The Fundamentals of Mixed Signal Testing

Course Information
The Fundamentals of Mixed Signal Testing course is designed to provide the foundation of knowledge that
is required for testing modern mixed signal devices using ATE equipment.

Many engineers are intimidated when confronting mixed signal test for the first time. However, the
percentage of VLSI and SOC devices containing analog functions, data converters, DSPs, and similar circuits
continues to grow. No longer a specialty or niche, mixed signal technology has entered the mainstream.

The Course
The course first introduces the instrumentation of a Mixed Signal Test System, with emphasis on the DSP
(digital signal processing) capabilities. Ample time is spent explaining the mathematics necessary to fully
understand signal sampling and waveform synthesis. Specifications for mixed signal devices are discussed
and the method of verifying each individual parameter is explained in detail.

The testing of Digital to Analog and Analog to Digital converters is covered step by step including device
conditioning, analog filtering, grounding issues and noise effects. These details are fundamental to most all
types of mixed signal circuits. Practical aspects of test development and debug are also discussed.

To insure that each student gains a complete understanding of the concepts presented, virtual test
instrumentation is used. Laptop computers play an essential role during the class to provide actual "hands
on" lab experience. The labs demonstrate the principles of sampling, Fourier series, sinusoidal waveforms,
FFT/DFT/Inverse Fourier transforms, signal generation and other mixed signal testing concepts. Each
student receives a personal copy of the DSP Lab software, which can be kept for later use and a 300+ page
reference manual titled "Fundamentals of Mixed Signal Testing".

Who Should Attend

Test and Product Engineers, Engineering Managers and Sales Engineers have all benefited from this course
it is the logical follow-on to Soft Tests Digital Test Technology class. In addition, Design, Verification,
and DFT Engineers find these courses to be a valuable resource for bettering their understanding of the IC
test process.

When & Where

Soft Test offers training services at our Sunnyvale, CA facility on a regular basis and we can also offer on-
site training at your facility. Give us a call for additional information and class schedules or visit our web
site at www.soft-test.com.

The Cost
Tuition is $2,000 per attendee and includes all course material including the Fundamentals of Mixed Signal
Testing text and the DSP Lab Software diskette. Contact Soft Test for on-site pricing.

Class Registration
Registration forms are available on our web site or contact the West Coast sales office at 408.377.1888. For
technical questions please call our East Coast office at 386.478.1979. Email inquires to admin@soft-
test.com.

Summary
Mixed Signal Test Engineering demands more math, theory, and rigor than its digital counterpart.
Attending this class helps cut through the confusion and gives you the tools you need to create, work with,
and understand mixed signal tests. There is a better way. Now you can jump start your educational process
and receive what can take years of on-the-job training in just one week.

There's More
Please visit our web site at www.soft-test.com for additional information on this course. Soft Test also
offers technical training and publications for Digital Test, Memory Test and a variety of subjects related to
the semiconductor industry.

Soft Test Inc. Phone 386.478.1979 Fax 386.478.1760 Web www.soft-test.com

 The Fundamentals of Mixed Signal Testing
Course Content

Course Length: 5 days

Purpose
This course is designed to explain the concepts and techniques used in testing mixed signal semiconductor
devices with automated test equipment (ATE). Practical information is presented pertaining to test
program development, debugging techniques and test result interpretation. Static, Dynamic and AC tests
are discussed in detail. Digital-to-Analog Converters (DAC) and Analog-to-Digital Converters (ADC) are
used as sample devices to develop a full suite of test techniques for use with any mixed signal device.

Our Goal
Our goal is to provide useful, practical information that will quickly improve the skill set required to be a
productive Test, Product or Applications Engineer. We present an environment where questions and
interactions are welcome and everyone is treated with respect regardless of their experience level.

