Room-Temperature Antiferromagnetic Memory Resistor: Articles
Room-Temperature Antiferromagnetic Memory Resistor: Articles
Room-Temperature Antiferromagnetic Memory Resistor: Articles
Room-temperature antiferromagnetic
memory resistor
X. Marti1,2,3*, I. Fina4,5, C. Frontera4, Jian Liu6, P. Wadley3,7, Q. He8, R. J. Paull1, J. D. Clarkson1,
J. Kudrnovsk9, I. Turek2,10, J. Kune3, D. Yi6, J-H. Chu6, C. T. Nelson11, L. You12, E. Arenholz8,
S. Salahuddin12, J. Fontcuberta4, T. Jungwirth3,7 and R. Ramesh1,6
The bistability of ordered spin states in ferromagnets provides the basis for magnetic memory functionality. The latest
generation of magnetic random access memories rely on an efficient approach in which magnetic fields are replaced by
electrical means for writing and reading the information in ferromagnets. This concept may eventually reduce the sensitivity
of ferromagnets to magnetic field perturbations to being a weakness for data retention and the ferromagnetic stray fields to an
obstacle for high-density memory integration. Here we report a room-temperature bistable antiferromagnetic (AFM) memory
that produces negligible stray fields and is insensitive to strong magnetic fields. We use a resistor made of a FeRh AFM, which
orders ferromagnetically roughly 100 K above room temperature, and therefore allows us to set different collective directions
for the Fe moments by applied magnetic field. On cooling to room temperature, AFM order sets in with the direction of the
AFM moments predetermined by the field and moment direction in the high-temperature ferromagnetic state. For electrical
reading, we use an AFM analogue of the anisotropic magnetoresistance. Our microscopic theory modelling confirms that
this archetypical spintronic effect, discovered more than 150 years ago in ferromagnets, is also present in AFMs. Our work
demonstrates the feasibility of fabricating room-temperature spintronic memories with AFMs, which in turn expands the base
of available magnetic materials for devices with properties that cannot be achieved with ferromagnets.
1Department of Materials Science and Engineering and Department of Physics, University of California, Berkeley, California 94720, USA, 2Department of
Condensed Matter Physics, Faculty of Mathematics and Physics, Charles University, 12116 Praha 2, Czech Republic, 3Institute of Physics ASCR, v.v.i.,
Cukrovarnick 10, 162 53 Praha 6, Czech Republic, 4Institut de Cincia de Materials de Barcelona, ICMAB-CSIC, Campus UAB, Bellaterra E-08193, Spain,
5Max Planck Institute of Microstructure Physics, Weinberg 2, Halle D-06120, Germany, 6Materials Science Division, Lawrence Berkeley National
Laboratory, Berkeley, California 94720, USA, 7School of Physics and Astronomy, University of Nottingham, Nottingham NG7 2RD, UK, 8Advanced Light
Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA, 9Institute of Physics ASCR, v.v.i., Na Slovance 2, 182 21 Praha 8, Czech
Republic, 10Institute of Physics of Materials ASCR, v.v.i., Zizkova 22, Brno 616 62, Czech Republic, 11National Center for Electron Microscopy, Lawrence
Berkeley National Laboratory, Berkeley, California 94720, USA, 12Department of Electrical Engineering and Computer Sciences, University of California,
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Figure 1 | AFM-AMR memory functionality in a FeRh resistor. a, Schematic illustration of the AFM FeRh/MgO structure and of the memory writing and
reading set-up. For writing, the sample is cooled in a field HFC from a temperature above the AFMferromagnetic transition in FeRh (we used maximum
field of 9 T and temperature of 400 K allowed in our transport measurement set-up) to below the transition temperature (200 K). Black arrows denote the
orientation of the magnetic moments in the ferromagnetic phase whereas either red or blue arrows denote two distinct configurations of the magnetic
moments in the AFM phase. The resulting AFM spin axis in the low-temperature memory state depends on the direction of HFC , which is either along the
[100] or [010] crystal axis. For reading, electrical current j is driven between electrical contacts (yellow bars) along the [100] direction and the resistance
is detected. b, Resistance measured at 200 K and zero magnetic field after field-cooling the sample with HFC parallel (blue) and perpendicular (red) to the
current direction. The two resistance states are clearly distinct and many successive measurement steps demonstrate the stability of the distinct memory
states. c, The same as in b, but at room temperature. d, Stability of the two memory states at room temperature tested by measuring the resistance while
sweeping a magnetic field H between 1 T applied along the [100] direction. e, The same as in d, while rotating a 1 T magnetic field. f, AMR values
calculated for the Rh-rich (Fe1x Rhx )Rh random alloy using the Kubo formula CPA-TB-LMTO formalism. The AMR is defined as a relative difference
between the resistivity for the spin axis parallel and perpendicular to the current, AMR = (Rskj Rsj )/RskI . Results are shown for the AFM ground state
(filled symbols) and for a hypothetical zero-temperature ferromagnetic state (open symbols) of FeRh.
