of 7.9 and can be performed

on any conductor size. When qualifying a family of joints the test shall be performed

on the particular splice body in the family which has the highest resistance from the

cable entrance to the midpoint of the joint body, usually the housing for the smallest

cable size in the family. Any conductor size in that housing may be used.

4) Connector thermal and mechanical tests of 7.11 shall be performed on appropriate

connectors, cable conductor materials and sizes.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
g) If a cable failure occurs during a design test, the failed cable may be reterminated

provided that the minimum specified distance between the joint and the termination is

met. The test shall be resumed by repeating the step during which the cable failed. If the

minimum length cannot be met, the joint on the failed cable or a new joint shall be

assembled on a new cable, and the entire design test sequence shall be repeated.

h) If a joint failure occurs during a design test, all qualification tests in that column

sequence in Figure 1, Figure 2, Figure 3, or Figure 4 of Table 5, Table 6 or Table 7 shall be

repeated for the number of samples specified for that sequence column. Any joint

samples that passed the original tests may be used to repeat that column of testing if

desired.

7.3 Dielectric integrity tests

7.3.1 Partial discharge voltage level test

This procedure is part of the design test sequence for all joints intended for use on extruded

dielectric cables. It is also used as a routine production test for premolded and single-component

cold-shrink joints. The purpose of this test is to verify that the partial discharge voltage level of the

test specimen is not less than the value given in Table 1 or Table 2 for design testing or Table 10 or

Table 11 for production testing when tested in accordance with IEC 60270.

The test voltage shall be raised to 20% above the partial discharge voltage level specified in Table

1 or Table 2 for design tests or Table 10 or Table 11 for production testing. If partial discharge

exceeds 5 pC, the test voltage shall be lowered to the partial discharge voltage level specified in the

tables and shall be maintained at this level for at least 3 s, but not more than 1 min. If partial

discharge readings still exceed 5 pC, the joint design does not meet the requirements of this

standard.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
7.3.2 Ionization test

This test is applicable only for transition joints. The purpose of this test is to verify that the

ionization factor of transition joints remains within the limits specified in Table 6. The ionization

factor is the difference, at 50 Hz or 60 Hz, between the dissipation factor measured at an average

stress in the cable of 4000 V/mm and the dissipation factor measured at an average stress of 800

V/mm. The measurement voltage is based on the insulation thickness of the laminated cable.

Table 5 Design tests and sequence for extruded dielectric cable joints
Minimum number of samples required in each

Design test Reference sequence

3(2) a 3(2) b 3(1) c 3 7e

Partial discharge voltage level 7.6.1 X X

AC withstand voltage 7.7.1 X X

DC withstand voltage 7.7.2 X X

Impulse withstand voltage at 25 C 7.7.3 X X

Impulse withstand voltage at


7.7.3 X X
emergency temperature

Partial discharge voltage level 7.6.1 X X

Cyclic aging in-air, 30 cycles

(shield and jacket restoration devices, if 7.9.1 or

applicable) d 7.9.2 X

7.9.1 or
Cyclic aging in water, 30 cycles X
7.9.2

Partial discharge voltage level 7.6.1 X X

High-voltage time 7.10 X X

Impulse withstand voltage at 25 C 7.7.3 X X

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Partial discharge voltage level 7.6.1 X X

Sectionalizer test (if applicable) 7.11 X X

Shield restoration: two short-time

current tests (if applicable) d 7.13.1 X

Jacket restoration: cyclic aging in

water, 10 cycles (if applicable) d 7.13.2 X

Short-time current 7.8 X

AC withstand voltage 7.7.1 X

Shielding 7.12 X

Connector thermal and mechanical 7.14 X

a
For c yclic aging in-air, three samples are required for 2.5 kV to 46 kV joints ac cording to 7.9.1 and two samples are required for

69 kV to 500 kV joints ac cording to 7.9.2. Shield and jac ket restoration c omponents should be assembled on these in-air samples if

applic able.

b
For c yclic aging in water, three samples are required for 2.5 kV to 46 kV joints ac c ording to 7.9.1 and two samples are required

for 69 kV to 500 kV joints ac cording to 7.9.2. For 69 kV to 500 kV, the two samples in water are not required if the joint design
inc orporates a solid metal housing that is welded or soldered to a solid c able sheath or pipe.

c
Three samples are required for 2.5 kV to 46 kV joints. One sample is required for 69 kV to 500 kV joints.

d
S hield and jac ket restoration c omponent testing shall be performed in the sequenc e shown if tested in c onjunc tion with design

tests of a c ompleted joint. If testing either or both of these c omponents independent of a joint design test, it is not nec essary to
perform the previous dielec tric tests in this sequenc e.

e
Four samples are required for thermal tests, and three samples are required for mec hanic al tests.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Table 6 Design tests and sequence for transition joints
Minimum number of samples required in each

Design test Reference sequence

2a 2b 2 7d

AC withstand voltage 7.7.1 X X

DC withstand voltage 7.7.2 X X

Impulse withstand voltage at 25 C 7.7.3 X X

Impulse withstand voltage at

emergency temperature 7.7.3 X X

Ionization 7.6.2 X X

Cyclic aging in-air

(shield and jacket restoration devices,

if applicable) c 7.9.2 X

Cyclic aging in water 7.9.2 X

Ionization 7.6.2 X X

High-voltage time 7.10 X X

Sectionalizer (if applicable) 7.11 X X

Shield restoration: two short-time

current tests (if applicable) c 7.13.1 X

Jacket restoration: cyclic aging in

water, 10 cycles (if applicable) c 7.13.2 X

Shielding 7.12 X

Connector thermal and mechanical 7.14 X

a
For c yclic aging in-air, two samples are required. S hield and jac ket restoration components should be assembled on these in-air

samples if applic able.

b
For c yc lic aging in water, two samples are required. For 69 kV to 500 kV, the two samples in water are not required if

the joint design inc orporates a solid metal housing that is welded or soldered to a solid c able sheath or pipe.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
c
S hield and jac ket restoration c omponent testing shall be performed in the sequenc e shown if tested in c onjunc tion with

design tests of a c ompleted joint. If testing either or both of these c omponents independent of a joint design test, it is not nec essary to
perform the previous dielec tric tests in this sequenc e.

d
Four samples are required for thermal tests, and three samples are required for mec hanic al tests.

Table 7 Design tests and sequence for laminated dielectric cable joints
Minimum number of samples

Design test Reference required

3(1) a 7b

AC withstand voltage 7.7.1 X

DC withstand voltage 7.7.2 X

Impulse withstand voltage at emergency

temperature 7.7.3 X

Connector thermal and mechanical 7.14 X

a Thre e samples are re quired for 2.5 kV to 35 kV joints and one sample is re quired for 46 kV to 500 kV joints.

b Four sample s are re quire d for the rmal te sts, and thre e sample s are re quire d for me chanical te sts.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Table 6Maximum allowable ionization factor values for transition
joints
Joints connecting paper-insulated lead- Joints connecting self-contained and high-

covered (PILC) cable pressure pipe-type cables

Maximum Maximum
Rated voltage Rated voltage
ionization factor ionization factor
(kV) (kV)
(%) (%)

1020 0.60 161 0.10

2135 0.40 > 161 0.05

3669 0.20

The measurement shall be made at ambient temperature. For pressurized cables, the gas or liquid

pressure shall be within the operating limits specified by the appropriate AEIC cable specification.