Content
The course information presented includes the following:

Introduction to Mixed Signal Testing and the Components of a Mixed Signal Test System
The Mathematical Basis of Digital Signal Processing
Principles of Analog Signal Theory
Static Parameters Testing of a DAC
Static Parameters Testing of an ADC
Sampling theory and how to correctly sample an analog signal
Dynamic Parameters Testing of a DAC
Dynamic Parameters Testing of an ADC
Creating Analog Signals with a Waveform Generator
DUT Connections to Reduce Analog and Digital Signal Interference
How to Use Analog Filtering and Other Signal Conditioning
Typical DSP Algorithms and When and How to Use Them
Extracting Test Measurements from Sampled Data and Relating Them to Device
Specifications

Distribution Materials
The Fundamentals of Mixed Signal Testing text, DSP Lab Software diskette, and all classroom materials
are provided with the course

Prerequisites
Students should have completed the Soft Test Digital Test Technology class or have equivalent experience.
Prior exposure to engineering mathematics is assumed.

Soft Test Inc. Phone 386.478.1979 Fax 386.478.1760 Web www.soft-test.com

 The Fundamentals of Mixed Signal Testing
Course Syllabus

Overview of Mixed Signal Testing

Digital Signals
Digital Test Systems
Analog Signals
Traditional Analog ATE
Mixed signal devices
Mixed Signal Test Systems
Waveform Digitizer
Waveform Generator
Digital Signal Processor

The Mathematics of DSP

Logarithms and exponents
Decibels (dB)
Time and Frequency
Periodic Motion
Root-Mean-Square Calculations
Time to frequency translation
Fourier series
Dirichlet conditions
Complex numbers
Conversion between polar and rectangular

Basic Device Specifications

Digital Devices
Analog Devices
Input Offset Voltage
Input Bias Current
Input Offset Current
Common Mode Rejection
Power Supply Rejection
Gain Bandwidth
Noise
Harmonic Distortion
Signal-to-Noise Ratio
Slew Rate
Settling Time
Filter Specifications

Soft Test Inc. Phone 386.478.1979 Fax 386.478.1760 Web www.soft-test.com

 The Fundamentals of Mixed Signal Testing
Course Syllabus

Digital to Analog Converter Static Parameters

DAC Static Specifications
Resolution
Gain and Offset
Differential and Integral Non-Linearity
Least Significant Bit
Monotonicity
Test System Configuration for DAC Static Parameter Tests
Example DAC Data Sheet
DAC Architecture Considerations
Fast Measurement Techniques

Analog to Digital Converter Static Parameters

ADC Static Specifications
LSB Size
Full Scale Range
Offset and Gain
Code Transitions and Code Widths
Differential and Integral Non-Linearity
No Missing Codes
Transition Noise
Segmented Ramp
Test System Configuration for ADC Static Tests
Example ADC Data Sheet
Unique ADC Testing Issues
Histogram Testing for DNL and INL
ADC Architecture Considerations

Sampling
Limits of Sampling
Shannon's theorem
Nyquist's theorem
Periodicity
Converting a time sample set to frequency
Discrete Fourier transform (DFT)
Fast Fourier transform (FFT)
Spectral replication and Aliasing
Prevention of aliasing errors
Leakage
Time sample windowing
Coherent Sampling
Coherency relationships
Fs, N, Ft and M
UTP, Fourier Frequency, frequency bins and resolution
The Inverse FFT (IFFT) algorithm

Soft Test Inc. Phone 386.478.1979 Fax 386.478.1760 Web www.soft-test.com

 The Fundamentals of Mixed Signal Testing
Course Syllabus

Digital to Analog Converter Dynamic Parameters

Measuring SINAD, THD, SNR, IM
Generating the DUT output signal
Calculating the desired output signal as an array of points
Using a sine wave equation
Using an Inverse FFT
What to do with the list of codes
Filtering the output signal
Using a Waveform Digitizer to capture the DAC output
Conditioning the analog signal for the waveform digitizer
Digitizing the (filtered) analog signal
Calculating the result parameters
Creating a Spectral Graph
Synchronization Issues

Analog to Digital Converter Dynamic Parameters

Dynamic parameters
Creating an input signal
Adjusting for zero and full scale
Input signal filtering
Acquiring and holding the input signal
An ADC with no track and hold
Adding track and hold
Dynamic impedance problems
Capturing the digital output data
Coherent sampling revisited
Undersampling
SINAD, THD, and SNR
Intermodulation Distortion
DUT noise, system noise and averaging
Effective Number Of Bits (ENOB)
Sparkle Codes
Sine Histogram Technique

