1100H Users Manual Version 2014.1.0
1100H Users Manual Version 2014.1.0
1100H Users Manual Version 2014.1.0
Version 2014.1.0
April 21, 2014
Table of Contents
Setup
Tester Basics
Basic Operation................................................................. 9
Downloading Updates and Changing the Language ............ 9
Security ............................................................................ 9
Changing the Speaker Volume ........................................ 10
Installing Adapters ........................................................... 11
Adapter Sizes.................................................................. 13
Duplicating the Adapter Setup.......................................... 15
Cable Signatures ............................................................. 16
Adapter Signatures.......................................................... 17
The Loaded Test Program and Tester Memory ................. 17
18
Using CTLWIN
31
34
User Preferences
40
46
51
61
67
Digital I/O
75
Tester Configuration
81
89
89
General Information
94
Calibration ...................................................................... 94
Maintaining Adapters and Fixturing .................................. 94
Service ........................................................................... 94
Conditions for Operation .................................................. 94
Appendix
84
Specifications .................................................................. 84
Warranty ......................................................................... 86
Setup
Setup
Purpose of this Manual
Tester Setup
Operator Training
Cable Testing
Users Manual
Quick Reference
Guide
1100H+ Tester
CTLWIN Kit
Power Supply
Power Cord
Plug type varies with
country of receipt.
Probe
Setup
Adapters
Interchangeable adapter
cards for connecting
cables to the tester.
Scanner Add-Ons
Each Scanner Add-On
provides 128 test points.
Connect up to seven for a
total of 1024 test points.
Tester Options
Your 1100H+ comes standard with 1000 volt DC (Direct Current) or 1500 volt DC, depending on
the model. Additional options are available for purchase, such as networking, scripting, SPC
Data Collection, and AC (Alternating Current) capability. If you have purchased any of these
options, a sticker on the back of the tester identifies the option(s) you received. Each option is
described below. To add any of these options to your 1100H+, call Cirris customer service at 1800-441-9910.
Networking
This option allows you to store test programs in a central location, easily collect test results,
keep track of test programs, and verify each tester on the production floor has access to the
same test information. Additionally, you can easily back up test information to prevent it from
being lost or deleted. Ultimately, operating multiple testers is more effective and efficient with a
network. To implement networking, Cirris Networking Made Easy Kit is required.
SPC Data Collection
This option allows you to store specific test information and retrieve that information for
analysis. For more information, see SPC Data Collection on page 86. To enable the SPC
Data Collection option, see 1100 Utilities Application on page 82.
Scripting
This option allows you to adapt the testers behavior to fit your needs, add new features, and
ease automation of tasks. Scripting can also be used to create and print custom labels for
wire identification (see Create Labels in the Scripting manual). To enable scripting, see
1100 Utilities Application on page 82.
AC Voltage
This option allows the 1100H+ tester to perform hipot tests using up to 700 VAC (RMS) on the
standard 1100H+ configuration. The testers AC hipot capacity is extended to 1000 VAC (RMS)
on the 1500 VDC model.
Note: Special high voltage adapters are required to test at hipot voltages above 1000 VDC and
700 VAC. To enable the AC option, see 1100 Utilities Application on page 82.
Setup
Hipot Warning!
Possible electric shock!
Cirris hipot testers are designed to be safe for operators. Injuries from hipot test
equipment are rare; however, not every hipot test situation is safe. Hipot testing is not a
danger to healthy individuals, although an occasional mild electric shock may be
experienced. A small shock will only occur during a hipot test when the operator
touches an energized connection point. A shock from the tester may result in a hipot
test failure.
Medical Warning!
Children and anyone wearing a cardiac pacemaker, insulin pump, or electronically
controlled medical device should NOT perform Hipot testing.
Setup
Power
Supply
Power
Cord
Well grounded
power is essential
for the tester to
operate accurately.
Probe
SIGNATURE 1100H+
Set Preferences
Set Up Test Program
TEST: 1B4137-4Z020
Note: If connecting either a printer or Scanner Add-ons, see the applicable sections that follow;
otherwise skip to Tester Basics on page 9.
Setup
Connecting a Printer
If you connect a printer to the 1100H+, you will be able to print cable documentation, error
information, and test reports. Without a printer, you will need to handwrite the results.
Caution! The 1100H+ is NOT compatible with serial printers. If you plug a serial printer into the
serial port, you may damage the tester.
Setup
Horizontal
Position
Note: The only time to remove the J1-J2 cover plate is when attaching an Add-on Scanner.
J3-J4 Cover Plate
Horizontal
Position
Scanner
Assembly
Setup
Cover Piece
Plastic Rivet
Scanner Assembly
Add-on Connector
Scanner Add-on
Setup
J8
J5
J7
J9
J12
J11
Continue this
sequence on
subsequent
Add-Ons.
Note: Labeling the coverplates identifies adapter positions to help you understand tester
prompts and error messages.
Setup
Tester
Tester Basics
Basics
Basic Operation
Available Buttons
These symbols change as the
available buttons on a screen
become active or inactive. They
show you which Up, Down, and
Back buttons are active.
Back Button
Returns to the
previous menu.
Up/Down Buttons
Scroll menu options
and settings.
Selection Buttons
Select menu options.
SIGNATURE 1100H+
Set Preferences
Set Up Test Program
TEST: 1B4137-4Z020
Good/Bad LED
Green if cable passes the test;
Red if cable has errors.
Menu Title
Always on the top
line in capital letters.
Security
When using your 1100H+ tester, you may see a lock symbol next to a menu
selection. This symbol indicates that the selection cannot be changed. By
connecting a computer to the tester, you can choose to lock or to unlock certain
menu selections. You may want to use this capability may be used if, for
example, you wanted to keep operators from creating new test programs or
changing tester settings. For more information, see 1100 Utilities Application
on page 82.
Menu Lock
Symbol
Tester
Basics
2. Scroll down
SIGNATURE 1100H+
Set Preferences
Set Up Test Program
TEST: 1B4137-4Z020
.
SET USER PREFS
Set Test Methods
Set Hipot Methods
Set Test Count
Note: If you scroll down from this screen, you can change the Date, Time, and Factory Default
setting for the test.
4. Press up
or down
to
change or turn off the volume.
The speaker selections are
OFF, LOW, MEDIUM, and
HIGH.
As you adjust the speaker
volume, you will hear audible
beeps indicating the change
in volume.
5. Press Accept to save the new
volume setting.
6. Press back
main menu.
to return to the
SET VOLUME
HIGH
ACCEPT
CANCEL
SET VOLUME
MEDIUM
ACCEPT
CANCEL
Tester
Basics
10
Installing Adapters
1. Twist both fasteners on the J3J4 cover plate horizontally.
Cover plate
twist
Note: Adapters should be inserted with the J1-J2 cover plate in place.
Tester
Basics
11
J1-J2
J3-J4
rotate
vertically
Caution! Always use the cover plates. Without the coverplates attached, the interfacing
connectors on the 1100H+ may become damaged.
Tester
Basics
12
Adapter Sizes
Cirris adapters mate with many industry standard connectors. The three sizes of Cirris adapters
are Single-High, Double-High, and Quad-High.
Single-High Adapters are used for
connectors with up to 28 test points.
Standard Adapter
Note: For more information on which adapters are available with HV option, visit
www.cirris.com or call 1-800-441-9910.
Tester
Basics
13
Adapter Positions
The tester recognizes positions for each adapter and refers to test points based on these
positions.
Notice the J1, J2, J3 and J4 labels
on the cover plates.
J2
Label
J4
Label
J3
Label
J1
Label
The J1 label shows how a Single, Double, or Quad-High Adapter occupies the J1 position.
Single-High
Adapter in J1
Double-High
Adapter in J1
Quad-High
Adapter in J1
Tester
Basics
14
RIGHT
Matches the
original setup.
WRONG
Does not match
the original setup.
Tester
Basics
15
Cable Signatures
When learning a cable, the tester
mathematically derives an 11-digit
alphanumeric code for the cable called a
Cable Signature.
CABLE LEARNED
Verify Test
Save Learned Test
TEST: 1B4137-4Z020
1B4137-4Z020
1B4137-4Z020
Some examples
The Cable Signature for each of these cables
indicates they have identical connections, but
different Test Parameter Settings.
3F09EF 2J8NH
3F09EF52AE3
3F09EF 2J8NH
54GF032J8NH
Note: If a test program has components, the paramater signature is MULTI. If a test program has
advanced hipot settings or a voltage greater than 1000 V DC, the parameter signature is -00000.
Tester
Basics
16
Adapter Signatures
The tester recognizes the
Adapter Signature because of
jumpers on the adapter pc board.
Adapter Signatures identify how
many pins are in the adapter,
where pin 1 is, and how the pins
are numbered.
REQUIRED ADAPTERS
J1 F5B4E0
J2 03FAC1
SIGNATURE 1100H+
Set Preferences
Set Up Test Program
TEST: 1B4137-4Z020
Internal Memory
The C drive is the testers internal memory and default drive. In addition to the last loaded test
program, the C drive contains up to 99 memory locations that can store test programs.
For example, this screen shows test
programs stored in memory locations 4,
5, and 6.
C:
4: A39CB4-2J8NH
5: 8E10C4-2J8NH
6: B34892-6F8N0
External memory
A thumb drive is external memory, which expands storage capacity. For more information,
see USB Thumb Drive on page 26.