For transition joints on self-contained or pipe-type cables, the ionization factor is defined as the

difference, at 50 Hz or 60 Hz, between the dissipation factor measured at 1.2 U 0 and the dissipation

factor measured at 0.125 U0 . U0 , the phase-to-ground voltage, should be that of the cable with the

lower rating.

If the measured value is outside the limits specified in Table 6, the joint design does not meet the

requirements of this standard.

This test is not required for joints that employ nonlinear, high dielectric constant or impedance layer

materials. However, the manufacturer shall demonstrate that the nonlinear material is stable

and will perform effectively over the life of the joint.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
(New)
a
S ample number 1, number 2, and number 3 to be used for c yc lic aging in-air, ac c ording to 7.6.1. Joint-metallic -shield and

jac keting c omponents shall be assembled on these in-air samples if applic able.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
b
S ample number 4, number 5, and number 6 to be used for c yc lic aging in water, ac c ording to 7.6.1.

c
Joint-metallic -shield and jac keting c omponent testing shall be performed in the sequenc e shown if tested in c onjunc tion with

design tests of a c ompleted joint. If testing either or both of these components independent of a joint design test, it is not nec essary to
perform the previous dielec tric integrity or voltage tests in this sequenc e.

d
S equenc e 1 performed on the smallest and largest available c onduc tor sizes.

e
S equenc e 2 performed on the largest available c onduc tor size.

f S equenc e 3, shielding test, per IEEE S td 592, latest revision.

Figure 1Flowchart 1

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
(New)
a
S ample number 1 and number 2 to be used for c yc lic aging in-air, ac c ording to 7.6.2. Joint-metallic -shield and jac keting
c omponents shall be assembled on these in-air samples if applic able.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
b
S ample number 3 and number 4 to be used for c yc lic aging in water, ac c ording to 7.6.2. These two samples in water are not

required if the joint design inc orporates a solid metal housing that is welded or soldered to a solid c able sheath or pipe.

c
Joint-metallic -shield and jac keting c omponent testing shall be performed in the sequenc e shown if tested in c onjunc tion with

design tests of a c ompleted joint. If testing either or both of these components independent of a joint design test, it is not nec essary to
perform the previous dielec tric integrity or voltage tests in this sequenc e.

d
S equenc e 1 and sequenc e 2 performed on the largest available c onduc tor size.

Figure 2Flowchart 2

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
(New)
a
S ample number 1 and number 2 to be used for c yclic aging in-air, ac c ording to 7.6.1 or 7.6.2. Joint-metallic -shield and jac keting
c omponents shall be assembled on these in-air samples if applic able.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
b
S ample number 3 and number 4 to be used for c yc lic aging in water, ac cording to 7.6.1 or 7.6.2. For 69 kV to 500 kV, the two

samples in water are not required if the joint design inc orporates a solid metal housing that is welded or soldered to a solid
c able sheath or pipe.

c
Joint metallic -shield and jac ket c omponent testing shall be performed in the sequenc e shown if tested in c onjunc tion with

design tests of a c ompleted joint. If testing either or both of these components independent of a joint design test, it is not nec essary to
perform the previous dielec tric integrity or voltage tests in this sequenc e.

d S equenc e 2, shielding test, per IEEE S td 592, latest revision.

Figure 3Flowchart 3

(New)
a
Three samples, number 1, number 2, and number 3, are required for 2.5 kV to 35 kV joints, and one sample is required for 46 kV to

500 kV joints.

Figure 4Flowchart 4

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
7.4 Voltage withstand tests

The purpose of these tests is to verify that the insulation of the test specimen is not defective and

will withstand the design test voltages shown in Table 1, Table 2, Table 3, or Table 4. Some of

the tests are also used as routine both production and design tests for premolded and single-

component cold-shrink joints shown in Table 10 and Table 11.

These tests are applicable for all joint types. The test voltage shall be applied to the parts of the cable

joint that are energized in service.

For transition cable joints, all electrical test values are based on the cable with the lower test

requirements.

For pressurized cables, the gas or liquid pressure shall be within the operating limits specified

by the appropriate AEIC specification.

7.4.1 AC voltage

This test is applicable as a design test for all joint types. It is also one of the routine production test

options for premolded and single-component cold-shrink joints.

For design testing, the voltage shall be raised at a rate of 5 kV/s 3 kV/s, to the value specified in

one of the following:

Table 1, column D, for extruded dielectric cable joints 2.5 kV kV to 46 kV

Table 2, column A, for extruded dielectric cable joints 69 kV to 500 kV

Table 3 for, ac withstand test for transition cable joints

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Table 4 for, ac withstand test for laminated dielectric cable joints

For routine production testing of premolded and single-component cold-shrink joints, the voltage

shall be raised at a rate of 5 kV/s 3 kV/s, to the value specified in one of the following:

Table 10, ac withstand test for extruded dielectric cable joints 2.5 kV to 46 kV, for 1 min

Table 11, ac withstand test for extruded dielectric cable joints 69 kV to 500 kV, for 15 min

The cable joint shall withstand the specified test voltage for the time specified in the tables.

7.4.2 DC voltage

See Annex C.

This test is applicable as a design test for all joint types.

The test voltage shall have a negative polarity (the negative terminal is connected to the conductor

of the test specimen) and shall be raised to the value specified in Table 1, Table 2, Table 3, or Table 4.

The cable joints shall withstand the specified test voltage for 15 min.

7.4.3 Basic Insulation Level Impulse voltage (BIL)

This test is applicable as a design test for all joint types. It is also one of the routine production test

options for premolded and single-component cold-shrink joints.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
The test voltage wave shape shall be as specified in IEEE Std 4, for full lightning-impulse voltages.

having the BIL specified in Table 1, Table 2, Table 3, or Table 4 of this standard. The test procedure

(including sample conditioning) shall be as specified in IEEE Std 82.

For design testing, the procedure (including sample conditioning) shall be as specified in IEEE Std

82. The cable joint shall withstand ten positive and ten negative full-wave impulses with a

magnitude equal to the BIL value specified in Table 1, Table 2, Table 3, or Table 4.

Design tests at emergency operating temperature shall correspond to the impulse temperature
requirements outlined in the applicable specifications standard (see Table 7). The cable manufacturer

should be consulted in the case of special-use cables.

Table 7 Reference cable specification standards for temperature


requirements
Cable type Standard

1.0 kV to 69 kV paper-insulated metallic-sheathed AEIC CS1

69 kV to 765 500 kV high-pressure pipe-type AEIC CS2

8 kV to 46 kV low-pressure gas-filled AEIC CS3

69 15 kV to 500 kV self-contained AEIC CS4

5 kV to 69 kV EPR AEIC CS6

69 kV to 138 kV XLPE AEIC CS7

5 kV to 46 kV extruded dielectrics AEIC CS8

Above 46 kV to 345 kV extruded dielectrics AEIC CS9

600 V to 28 kV varnished cloth NEMA WC4*


*historic al doc ument

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
For extruded dielectric cable joints, the test shall be performed first with the conductor at ambient

temperature, and then again with the conductor at the maximum emergency operating temperature

of the cable, +0 C /-105 C.

For transition joints, the test shall be performed first with the conductor temperature of both cables

at ambient temperature, and then again with the cables at elevated temperature, +0/-105C. The

elevated temperature is based on the maximum emergency operating conductor temperature of the

cable with the lower temperature rating.

For laminated dielectric cable joints, the test shall be performed only at the maximum emergency

operating conductor temperature of the cable, +0/- C 105 C.