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Figure 2 | Characterization of the magnetic and crystal structure of the FeRh film. a, Fe L-edge XMLD difference in absorption intensities in the AFM state
of FeRh for the cooling-field vector HFC k [100] and the X-ray linear polarization vectors E k [100] and E k [010]. b, The same as in a, for the cooling-field
vector HFC k [010] and the X-ray linear polarization vectors E k [100] and E k [010]. In a,b, the maximum field of 0.5 T allowed in the XMLD set-up was
applied when cooling the sample from 500 to 200 K and then removed before room-temperature XMLD measurements were performed. c, Fe L-edge
XMLD difference in absorption intensities in the ferromagnetic state of FeRh at 500 K for the X-ray linear polarization vector E k [100] and applied
magnetic fields H k [100] and H k [010]. The AFM and ferromagnetic XMLD signals are of comparable strength and the signs of the signals are consistent
with the AFM spin axis oriented perpendicular to HFC , as indicated in the insets. d, Cross-section image of the FeRh thin film at the interface with the MgO
substrate, viewed down the (112) and (100) zone axis of the two respective materials. Scale bar, 2 nm. e, 2 scan showing textured films; indicated are
the (00l) reflections of the substrate and the film. f, Compositional map of the Fe/Rh content of the film.
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Figure 3 | Magnetic properties. a, Temperature dependence of the magnetization at 1, 5 and 9 T applied magnetic fields. b, Magnetic field dependence of
the magnetization at 200 K, room-temperature and 400 K. c, Comparison of 400 K magnetization loops for magnetic field applied along the [100] and
[010] MgO crystallographic directions. d, Magnetic field dependence of the resistance at 200 K, room-temperature, 320 and 340 K. Black arrows indicate
the direction of the temperature sweep.
the AMR in the ferromagnetic state of FeRh and to the AMR sign in
common transition-metal ferromagnets 4,1620, our theory predicts a
lower resistivity state for the AFM spin axis aligned perpendicular
to the current. This confirms the scenario, anticipated in Fig. 1a,
by which the field-cooling procedure sets in the spin-axis direction
in the FeRh AFM state. In agreement with the theoretical sign of
the AFM-AMR, the ferromagnetically aligned moments along the
applied magnetic field HFC at the high temperature rotate clockwise
in one spin sublattice and anticlockwise in the other sublattice of
FeRh until they reach the AFM configuration at the low temperature
with the spin axis oriented perpendicular to HFC .
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Figure 4 | Stability of the memory states at high magnetic fields. a, Resistance of the two memory states at 200 K and in a magnetic field swept between
9 T along the [100] direction. The insets show two distinct configurations of the AFM moments in the device. b, The same as in a, in a 9 T rotating
magnetic field. In a,b, the red square and blue circle indicate the zero-field resistances of the two memory states after the cooling-in-field writing
procedure. c, The same as in a, measured at room temperature. d, The difference between resistances of the two memory states plotted in c. In c,d, the
arrows indicate the direction of sweeping of the magnetic field.
{00l} family of peaks of both FeRh and MgO, confirming that the
samples are textured with no spurious phases. In Fig. 2f we show the
wavelength dispersive X-ray spectroscopy analysis of the chemical
composition of our FeRh film. We observe a small Fe deficit from
the targets nominal 1:1 stoichiometry with Fe/Rh 0.940.96.
Figure 3 presents magnetic characterization of our FeRh film
by the superconducting quantum interference device and vibrating
sample magnetometer, which provides further insight into the
behaviour our AFM memory. In Fig. 3a we show temperaturedependent magnetization data recorded at different magnetic fields.