If you are using a thumb or network
drive, the corresponding drive letter(s)
will be displayed on the screen.
C:
<D:>
<H:>
1: E3248D-2J8NH
1:
:
Tester
Basics
17
Using
Usingthe
the Tester
Tester
Creating a Test Program
A test program can be created by learning a sample cable. It is important to ensure the learned
sample cable is a good cable. To create a test program from a sample cable:
1. Attach the sample cable:
a. Remove the J3-J4 cover plate.
b. Install the correct adapters.
c. Replace the cover plate.
d. Connect the sample cable.
2. Learn the sample cable:
a. From the main menu, press
Set Up Test Program.
b. Press Create New Test.
SIGNATURE 1100H+
Set Preferences
Set Up Test Program
TEST: 39E92F-4Z020
c. Press LEARN.
3.
CABLE LEARNED
Verify Test
Save Test
Test: 39E92F-4Z020
1100H+ Cable Documentation
Cable Signature: 39E92F-4Z020
J1 Adapter Signature: F5B4E0
J2 Adapter Signature: 03FAC1
CABLE LEARNED
Verify Test
Save Test
Test: 39E92F-4Z020
Using the 18
Tester
CABLE LEARNED
Verify Test
Save Test
TEST: 39E92F-4Z020
SIGNATURE 1100H+
Set Preferences
Set Up Test Program
TEST: 39E92F-4Z020
c. Press LEARN.
3. Verify there are no connections:
a. Press CONTINUE LEARN.
WARNING!
No Connection(s)
Found
CONTINUE LEARN
CABLE LEARNED
Verify Test
Save Test
TEST: 39E92F-4Z020
Using the 19
Tester
At least one
adapter must be
installed to learn.
SIGNATURE 1100R+
Set Preferences
Set Up Test Program
TEST: 39E92F-4Z020
b. Toggle the up
and down
arrows to increase or decrease the
threshold.
4W Kelvin: OFF
SE Wires: > 26.0 pF
SE Pins: < 10.0 pF
4W Kelvin: OFF
SE Wires: > 26.0 pF
SE Pins: < 10.0 pF
26.0 pF
ACCEPT
CANCEL
Using the 20
Tester
Press Continue.
WARNING!
No Connection(s)
Found
CONTINUE LEARN
LEARN BACKGROUND
CAPACITANCE
**REMOVE CABLE**
CONTINUE
Note: Everytime you test a batch of cables, you will be asked (once per batch) to remove the
cable so that the tester may learn the background capacitance.
6. The test program is ready for use.
CABLE LEARNED
Verify Test
Save Test
TEST: 39E92F-4Z020
CABLE LEARNED
Verify Test
Save Test
TEST: 1E670-2L35H
b. Press Print.
CABLE LEARNED
Verify Test
Save Test
TEST: 1E670-2L35H
CABLE LEARNED
Verify Test
Save Test
TEST: 1E670-2L35H
Using the 21
Tester
Using the 22
Tester
Testing a Cable
1. Make sure the test program for the
cable being tested is loaded:
Load a different test program by:
OR
Retrieving a test from memory.
CABLE LEARNED
Verify Test
Save Test
Test: 39E92F-4Z020
The last
loaded test
program is
displayed on
the main
menu after
learning a
cable.
Adapters set up in
original positions
or
b. Press Test for the loaded test
program.
Note: If the User Preference Test Mode is set to CONTINUOUS, the test will start
automatically. If Test Mode is set to SINGLE TEST, press START TEST to begin the test.
For more information, see Test Mode on page 41.
Using the 23
Tester
FAILED: HIPOT
View Errors
Print Errors
RETEST
Note: If the screen does not display the ATTACH CABLE prompt after removing the tested
cable, it means the tester still sees connections. Check your adapter or adapter cables for shorts.
Using the 24
Tester
Test Summaries
A test summary displays the results of a batch of tested cables.
Displaying a Test Summary
After testing a good cable:
1. Scroll down
Note: You can change the format of the test summary to display the count for good cables only.
For more information, see Test Count on page 44.
To Clear or Reset a Test Summary
Once you have finished with a run of cables,
and you have the summary data you need,
press STOP TEST RUN to complete the run.
The summary counts (Total, Good, and Bad)
will be reset to 0 in preparation for another
run.
Using the 25
Tester
D:
<C:>
1: 2B4137-4Z20
2:
D:
<C:>
custom
2: 2B5284-5Z30
Using the 26
Tester
Creating Folders
On your PC, you can organize test programs into folders and then copy the folders into the tester
via thumb drive.
How folders function:
<C:>
<folder>
1:
D:
D:
<C:>
<newfol 1>
1:
D:\folder
<C:>
<. .>
custom
Using the 27
Tester
CABLE LEARNED
Verify Test
Save Test
Test: 39E92F-4Z020
SIGNATURE 1100H+
Manage Files
Version Information
PRINT: lower
3. Press Save.
C:
<D:>
<H:>
1:
1:
:
b. Folder
c. Memory location
<C:>
<D:>
<folder1>
<D:>
<. .>
1:
1:
:
H:
The selected
drive is
displayed here.
H:/folder1/
Note: Selecting a memory location saves the test program in the tester.
Note: Cirris recommends recording the test program information on the 1100H+ Cable
Documentation or 1100H+ Test Program Location Listing form (blank forms in appendix).
Using the 28
Tester
SET UP TEST
Create New Test
Load Test
EDIT: 39E92F-4Z020
<E:>
<F:>
<Z:>
C:
C:/
SIGNATURE 1100H+
Manage Files
Version Information
PRINT: 1B4137-4Z020
DELETE 0 FILES
Mark Files
Delete Marked
CANCEL
C:
Lock.txt
PRINTER.cmp
Report.lua
DELETE 2 FILES
Mark Files
Delete Marked
CANCEL
Using the 29
Tester
FILE NAME
This option will display the name
of the bundled file as a .ccb file or
the single file as a .ccf file.
FILE CONTENT
This option will display all files in
the bundle or the single files.
SIGNATURE 1100H+
Manage Files
Version Information
PRINT: 1B4137-4Z020
IMPORT 0 FILES
View: FILE NAME
Mark Files
Import Marked
D:
Lock.txt
CirrisST.ccb
Adapter2.ccf
IMPORT 2 FILES
View: FILE NAME
Mark Files
Import Marked
Using the 30
Tester
Using
CTLWIN
Using CTLWIN
Included with your tester is the CTLWIN kit, which contains a software install disk and a PC
interface cable. CTLWIN is a PC Windows program, which allows you to access Test
Programs in the testers memory. Using CTLWIN you can:
For installation instructions and PC requirements to run CTLWIN, refer to the Cirris Software
Installation Guide.
PROBE ON POINT
J5-03_RED WIRE
Custom
Point Label
Using
31
CTLWIN
*984123-2J8NM
(984123-2J8NM
J1 D507F1
CONNECTION RESIS 10.0 ohm
LV INSULATION RESIS 100k ohm
HIPOT VOLTAGE 50 V
INSULATION RESIS 5.00M ohm
HIPOT DURATION 1 SEC
APPLY HIPOT TO ALL ADAPTER PINS
HIPOT SOAK TIME 0 SEC
Cable description
changed from the
Cable Signature to
a custom description
(the cable signature
will be -00000 if the
voltage is greater
than 1000 V DC).
(984123-2J8NM
J1 D507F1
CONNECTION RESIS 10.0 ohm
LV INSULATION RESIS 100k ohm
HIPOT VOLTAGE 50 V
INSULATION RESIS 5.00M ohm
HIPOT DURATION 1 SEC
APPLY HIPOT TO ALL ADAPTER PINS
HIPOT SOAK TIME 0 SEC
1 J1-001 J1-002
2 J1-003 J1-004
1 J1-001 J1-002
2 J1-003 J1-004
LABELS
J1-001 = HEADER_PIN1
J1-002 = HEADER_PIN2
J1-003 = RED_WIRE
J1-004 = BLUE_WIRE
*477BDD-MULTI
*477BDD-MULTI
(477BDD-MULTI
(477BDD-MULTI
J1 ACEFA1
J2 1A59C0
J1 ACEFA1
J2 1A59C0
1 J1-001 J2-001
2 J1-004 J2-002
3 J2-007 J2-008
1 J1-001 J2-001
2 J1-004 J2-002
3 J2-007 J2-008
CHECK COMPONENTS
1 RESIS J1-002 J2-007 42.3 ohm 10 %
2 RESIS J1-008 J2-009 6.64 K ohm 10 %
3 CAP J1-006 J1-002 420 nF 10 %
4 LINK J1-005 J2-005
)
Learned resistor
values and default
CHECK COMPONENTS
tolerances edited. 1 RESIS J1-002 J2-007 42.2 ohm 5 %
2 RESIS J1-008 J2-009 6.65 K ohm 5 %
3 CAP J1-006 J1-002 420 nF 10 %
4 RESIS J1-005 J2-005 1M ohm 10%
Link command
)
changed to a
resistor command.