Elevated conductor temperatures are primarily obtained by circulating ac current in the conductor

of the cable. There shall be no current in the metallic-shields of the cable or joint. The reference

location for all conductor temperature requirements is midway between the end of the joint and the

base of the termination.

In all cases, the test temperature shall be reported in the test report. Elevated conductor

temperatures produced by means other than by circulating current in the conductor of the cable is

permissible only by mutual agreement between the supplier and the end user. When such alternate
methods are used, it is necessary to verify must ensure that the conductor temperature is at the

maximum emergency operating temperature of the cable, +0 C/-105 C.

When the impulse voltage withstand test is used as a production test, the cable joint shall withstand

one full-wave impulse at each polarity with a magnitude equal to the BIL value specified in Table 10

or Table 11.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
7.5 Short-time current test

The purpose of this test is to verify that the extruded dielectric cable joint is capable of withstanding

short- time, short-circuit currents. The magnitude shall be equal to the short-circuit rating (in rms

symmetrical amperes) of the largest conductor for which the joint is size defined in 7.2 for a
duration of 0.17 s. The 50 Hz or 60 Hz current magnitude shall be sufficient to raise the cable

conductor temperature from ambient to its rated short-circuit temperature. The current magnitude

used for this test should not exceed 40 35 kA and shall be determined by using ICEA P-32-382 and

utilizing the formulas given to correct the curves to the appropriate ambient temperature condition.

The current magnitude shall be measured in accordance with IEEE Std C37.09.

Following the short-time current test, the cable joint shall be tested in accordance with the ac voltage

test of 7.4.1 to further verify its integrity.

7.6 Cyclic aging test for extruded dielectric and transition joints

The purpose of this test is to verify that cyclic loading will not adversely affect the ability of the

cable joint to operate in-air or submerged in water. If a joint design or construction requires an

integral specific jacketing restoration kit or environmental sealing components for proper operation,

and the manufacturer only provides the joint with this device as a complete kit, then 7.6.1 or 7.6.2

shall be performed with this cover or seal installed.

If desired, joint cable metallic-shield restoration components and/or cable restoration jacketing

components may be qualified simultaneously with a cable joint qualification. In this case, either or

both of these restoration components shall be assembled only on the in-air samples as described in

7.10.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
7.6.1 Extruded cable joints rated 2.5 kV to 46 kV

If joint metallic-shield and/or jacketing cable restoration components are to be qualified

simultaneously with a specific joint design, the appropriate restoration components shall be

assembled on the in-air joints. The joint samples in water shall be cycled without restoration

jacketing components to verify ensure that these devices do not influence potentially marginal joint

electrical interfaces unless their design or construction specifically requires an integral jacketing kit

or environmental seal for proper operation and the manufacturer only provides the joint with this

device as a complete kit.

The test may be conducted on each joint individually or with two or more joints connected in series

for either of the two groups of tests performed.

The required number of tests, as well as the specific cable sizes required for each test, are described

in 7.2. Each test group The cable joints shall be assembled on a cable that has an insulation outside

diameter that is at or near the minimum diameter for which the cable joint is designed, and shall be

subjected to the continuous ac voltage shown in Table 1, column A, for 30 d. The test shall be

performed on a minimum of three cable joints in-air and a minimum of three cable joints in tap

water on the same type and size cable The cable insulation material and cable conductor material

used for each test group shall be according to Clause 7. The same six joints in each group shall are

to be used for on all cyclic aging tests in Sequence 1 of Figure 1. The cable joints in water shall be

submerged at a minimum depth of 0.3 m (1 ft), measured from the top surface of the joints. The

water shall neither be heated nor cooled during this test, but shall be left to follow the load cycling

unconstrained.

A minimum length of 2 m (6.5 ft) of cable is required between joint ends and the base of each

termination.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
The six joints in each test group shall be subjected to 30 load cycles. Each load cycle is defined as a

24 h time span with a current-on period and a current-off period. During the current-on period,

sufficient ac current shall be passed through the conductor to achieve a cable conductor

temperature within +0 C/-105 C of the cable rated emergency operating temperature for a period of
at least 6 h. The 6 h period does not include the time it takes to achieve the emergency operating

temperature. There shall be no current in the cable metallic-shield. The cable emergency operating

temperature shall be determined by reference to the applicable specification standard (see Table 7).

The cable manufacturer should be consulted in the case of special-use cables.

The samples shall be subjected to the continuous ac voltage shown in Table 1, Column A, for the 30

cycles.

The reference location for all conductor temperature requirements is midway between the water

surface and the base of the end terminations for joints tested in water, or midway between the joint

end and the base of the end terminations for joints tested in-air. The temperature at this location

shall not be influenced by the joint, water, or end terminations.

The following information shall be recorded in the test report:

a) The maximum temperature of the outside of each the joint body housings in water

b) The maximum temperature of the outside of each the joint body housings in air

c) The temperature of the outside surface of the cables in air

d) The cable rated emergency operating temperature used to qualify the joint

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
During the current-off period, the reference cable conductor temperature shall drop to within 5 C of

the ambient air temperature. If this condition cannot be met, the test shall be interrupted at the end

of the 5th cycle, 10th cycle, 15th cycle, 20th cycle, and 25th cycle. During these interruptions, the

voltage, current, and any supplemental heat source shall remain off for a minimum period of 24 h
to allow the joints to cool as close to room temperature as possible. The load cycle (current and

voltage) and supplemental heat source (if used) shall be resumed at the end of the interruption

period. This procedure may be followed even if the temperature condition during the current-off

period can be met.

The test samples specimens shall complete 30 load cycles. The 24 h interruption periods are not

considered part of a load cycle.

If, for any reason, the voltage or conductor temperature falls below the specified level for more

than 5 min at any time during any given load cycle, then that load cycle shall be repeated. Load

Cycles may be contiguous, or there may be periods with no voltage and no current between load

cycles to accommodate schedule variations or equipment failures.

7.6.2 Extruded cable joints rated 69 kV to 500 kV and transition joints


rated 2.5 kV to 500 kV

If joint metallic and jacketing cable restoration components are to be qualified simultaneously with

a specific joint design, the appropriate restoration components shall be assembled on the in-air

joints. The joint samples in water are cycled without restoration jacketing components to verify

ensure that these devices do not influence potentially marginal joint electrical interfaces unless their

design or construction specifically requires an integral jacketing kit or environmental seal for proper

operation and the manufacturer only provides the joint with this device as a complete kit.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
The test may be conducted on each joint individually or with two or more joints connected in series.

The conductors of multi-conductor joints should be connected in series.

The cable joints shall be assembled on cables with conductor sizes as described in 7.2. that have an

insulation outside diameter that is at or near the minimum diameter for which the cable joint is

designed. Sheath/shield sectionalizers shall be incorporated if they are part of the joint design. They

shall remain shorted until the tests in 7.8 are performed.

Testing shall be performed on four cable joints. The same four joints are to be used for all cyclic

aging tests in Sequence 1 of Figure 2 or Figure 3. Multi-conductor joints in a common housing are

considered one joint. Two joints are suspended in-air, and two are submerged in tap water to a

depth of 1 m (3.3 ft). The two samples in water are not required if the joint design incorporates a

solid metal housing that is welded or soldered to a solid cable sheath or pipe.