When warming up, the magnetization exhibits a clear signature
of the transition from the AFM to the ferromagnetic phase of
FeRh. The thermal hysteresis reflects the first-order nature of the
transition 4. When increasing the magnetic field, the ferromagnetic
phase is stabilized and the transition occurs at lower temperatures.
Note that at 400 K, a field of 9 T is strong enough to fully stabilize
the ferromagnetic state. In our transport measurement set-up, the
highest allowed temperature was 400 K, so we applied HFC of 9 T
to safely enter the ferromagnetic state at this temperature. At lower
temperatures, the system gradually turns into the AFM state. The
XMLD experimental set-up allowed us to perform the field-cooling
procedure from 500 K. In this case, HFC of 0.5 T was sufficient to
stabilize the two orthogonal metastable spin axes configurations in
the room-temperature AFM memory state.
Complementary magnetic-field-dependent magnetization traces
are plotted in Fig. 3b,c. At 400 K, the data are consistent with
the ferromagnetic alignment of Fe spins and identical signal is
detected while sweeping the magnetic field along the [100] or
[010] crystal directions (Fig. 3c). This confirms the expected inplane cubic symmetry of our FeRh film deposited on the cubic
MgO substrate. We note that the loops were obtained by sweeping
the magnetic field between 9 and 400 K. Magnetization data
measured at room temperature and 200 K (Fig. 3b) confirm the
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Figure 5 | Temperature dependence of the AMR. a, Resistance measured while field-cooling from 400 K in HFC of 9 T k [100] and while subsequently
warming up in zero magnetic field. b, Relative resistance difference, (R(HFC k [010]) R(HFC k [100]))/R(HFC k [100]), for the field-cool and
zero-field-warm measurements. c, Low-temperature zero-field-warm relative resistance differences, (R(HFC k [010]) R(HFC k [100]))/R(HFC k [100])
(solid line) and (R(HFC k [110]) R(HFC k [100]))/R(HFC k [100]) (dashed line). d, High-temperature field-cool relative resistance differences,
(R(HFC k [010]) R(HFC k [100]))/R(HFC k [100]) (solid line) and (R(HFC k [110]) R(HFC k [100]))/R(HFC k [100]) (dashed line).
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Discussion
We have demonstrated a room-temperature AFM memory and
explained the AFM-AMR effect we employed for a simple ohmic
resistance read-out. Our magnetic memory shows the unique
features of AFMs. In particular, it is insensitive to strong magnetic
field perturbations and produces negligible stray fields. The
magnitude of the AFM-AMR effect in our FeRh sample is sufficient
to reproducibly detect the two distinct memory states at room
temperature.
Our work represents the proof of principle demonstration of
an AFM memory resistor, yet there is much room for improving
all of the functionalities of such a device. We note, however, that
the magnetic memory concept we introduce is generic to a broad
class of spinorbit-coupled AFMs. Our microscopic calculations
and temperature-dependent AFM-AMR measurements indicate a
route for increasing the magnitude of the AFM-AMR in materials
with higher transition temperatures. The same theory framework
or measurements can systematically map ohmic AMRs in a variety
of metallic AFMs. To improve our cooling-in-field procedure for
writing, future studies of AFM memories can benefit from the
extensive research and development of techniques in ferromagnets
for heat-assisted magnetic recording 31. In our FeRh samples, the
temperature and field strength can still be optimized to achieve the
most efficient writing in this material. Other systems that show the
high-temperature AFMferromagnetic transition can be considered
or, as recently demonstrated in a tunnelling IrMn device 10, heating
close to the AFM to paramagnetic transition in materials without
the AFMferromagnetic transition point may by a viable alternative.
A highly attractive approach for AFMs is to use spinorbit coupling
not only for reading but also for writing the state by electrical means.
Methods
Thin films were prepared by d.c. sputtering. MgO(001) substrates were heated
up to 550 K in a base pressure of 108 torr. Subsequently, Ar gas was introduced
(3 mtorr) and films were grown using 50 W power at a rate of 1 nm min1 using a
stoichiometric FeRh target.
X-ray diffraction experiments were carried out using a Panalytical XPert Pro
diffractometer by Philips. The composition and thickness of the thin films were
obtained by variable-voltage electron-probe microanalysis, using a CAMECA SX-50
electron microprobe equipped with four wavelength-dispersive X-ray spectrometers.
X-ray intensities were measured at 10, 12, 15 and 20 keV electron incident energy
and they were analysed with the help of the program STRATAGEM (SAMX), which
calculates the thickness and composition of a multilayer target by least-squares
fitting of an analytical X-ray emission model to the experimental data.
