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    Rigaku NEX CG Brochure Rev6sm

    Uploaded by

    Leons Rixson Siahaan
    RIgaku XRF

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd

    Rigaku NEX CG Brochure Rev6sm

    Uploaded by

    Leons Rixson Siahaan
    193 views6 pages
    RIgaku XRF

    Copyright

    © © All Rights Reserved

    Available Formats

    PDF, TXT or read online from Scribd

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    RIgaku XRF

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
    193 views6 pages

    Rigaku NEX CG Brochure Rev6sm

    Uploaded by

    Leons Rixson Siahaan
    RIgaku XRF

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
    of 6

    (QHUJ\'LVSHUVLYH;UD\)OXRUHVFHQFH

    Analyze 11Na to 92U non-destructively


    Solids, liquids, powders and thin lms
    Polarized excitation for lower detection limits
    Semi-quantitative analysis without standards
    Reduced standards requirements with RPF-SQX
    Novel treatment of peak overlap reduces errors
    Simplied user interface with EZ Analysis

    9HUVDWLOLW\IRUTXDOLWDWLYHDQG
    TXDQWLWDWLYHHOHPHQWDODQDO\VLV
    Energy dispersive X-ray uorescence (EDXRF) is a routinely used analytical technique for the qualitative and
    quantitative determination of major and minor atomic
    elements in a wide variety of sample types. The heart
    of its versatility stems from the ability to provide rapid,
    non-destructive, multi-element analyses from low
    parts-per-million (ppm) levels to high weight percent
    (wt%) concentrations for elements from sodium (11Na)
    to uranium (92U).
    The versatile Rigaku NEX CG EDXRF spectrometer delivers
    routine elemental measurements across a diverse range
    of matrices from homogeneous, low viscosity liquids

    (=$QDO\VLVLQWHUIDFHIRU
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    Rigaku NEX CG software was developed to be both extraordinarily powerful and extremely easy to use. Ideal for
    non-technical operators, routine analyses are performed
    through a simplied customizable EZ Analysis interface:
    1. Select the sample position and enter a name
    2. Select the application method
    3. Press start
    The depth and breadth of features, as well as the sophistication of the interface is the result of decades of XRF
    software development at Rigaku.

    to solids, metals, slurries, powders and pastes. Especially


    well suited to the semi-quantitative determination of
    elemental content in complete unknowns, the superior
    analytical power, exibility and ease-of-use of the
    NEX CG add to its broad appeal for research, industrial
    and in-plant monitoring applications.

    53)64;UHGXFHVWKHQHHGIRUVWDQGDUGV

    Black dot: Raw data


    Gray: Result of tting
    Blue: Barium
    Green: Titanium
    Red: Chromium

    NEX CG is powered by a new qualitative and quantitative analytical


    software, RPF-SQX, that features Rigaku Prole Fitting (RPF) technology.
    The software allows semi-quantitative analysis of almost all sample types
    without standards and rigorous quantitative analysis with standards.
    Featuring Rigakus famous Scatter FP method, the software can automatically estimate the concentration of unobserved low atomic number
    elements (H to F) and provide appropriate corrections.
    RPF-SQX greatly reduces the number of required standards, for a given
    level of calibration t, as compared to conventional EDXRF analytical
    software. As standards are expensive, and can be difcult to obtain for
    many applications, the utility of RPF-SQX can signicantly lower the cost
    of ownership and reduce workload requirements for routine operation.

    In the analysis of RoHS polymer standard BCR680,


    coexisting elements Ti and Ba overlap with Cr.
    RPF-SQX deconvolutes the overlap so that Cr can
    be analyzed.

    &DUWHVLDQJHRPHWU\IRUKLJKHVWSHDNWREDFNJURXQG
    Unlike conventional EDXRF analyzers, the NEX CG was engineered with a
    unique close-coupled Cartesian Geometry (CG) optical kernel that dramatically increases signal-to-noise. By using secondary target excitation, instead of
    conventional direct excitation, sensitivity is further improved.
    The resulting dramatic reduction in background noise, and simultaneous increase in element peaks, results in a spectrometer capable of routine trace element analysis even in difcult sample types. Up to ve
    polarization and secondary
    targets cover the complete
    elemental range (Na-U) with
    Conventional EDXRF
    optimized sensitivity.
    direct excitation

    Cartesian geometry with secondary targets delivers exceptional signal-to-noise (orange spectrum)
    as compared to a conventional system (blue
    spectrum).

    Excitation is provided by a 50 watt Pd-anode end-window X-ray tube. For maximum stability, the tube is tted with a shutter so that the tube may remain on
    at all times for maximum stability and durability. An uninterruptible power supply (UPS) compensates for power line uctuations and extends tube life. Superior counting statistics and designed-in high stability translate into extraordinary
    analytical performance.