Using
32
CTLWIN
*695BAE-MULTI
*695BAE-MULTI
(695BAE-MULTI
(695BAE-MULTI
J1 ACEFA1
J2 1A59C0
J1 ACEFA1
J2 1A59C0
1 J1-001 J2-001
2 J1-004 J2-002
1 J1-001 J2-001
2 J1-004 J2-002
CHECK COMPONENTS
1 DIODE J1-007 J2-008
CHECK COMPONENTS
1 DIODE J1-007 J2-008
2 CAP J1-006 J1-003 50 nF 10 %
3 DIODE J1-008 J2-009 LED
Using
33
CTLWIN
Overview
of of Preferences & Settings
Overview
Preferences
& Settings
What are Preferences and Settings?
The way the tester operates is determined by the following:
User Preferences
Learn Settings
Test Parameter Settings
User Preferences
User preferences affect how the tester functions and prompts the operator. For example, you
may choose whether the operator has to press a button to start a test or have the test start by
itself after the tester senses a connection. User Preferences do not affect the critical
characteristics of the test.
Learn Settings
Learn Settings affect the way the tester learns a cable. For example, do you want the tester to
learn electrical components in the cable? If so, you need to change one of the Learn Settings
that checks for components. Another Learn Setting determines how low the resistance of a
connection must be before it is recognized as a connection. After a successful learn, the Learn
Settings become the Test Parameter Settings for that cable until it is changed.
Overview of
Preferences
and Settings
34
Volume
Factory Defaults
CONTINUOUS
OFF
OFF
OFF
ON
ON
OFF
Good Only
OFF
Pin 7 = Good Light On
Pin 8 = Bad Light On
Medium
10.0
100K
OFF
Test Mode
External Switch
Fault Location
Auto Start
Automatic Hipot
High Speed Hipot
Safety Switch
Test Count
Auto Print
Digital Outputs
Factory Defaults
Factory Defaults
STANDARD
50
5M
.01 seconds for VDC and 1 cycle for VAC
ALL PINS
NO
0 seconds
SIGNATURE 1100H+
Set Preferences
Set Up Test Program
TEST: DT Solar
3. Press RESET.
Overview of
Preferences
and Settings
35
Second Part
High Voltage (or Hipot) Test
The tester applies high voltage
to the cable as required to test
the cables insulation.
Third Part
Intermittent Test
Until the cable is removed,
the tester repeatedly runs
low voltage tests to check
for intermittent errors.
Some preferences and settings affect the low voltage test. Other preferences and settings affect
the high voltage (hipot) test. Still others only affect the intermittent test. Because of its
complexity, the high voltage test is explained in more detail below.
Note: The high voltage test will not occur if the test setting Hipot Voltage is OFF or if the cable
fails the low voltage test. The intermittent test will not occur if the User Preference Test Mode is
set to SINGLE.
Overview of
Preferences
and Settings
36
Overview of
Preferences
and Settings
37
Voltage
0
Time
Current
0
The Voltage Ramps Up
As the voltage rises to its
High Voltage setting,
current is limited for safety.
Dielectric Withstand Test
The 1100H+ watches for high
voltage arcs (exhibited as large
spikes in current) during the
Hipot Duration. In this example,
there are no large current spikes
because the cable is good.
Note: This chart shows a single hipot voltage (in the High Voltage setting) throughout the hipot
test. However, using the Hipot Test advanced setting allows one voltage to be applied for the
Dielectric Withstand Test and another voltage for the Insulation Resistance Test.
Overview of
Preferences
and Settings
38
AC Testing
AC testing is an available option on the 1100H+. AC Testing may be required to meet a test
specification, in which you cannot substitute an equivalent VDC. For more information, see
Substituting VDC for a VAC Specification on page 58. When using AC, the hipot test
progresses somewhat differently as the graphs below illustrate.
DWV Voltage Setting
(in AC RMS)
Voltage
Time
Current
Time
Using VAC for hipot testing causes current peaks due to cable capacitance. These peaks are
proportional to how fast the voltage is changing. For more information on the differences
between DC and AC hipot testing, see www.cirris.com/testing/guidelines/ac_hipot_testing.html.
Overview of
Preferences
and Settings
39
User
User
Preferences
Preferences
User Preferences affect the way the tester performs and interacts with the operator, but do not
affect the critical characteristics of the test.
SIGNATURE 1100H+
Set Preferences
Set Up Test Program
TEST: Red Wire
Test Mode
External Switch
Fault Location
Auto Start
Auto Hipot
Delay
Hi-Speed Hipot
Safety Switch
Auto Print
Digital Outputs
Volume
Date
Time
Factory Default
Each User Preference for the 1100H+ is described on the following pages.
User
Preferences
40
Test Mode
Selections
Factory Default
CONTINUOUS
or SINGLE
CONTINUOUS
Test Mode determines how the operator will start a test and whether the tester will continually
scan a cable for intermittent errors until removed from the tester.
If Test Mode is set to CONTINUOUS, the test will start automatically when a cable is
connected to the tester. After passing the low voltage and hipot test, the tester
continuously scans the cable for intermittent errors until the cable is removed.
If Test Mode is set to SINGLE, the test will not start until START TEST is pressed. After
completing the low voltage and hipot test, the tester will not scan for intermittent errors.
In CONTINUOUS test mode, you will hear a ticking sound when a cable passes. Each tick
signifies a successful low voltage scan of the tested cable. If there are errors, the tester
continuously beeps as it scans the cable to help you find the intermittent errors.
External Switch
Selections
Factory Default
ON or OFF
OFF
External Switch allows the testers digital I/O port to receive an input signal from an external
switch to start a test. The external switch, such as a foot pedal or a button, is located away from
the tester.
If External Switch is ON, the tester starts a test from the external switch signal.
If External Switch is OFF, the tester does not look for the external switch signal.
Turning External Switch on does not inhibit your ability to press START TEST on the tester
display. To turn this setting on, the Test Mode must be set to SINGLE. For details on using the
External Switch setting, see Digital I/O on page 75.
User
Preferences
41
Fault Location
Selections
Factory Default
ON or OFF
ON
Fault Location determines which end of the cable first displays an open, short, or miswire in the
tested assembly.
When Fault Location is ON, the tester displays an asterisk next to the pin or pins
closest to the open or short.
When Fault Location is OFF, the fault location information will not be displayed.
Because finding fault locations in the tester takes more time, only the fault locations of the first
five errors are displayed. If fault locations are required for more than five errors, you can correct
the errors and retest the assembly. In most cases, the tester can find the position of the error.
The tester locates opens using capacitance and shorts with resistance. For examples of errors
where Fault Location is used, see Shorts on page 68 and Opens on page 69.
Note: For Fault Location to work well, the custom test fixturing should be no greater than onehalf the length of the wires in the tested device.
Auto Start
Selections
Factory Default
YES or NO
NO
Auto Start allows the 1100H+ to automatically start testing upon boot up.
If Auto Start is ON, the tester will automatically start testing using the loaded test in
memory.
If Auto Start is OFF, the tester screen will show the main menu.
This feature can be helpful when the tester is built into automated test equipment where the
tester interface cannot be easily accessed.
If you need to access the normal tester interface once Auto Start has been turned on, you may
do so by turning on the tester and pressing CANCEL before the Auto Test countdown expires.
User
Preferences
42
Auto Hipot
Selections
Factory Default
ON or OFF
ON
When Automatic Hipot is ON, the high voltage test starts automatically after the low
voltage test passes and the Delay for Automatic Hipot has expired (see Delay below).
When Automatic Hipot is OFF, the hipot test starts only when an operator presses
START HIPOT.
Auto Hipot allows operators to avoid having to press START HIPOT to initiate the hipot test.
However, some cable assemblies may have exposed connections, conductive connector
housings, or cable shielding which will become electrified during the hipot test. Forcing a button
push before the hipot test helps ensure that operators do not have their hands on the cable.
Delay
This setting is enabled when Auto Hipot is turned on. You can change the delay to extend the
time between the completion of the low voltage test and the beginning of the hipot test. The
delay may be set from .1 to 2 seconds.
Hi-Speed Hipot
Selections
Factory Default
ON or OFF
ON
Hi-Speed Hipot determines whether the tester will use advanced algorithms to speed the hipot
test.
When High Speed Hipot is ON, the tester uses advanced algorithms. The algorithms
allow the tester to perform the hipot test much faster by applying high voltage to several
nets simultaneously in a pattern that ensures each net is hipot tested against every other
net.
When High Speed Hipot is OFF, the tester applies high voltage to each net one at a
time.
Note: If the tester finds an error during the High Speed Hipot process, it switches to the lowspeed routine to find which wire failed. This means a failed hipot test will actually take longer
than a passed hipot test. The tester may not be able to duplicate a dielectric error found in the
high-speed routine and displays the error Dielectric Failure Undetermined Net. This would be
the case if an arc occurred while in the high-speed routine which cleared away a conductive
path. Some specifications may require you to test with High Speed Hipot turned OFF.
User
Preferences
43
Safety Switch
Selections
Factory Default
ON or OFF
OFF
Safety Switch requires that the tester sees a high signal on pin 2 of the digital I/O connector
before starting the hipot test. Safety Switch can be used to help ensure an operator does not
shock themselves during a hipot test.
When Safety Switch is ON, the tester will look for a high signal on pin 2 of the digital
I/O connector before starting a hipot test.
When Safety Switch is OFF, the tester ignores the signal status of input pin 2 on the
digital I/O connector.
