Tarjeta EPMx40 Altera
Tarjeta EPMx40 Altera
Tarjeta EPMx40 Altera
This section provides designers with the data sheet specifications for MAX II devices.
The chapters contain feature definitions of the internal architecture, Joint Test Action
Group (JTAG) and in-system programmability (ISP) information, DC operating
conditions, AC timing parameters, and ordering information for MAX II devices.
This section includes the following chapters:
Chapter 1, Introduction
Revision History
Refer to each chapter for its own specific revision history. For information about when
each chapter was updated, refer to the Chapter Revision Dates section, which appears
in the complete handbook.
August 2009
Altera Corporation
I2
August 2009
Altera Corporation
1. Introduction
MII51001-1.9
Introduction
The MAX II family of instant-on, non-volatile CPLDs is based on a 0.18-m,
6-layer-metal-flash process, with densities from 240 to 2,210 logic elements (LEs) (128
to 2,210 equivalent macrocells) and non-volatile storage of 8 Kbits. MAX II devices
offer high I/O counts, fast performance, and reliable fitting versus other CPLD
architectures. Featuring MultiVolt core, a user flash memory (UFM) block, and
enhanced in-system programmability (ISP), MAX II devices are designed to reduce
cost and power while providing programmable solutions for applications such as bus
bridging, I/O expansion, power-on reset (POR) and sequencing control, and device
configuration control.
Features
The MAX II CPLD has the following features:
August 2009
Provides four global clocks with two clocks available per logic array block (LAB)
MultiVolt I/O interface supporting 3.3-V, 2.5-V, 1.8-V, and 1.5-V logic levels
I/Os are fully compliant with the Peripheral Component Interconnect Special
Interest Group (PCI SIG) PCI Local Bus Specification, Revision 2.2 for 3.3-V
operation at 66 MHz
Supports hot-socketing
Built-in Joint Test Action Group (JTAG) boundary-scan test (BST) circuitry
compliant with IEEE Std. 1149.1-1990
Altera Corporation
12
Chapter 1: Introduction
Features
EPM240
EPM240G
EPM570
EPM570G
EPM1270
EPM1270G
EPM2210
EPM2210G
EPM240Z
EPM570Z
240
570
1,270
2,210
240
570
LEs
Typical Equivalent Macrocells
192
440
980
1,700
192
440
128 to 240
240 to 570
570 to 1,270
1,270 to 2,210
128 to 240
240 to 570
8,192
8,192
8,192
8,192
8,192
8,192
80
160
212
272
80
160
4.7
5.4
6.2
7.0
7.5
9.0
304
304
304
304
152
152
tSU (ns)
1.7
1.2
1.2
1.2
2.3
2.2
tCO (ns)
4.3
4.5
4.6
4.6
6.5
6.7
For more information about equivalent macrocells, refer to the MAX II Logic Element to
Macrocell Conversion Methodology white paper.
MAX II and MAX IIG devices are available in three speed grades: 3, 4, and 5, with
3 being the fastest. Similarly, MAX IIZ devices are available in three speed grades: 6,
7, and 8, with 6 being the fastest. These speed grades represent the overall relative
performance, not any specific timing parameter. For propagation delay timing
numbers within each speed grade and density, refer to the DC and Switching
Characteristics chapter in the MAX II Device Handbook.
Table 12 shows MAX II device speed-grade offerings.
Table 12. MAX II Speed Grades
Speed Grade
Device
EPM240
EPM240G
EPM570
EPM570G
EPM1270
EPM1270G
EPM2210
EPM2210G
EPM240Z
EPM570Z
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Altera Corporation
Chapter 1: Introduction
Features
13
MAX II devices are available in space-saving FineLine BGA, Micro FineLine BGA,
and thin quad flat pack (TQFP) packages (refer to Table 13 and Table 14). MAX II
devices support vertical migration within the same package (for example, you can
migrate between the EPM570, EPM1270, and EPM2210 devices in the 256-pin
FineLine BGA package). Vertical migration means that you can migrate to devices
whose dedicated pins and JTAG pins are the same and power pins are subsets or
supersets for a given package across device densities. The largest density in any
package has the highest number of power pins; you must lay out for the largest
planned density in a package to provide the necessary power pins for migration. For
I/O pin migration across densities, cross reference the available I/O pins using the
device pin-outs for all planned densities of a given package type to identify which
I/O pins can be migrated. The Quartus II software can automatically cross-reference
and place all pins for you when given a device migration list.