Conduit may be used for the in-water portion of this test and may be made of any appropriate

material. The conduit (or enclosure) should be longitudinally centered on the joints and shall extend

a minimum of 300 mm (12 in) beyond each joint end. A vertical tube having a minimum inside

diameter of 50 mm (2 in) should be attached to the conduit. It should be of sufficient length to

provide the specimen with a head of tap water measuring a minimum of 1 m from the top surface
of the joint. The water shall neither be heated nor cooled during this test, but shall be left to follow

the load cycling unconstrained.

A minimum length of 2 m (6.5 ft) of cable is required between the conduit or water tank and the

base of each end termination for joints tested in water or between the joint ends and the base of

each termination for joints tested in-air.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
The four joints shall be subjected to 30 load cycles. Each load cycle is defined as a 24 h time span

with a current-on period and a current-off period. During the current-on period, sufficient ac

current shall be passed through the conductor to achieve a cable conductor temperature within +0

C/-105 C of its rated emergency operating temperature for a period of at least 6 h. The 6 h period
does not include the time it takes to achieve the emergency operating temperature. For transition

joints, the emergency operating temperature of the cable with the lower rating should be used. The

cable emergency operating temperature shall be determined by reference to the applicable

specification standard (see Table 7). The cable manufacturer should be consulted in the case of

special-use cables.

Two times the rated phase-to-ground ac voltage shall be applied continuously for the 30 cycles. For

transition joints, two times the rated phase-to-ground ac voltage of the cable with the lower rating

should be used. There shall be no current in the cable metallic-shield.

The reference location for all conductor temperature requirements is midway between the end

of the conduit or water tank and the base of the end terminations for joints tested in water or

midway between the joint ends and the base of the end terminations for joints tested in-air. For

transition joints, this measurement is made on the cable with the lower temperature rating. The

temperature at this location shall not be influenced by the joint, water-filled conduit or tank, or end
terminations.

The following information shall be recorded in the test report:

a) The maximum temperature of the outside of each the joint body housings in water

b) The maximum temperature of the outside of each the joint body housing in-air

c) The temperature of the outside surface of the cables in-air

d) The cable rated emergency operating temperature used to qualify the joint

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
During the current-off period, the reference cable conductor temperature shall drop to within 5 C of

the ambient air temperature. If this condition cannot be met, the test shall be interrupted at the end

of the 5th cycle, 10th cycle, 15th cycle, 20th cycle, and 25th cycle. During these interruptions, the

voltage and current shall remain off for a period of at least 24 h to allow the joints to cool as

close to room temperature as possible. The load cycle (current and voltage) shall be resumed at the

end of the interruption period. This procedure may be followed even if the temperature requirement

during the current-off period can be met.

The test samples specimen shall complete 30 load cycles. The 24 h interruption periods are not
considered part of a load cycle.

If, for any reason, the voltage or conductor temperature falls below the specified level for more

than 5 min at any time during any given load cycle, then that load cycle shall be repeated. Load

Cycles may be contiguous or there may be periods with no voltage and no current between load

cycles to accommodate schedule variations or equipment failures.

For transition joints, the ionization factor shall be measured as specified in 7.3.2 at the beginning of

the test period and at the end of the load cycle test (the completion of 30 cycles). The ionization

factor shall be in accordance with Table 6.

For transition joints, the internal pressure of the pressurized and laminated dielectric cable shall be

maintained at normal operating pressure throughout this test, except for solid-type laminated

dielectric cables, which shall have a maximum pressure during the test of 103 kPa (14.9 psi) gauge.

7.7 High-voltage time test

The purpose of this test is to verify the electrical integrity of extruded dielectric and transition joints.

Figure 1, Figure 2, and Figure 3 Table 5 and Table 6 specify the design test sequence. Test voltage is

applied as follows:

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
For extruded dielectric cable joints rated 2.5 kV to 46 kV:

Test voltage specified in Table 1, Column C, for 5 h followed by:

Test voltage specified in Table 1, Column B, for 5 min.

For extruded dielectric cable joints rated 69 kV to 500 kV:

Test voltage specified in Table 2, Column B, for 6 h.

For transition joints rated 2.5 kV to 500 kV:

Test voltage and time as specified in the ac High Voltage (ac HV) time test column of

Table 3.

All joints subjected to this test shall be completely submerged in ambient temperature tap

water. The submersion depth is a minimum of 0.3 m (1 ft) for 2.5 kV to 46 kV extruded dielectric

cable joints and a minimum of 1 m (3.3 ft) for 69 kV to 500 kV extruded dielectric cable joints and all

transition joints. These submersion depths correspond to the submersion depths required during the

load cycle tests for each joint construction. They are measured from the top surface of the joint.

The joint shall be submerged for at least 1 h before the test voltage is applied. Samples previously

tested in a water-filled conduit may be left in the conduit. Samples previously tested in-air shall be

submerged in tap water using any convenient method.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
7.8 Sectionalizer tests

Cable joints with sectionalizers, samples 1, 2, and 3 of Figure 1 or samples 1 and 2 of Figure 2 or

Figure 3, shall be tested in accordance with the following procedures. All joints subjected to this test

shall be completely submerged in ambient temperature tap water. The minimum submersion depth

shall be 0.3 m (1 ft) for extruded cable joints rated 2.5 kV to 46 kV and 1 m (3.3 ft) for all

other joints. This depth corresponds to the submersion depth required during the load cycle

test, 7.6.1 and 7.6.2, for each joint construction and is measured from the top surface of the joint.

The joints containing sectionalizers shall remain submerged in the water following the high-voltage

time test.

7.8.1 AC voltage withstand tests

A voltage of 20 kV ac shall be applied across each sectionalizer for a minimum of 1 min.

WARNING CAUTION

Serious injury may result if the water is not grounded during this test. During this test, the water

should be grounded for safety.

The sectionalizer shall then be shorted, and 20 kV ac shall be applied between the sectionalizer and

the grounded water for a minimum of 1 min. The sectionalizer shall withstand both tests without

arcing across or to ground.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
7.8.2 Basic Insulation Level (BIL) Impulse voltage withstand tests

The impulse test voltage shall be a 1.2 s 50 s wave that meets the requirements of IEEE

Std 4. The joints containing sectionalizers shall remain submerged in the water

WARNING CAUTION

Serious injury may result if the water is not grounded during this test. During this test, the water

should be grounded for safety

The sectionalizer shall remain then be shorted following the ac test of 7.8.1, and ten 30 kV-crest,

positive impulses followed by ten 30 kV-crest, negative impulses shall be applied between the

sectionalizer leads (cable shields) and the grounded water.

The joints containing sectionalizers shall then be removed from the water and the short across the

sectionalizer removed. Ten 60 kV-crest, positive impulses followed by ten 60 kV-crest, negative

impulses shall be applied across the sectionalizer.

The sectionalizers are considered satisfactory if all impulse voltage surges are withstood without

any physical damage to the joint, cable, or sectionalizer.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
7. 9 Semiconducting Shielding test

Many cable joints are supplied with exposed semiconductive insulation shields and minimal or no

metallic- shielding in direct contact with the semiconducting shield. The purpose of this test is to

verify that these cable joint designs insulation shield will maintain their outer semiconducting shield

surface effectively at ground potential under normal operating conditions and initiate fault current

arcing if the cable joint insulation system should fail.

The insulation shield of all joint types shall meet the resistivity stability requirement of IEEE Std 592.