Safety Switches can be dual palm switches wired in series, a foot pedal, or a sensor in
automated test equipment. For more information on wiring a safety switch, see Hipot Safety
Switch on page 76.
Test Count
Selections
Factory Default
ALL CABLES
Test Count determines the types of tested cable counts listed in the test summary.
When Test Count is set to ALL CABLES, the test summary includes four counts: total
cables tested, cables tested good, cables tested bad, and cables tested intermittent.
When Test Count is set to GOOD ONLY, the test summary includes the count for good
cables only.
The factory default ALL CABLES is more informative. However, some customers prefer to use
GOOD CABLES ONLY.
User
Preferences
44
Auto Print
Selections
Factory Default
ON or OFF
OFF
Auto Print determines whether the tester will automatically print test results after each test.
When Auto Print is ON, you can select one of six reports that will automatically print
test results. Depending on the type of selected report, the report will print after one of
the following: (1) a good or bad cable is tested, (2) a good cable is tested, or (3) a bad
cable is tested.
When Auto Print is OFF, the tester will print test results only when an operator presses
PRINT TEST SUMMARY.
Auto Print allows you to select one of three standard reports or one of three custom reports.
The standard reports are: All, Standard; Good, Standard; or Bad, Standard. The All,
Standard prints a short one line report after each test whether the cable tests good or bad. The
Good, Standard prints a full page report after a cable tests good. The Bad, Standard prints a
full page report after a cable tests bad.
The reports autoall.rpt, autogood.rpt, and autobad.rpt can be customized if you purchased
the scripting option. Being able to customize reports allows you to put your company name on
the report and choose the data displayed on the report.
Regardless of the type of report selected, you can print a test summary after any test when
testing a run of cables. Remember, when you select a report, the same report will be used for
all test programs until you change the report selection.
Digital Outputs
Selections
Factory Default
Volume
Selections
Factory Default
Medium
Volume allows you to mute or adjust the volume of the tester. If you need louder sound, you
can make an adjustment inside the unit. For more information, see Changing Volume and
Display Controls on page 88.
Factory Defaults
Factory Defaults restores the factory defaults for the testers User Preferences and Learn
Settings.
User
Preferences
45
Low Voltage
Resistance
Low Voltage Resistance Settings
Settings
Changing Learn and Test Parameter Settings
Learn Settings affect the way the tester learns a cable. After a cable is learned, the Learn
Settings become the Test Parameter Settings for that cable, which determine how a cable is
tested.
SIGNATURE 1100H+
Set Preferences
Set Up Test Program
TEST: E3248D-2J8NH
to exit the
8. Press back
to exit the category of
Learn Settings.
9. Press back
to exit the SET LEARN
SETTINGS menu.
Low Voltage
Settings
46
SIGNATURE 1100H+
Set Preferences
Set Up Test Program
TEST: 39E92F-4Z020
The cable
signature or
file name of
the loaded
test is
displayed
on the main
menu.
SET UP TEST
Create New Test
Load Test
EDIT: 39E92F-4Z020
to exit the
8. Press back
test settings
9. Press back
TEST EDITED
Print Test
Save Test
TEST: 39E92F-4Z020
Each Learn and Test Parameter Setting used for setting low voltage resistance thresholds is
described on the following pages.
Low Voltage
Settings
47
Selections
Factory
Default
.1-100K, 500K
1M, 5M
10.0
How good are the connections in a cable? The Connection Resistance setting specifies the
maximum resistance a connection can have, and still be considered good as opposed to having
high resistance.
HIGH RESISTANCE
GOOD
Zero
Resistance
OPEN
Infinite
Resistance
Connection
Resistance
Setting
When you learn a cable, the cables connections must be lower in resistance than the
Connection Resistance setting to be learned as connections. When you test a cable, the
cables connections must be lower than the Connection Resistance setting to pass the test.
To allow for cable and tester tolerances, you should generally select a connection
resistance at least 20% or 0.2 ohms (whichever is greater) above the resistance of the
actual connections.
Over time, heavily used adapters can develop worn contacts, which will add to the
connection resistance measurement. Cirris recommends replacing worn adapters before
they affect the measured connection resistance and create high resistance errors. If you
must use adapters with substantial wear, you will have to increase the Connection
Resistance setting to get cables to pass.
The tester can measure the actual connection resistance and give you a suggested value for the
Connection Resistance setting.
Low Voltage
Settings
48
LV Insulation Resistance
(LV Insul Res)
Selections
Factory Default
0.1-100K,
500K, 1M, 5M
100K
LV Insulation Resistance only affects the low voltage test where the basic cable pattern and
gross insulation problems are identified. This setting determines how high the insulation
resistance must be between cable nets to pass the low voltage test. The tester displays
SHORT for an unintended resistance between nets that is less than the LV Insulation
Resistance setting.
SHORT
Zero
Resistance
PASSES LV
SHORT
PASSES LV
Infinite
Resistance
LV Insulation
Resistance
Setting
GOOD
Zero
Resistance
Connection
Resistance
Setting
LV Insulation
Resistance
Setting
OPEN
Infinite
Resistance
Low Voltage
Settings
49
Component Resistance
Selections
Factory Default
(automatically set)
.1-5M
OFF
Zero
Resistance
HIGH RESISTANCE
Connection
Resistance
Setting
Component
Resistance
Setting
OPEN
Infinite
Resistance
Components with resistance so low that you lose the measurement window between
Connection Resistance and Component Resistance settings. In this case, you potentially
have two options:
Option 1: You can raise the Connection Resistance and Component Resistance
settings to test components as connections.
Option 2: If cable connections have more than .1 of resistance, lower both the
Connection Resistance and Component Resistance settings below the cable connection
resistance. Wires and components will be measured as components.
Large capacitors (values greater than 10 microfarad). In this case, you may need to change
the Component Resistance setting below 1K so the capacitors will not be reported as
shorts.
Low Voltage
Settings
50
High Voltage
Settings
High Voltage Settings
Hipot Test
Selections
Factory Default
OFF, STANDARD,
ADVANCED
STANDARD
Hipot Test determines whether the tester performs the hipot test and if so, what settings will be
used.
When Hipot Test is OFF, the tester does not perform a hipot test when the assembly is
tested.
When STANDARD is selected, the hipot settings are simplified. The same settings are
used for the Dielectric Withstand (DW) Test and the Insulation Resistance (IR) Test.
When ADVANCED is selected, more hipot settings are available. The added settings
allow increased and independent control over the Dielectric Withstand (DW) Test and
Insulation Resistance (IR) Test.
The chart below contrasts the settings for the Standard and Advanced Hipot Test.
Standard Setting
Advanced Setting
Hipot Mode
VDC
Frequency
N/A
DWV Current
N/A
Insulation Resistance
Time
High Voltage
Settings
51
High Voltage
Selections
1000V Unit:
50V, 100V, 200V, 300V, 400V, 500V,
630V, 800V, 900V, 1000V
Factory
Default
50 V
1500V Unit:
50V, 100V, 200V, 300V, 400V, 500V,
630V, 800V, 900V, 1000V, 1100V,
1200V, 1300V. 1400V, 1500V
High Voltage determines the voltage applied to a cable during the hipot test. A higher High
Voltage setting tests higher levels of insulation resistance between nets; however, there are
limits to the amount of high voltage you should use on a cable assembly.
The spacing between the pins in a connector, as well as the separation of the
conductors in a cable, limits the amount of voltage that can be applied to a cable.
Use the manufacturers specifications for the wire and connectors used in a cable.
The High Voltage setting affects the available selections for the Insulation Resistance
Settings. For more information, see the Available HV Insulation Resistance Settings
table on the next page.
Highly capacitive cables may limit the amount of high voltage that can be applied to the
cable. See the 1100H+ Spec Sheet on the Cirris website for these capacitance limits.
High Voltage
Settings
52
HV Insulation Resistance
Selections
Factory
Default
10M
GOOD CABLE
LEAKAGE
Zero
Resistance
Infinite
Resistance
HV Insulation
Resistance
Setting
The HV Insulation Resistance settings are limited by the high voltage settings. The table
below shows the available Insulation Resistance settings at each of the high voltage settings.
High
Voltage
50 V
100 V
200 V
300 V
400 V
500 V
630 V
800 V
1000 V
100.0 M
200.0 M
500.0 M
1.00 G
High Voltage
Settings
53
Allowed Contamination
Cables in high voltage and sensitive electronic equipment must have a stringent test
because of their ultimate use. Other cables may be tested at lower levels to allow for
contamination, such as fingerprints and mold release.
Cable Length
Long cables may need a lower Insulation Resistance setting to accommodate the
cumulative effect of small current leakages along their length.
Humidity
A humid environment can aggravate the effects of contamination between cable
contacts and affect cable insulation. For more information, see
Max Soak on page 56.
Duration
Selections
Factory
Default
VDC
.01, .1, 1, 2, 5, 10, 30,
60, 120 seconds
.01 seconds
VAC
1, 10, 60, 300, 3600, or
7200 cycles
1 cycle
Duration determines the amount of time the high voltage is applied to each net during the
Dielectric Withstand Test, which occurs during the hipot test. If using an AC test voltage for the
Dielectric Withstand Test, the duration (typically referred to as dwell) is set in cycles rather
than seconds. If you do not have a Duration Specification, use the following guidelines:
The default setting for this parameter of 0.010 seconds (10 milliseconds) should be
adequate to test most cables. A longer Duration will increase the total hipot test time.