Table 13. MAX II Packages and User I/O Pins
144-Pin
TQFP
144-Pin
Micro
FineLine
BGA (1)
256-Pin
Micro
FineLine
BGA (1)
256-Pin
FineLine
BGA
324-Pin
FineLine
BGA
80
76
76
116
160
160
116
212
212
204
272
EPM240Z
54
80
EPM570Z
76
116
160
256-Pin
Micro
FineLine
BGA
256-Pin
FineLine
BGA
324-Pin
FineLine
BGA
Device
68-Pin
Micro
FineLine
BGA (1)
100-Pin
Micro
FineLine
BGA (1)
100-Pin
FineLine
BGA
100-Pin
TQFP
80
80
76
EPM240
EPM240G
EPM570
EPM570G
EPM1270
EPM1270G
EPM2210
EPM2210G
Table 14. MAX II TQFP, FineLine BGA, and Micro FineLine BGA Package Sizes
68-Pin
Micro
FineLine
BGA
100-Pin
Micro
FineLine
BGA
100-Pin
FineLine
BGA
100-Pin
TQFP
144-Pin
TQFP
144-Pin
Micro
FineLine
BGA
Pitch (mm)
0.5
0.5
0.5
0.5
0.5
0.5
Area (mm2)
25
36
121
256
484
49
121
289
361
55
66
11 11
16 16
22 22
77
11 11
17 17
19 19
Package
Length width
(mm mm)
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Chapter 1: Introduction
Referenced Documents
MAX II devices have an internal linear voltage regulator which supports external
supply voltages of 3.3 V or 2.5 V, regulating the supply down to the internal operating
voltage of 1.8 V. MAX IIG and MAX IIZ devices only accept 1.8 V as the external
supply voltage. MAX IIZ devices are pin-compatible with MAX IIG devices in the
100-pin Micro FineLine BGA and 256-pin Micro FineLine BGA packages. Except for
external supply voltage requirements, MAX II and MAX II G devices have identical
pin-outs and timing specifications. Table 15 shows the external supply voltages
supported by the MAX II family.
Table 15. MAX II External Supply Voltages
EPM240
EPM570
EPM1270
EPM2210
EPM240G
EPM570G
EPM1270G
EPM2210G
EPM240Z
EPM570Z (1)
3.3 V, 2.5 V
1.8 V
Devices
MultiVolt core external supply voltage (VC CINT) (2)
MultiVolt I/O interface voltage levels (VC CIO)
Notes to Table 15:
(1) MAX IIG and MAX IIZ devices only accept 1.8 V on their VCCINT pins. The 1.8-V VCC INT external supply powers the device core directly.
(2) MAX II devices operate internally at 1.8 V.
Referenced Documents
This chapter references the following documents:
Changes Made
Summary of Changes
August 2009,
version 1.9
October 2008,
version 1.8
December 2007,
version1.7
December 2006,
version 1.6
August 2006,
version 1.5
July 2006,
version 1.4
August 2009
Altera Corporation
Chapter 1: Introduction
Document Revision History
15
Changes Made
Summary of Changes
June 2005,
version 1.3
December 2004,
version 1.2
June 2004,
version 1.1
August 2009
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Chapter 1: Introduction
Document Revision History
August 2009
Altera Corporation
2. MAX II Architecture
MII51002-2.2
Introduction
This chapter describes the architecture of the MAX II device and contains the
following sections:
Functional Description
MAX II devices contain a two-dimensional row- and column-based architecture to
implement custom logic. Row and column interconnects provide signal interconnects
between the logic array blocks (LABs).
The logic array consists of LABs, with 10 logic elements (LEs) in each LAB. An LE is a
small unit of logic providing efficient implementation of user logic functions. LABs
are grouped into rows and columns across the device. The MultiTrack interconnect
provides fast granular timing delays between LABs. The fast routing between LEs
provides minimum timing delay for added levels of logic versus globally routed
interconnect structures.
The MAX II device I/O pins are fed by I/O elements (IOE) located at the ends of LAB
rows and columns around the periphery of the device. Each IOE contains a
bidirectional I/O buffer with several advanced features. I/O pins support Schmitt
trigger inputs and various single-ended standards, such as 66-MHz, 32-bit PCI, and
LVTTL.
MAX II devices provide a global clock network. The global clock network consists of
four global clock lines that drive throughout the entire device, providing clocks for all
resources within the device. The global clock lines can also be used for control signals
such as clear, preset, or output enable.