    6LOLFRQGULIWGHWHFWRUIRUH[FHSWLRQDOSUHFLVLRQ
    A silicon drift detector (SDD) affords extremely high count rate capability with
    excellent spectral resolution. This enables NEX CG to deliver the highest precision analytical results in the shortest possible measurement times.

    Simplied diagram of a SDD detector illustrating


    the concentric ring construction that allows for
    very high X-ray count rates.

    PDNHVURXWLQHDQDO\VLVDVHDV\DV
    3UHSDUHVDPSOHV
    No digestion; minimal sample preparation
    Direct non-destructive measurement of most materials

    /RDGVDPSOHVDQGHQWHUVDPSOHQDPHV
    Autosampler for unattended operation
    EZ Analysis software interface for simple operation

    &OLFNWKHVWDUWEXWWRQ
    Fast simultaneous multi-element quantitative results
    Powerful RPF-SQX software minimizes standards

    9HUVDWLOH6DPSOH&KDQJHU&RQILJXUDWLRQV
    6DPSOH&KDQJHU

    $SSOLFDEOHWR$6L]H/DUJH6DPSOH
    Large sample chamber
    (38cm diameter
    and 10cm deep)
    accomodates up to A4
    size large samples for
    direct analysis.

    6DPSOH6SLQQHU2SWLRQ
    High capacity 15-position
    changer for cups and
    coupons up to 32mm
    diameter. 10-position
    changer supplied for 3540mm sample sizes.

    Optional sample spinner


    and 9-position changer
    allows analysis of nonuniform samples.

    1(;&*6SHFLILFDWLRQV
    Excitation

    X-ray tube with Pd anode


    50W max power
    50kV max voltage
    Four standard polarization and secondary targets depending
    on application, for optimum excitation
    Optional fth target for optimal excitation of Na and Mg

    Detector

    High performance SDD


    Peltier electronic cooling
    Large active detection area
    Optimum balance of spectral resolution and high
    count rate

    Software & Application Packages

    Sample Chamber
    Large 38 cm diameter x 10 cm deep sample chamber for bulk
    samples
    15-position automatic sample changer (32mm sample cups)
    10-position automatic sample changer (35-40mm sample cups
    and pellets)
    9-position automatic sample changer with sample spinner
    Analysis in air, helium purge, or vacuum

    Environmental Conditions

    Ambient temperature 18-28 C (65-82 F)


    Relative humidity )75%
    Vibration: undetectable by people
    Free from corrosive gas, dust and particles

    Spectrometer Data
    Single phase AC 100/220V, 15/7A (50/60 Hz)
    Dimensions: 60(W) X 60(D) X 40(H) cm (23.6 X 23.6 X 15.7 inch)
    Weight: 80 kg (176 lbs)

    Options

    Computer

    Menu-based software for control of spectrometer functions


    and data analysis
    Application templates
    Simple ow bar wizard to create your own methods
    RPF-SQX FP for qualitative and quantitative analysis
    Matching Library for augmentation of FP
    Automatic spectral overlap deconvolution
    Empirical calibration with overlap and matrix compensation

    External PC computer system


    Microsoft Windows Vista operating system
    Keyboard and mouse
    Monitor
    Printer

    Fifth secondary target for optimum excitation of Na and Mg


    9-position automatic sample changer with sample spinner
    Vacuum system
    Uninterruptible power supply (UPS)
    10-position automatic sample changer

    $SSOLHG5LJDNX7HFKQRORJLHV
    9825 Spectrum Drive, Bldg 4, Suite 475, Austin, TX 78717 USA
    voice (+1) 512-225-1796 | toll free (+1) 877-55E-DXRF | fax 512-225-1797
    email [email protected] web RigakuEDXRF.com
    Rigaku Americas

    Rigaku Europe

    Rigaku Japan

    Rigaku Beijing Corporation

    9009 New Trails Drive


    The Woodlands
    Texas USA 77381-5209
    email: [email protected]
    Tel: (281) 362-2300
    Fax: (281) 364-3628

    Gross-Berliner Damm 151


    12487 Berlin Germany
    e-mail: [email protected]
    Tel: +49-(0)30-6264035-0
    Fax: 49-(0)30-6264035-10

    Rigaku Corporation
    4-14-4, Sendagaya, Shibuya-Ku,
    Tokyo 151-0051, JAPAN
    email: [email protected]
    Tel: +81 3-3479-0618
    Tel: +81 3-3479-6012 (SEMI)
    Fax: +81 3-3479-6112

    2601A, Tengda Plaza, No. 168


    Xizhimenwai Avenue Haidian District
    Beijing, 100044, P.R. China
    Tel: 010-88575768
    Fax: 010-88575748
    http://www.rigaku.com.cn

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