A shorter Duration without any Soak Time is more likely to fail due to humidity related
problems since absorbed moisture may not have time to be dried out of the cable
before the Insulation Resistance Test.
A longer Duration provides a more stringent test for predicting dielectric failures
(exhibited as sudden arcs); however, equivalent dielectric errors can be found by
compensating a shorter Duration with a higher High Voltage setting.
A longer Duration may be better for predicting some types of insulation failures and may
increase the chance for detecting a breakdown condition.
High Voltage
Settings
54
Hipot To
Selections
Factory Default
ALL PINS
Hipot To determines which test points the tester applies high voltage to.
When Hipot To is set to ALL PINS, the tester applies high voltage to all adapter test
points, regardless of whether they have connections to other points in the test.
When Hipot To is set to CONN ONLY, the tester applies high voltage only to adapter
test points that have connections to other test points in the test.
If unused connector pins have loaded contacts (metal in the holes); you should use the ALL
PINS selection. This ensures the tester will catch high voltage shorts between unconnected
contacts. If not, using CONN ONLY can save test time.
Setting High Capacitance Shield to YES forces the Hipot To setting to ALL PINS and cannot
be changed. This ensures the tester catches a condition where leakage occurs from a high
capacitance shield to an unused pin.
Selections
Factory Default
YES, NO
NO
High Capacitance Shield allows a cable to pass with one net too capacitive to pass a hipot
test. This setting is often used when a shielded cable is hipot tested. Cable shields usually
have substantially higher capacitance, because the shield surrounds, and has capacitance to,
all wires in a cable. To avoid an unsafe shock hazard during a hipot test, the tester will not
continue to charge a highly capacitive net.
If High Capacitance Shield is set to NO, the tester reports an Overcurrent Error when
it stops charging a highly capacitive net.
If High Capacitance Shield is set to YES, the tester ignores a single Overcurrent
Error generated by a cable shield (as long as all other wires pass).
A single-net hipot failure can be an indication of a net with high capacitance. Normally,
hipot failures show up with at least two failed nets.
By turning on the High Capacitance Shield setting, you can successfully test a cable
with a highly capacitive shield.
High Voltage
Settings
55
Max Soak
Selections
Factory Default
0 seconds
SOAK Overview
In some cables, the current flow stabilizes quickly when high voltage is applied. In other cables
the current flow may take longer to stabilize due to humidity, dielectric absorption, temperature,
residual charges, or other factors. To compensate for cables that take longer to become
steady, Cirris testers have the SOAK capability. SOAK applies voltage to the cable for a
period of time to "dry out" or stabilize the current flow so the tester can perform an accurate
Insulation Resistance test. SOAK allows you to meet the required procedure of Mil-Std-202F
method 302 paragraph 1.3 which states: ...When electrification time is a factor, the insulation
resistance measurements shall be made immediately after a 2-minute period of uninterrupted
test voltage application, unless otherwise specified. However, if the instrument reading
indicates that an insulation resistance meets the specified limit, and is steady or increasing, the
test may be terminated before the end of the specified period. If you want to apply a forced
voltage for a specific period of time before the I.R. test is done, change the Advanced Hipot
settings and uncheck the box marked Soak Until Good. You can then set a Soak For time
that applies voltage for the entire time specified before performing the I.R. test (see the next
page for more information).
Max Soak allows the tester to monitor the insulation resistance for a selected period of time.
If the I.R. becomes "good" (i.e. actual I.R. reading becomes greater than the Insulation
Resistance setting), the I.R. test is deemed "good" for that net; the test immediately stops for
that net and moves onto the next net.
Note: When a Max Soak time is set, the tester continues to monitor the Dielectric Withstand
Current. If the Dielectric Withstand Current is exceeded, the tester emits a "Dielectric Failure".
Max Soak diagnoses certain failures. If your cables are failing with a voltage leakage
error, you might increase Max Soak. If the problems disappear, the cable likely has a
dielectric or moisture absorption problem.
If a cable must exhibit rigorous high voltage resistance in humid environments, turn Max
Soak off.
Use a longer Max Soak setting for measuring best-case insulation resistances, or for
testing the physical properties of insulation independent of environmental degradation.
Use a shorter Max Soak setting for detecting corona (small current spikes that occur as
moisture dissipates from the cable) and other humidity-related problems in a cable.
High Voltage
Settings
56
Selections
OFF, ON
In the Advanced Hipot settings, you can turn Soak Until Good ON or OFF.
When Soak Until Good is ON, the tester displays Max Soak settings and applies
voltage to each net in the cable until it either, a: passes the I.R. test, or b: completes the
Max Soak time (the same behavior occurs when using the Standard Hipot setting).
When Soak Until Good is OFF, the tester displays the Soak For setting, see the next
section for details.
Note: Unless specifications require otherwise, turning this setting ON can save test time.
Soak for
Available only when Hipot Test: Advanced is selected.
Selections
002, .017, .02, 1, 10, 30,
60, 120 Seconds
Soak For applies voltage to each net in the cable for the specified time BEFORE performing
the I.R. test.
Note: Soak For will generally result in a slower hipot test as each net will be "soaked" for the
entire Soak For period.
Hipot Mode
Available only when Hipot Test: Advanced is selected.
Selections
(May be changed to AC only
when the tester is equipped
with the AC option)
AC, DC
Hipot Mode allows you to select whether the tester will apply AC or DC in the Dielectric
Withstand Test. If you select AC, the Frequency setting is displayed, and the Duration
setting is set in cycles rather than time.
High Voltage
Settings
57
High Voltage
Settings
58
Frequency
Available only when Hipot Mode: AC is selected.
Selections
25, 30, 50, 60 Hz.
Frequency defines the frequency of AC waveform cycle when AC is selected for the Hipot
Mode setting. This setting is often dictated by a customer or engineering specification.
DWV Voltage
Available only when Hipot Test: Advanced
is selected.
DC Selections
1000V Unit:
50V, 100V, 200V, 300V, 400V,
500V, 630V, 800V, 900V, 1000V
1500V Unit: 50V, 100V, 200V,
300V, 400V, 500V, 630V, 800V,
900V, 1000V, 1100V, 1200V,
1300V, 1400V, 1500V
DWV Voltage determines the voltage that is applied to each net in the Dielectric Withstand
Test where gross hipot failures, such as arcs and breakdown conditions, are detected. This
setting is often dictated by a customer or engineering specification. If you do not have a
specification, the
High Voltage guidelines for the settings (page 52) are applicable to this setting.
Selections
100uA (.1mA), 200uA (0.2mA),
500uA (0.5mA), 1mA, and
1.5mA
DWV Max Current determines the maximum current that is allowed to flow out of each net
during the Dielectric Withstand Test. If current flow exceeds this setting, the tester will fail the
tested assembly and display a dielectric error, indicating an arc or insulation breakdown.
Use a lower setting to provide a more stringent test, but too low of a setting may cause
false failures.
Cables with higher internal capacitance may necessitate using a higher setting,
especially if you are testing with a VAC where current surges occur throughout the test
period proportionally to the capacitance in the tested device.
High Voltage
Settings
59
HV Insulation Voltage
(HV Insul Voltage)
Available only when Hipot Test: Advanced
is selected.
Selections
(Available selections limited by
High Voltage Setting)
1000V Unit:
50V, 100V, 200V, 300V, 400V,
500V, 630V, 800V, 900V, 1000V
1500V Unit:
50V, 100V, 200V, 300V, 400V,
500V, 630V, 800V, 900V, 1000V,
1100V, 1200V, 1300V, 1400V,
1500V
HV Insulation Voltage determines the voltage that is applied to each net during the Insulation
Resistance Test.
Note: The tester does not permit you to set this voltage higher than the equivalent DWV
Voltage. This setting specifies a VDC. If you do not have a specification for this setting, the
High Voltage guidelines (page 52) are applicable.
Selections
.002, .017, .02, 1, 10, 30, 60
Seconds
Insulation Resistance Time specifies the time period that the insulation resistance
measurement must remain below the insulation resistance setting during the Insulation
Resistance Test. Unless otherwise specified, the default setting of .002 second (2ms) is
typically sufficient.
High Voltage
Settings
60
Component
Settings
& Test
Component
Setting & Test
Learn Components
Selections
Factory Defaults
On or Off for:
Resistors, Diodes, Capacitors
Twisted Pair, 4W Kelvin
Learn Components is found in Learn Settings. Learn Components determines whether the
tester looks for the existence of components when learning a cable. From the main menu,
you can access the Learn Components menu by selecting Set Up Test Program, Create
New Test, Set Learn Settings, and Set Components. If you learn a cable with components,
the Parameter Signature (the last five digits of the Cable Signature) is displayed as MULTI.
Learning an Assembly with Components
After learning a cable assembly, the technician should verify the test program (page 20).
When verifying the test program of a cable assembly with components, you must assure that
each component in the learned cable assembly is identified with the appropriate component
or link command. The following topics in this section can help you understand how to do this.
Test
Resistors: 0.1 to 1M
Note: The tester does not learn or test germanium diodes, Shottky diodes, and diodes in
series with some resistors. The tester recognizes these components as opens and shorts.