All joints with exposed semiconducting shields for use on extruded dielectric cable joints rated 15

kV to 35 kV shall meet the shield resistance and fault-current initiation short-circuit requirements of

IEEE Std 592 to verify the adequacy of the shielding system. This test is a requirement only if the

joint kit is supplied to the end customer in any of the following configurations:

a) with no metallic-shielding

b) with metallic-shielding having a cross-sectional area less than that of #4 AWG copper (the

conductor size which would fuse at 10kA, 0.17 s)

c) with metallic-shielding having a cross-sectional area greater than that of #4 AWG copper

(the conductor size which would fuse at 10 kA, 0.17 s) but not in direct contact with the

exposed semiconductive shield

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
7. 10 Joint Cable metallic-shield restoration and cable jacket restoration
jacketing components

Virtually all modern cable designs are provided with require jacketing components materials over

the cable metallic- shielding. Therefore, when cables are joined, it is necessary to replace or restore

these cable components with appropriate devices that will provide the same current carrying

capability and environmental protection as the non-spliced portions of the cable. In many cases, the
components needed to restore the cable metallic-shield and jacket are provided with the joint kit.

Sections 7.10.1 and 7.10.2 provide qualification requirements for both the metallic-shield

components and jacketing components of a joint. These tests may be performed simultaneously with

the joint design test sequence or as independent component tests on separate samples. When testing

these components independently on separate samples, the samples shall be assembled as they

would be installed in service. In this case, it is only necessary to perform the appropriate tests of

clause 7.10.1 or 7.10.2 without the continuous voltage requirement of 7.6 or any of the dielectric

integrity or voltage tests in the design sequence.

Metallic-shield restoration components are available in various configurations and in many cases are

provided along with an environmental sealing device. The following test sequence encompasses

both the metallic-shield restoration and environmental seal restoration components. They may be

tested on joints that are undergoing design testing or they may be tested on separate samples. If they

are tested on separate samples, these samples shall be assembled in the same manner as they would

be installed in service. If a device is being tested independently as a shield restoration or a jacket

restoration device, it is only necessary to perform the tests in the appropriate subclause (7.13.1 or

7.13.2). If these tests are being performed on the restoration components only, and not as part of a

joint qualification test, it is not necessary to apply the continuous, ac phase-to-ground voltage of 7.9

or any of the dielectric tests in the sequence.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
The joint cable metallic-restoration shielding and/or jacketing cablerestoration components shall be

installed on three complete extruded dielectric joint assemblies for rated 2.5 kV to 46 kV jointor, two

complete extruded dielectric joint assemblies rated for 69 kV to 500 kV, or two complete transition

joint assemblies rated 2.5 kV to 500 kV. It is not possible to perform a dielectric test to verify the

integrity of the environmental sealing of the jacketing components in certain situations without

altering the design of the device. An example is when either bare metallic- shield materials emerge

from the restoration jacketing devices or when the cable jackets are semiconductive. Therefore, the

integrity of the sealing capability of the jacketing device shall be determined using moisture

sensitive tape. Prior to installing the restoration jacketing component(s), apply a moisture sensitive

tape within 25 mm (1 in) of the inner moisture barrier of the jacketing restoration component on

each side of the joint. A sufficient length of this tape shall be used to go completely around the

circumference of the cable.

The metallic-shielding restoration and jacketing cable restoration components are only installed on

the cable joints that will be cyclically aged for 30 days in-air according to the requirements of 7.6.1 or

7.6.2, cyclic aging test, for 30 load cycles. The joint samples in water are cycled without jacketing

restoration components as to ensure that these devices may do not influence potentially marginal

joint electrical interfaces. If the joint design or construction specifically requires an integral jacketing

kit or environmental seal for proper operation and the manufacturer only provides the joint with

this device as a complete kit then the joint samples in water shall be cycled with these components

installed.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
7.10.1 Joint Cable metallic-shield restoration components

When qualifying metallic-shield component designs independent of any joint design, complete

the 30 cycles of the cyclic aging test on in-air samples, according to either:

a) 7.6.1 for components used on joints rated 2.5 kV to 46 kV, noted as sample numbers 7, 8,
and 9 in Figure 1; or

b) 7.6.2 for components used on joints rated 69 kV to 500 kV, noted as sample numbers 5

and 6 in Figure 2; or

c) 7.6.2 for components used on transition joints rated 2.5 kV to 500 kV, noted as sample

numbers 5 and 6 in Figure 3.

Load cycle the cable joints, shield restoration components, and/or the jacket restoration components,

as applicable, in-air only according to 7.9.1 for joint ratings of 2.5 kV to 46 kV or 7.9.2 for joint

ratings of 69 kV to 500 kV.

Following the cyclic aging, load and, if applicable, the partial discharge, high-voltage time,

impulse, and sectionalizer tests, it is necessary to verify that the metallic-shield restoration

components are capable of withstanding two short-time, short-circuit current tests as described

below.

When qualifying a metallic-shield component design along with a specific joint design, complete

sequence 1 from Figure 1, Figure 2, or Figure 3 on in-air samples, according to either:

a) 7.6.1 for joint ratings of 2.5 kV to 46 kV, noted as sample numbers 1, 2, and 3 in Figure 1; or

b) 7.6.2 for joint ratings of 69 kV to 500 kV, noted as sample numbers 1 and 2 in Figure 2; or

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
c) 7.6.2 for joint ratings of 2.5 kV to 500 kV, noted as sample numbers 1 and 2 in Figure 3.

In this case, the joint samples together with the metallic-shield components shall undergo all

dielectric integrity tests, voltage tests, cyclic aging tests, as well as final dielectric tests and voltage

tests. Following this sequence, verify that the metallic-shield components are capable of

withstanding two short-time, short- circuit current tests as described below.

The two short-time, short-circuit 50 Hz or 60 Hz current tests shall have a magnitude (in rms

symmetrical amperes) and duration (in seconds) as determined by Eq. (1). The current magnitude

shall be sufficient to raise the cable shield temperature from ambient to its rated short-circuit

temperature, either 350 C if all cable materials in direct contact with the metallic-shield are

thermosetting (e.g., XLPE or EPR), or 200 C if any cable materials in direct contact with the metallic

-shield are thermoplastic or laminated dielectric material. For example, as stated in ICEA P-45-482, a

cable having a cross-linked semiconducting shield under the metallic-shield and a cross-linked

jacket over the metallic-shield would have a maximum allowable shield temperature of 350 C. Or,

if the cable sheath is lead, the short-circuit temperature should be limited to 200 C regardless of the

other cable materials. The 350 C or 200 C short-circuit temperatures are calculated values only

and need not be measured during the test. Unless otherwise required by customer or

manufacturer specifications, the current magnitude used for this test should not exceed 40 kA.

The current source shall be connected between the cable conductor and the cable shield at one end

of the cable. The conductor and shield shall be connected together at the other end of the sample.

The test may be performed on several joints simultaneously if connected in series. If the shielding

components exit the restoration jacketing components on each end of the joint, then a jumper of

appropriate cross section shall be used to join them across each joint. The current magnitude shall be

measured in accordance with IEEE Std C37.09.

In accordance with ICEA P-45-482, the required short-circuit test current magnitude for the shield is

calculated by the following equation:

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
where

I is the short-circuit current in amperes

A is the cable metallic-shield cross-sectional area in circular mils (calculated from Table 9)

t is the duration of short circuit in seconds (shall be 1 s)

T1 is the starting ambient temperature in degrees Celsius

T2 is equal to 350 C if all cable materials in direct contact with the metallic-shield are

thermosetting (e.g., XLPE or EPR) or 200 C if any cable materials in direct contact with the

metallic-shield are thermoplastic or laminated. This temperature is a calculated value only.