General Mixed Signal Test Issues

Does the measurement reflect the conditions of the DUT or the test system?
Noise in the test environment
Amplifiers amplify noise too
Ground Issues
Current Paths
Power Supplies
Reference Signals
Averaging and Repeatability
Troubleshooting
War Stories

Soft Test Inc. Phone 386.478.1979 Fax 386.478.1760 Web www.soft-test.com

 The Fundamentals of Mixed Signal Testing

DSP Lab Software

The DSP Lab Software consists of a set of Virtual Test Instruments designed specifically
for Soft Test's Fundamentals of Mixed Signal Testing course. The DSP Lab software is
included with the "Fundamentals of Mixed Signal Testing" textbook, and is used to
provide a hands-on programming experience throughout the training class. It helps the
student visualize the concepts associated with waveform generation, signal sampling and
signal analysis.

The Microsoft Windows-based software allows the student to perform interactive

laboratory exercises which demonstrate the principles of Sampling, Fourier Series,
Sinusoidal Waveforms, Fast Fourier Transforms, Inverse Fourier Transforms, Signal
Generation and other mixed signal testing concepts.

Note: The screen images appear distorted because they have been resized to fit this
document.

Soft Test Inc. Phone 386.478.1979 Fax 386.478.1760 Web www.soft-test.com

 Fourier Series

The Fourier Series function is used to create sine waves of various frequencies.
Harmonics and noise can also be added to the signal. Several predefined signals are also
available for analysis. Once a signal is defined it can be viewed via the Oscilloscope.

The Oscilloscope Showing a Square Wave

The Oscilloscope is available for viewing waveforms. In this example a 1 KHz square
wave is shown. Notice the fundamental and each harmonic frequency is shown in a
unique color.

Soft Test Inc. Phone 386.478.1979 Fax 386.478.1760 Web www.soft-test.com

 The Sampler

Signal sampling is an important step in the process of mixed signal testing. The Sampler
function is designed to allow the user to experiment and visualize results, via the
Oscilloscope.

The Oscilloscope Showing Sample Points

This example shows the Sample Points for a 1 KHz sine wave, as defined above in the
Sampler Window.

Soft Test Inc. Phone 386.478.1979 Fax 386.478.1760 Web www.soft-test.com

 The Spectrum Analyzer

The Spectrum Analyzer displays signal data in the frequency spectrum. When used in
conjunction with the Oscilloscope, a signal can be viewed in both the Time and
Frequency domains. This instrument also illustrates the effects of various windowing
functions.

The Sine Generator

Signal generation is an important step in the process of mixed signal testing. The Sine
Generator is designed to allow the student to experiment with sine wave creation. This
activity is similar to using the Arbitrary Waveform Generator of a mixed signal test
system.

Soft Test Inc. Phone 386.478.1979 Fax 386.478.1760 Web www.soft-test.com

 Waveform Generation Data Points

During the signal generation process the data points used to create a waveform can be
written to a file. This data can be compared to the data points shown in the Sine
Generator window. This example shows data points used to construct the signal as seen
in the Sine Generator Window.

The Inverse FFT

The Inverse FFT function offers a means of creating a signal via the frequency spectrum,
then viewing the results in the time spectrum using the Oscilloscope

Soft Test Inc. Phone 386.478.1979 Fax 386.478.1760 Web www.soft-test.com

 The Oscilloscope Showing IFFT Waveform

The frequency data defined in the Inverse FFT function above is displayed in the time
domain using the Oscilloscope.

Summary
Many engineers find the DSP Lab software a very effective aid in understanding the
complex issues associated with signal generation, signal sampling and signal analysis. It
allows the user to experiment with various test concepts and methods in a safe
environment and it eliminates the need for expensive test system time. This software is
included with the textbook Fundamentals of Mixed Signal Testing distributed in the
training class, or it can be purchased separately.