Twisted-pairs: Minimum length 1 to 6 feet
depending on electrical characteristics of
twisted-pair. Minimum of 3 wires in cable.
Same as Learn
Same as Learn
Component
Settings & Test
61
Links
In some cases, the tester may sense the electrical characteristics of a component, but
cannot determine if the component is a resistor, diode, or capacitor. When this occurs, the
tester creates a link in the test program to ensure that no high voltage is applied across the
component during the hipot test. Essentially, the tester applies high voltage simultaneously
to linked test points; thereby, ensuring voltage is not dropped across the link and that the link
is effectively isolated from other cable connections. During the Low Voltage test, the tester
assures the linked points have a higher resistance than the Component Resistance setting.
Links may be created either automatically by the tester or by the technician setting up the
test.
Link
Connections
to Shield 1
Connections
to Shield 2
Link
Connections
to Shield 3
Component
Settings & Test
62
4-Wire Kelvin
The 1100H+ tester can perform 4-Wire Kelvin resistance measurements. This capability
allows you to null out fixturing resistance and measure very low resistances (down to .001 ).
The standard 2-wire resistance measurement requires a single test point for every connection
on the device-under-test. The 4-wire measurement requires two correctly paired test points
for every connection. One test point supplies current (typically referred to as force), while
the other senses voltage (typically referred to as sense).
You may connect force to sense on the contact mechanism to the device-under-test and see
a very small interface resistance. However, if you bring force and sense together directly on
the contact of the device-under-test, you will eliminate all sources of interface resistance. This
extra effort may not be feasible. For more information, see Four Wire Kelvin Testing at
http://www.cirris.com/testing/resistance/fourwire.html.
Note: 2-wire and 4-wire testing can be put into any combination on the 1100H+ tester.
Component
Settings & Test
63
The other way to construct 4-wire fixturing is to use the separate method (shown below).
Although more difficult to construct, the separate method will create a Net List, which will
document correctly without using custom test point Labels. A 2-wire Net List can be
preserved when converting to 4-wire.
Note: Because the first scanned point of a 4-wire pair becomes the visible point; make sure
hidden point adapter(s) are in a higher-counting J position than Net List adapter(s).
Separate
Method
Component
Settings & Test
64
Each 4-wire measurement requires two Kelvin points; one at each end of the tested device.
The Kelvin points should be placed as close to the device-under-test as possible. This is
because the 4-wire test measures from Kelvin point to Kelvin point, so any contact and lead
resistance between the Kelvin points is added to the resistance measurement of the deviceunder-test. The diagram below shows how the location of the Kelvin points will affect the
resistance measurement of the device-under-test.
DUT #1:
The measurement is only
of the device-under-test.
This is ideal, but in real
situations; it may be
nearly impossible.
DUT #2:
The measurement includes part
of the fixture. Warning! If a lot
of the fixture is between a Kelvin
point and the device-under-test,
the 4-Wire Test will be
considerably compromised.
DUT #3:
The measurement tests only
part of the device-under-test.
For example, by using probe
pins, you can eliminate the
resistance of a connector
from the measurement.
Component
Settings & Test
65
4W POINT TYPE
J1A007 = Type 2
Note: Be sure to turn off the 4W Kelvin setting after learning a 4-wire test. This will prevent
problems when learning a 2-wire resistance setup.
Connect the assembly to be tested, and press
Continue to learn the wiring pattern of the
sample tested assembly.
The tester should make a sound indicating
that the assembly has been learned.
The screen will display CABLE LEARNED.
Component
Settings & Test
66
Cable Error
Cable Error Messages
Messages
When an error is found in a tested cable, the screen displays a cable error message. The four
cable error message types are: Low Voltage, Component, High Voltage, and Intermittent.
When a tested cable has an error:
The tester displays
the type of test error
on the screen.
Error tones
sound based
on the type
of error.
ERROR:BBF085-2X8NH
NET 1: SHORT
J1-001 J3-001 TO
J1-002 J3-002
Error Tones
When the tester finds a cable error, it makes error tones based on the type of error:
Opens = single beeps
Shorts = double beeps
Miswires = triple beeps
High voltage errors = triple beeps
Error tones give the operator instant feedback if there is a problem. For instructions on
changing speaker volume, see Changing the Speaker Volume on page 12 and Changing
Volume and Display Controls on page 88.
Cable Error
67
Messages
Shorts
The tester displays SHORT if it senses an interconnection that should not exist in the cable.
There are two kinds of short errors:
1.
Shorts that occur between nets that exist in the net list.
For example, this kind of short
NET 1
J1
J3
NET 2
ERROR: BBF085-2X8NH
NET 1: SHORT
J1-001 J3-001 TO
J1-002 J3-002
ERROR: BBF085-2X8NH
NET 1: SHORT
*J1-001 J3 -001 TO
2. Shorts that occur between points not used in the net list.
For example, this kind of short
NET 1
J1
3
4
NET 2
ERROR: B73AE5-2X8NH
NET NC: SHORT
J1-003 TO J1 -004
3
4
A NET NC SHORT indicates a short
exists between two No Connect pins, or
between a net and a No Connect pin.
Defects in the cable such as frayed wire strains, bridging solder joints, or conductive
contaminates between exposed connections.
The LV Insulation Resistance setting being set above the actual resistance of the
insulation between nets; therefore, nets leaking into each other appear as shorts.
Cable Error
68
Messages
Opens
The tester displays OPEN if it does not sense an interconnection that should exist in the cable.
For example, if this is correct
NET 1
J1
NET 1
1
J3
J1
1
2
NET 2
J3
2 pr
ob
e
ERROR: 1C4873-2X8NH
NET 2: OPEN
J1-002 TO J3 -002
ERROR: 1C4873-2X8NH
NET 2: OPEN
* J1-002 TO J3-002
Defects in the cable, such as missing or cut wires, defective or un-inserted connector
contacts, or cold solder joints.
The LV Insulation Resistance setting is lower than the actual resistance of a wire
connection.
Cable Error
69
Messages
Miswires
The tester displays MISWIRE if it senses that a contact, which should have a valid connection,
is connected to an incorrect contact.
For example, if this is correct
NET 1
J1
J3
J1
1
2
NET 2
J3
2 pr
ob
e
ERROR:E8C464-2X8NH
NET 2: OPEN
J1-002 TO J3-002
MISWIRE J3-001
As shown in this example, the miswire error is indicated as a contact OPEN to where it should
go, and MISWIRE to where it does go.
Miswires are caused by:
Wiring errors in the cable.
High Resistance
The tester displays a High Resistance error when a cable interconnection has too much
resistance.
Defects in the cable, such as partially inserted or dirty connector contacts and poorly
crimped wires.
High resistance in the adapter or tester connector contacts. In this case, the tester
connectors that interface with the adapters may be worn or damaged and need to be
replaced.
A Connection Resistance setting too low for the tested assembly. In this case, the
resistance of a wire or contact is greater than the Connection Resistance setting, but
less than the LV Insulation Resistance setting.
A component, such as a resistor, exists in the cable which has not been learned in the
test program.
Cable Error
70
Messages
Intermittent Errors
The 1100H+ looks for intermittent errors in a cable during the Intermittent Test. Intermittent
errors include the same short and open errors found in the low voltage test, as described in the
previous section.
Whats the difference between Intermittent Errors and Low Voltage Errors?
To be an Intermittent Error, the tester must sense that the cable wire pattern:
1. Was good,
2. Then changed to bad,
3. Then changed back to good.
Intermittent Errors are caused by:
Cable defects that show up only when the cable is moved or wiggled during the test.
The same as those described in the previous section for opens and shorts.
ERROR:E1D464-KJ8NH
High Volt. Leakage
NET 1: J1-002
J3-007
Note: The High Voltage error message does not show what the error was to, only that it
happened from the displayed net.
For example, the error message shows First Detail Error Screen
two hipot errors; therefore, we assume
these two points were arcing to each
ERROR:E1D464-KJ8NH
Dielectric Failure
other (NET NC means the error
NET NC: J3-003
occurred on an unconnected point in
Dielectric Failure
the connector).
If more than two hipot errors occur,
you cannot assume which points were
leaking or arcing to each other.
ERROR:E1D464-KJ8NH
NET NC: J3-005
Cable Error
71
Messages
Overcurrent Errors
An overcurrent error indicates that the tester could not supply enough current to raise a net (or
point) to the selected hipot test voltage.
A net with too much capacitance to be raised up to full hipot voltage. In this case, you
may need to adjust the High Voltage setting, or turn the High Cap Shield Allowed
setting to Yes.
The LV Insulation Resistance setting is set so low the tester could not sense a near
short.
Youve re-run the hipot test on a cable that produced a dielectric failure. Occasionally,
the high voltage arc that caused the dielectric failure creates a conductive carbon trail,
which causes the cable to fail subsequent tests.
Dielectric Failure
This error occurs when high voltage is applied to a cable connection, and the tester detects a
current spike caused by the discharge of a high voltage arc.
Exposed cable connections, too close to each other, which may be related to damaged
insulation, or terminal spacing problems.
The Hipot Voltage setting being too high for the tested cable or adapters used for the
test.
Cable Error
72
Messages
?
User Aborted Hipot
Indicates that the operator pressed ABORT before the hipot cable test finished.