It is not necessary to measure the shield temperature during the test.

, K are determined from Table 8

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Table 8 Values for or K
Cable shielding material Value of Value of K

Aluminum a 228 0.0125

Bronze b 564 0.0297

Copper c 234 0.0297

Lead d 236 0.0010

Steel e 180 0.0036

Zinc f 219 0.0080

Cupro-nickel alloy g 1800 0.0140


a
3/4 hard, 1350 aluminum
b
Commerc ial bronze, 90% copper, 10% zinc
c
Annealed, 100% conduc tivity copper
d
Pure lead, 99.99%
e
Mild or low c arbon steel
f
Commerc ial rolled zinc, 0.08% lead
g
80% c opper, 20% nic kel

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Table 9 Calculation of cross-sectional area [the symbol A in Eq. (1)]
Formula for calculating A
Type of shield or sheath
(See Note 2)

Wires applied either helically, as a braid or serving; or

longitudinally with corrugations nds 2 (a)

Helically applied tape or flat wires, not overlapped 1.27 nwb (b)

Helically applied flat tape, overlapped (See Note 3) (c)

4bdm (100 / [2 (100 L)])1/2

Corrugated tape, longitudinally applied 1.27 [ (dis + 50) + B] b (d)

Tubular sheath 4bdm (e)

NOTE 1
A is the effective cross-sectional area, shield, or sheath

B is the tape overlap (in mils) (usually 375)

b is the thickness of tape or flat wires (in mils)

dis is the diameter over semiconducting insulation shield (in mils)

dm is the mean diameter of shield or sheath (in mils)

ds is the diameter of wires (in mils)

w is the width of tape or flat wires (in mils)

n is the number of serving or braid wires or tapes

L is the overlap of tape (in percentage)

NOTE 2The effective area of composite shields is the sum of the effective areas of the

components. For example, the effective area of a composite shield consisting of a helically applied,

not overlapped tape and a wire serving would be the sum of the areas calculated from Eq. (b) of

Table 9 and Eq. (a) of Table 9.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
NOTE 3The effective area of thin, helically applied overlapped tapes depends, also, on the

degree of electrical contact resistance of the overlaps. Eq. (c) of Table 9 may be used to calculate the

cross-sectional area of the shield of new cable. An increase in contact resistance may occur after

cable installation or during service involving exposure to moisture and heat. Under these conditions

the contact resistance may approach infinity, where Eq. (b) of Table 9 could apply.

If practical, the test duration should be conducted using a 0.17 s (10 cycles at 60 Hz). If the calculated

fault current cannot be achieved due to equipment limitations, then an alternate current and time

combination shall be used to conduct the test as long as the alternate time and current have the same

I2t value as the originally calculated values and the alternate time (t) is not longer than 1 s. The

test samples may be allowed to cool to ambient after the first short-time current test.

All shield restoration components shall withstand two, full short-time current tests without signs of

arcing of the metallic components, and without catching on fire. All metallic-shield restoration

components also shall remain intact. Slight melting of polymeric components is allowed as long as

no material leaves the assembly cable.

7.10.2 Joint Cable jacket restoration seal integrity

The following procedure is used to qualify cable jacket restoration components for seal integrity.

If the joint jacket seal is being qualified independent of any joint or metallic-shield component, If the

following test is being performed following the cyclic aging for 30 days in air. If the joint jacket seal

is being qualified in conjunction with the metallic-shield restoration component test of 7.10.1, the

following procedure is performed after following the two short-time current tests of that subclause.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
If this test is being performed to qualify a cable jacket restoration seal design exclusive of any

metallic- shield components, the following procedure would be performed following the partial

discharge test and, if applicable, the sectionalizer test.

The joint cable jacket component restoration assemblies that were cyclically aged in-air for 30 cycles

shall be completely submerged in ambient temperature tap water for a minimum of 24 h. The

minimum depth of water shall be 0.3 m (1 ft) for extruded cable joints rated 2.5 kV to 46 kV and 1

m (3 ft) for all other joints. This depth corresponds to the submersion depth required during the load

cycle test of 7.6.1 and 7.6.2 for each joint construction and is measured from the top surface of the

joint. The assemblies shall then be subjected to an additional ten thermal cycles using a with current

of magnitude equal to the cyclic aging current requirements of 7.6.1 or 7.6.2. It is not necessary to

apply the continuous, ac phase-to-ground voltage of 7.6.1 or 7.6.2. Afterward, the assemblies shall

be removed from the water and the external surfaces fully dried. Within 2 h of removal from the

water, the environmental seals shall be removed and the moisture sensitive tape examined. The

cable restoration jacketing /environmental seal component design is acceptable if there is no

evidence of water migration beyond the water block area as determined by the color of the

moisture sensitive tape.

7.11 Connector thermal and mechanical tests

Connectors used in cable joints to join two aluminum conductors, two copper conductors, or an

aluminum conductor to a copper conductor, shall meet all Class A current cycle requirements given

in ANSI C119.4.

In addition, connectors used to join two aluminum conductors or an aluminum conductor to a

copper conductor for use in any cable joint excluding pipe-type, laminated dielectric cable joints,

shall meet all Class 2 partial tension requirements given in ANSI C119.4. The tensile strength

requirements for connectors used in pipe-type laminated dielectric cable joints should be

established between the supplier and the end user.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
NOTEThere is a wide variety of compression tools and dies for any particular connector design

as well as a variety of connector designs (such as overall length and diameter) for any particular

conductor size. There is also variation in crimping techniques such as the number of crimps, rotation

of successive crimps, etc. It should be understood that these tests may only have been performed on

a representative compression tool, die, and crimp technique.

The manufacturer should follow a similar test protocol to verify that connectors used between

copper conductors will perform reliably in service.

8. Routine production testing

Production tests shall be performed on 100% of all premolded joints produced and 100% of all

single- component cold-shrink joints produced according to 8.1.

The production electrical tests of 8.1 cannot be performed on field-fabricated joints, such as heat-

shrinkable, hand-taped, or certain multi-component cold-shrinkable joints. To assure the reliability

of these field-fabricated joints, the manufacturer shall perform a series of physical and

electrical tests on the materials that make up the joint according to 8.2 for heat-shrink or multi-

component cold-shrink joint components and 8.3 for taped joint components.

8.1 Production tests for Premolded and single-component cold-shrink


joints

The following production tests shall be performed by the manufacturer on 100% of all

premolded and single-component cold-shrink joints produced:

a) Partial discharge voltage level (see 7.3.1, Table 10, and Table 11)

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
b) AC withstand or BIL full-wave impulse withstand voltage (see 7.4.1 or 7.4.3, Table 10, and

Table 11)

8.2 Fingerprint tests for Heat-shrink and multi-component cold-shrink


joints components

The following fingerprint tests shall be performed by the manufacturer according to the

sampling rate shown in Table A.2. These tests shall be performed on stress control, conductive,

insulating, and protective tubes whether extruded or molded. The tests are performed after these

components have completed all manufacturing processes, such as molding, extruding, cross-linking,

and expansion (i.e., in the as-supplied forms). The required tests are summarized in Table A.1 along

with typical values.

8.2.1 Visual examination

Expanded tubes shall be free from splits, pinholes, inclusions, or other visible defects. Tubing

edges shall be straight and smooth.

8.2.2 Dimensions

The wall thickness of expanded tubes shall be measured at four equally-spaced positions

around the sample. The length of the expanded tubes shall also be measured.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
The same tubes shall then be fully recovered and cooled (if applicable). The above measurements

shall then be repeated. Calculate the ratio of minimum thickness to maximum thickness expanded

and the ratio of minimum thickness to maximum thickness recovered. Calculate the change in

length after recovery.