Soft Test Inc. Phone 386.478.1979 Fax 386.478.1760 Web www.soft-test.com

 The Fundamentals of Mixed Signal Testing

If you miss more than 3, you are a good candidate for the
Fundamentals of Mixed Signal Testing class.
1. The term resolution is typically used to describe which of the following DAC characteristics?
a) Voltage Range
b) Accuracy
c) Number of Bits
d) Maximum Clock Frequency
2. The sine of an angle in a right triangle is the ratio of sides given by:
a) Opposite over adjacent
b) Opposite over hypotenuse
c) Adjacent over hypotenuse
d) Adjacent over opposite
3. Sampling can be used to get information about all of the following except:
a) Signal Amplitude
b) Nyquist frequency of a signal
c) Magnitude of a signal at various frequencies
d) Phase of a signal at various frequencies
4. What is the Fourier Frequency?
a) The highest frequency component of a frequency spectrum
b) The lowest frequency component of a frequency spectrum
c) The frequency of interest in a frequency spectrum
d) The frequency resolution of a frequency spectrum
5. Time Windowing functions can be used to reduce:
a) Aliasing
b) Spectral leakage
c) Distortion
d) Quantization error
6. The following is a requirement for coherent sampling:
a) A high bandwidth waveform digitizer
b) An integer number of signal cycles
c) Samples from more than one cycle of a signal
d) A lowpass filter

Soft Test Inc. Phone 386.478.1979 Fax 386.478.1760 Web www.soft-test.com

7. A filters 3dB point is:
a) The frequency at which the signal is completely attenuated
b) The frequency at which the signal is not attenuated at all
c) The frequency at which half the signal power is attenuated
d) The frequency at which half the signal voltage is attenuated

8. Which of the following is not a Differential Nonlinearity test method for Analog-to-Digital Converters?
a) Servo Loop
b) Segmented Input Ramp
c) Histogramming
d) Thermal Tail
9. A DAC LSB is calculated as:
a) (Full scale output - zero scale output) * (2bits - 1)
b) (Full scale output - zero scale output) / (2bits - 1)
c) (Full scale output - zero scale output) / 2bits
d) (Full scale output / bits)
10. A Sine Histogram test is often used to:
a) Find superposition problems with R/2R DACs
b) Find distortion problems with sigma-delta ADCs
c) Find noise problems with partially decoded DACs
d) Find sparkling problems with flash ADCs
11. Pi radians equals:
a) 45
b) 90
c) 180
d) 360
12. A low pass filter with 6 poles has a voltage roll-off of:
a) 36dB per decade
b) 120dB per octave
c) 120dB per decade
d) 6dB per octave
13. A value of 80dB represents a ratio in volts of
a) 10000 : 1
b) 80 : 1
c) 8 : 1
d) 4 : 1

Soft Test Inc. Phone 386.478.1979 Fax 386.478.1760 Web www.soft-test.com

14. The frequency resolution of a spectrum, FF, is given by:
a) M / Ft
b) N / Fs
c) 1 / UTP
d) All of the above
15. The Fast Fourier Transform uses how many calculations?
2
a) N calculations
b) (N / 2) log2 N
c) (N / 2) log10 N
d) (N) log2 N
16. For a given Ft and Fs, what is the effect of increasing M?
a) The number of samples N is decreased, leading to lower frequency domain resolution
b) The number of samples N is increased, leading to higher frequency domain resolution
c) The Unit Test Period is decreased, leading to lower test time
d) The Fourier Frequency is increased, leading to higher noise measurements
17. What is a sparkle code?
a) A glitch in a DACs output due to superposition error
b) A glitch in an ADCs output due to superposition error
c) A glitch in an ADCs output due to illegal states in the output decoder
d) A glitch in a DACs output due to major carry transitions
18. A device LSB for an ADC is calculated from the:
a) Zero and full scale measurements
b) Gain measurement
c) Zero and full scale transition measurements
d) Datasheet
19. When using the histogram method to test an ADC, average hits per code is analogous to:
a) Total number of samples taken
b) DNL
c) Device LSB
d) Tester LSB
20. To use a 12-bit waveform digitizer to dynamically test a 14-bit DAC, you will probably need
a) Waveform generator
b) Notch filter
c) Phase locked loop
d) Bandpass filter

To check your answers please visit our web site the direct link is

http://www.soft-test.com/mixanswers.html
Soft Test Inc. Phone 386.478.1979 Fax 386.478.1760 Web www.soft-test.com