Cable Error
73
Messages
Component Errors
The tester displays a component error if it senses a problem with an electrical component
programmed into the cable test. The tester detects component errors during the Low Voltage
cable test.
The connection to the component has high resistance and therefore, has affected the
testers ability to correctly measure the component value.
The component has not been installed, is missing, or has a value greater than what the
tester can measure.
Bad Diode
The tester displays this message when it senses a defective diode condition.
Possible causes:
Reversed Diode
The tester displays this message when it senses a diodes orientation is reversed.
Possible cause:
NOT twisted
No twisted-pairs
Cable Error
74
Messages
Digital I/O
Digital I/O
Digital I/O on the 1100H+
Digital I/O allows you to set up the 1100H+ to control external devices with tester functions.
You can also use an input on the tester to start a test. For example, the tester could be built
into a cabinet that does not allow the operator to access the display. By using External
Switch input, you can allow the operator to start a test with a switch on the outside of the
cabinet. Additionally, if the cable doesnt pass the test, you can use two of the testers outputs
to activate a buzzer and a red light.
The digital I/O port is located on the back of
the tester. The location and pin out of the
connector are as shown.
01
11
91
21
31
41
5
1 2 34 5 6 7 8
Explanation
Input
Input
Output
Output
Output
Output
10
Output
11
Output
12
13
Not used
14
Ground
15
Ground
Digital I/O
75
Inputs
The 1100H+ tester has four inputs. VDC logic is typically used to control an input; however,
any VDC up to a nominal 24 volts may be used. Inputs used for the testers External Switch
and Hipot Safety Switch capability are described below. If needed, other inputs can be
assigned by using the Scripting option.
External Switch
The 1100H+ has the ability to start a test based on input from an external switch, such as a
foot pedal or sensor in automated test equipment. To use the External Switch input, you must
set the User Preference External Switch to YES. For more information, see External Switch
on page 41.
The External Switch input is on pin 1 of the digital I/O connector. If a DC +5 volt (logic high) is
applied to pin 1, the tester behaves as if START TEST were pressed. You can use the DC +5
volts power source on the digital I/O connector to supply the DC +5 voltages through the switch
circuit as shown below. Do not apply an AC voltage to the input.
P
in9
D
C+
5V
o
lts
P
in1
E
x
te
rn
a
lS
w
itc
hIn
p
u
t
Digital I/O
76
Outputs
The testers outputs are sink outputs. When activated they will connect (or sink) a voltage to
ground, in effect turning ON the output circuit. The outputs are capable of sinking up to a
nominal 24 volts and 500 milliamps. To limit the output current, always ensure adequate
resistance between power supply and the output. When switching a voltage between 12 and
24 volts, the output will allow a slight current flow (about 1mA at 24 volts) when the output is
OFF.
Current cannot flow when the normal state of each output is off. Using the Digital Outputs
settings in the User Preferences tester interface, you can set up test events to turn an output
ON or OFF. One test event sinks the output to ground, thereby allowing current flow through
the output circuit. A second event resets the output line to its original OFF state. If you select
the same event to set and reset the output, the tester will sink the output for a 10 millisecond
pulse. For step-by-step instructions on setting up Digital Outputs, see Setting up the Events
Outputs on page 80.
Each of the test events that change output status are listed below.
Test Event Name
Description
Bad Light On
Cable Attached
Cable Removed
Count Intermittent
Good Light On
HV Delay Started
The tester completed the high voltage test with either pass or fail.
HV Test Failed
HV Test Passed
HV Test Started
HV Test Aborted
Is Intermittent
Learn Completed
Learn Started
The tester completed the low-voltage test with either pass or fail.
Digital I/O
77
LV Test Failed
LV Test Passed
LV Test Started
Ready to Test
The tester is ready to test; the cable may or may not be attached.
Output Examples
Controlling an LED
Lets say you want to light an LED to warn the operator during the hipot test. In the User
Preference Set Digital Output, you can choose to configure one of the outputs. In this case,
choose output pin 10. For this output pin, select HV Test Started to set, and HV Test Done
(P/F) to reset the output.
In this example, the LED requires only 20 mA, so we can use the +5 DC volt supply on the
digital I/O port to power our circuit. Use a resistor in series with the LED to limit the current
going through it.
Resistor
LED
Pin 10
Output
Pin 9
DC +5 Volts
How do you choose the resistor? The LED in this instance has a forward bias voltage drop of
two volts; therefore, three volts must drop across the current limiting resistor. Knowing voltage
drop and current through the circuit, Ohms Law can be used to determine the resistor value.
V
3
V
o
l
t
s
R
=
=
=
1
5
0
O
h
m
s
I 0
.
0
2
0
A
m
p
s
When the hipot test starts, the tester will pull the output to ground allowing current to flow in the
circuit, and the LED will turn on. When the hipot test completes, current through the output will
stop, and the LED will turn off.
Digital I/O
78
Relay
Diode
Pin 6 Output
A diode, such as a 1N4002, is added across the relay to protect the digital I/O port from the
reverse current created from the coil when the output turns off.
Activating an Air Valve
Lets say you want to control an air valve for equipment that will automatically stamp tested
good on each assembly that passes a test. In the User Preference Set Digital Output, you
can select Cable Counted Good to both set and reset the output. Remember, if the same
event is selected for set and reset, the tester will sink the output for a 10-millisecond pulse. In
this case, a pulse is all we need to make our stamp mechanism function.
In this example, the solenoid for the air piston requires DC 24 volts and 300 milliamps (the coil
resistance is 80 ohms).
Note: The digital I/O port can only supply 100 milliamps at either DC 5 or 10 volts; however,
the output can sink up to 24 DC volts. In this case, you can use an external power supply for
the valve circuit as shown below.
+24 V
DC Power
Supply
Diode
Valve
Solinoid
Pins 14 & 15
Ground
Pin 5
Output
In this example, a 1N4002 is added across the relay to protect the digital I/O port from the
reverse current created from the coil when the output turns off.
Digital I/O
79
3. Scroll up or down
to the digital output
pin you want to set up.
4. Press S (set).
5. Scroll up or down
to the test event
needed to start the operation of the output
device; press Accept.
6. Press R (reset).
7. Scroll up or down
to the event needed
to stop the operation of the output device;
press Accept.
Digital I/O
80
Tester
Configuration
Tester Configuration
1100 Upgrade Application
The 1100 Upgrade Application allows you to update the tester software and change the
interface language of the tester. English and Spanish are now available for the1100H+ tester.
Other languages may be available in the future.
To update the software and select an interface language, you need to obtain a file containing
the 1100 Upgrade Application and the current 1100 tester software. You can access this file
from the Cirris FTP site, or it can be emailed or mailed to you. You will need a computer that
can provide a serial interface for your tester. If you do not have a computer with a serial port,
you may use a USB port with a Cirris qualified Keyspan USB-to-serial adapter. A serial cable
is provided with the CTLWIN kit you received with the tester.
To download the upgrade file from the Cirris FTP site:
1. Type the URL ftp://ftp.cirris.com/1100 in your web browser.
2. Double click on the file 1100_verx.xx.exe, where the x.xx is the current revision.
3. In the File Download dialogue box that comes up, click Run to install the 1100
Upgrade software, or click Save if you will be installing the software on other stations.
The software installation should take a few seconds. When the software is installed, an
1100 Upgrade utility icon will appear on the computer desktop.
To run the 1100 Upgrade Application:
With the tester turned ON and connected to the computer, double click the 1100 Upgrade
Utility icon. In the Download Utility screen, select a language and click Download. When
the download is complete the tester will reboot with the selected language and updated
software.
Tester
Configuration
81
Tester
Configuration
82
Tester
Status
Features
affected by
Security
Group
settings
Load and
Save security
profiles
Transfer a
profile to and
from the
analyzer
Tester
Configuration
83
Note: The compressed bundle file extension .ccb stands for Cirris Compressed Bundle.
The compressed single file extension .ccf stands for Cirris Compressed File.
3. When you have made your selection,
click Select Tester Files.
Tester
Configuration
84
Tester
Configuration
85
Tester
Configuration
86
SET UP SPC
SPC Data: DISABLED
Values: ON
Error Text: ON
SET UP SPC
SPC Data: ENABLED
Values: ON
Error Text: ON
Note: Subsequent runs of SPC Data will not overwrite previously stored information. Newer
SPC Data will be appended to the end of the existing data file.
Cirris SPC Data can be read and stored by the SPC Link software that comes
with the SPC Data Collection package. Instructions for use are included with
the PC software.
SPC Made Easy
SPC Made Easy not only reads and stores SPC Data, but it allows you to graph and
chart specific data making analysis quick and easy. SPC Made Easy makes it
possible for you to: look for defects, view production rates, measure efficiency, and
manage data. A demonstration of SPC Made Easy can be obtained from Cirris by
calling 1-800-441-9910.
Tester
Configuration
87
Processor
Assembly
Scanner
Assembly
VERSION INFO
Software Ver: 4.6
Hardware Ver: 2B
S/N: 00322484
Tester
Configuration
88
Software
Installation
Guide
Close all Windows applications on the computer.
This guide pertains to:
Easy-Wire
Cirris Server Software
CTLWIN
Easy-Wire for 1100 testers PC control
SPC Made Easy
SPC Link
Networking Made Easy
Note: If you are updating an existing installation, these instructions may be different than those
you originally used.