See Table A.1 for typical values of expanded wall thickness ratio, recovered wall thickness

ratio, and length change.

8.2.3 Tensile strength and ultimate elongation

Specimens shall be prepared from fully-recovered tubing or molded components. Specimen

thickness shall be between 2 mm and 4 mm (0.079 in and 0.157 in). From each of the samples in the

lot, five specimens of each material shall be prepared in accordance with ASTM D412-98. Tubing

specimens shall be cut along the length of the tubing.

The test shall be performed at a cross-head speed of 500 mm/min 50 mm/min (20 in/min 2

in/min).

The tensile strength shall be determined using the maximum applied load and the initial specimen

cross- sectional area.

Ultimate elongation is the increase in length at the point of break over the initial length expressed as

a percentage.

See Table A.1 for typical values of tensile strength and elongation.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
8.2.4 Volume resistivity of conductive tubes

From each of the samples in the lot, five specimens shall be prepared from tubing or molded

components and tested in accordance with ASTM D991-89.

See Table A.1 for typical values.

8.2.5 Dielectric strength of insulating tubes

The dielectric strength of tubing or molded components shall be determined at room

temperature in accordance with ASTM D149-97a.

From each sample of the lot, five specimens of tubing or molded components shall be recovered

onto a cylindrical mandrel of diameter equal to the fully recovered specimen inside diameter plus

10%. The specimen thicknesses for each test shall be reported.

See Table A.1 for typical values of dielectric strength.

8.2.6 Sampling rate

Unless otherwise required by customer or manufacturer specifications, the component sampling

requirements after each manufacturing step, including molding, extrusion, cross-linking, and

expansion, shall be according to the sampling rate shown in Table A.2.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
8.3 Fingerprint tests for Elastomeric taped joint components

The following fingerprint tests for taped joint components shall be performed by the manufacturer

according to the sampling rate shown in Table B.2.These tests shall be performed on non-metallic

and electrically insulating rubber tapes according to 8.3.1, 8.3.2, 8.3.3, and 8.3.5 and on

semiconducting rubber tapes according to 8.3.1, 8.3.2, 8.3.3, and 8.3.4. The required tests for each

type of tape, along with the corresponding ASTM tape classification, are summarized in Table B.1

along with typical values.

All tests are performed on the sample rolls after removing and discarding at least 610 mm (24 in)

of the outer layer.

All sample rolls shall be subjected to 23 C 2 C and 50% 2% relative humidity for a minimum of

16 h before specimens are removed.

All samples are then removed from the rolls at a slow, uniform rate without jerking. The individual

samples shall be left for a minimum period of 1 h at 23 C 2 C and 50% 2% relative humidity.

All tests shall then be conducted at these same standard conditions.

8.3.1 Fusion

Remove three specimens, 280 mm in length, from each roll of the sample lot. Using the winding
fixture and procedure described in Clause 8 and Clause 9 of ASTM D4325-0802, wind the specimens

using 300% elongation. After wrapping, condition the specimens at 23 C 2 C and 50% 2%

relative humidity for a minimum of 24 h. Following the conditioning, the maximum flag for any

specimen shall meet the requirements of Table B.1.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
8.3.2 Dimensions

8.3.2.1 Length

Unwind the tape and separator from each roll of the sample lot. After the conditioning in 8.3, place

each tape/separator sample on a hard, smooth surface and measure its length. The length shall meet

the requirements of Table B.1.

8.3.2.2 Width

Unwind the tape and separator from each roll of the sample lot.After the conditioning in 7.3, place

each tape/separator sample on a hard smooth surface and measure their width. The width shall

meet the requirements of Table B.1.

8.3.2.3 Thickness

Unwind the tape and separator from each roll of the sample lot. Measure the tape/separator

sample thickness at five locations uniformly distributed over the length of the test specimen using

the procedure described in of Clause 12, Clause 13, and Clause 14 of ASTM D4325-08. The average
of the five measurements shall meet the requirements of Table B.1.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
8.3.3 Tensile strength and ultimate elongation

For each roll in the sample lot, cut five specimens, 610 mm in length, from a single ply of tape

(rubber and separator) that is free from visible defects using the ASTM standard die, as shown in

Figure 1 (die A) of ASTM D412-98, except that the ends of the specimens cut from 19 mm tape need

not be full width. Place bench marks on the specimens as directed in ASTM D412-98. Measure the

thickness in accordance with 14.2 of ASTM D4325-0802, removing the separator where it is not an

integral part of the tape. The average breaking strength and average percent elongation shall meet

the requirements of Table B.1. When specimens break at the jaws, discard the results and retest.

8.3.4 Volume resistivity

This test is applicable only to semiconducting tapes. For each roll in the sample lot, test five

specimens. Condition the tapes at 90 C 2 C for 168 h. Remove the specimens from the

oven, assemble in electrodes, and test within 2 min. Use strip electrodes for tape as shown in Figure

2 of ASTM D4496-04. Apply direct voltage of 5 V 0.5 V for the time specified in ASTM D4496-04.

The average volume resistivity shall meet the requirements of Table B.1.

8.3.5 Dielectric strength

This test is applicable only to insulating tapes. Make five breakdown tests on each roll of the

sample lot. Use Type-3 electrodes as described in Table 1 of ASTM D149-97a. To prevent flashover

of the sample, insulating fluid may be used, or the tape width can be increased by attaching

additional tape strips to each edge of the test sample. Measure and calculate the dielectric strength

in kilovolts per millimeter (kV/mm) in accordance with ASTM D149-97a using the short-time test

by increasing the voltage at a uniform rate of 500 V/s. The average dielectric strength in kV/mm

shall meet the requirements of Table B.1. The specimen thicknesses for each test shall be reported.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
8.3.6 Sampling

Unless otherwise required by customer or manufacturer specifications, the tape sampling

requirements shall be according to the sampling rate shown in Table B.2.

Table 10 Routine production test levels for extruded dielectric cable


joints rated 2.5 kV to 46 kV
Minimum partial
Voltage rating Voltage rating Basic insulation
1-min ac withstand discharge voltage
phase-to-phase, U phase-to-ground, level (BIL) (kV
voltage (kV rms) level, 1.5 U0
(kV rms) a U0 (kV rms) b crest)
(kV rms)

2.5 1.4 60 9 2

5 2.9 75 18 4

8 4.6 95 23 7

15 8.7 110 35 13

25 14.4 150 52 22

35 20.2 200 69 30

46 26.6 250 80 40
a To obtain test values for voltage classes that are not listed, use linear interpolation between the next higher and lower listed values

and round off to the nearest whole kilovolt.

b For grounded systems.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Table 11 Routine production test levels for extruded dielectric cable
joints rated 69 kV to 500 kV
Minimum partial
Voltage rating Voltage rating Basic Insulation 5-min ac withstand
discharge voltage
phase-to- phase, U phase-to- ground, Level (BIL) (kV test at 3 U0 (kV
level, 1.5 U0
(kV rms) a U0 (kV rms) b crest) rms)
(kV rms)

69 39.8 350 120 60

115 66.4 550 200 100

138 79.7 650 240 120

161 93.0 750 280 140

230 132.8 1050 400 200

345 199.2 1300 600 300

500 288.7 1550 870 435


a To obtain test values for voltage classes that are not listed, use linear interpolation between the next higher and lower listed values

and round off to the nearest whole kilovolt.