The cross-sectional sample for transmission electron microscopy was prepared
by mechanical polishing followed by Ar ion milling. High-angle annular dark-field
scanning transmission electron microscopy imaging was performed on an FEI titan,
the TEAM0.5 at the National Center for Electron Microscopy. The image shown in
Fig. 2a is an averaged region from a scanning transmission electron micrograph
taken with a high-angle annular dark-field detector. This mode highlights the atom
nucleus with intensity corresponding to the atomic number; here Rh (Z = 45)
appears brightest followed by Fe (Z = 26), and Mg (Z = 12) in the substrate. The
image was averaged laterally over approximately 30 adjacent unit cells.
Magnetic characterization with magnetic fields up to 5 T was carried out in a
superconducting quantum interference device by Quantum Design using the
Reciprocating Sample Option. Measurements up to 9 T were performed in a
vibrating sample magnetometer by Quantum Design.
Fe L-edge XMLD measurements were performed at Beamline 4.0.2 of the
Advanced Light Source. Field-cooling was performed from 500 K with the largest
magnetic field of 0.5 T allowed by the XMLD measurement set-up.
Transport experiments were four-probe resistance measurements carried
out using the Physical Property Measurement System by Quantum Design in
resistivity mode and equipped with a horizontal rotator module. For parallel
current (bi-polar constant current ranging from 1 to 10 A) and magnetic field
position is defined as 0, along the substrate [100] direction shown. Maximum
magnetic field and temperature allowed by the transport measurement set-up are
9 T and 400 K, respectively.
Kubo formula CPA-TB-LMTO calculations were performed for the cubic, CsCl
crystal structure of FeRh. The structure of the AFM state was described as a
stacking of four interpenetrating face-centred-cubic sublattices along the
[111]-direction occupied respectively by Fe[up], Rh, Fe[down] and Rh atoms.
Substitutional RhFe disorder was placed on both Fe sublattices in the considered
Rh-rich (Fe1x Rhx )Rh random alloy. The model of quasiparticle broadening was
treated by adding a constant, spin-independent imaginary part of the self-energy
(of order 103 102 Ry). A large number (107 ) of points in the full
face-centred-cubic Brillouin zone was used to obtain converged AMR values.
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Acknowledgements
The authors acknowledge the support from the NSF (Nanosystems Engineering
Research Center for Translational Applications of Nanoscale Multiferroic Systems,
Cooperative Agreement Award EEC-1160504) and DOE. Transmission electron
microscopy characterization was performed at NCEM, which is supported by the
Office of Science, Office of Basic Energy Sciences of the US Department of Energy
under Contract No. DE-AC0205CH11231. J.F. acknowledges financial support from
the Spanish Government (Projects MAT2011-29269-C03, CSD2007-00041) and
Generalitat de Catalunya (2009 SGR 00376); C.F. acknowledges financial support from
the Spanish Government (Projects MAT2012-33207, CSD2007-00041). I.F.
acknowledges a Beatriu de Pins postdoctoral scholarship (2011 BP-A 00220) and the
Catalan Agency for Management of University and Research Grants
(AGAUR-Generalitat de Catalunya). X.M. acknowledges the Grant Agency of the
Czech Republic No. P204/11/P339. Research at the University of Nottingham was
funded by EPSRC grant EP/K027808/1. T.J. acknowledges support from the ERC
Advanced Grant 268066, Praemium Academiae of the Academy of Sciences of the
Czech Republic, and from the Ministry of Education of the Czech Republic Grant
LM2011026. S.S. acknowledges funding by STARnet FAME. J. Kune 83 and I.T.
acknowledge the Czech Science Foundation No. P204/11/1228.
Author contributions
Sample preparation, R.J.P., J.D.C., L.Y.; scanning transmission electron microscopy,
C.T.N.; magnetotransport and structural characterization, I.F. and C.F.; data analysis,
I.F., C.F., P.W., J-H.C. and D.Y.; X-ray linear dichroism, J.L., E.A. and Q.H.; theory, J.
Kudrnovsk, I.T. and J. Kune; writing and project planning, X.M., T.J., J.F., P.W., S.S.
and R.R.
Additional information
Reprints and permissions information is available online at www.nature.com/reprints.
Correspondence and requests for materials should be addressed to X.M.