For assistance:
Call Cirris toll-free at 1-800-441-9910 or email [email protected].
Outside the US, contact the Cirris office nearest you.
Optional Accessories
Software
Installation Guide
89
If your previously installed software version is from 2.0 to 6.5, call Cirris Technical Support
before attempting to install the new version.
If your previously installed software version is from 7.0 to 9.0, perform the steps in
Removing Easy-Wire version 7.0 9.0 and storing the data below before installing the
current software. You must first remove the previous version and store its data files before
you install the new version.
If your previously installed software version is 2008.2.0 or newer, proceed with Installing
the Software below.
Software
Installation Guide
90
For a stand-alone station or a network station, double-click on the file that has the
name of the program and version you want to install followed by .exe:
For a network server, double-click on the file: Cirris Server 20XX.X.X XXXX
install.exe, where the X.X XXXX represents the version and build.
3. Depending on the Windows operating system, you may need to click Run or Allow to allow
the software to install.
4. If this is the first installation of the software, follow the prompts on the screen to complete
the installation steps provided.
5. If you have installed anything other than the Cirris Server Software, proceed to the
Starting the Software section because core files are generated during the first run of the
software. If you have installed the Cirris Server Software, proceed to the Updating the
Server Configuration section.
Software
Installation Guide
91
Software
Installation Guide
92
Note: If you have any problems with installing or updating your server software complete the
following before contacting Cirris for support:
1. At the server, click Start, All Programs, Cirris Systems Corporation, Easy-Wire Server,
Update Easy-Wire Cirris Server Configuration.
2. You will see the Updating Configuration message. After a moment this message will
Software
Installation Guide
93
General
Information
General Information
Calibration
Each new 1100H+ tester comes with a complimentary certificate of calibration. Cirris
recommends the tester be recalibrated on a one-year interval. In the U.S.A. Cirris offers
complete calibration services in compliance with ANSI/NCSL Z540-1-1994 and MIL-STD
45662A.
To verify calibration and functionality, you can purchase an 1100H+ Performance Check Kit.
The 1100H+ Performance Check Kit has a valid calibration period of 2 years, after which it
must be replaced. In addition to the performance check kit, you need a calibrated volt meter
and high voltage probe capable of measuring the highest voltage the tester can output.
Note: In the event a Cirris tester is found to be out of calibration, there are no adjustable
controls. The tester, or the affected portions, must be sent back to Cirris for repair.
Service
All Cirris Testers are designed as modules for easy servicing. Should your Cirris tester require
service, as directed by Cirris support personnel, you may need to send the affected module or
entire tester back to Cirris for repair. During the repair period, a loaner tester can be sent to
you if needed. You should not attempt to service any circuit board at the component level. All
component-level service should be performed by Cirris technicians.
General
Information
94
Appendix
Appendix
Specifications
Test Point Capacity
Connection Resistance
Sensitivity
LV Insulation Resistance
HV Insulation Resistance
Kelvin Four-Wire
Resistance
Dielectric Withstand
Current
35 mJoules
128
Appendix
84
Specifications Continued
Component Specifications
Twisted Pair
Parallel Port
Memory
Power
Appendix
85
Warranty
1100H+ Warranty
Cirris Systems Corporation warrants the Signature 1100H+ Cable Analyzer to be free of
defects in materials and workmanship for a period of one (1) year from the date of delivery; as
evidenced by receipt of your warranty registration form. In the event a defect develops due to
normal use during the warranty period, Cirris Systems Corporation will repair or replace the
analyzer with a new or reconditioned unit of equal value.
In the event of replacement with a new or reconditioned model, the replacement unit will
continue the warranty period of the original analyzer. The replacement unit will generally ship
within one working day for U.S. customers.
If the analyzer failure results from accident, abuse, or misapplication, Cirris Systems
Corporation shall have no responsibility to replace the analyzer or refund the purchase price.
Defects arising from such causes will be considered a breach of this warranty. Cirris Systems
Corporation is not responsible for special, incidental, or consequential damages resulting from
any breach of warranty, or under any other legal theory, including lost profits, downtime,
goodwill, damage to or replacement of equipment and property, and any costs of recovering
materials used with the Signature 1100H+ Cable Analyzer.
ANY IMPLIED WARRANTIES ARISING OUT OF SALES OF THE SIGNATURE 1100H+
CABLE ANALYZER, INCLUDING, BUT NOT LIMITED TO, IMPLIED WARRANTIES OF
MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE ARE LIMITED IN
DURATION TO THE ABOVE STATED ONE (1) YEAR PERIOD. CIRRIS SYSTEMS
CORPORATION SHALL NOT BE LIABLE FOR INCIDENTAL OR CONSEQUENTIAL
DAMAGE, EXPENSES, OR ECONOMIC LOSS.
Some states do not allow limitations on length of implied warranty or the exclusion or limitation
of incidental or consequential damages. The above limitations or exclusions may not apply to
you.
This warranty gives you specific legal rights and you may also have other legal rights, which
vary from state to state.
Cirris Systems Corporation
Salt Lake City, Utah
Warranty
86
J9
J17
J25
J2
J10
J18
J26
J3
J11
J19
J27
J4
J12
J20
J28
J5
J13
J21
J29
J6
J14
J22
J30
J7
J15
J23
J31
J8
J16
J24
J32
Connections Only
Test Points
No
Connections continued:
Net
Test Points
Components:
Notes:
Folder
Mem.
Loc.
Part
Number
Cable
Description
Cable
Signature/ File Name
Index
A
AC testing
graph of test 37
option 2
Adapter
Checking 87
double-high 13
high voltage 13
installing 11
position 14
quad-high 13
setup 15
Signatures 17
single-high 13
sizes 13
Auto Start Test 40
Automatic Hipot 41
B
Bad component error 72
Bad LED 9
C
Cable error messages 6578
component 72
error tones 65
high voltage 6971
intermittent 69
low voltage 6668
viewing 65
Cable Signatures 16
Calculating connection resistance 46
Calibration 87
Capacitors, testing 48, 59
Component
default values 29
errors 72
Resistance Setting 48
test values 30
testing 59
Compressed files
wirelists, scripts 28
Conditions for Operation 87
Connection Signature 16
Continuous Test Mode 39
Contrast See Display adjustment
CTLWIN
examples 30
installing 29
Customer Support 1
E
Editing Test Parameter Settings 45
Error messages See Cable error messages
Error Tones 65
External Switch 39
F
Factory Defaults 33
Fault Location 40, 42
Fixturing
Checking 87
Folders 25
Four-Wire Testing 61
buiding fixturing 61
Kelvin Points 63
learning test 64
point types 61
probing point types 64
turning on 64
G
Good LED 9
Hardware version 86
High Cap Shield Setting 60
High Speed Hipot 41
High voltage leakage 71
High Voltage Setting 50, 57
High Voltage Test
delay 41
dielectric withstand test 35, 36
duration 52
errors 6971
insulation resistance test 36
soak period 35
voltage ramp up 35, 36
Hipot Test See High Voltage Test
Hipot To Setting 53
HV Insulation Resistance Setting 51
N
Net Lists 15
Nets 15
Networking 2
I
I/O Port 73
Importing
compressed wirelists and scripts 28
Insulation resistance test 36
Intermittent errors 69
L
Labels
see Scripting manual, p. 40-42 2
Leaky diode error 72
Learn and Test Settings 4464
changing 44
Component Resistance 48
Duration 52
High Voltage 50, 57
Hipot To 53
HV Insulation Resistance 51
learn 32
Learn Component 59
LV Insulation Resistance 47
restoring factory defaults 33
Test Parameter 32
Learn Component Setting 59
LEDs See Components, testing
Links 29, 30, 60
Low voltage errors 6668
LV Insulation Resistance Setting 47
O
Open error 67
Outputs 78
events 78
setting up 78
P
Parameter Signature See Test Parameter Signature
Pins 15
Point Labels 29
Preferences See User Preferences
Printer 5
Printing
errors 65
labels (see Scripting manual, p. 40-42) 2
Test Reports 43
Test Summaries 23
Probe
installing 4
R
Reports 43
Saving
test programs 26
Saving test programs 26
Scanner Add-Ons
attaching 58
labeling 8
Scripting 2, 74
Serial Number 86
Service 87
Short error 66
shorting blocks 87
Shottky diodes See Components, testing
Signatures
Adapter 17
Cable 16
Connection 16
Test Parameter 16
Single Test Mode 39
Soak period See Max Soak Setting
Software version 86
SPC Data Collection 84
Speaker Volume See Volume Control
Specifications 84
Upgrade Appication 79
User aborted hipot error 71
User Preferences 32
Auto Start Test 40
Automatic Hipot 41
External Switch 39
Fault Location 40, 42
High Speed Hipot 41
restoring factory defaults 33
Test Mode 39
Test Summary Count 42
Utilities Appication 80
Warranty 86
Test Mode 39
Test Parameter Settings 32
Test Parameter Signature 16
Test Program Location Listing 26, 27, 28, 89
Test programs
creating 18
editing with CTLWIN 2931
Test summary 23
Test Summary Count 42
Testing 21, 3437
Thumb drive 17
Twisted paired wires See Components, testing
V
Version information 86
Volume control
manual adjustment 86
User Preference 10
Z
Zener diodes See Components, testing