b For grounded systems.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Annex A

(informative)

Typical values of heat-shrinkable and multi-component cold-shrink


joint component tests and sampling rates

Table A.1Heat-shrink and multi-component cold-shrink joint


component tests and requirements
Stress
Shrinkable tubing or molded component Reference Conductive Insulating Protective
control

Visual examination 87.2.1 No splits, pinholes, inclusions, or other defects

Dimensions (%)

Expanded (min/max wall thickness ratio) 87.2.2 60 % 60 % 60 % 60 %

Recovered (min/max wall thickness ratio) 87.2.2 80 % 80 % 80 % 80 %

Length change after recovery 87.2.2 15 % 15 % 15 % 15 %

Tensile strength (MPa) 87.2.3 10 10 10 10

Elongation at break (%) 87.2.3 200 % 200 % 200 % 200 %

Volume resistivity ( cm) 87.2.4 50k

Dielectric strength (kV/mm) 87.2.5 N/A N/A 10

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Table A.2Heat-shrink and multi-component cold-shrink joint
component sampling rates
Length of lot size (m) Sampling size (pieces)

1 to 500 2

501 to 2000 4

2001 to 5000 7

5001 to 10 000 10

> 10 000 15

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Annex B

(informative)

Typical values of elastomeric taped joint component tests and sampling


rates

Table B.1Taped joint component tests and requirements


Up to Up to Up to
Voltage class of tape Reference Semiconductive
35 kV 138 kV 325 kV

ASTM tape classification II III V IV

Fusion (max flag) 87.3.1 2 mm 2 mm 2 mm 2 mm

Dimensions (acceptable

variations from nominal)

Length 87.3.2.1 nominal nominal nominal nominal

Width 87.3.2.2 0.76 mm 0.76 mm 0.76 mm 0.76 mm

Thickness (avg) 87.3.2.3 0.076 mm 0.076 mm 0.076 mm 0.076 mm

Tensile strength (MPa, min) 87.3.3 1.7 1.7 2.4 0.69

Elongation at break (min %) 87.3.3 500 700 700 300

Volume resistivity ( cm, min) 87.3.4 103

Dielectric strength for 0.76 mm

thickness (kV/mm, min) 87.3.5 20 24 28 N/A

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Table B.2Taped joint component sampling rates
Number of rolls in shipment Number of sample rolls

50 to 200 2

201 to 500 3

501 to 1000 4

1001 to 5000 50

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Annex C

(informative)

DC test voltage reference

For reference only, the following dc test voltages have been used in the past for design qualification

testing of cable joints. Many standards-making bodies have eliminated the use of dc testing since

industry data has determined that ac testing is more appropriate for extruded dielectric cables.

Table C.1Voltage ratings and reference dc test levels for extruded


dielectric cable joints rated 2.5 kV to 46 kV

Voltage rating phase-to-phase, U (kV rms) a DC withstand voltage 15-min (kV)

2.5 30

5 35

8 45

15 75

25 105

35 140

46 172
a To obtain test values for voltage c lasses that are not listed, use linear interpolation between the next higher and lower listed

values and round off to the nearest whole kilovolt.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Table C.2Voltage ratings and reference dc test levels for extruded
dielectric cable joints rated 69 kV to 500 kV

Voltage rating phase-to-phase, U (kV rms) a DC withstand voltage 15-min (kV)

69 240

115 300

138 315

161 375

230 525

345 650

500 775
a To obtain test values for voltage classes that are not listed, use linear interpolation between the next higher and lower listed values

and round off to the nearest whole kilovolt.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Table C.3Voltage ratings and reference dc test levels for transition and
laminated cable joints

Voltage rating phase-to- phase, U (kV rms) a DC withstand voltage 15-min (kV)b

2.5 30

5.0 38

8.7 48

15 55

25 75

35 100

46 125

69 175

115 225

120 275

138 325

161 375

230 525

345 650

500 775
a To obtain test values for voltage classes that are not listed, use linear interpolation between the next higher and lower listed values

and round off to the nearest whole kilovolt.

b Voltages represent 0.5 times the BIL values shown in Table 3.

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Annex D

(informative)

Bibliography

Bibliographical references are resources that provide additional or helpful material but do not

need to be understood or used to implement this standard. Reference to these resources is made

for informational use only.

[B1] ANSI/ICEA S-94-649, Standard for Concentric Neutral Cables Rated 5 Through 46 kV 5,000

46,000 Volts. 1

[B2] ANSI/ICEA S-97-682, Standard for Utility Shielded Power Cables Rated 5 Through 46 kV.

[B3] ANSI/ICEA S-108-720, Standard for Extruded Insulation Power Cables Rated Above 46 kV

Through 345 kV.

[B4] ASTM D4388-02, Standard Specification for Nonmetallic Semi-Conducting and Electrically

Insulating Rubber Tapes. 2

1 ICEA public ations are available from ICEA, P.O. Box 1568, Carrollton, GA 30112, 20048, Minneapolis, MN 55420, US A

(http://www.ic ea.net/).

2 AS TM public ations are available from the Americ an S oc iety for Testing and Materials, 100 Barr Harbor Drive, West

Conshohoc ken, PA 19428-2959, US A (http://www.astm.org/).

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
[B5] CEI/IEC 60502-4, Power Cables with Extruded Insulation and Their Accessories for Rated

Voltages from 1 kV up to 30 kV. 3

[B6] CEI/IEC 60840, Power Cables with Extruded Insulation and Their Accessories for Rated

Voltages above 30 kV up to 150 kV.

[B7] IEEE 100, The Authoritative Dictionary of IEEE Standard Terms, Seventh Edition. 14, 15

[B8] NEMA WC 3/ICEA S-19-81 (Reaff 1992), Rubber-Insulated Wire and Cable for the

Transmission and Distribution of Electrical Energy. 16

[B9] NEMA WC 5/ICEA S-61-402, Thermoplastic-Insulated Wire and Cable for the Transmission

and Distribution of Electrical Energy.

[B10] NEMA WC 7/ICEA S-61-524, Cross-Linked Thermosetting-Polyethylene-Insulated Wire and

Cable for the Transmission and Distribution of Electrical Energy.

[B11] NEMA WC 8/ICEA S-68-516, Ethylene-Propylene-Rubber-Insulated Wire and Cable for the

Transmission and Distribution of Electrical Energy.

3 CEI/IEC public ations are available from the S ales Department of the International Elec trotechnical Commission, Case Postale 131,

3, rue de Varemb, CH-1211, Genve 20, Switzerland/S uisse (http://www.iec.ch/). IEC public ations are also available in the United

S tates from the S ales Department, Americ an National S tandards Institute, 11 West 42nd S treet, 13th Floor, New York, NY 10036,

US A.

14 IEEE public ations are available from the Institute of Elec tric al and Elec tronics Engineers, 445 Hoes Lane, Piscataway, NJ 08855-

1331, US A (http://standards.ieee.org/).

15 The IEEE standards or produc ts referred to in this c lause are trademarks of the Institute of Elec tric al and Elec tronic s Engineers,

Inc .

16 NEMA public ations are available from Global Engineering Documents, 15 Inverness Way East, Englewood, CO 80112, US A

(http://global.ihs.c om/).

Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.
Authorized licensed use limited to: Universidad de Tarapaca. Downloaded on March 27,2017 at 13:12:10 UTC from IEEE Xplore. Restrictions apply.

You might also like