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IOE
IOE
IOE
IOE
IOE
IOE
Logic
Element
Logic
Element
Logic
Element
IOE
Logic
Element
Logic
Element
Logic
Element
IOE
Logic
Element
Logic
Element
Logic
Element
IOE
Logic
Element
Logic
Element
Logic
Element
Logic Array
BLock (LAB)
MultiTrack
Interconnect
MultiTrack
Interconnect
Each MAX II device contains a flash memory block within its floorplan. On the
EPM240 device, this block is located on the left side of the device. On the EPM570,
EPM1270, and EPM2210 devices, the flash memory block is located on the bottom-left
area of the device. The majority of this flash memory storage is partitioned as the
dedicated configuration flash memory (CFM) block. The CFM block provides the nonvolatile storage for all of the SRAM configuration information. The CFM
automatically downloads and configures the logic and I/O at power-up, providing
instant-on operation.
f
For more information about configuration upon power-up, refer to the Hot Socketing
and Power-On Reset in MAX II Devices chapter in the MAX II Device Handbook.
A portion of the flash memory within the MAX II device is partitioned into a small
block for user data. This user flash memory (UFM) block provides 8,192 bits of
general-purpose user storage. The UFM provides programmable port connections to
the logic array for reading and writing. There are three LAB rows adjacent to this
block, with column numbers varying by device.
Table 21 shows the number of LAB rows and columns in each device, as well as the
number of LAB rows and columns adjacent to the flash memory area in the EPM570,
EPM1270, and EPM2210 devices. The long LAB rows are full LAB rows that extend
from one side of row I/O blocks to the other. The short LAB rows are adjacent to the
UFM block; their length is shown as width in LAB columns.
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LAB Columns
Total LABs
EPM240
24
EPM570
12
3 (3)
57
EPM1270
16
3 (5)
127
EPM2210
20
10
3 (7)
221
Devices
I/O Blocks
Logic Array
Blocks
Logic Array
Blocks
2 GCLK
Inputs
2 GCLK
Inputs
I/O Blocks
UFM Block
CFM Block
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Row Interconnect
Column Interconnect
LE0
Fast I/O connection
to IOE (1)
LE1
DirectLink
interconnect from
adjacent LAB
or IOE
LE2
DirectLink
interconnect from
adjacent LAB
or IOE
LE3
LE4
LE5
LE6
DirectLink
interconnect to
adjacent LAB
or IOE
DirectLink
interconnect to
adjacent LAB
or IOE
LE7
LE8
LE9
Logic Element
LAB
Local Interconnect
LAB Interconnects
The LAB local interconnect can drive LEs within the same LAB. The LAB local
interconnect is driven by column and row interconnects and LE outputs within the
same LAB. Neighboring LABs, from the left and right, can also drive an LABs local
interconnect through the DirectLink connection. The DirectLink connection feature
minimizes the use of row and column interconnects, providing higher performance
and flexibility. Each LE can drive 30 other LEs through fast local and DirectLink
interconnects. Figure 24 shows the DirectLink connection.
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LE0
LE1
LE2
LE3
LE4
LE5
DirectLink
interconnect
to left
LE6
DirectLink
interconnect
to right
LE7
Local
Interconnect
LE8
LE9
Logic Element
LAB
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Local
Interconnect
Local
Interconnect
Local
Interconnect
Local
Interconnect
Local
Interconnect
labclkena2
labclkena1
Local
Interconnect
labclk1
labclk2
labclr2
syncload
asyncload
or labpre
labclr1
addnsub
synclr
Logic Elements
The smallest unit of logic in the MAX II architecture, the LE, is compact and provides
advanced features with efficient logic utilization. Each LE contains a four-input LUT,
which is a function generator that can implement any function of four variables. In
addition, each LE contains a programmable register and carry chain with carry-select
capability. A single LE also supports dynamic single-bit addition or subtraction mode
selectable by an LAB-wide control signal. Each LE drives all types of interconnects:
local, row, column, LUT chain, register chain, and DirectLink interconnects. See
Figure 26.
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LAB Carry-In
addnsub
Carry-In1
Carry-In0
Programmable
Register
LUT chain
routing to next LE
data1
data2
data3
Look-Up
Table
(LUT)
Carry
Chain
Synchronous
Load and
Clear Logic
PRN/ALD
D
Q
ADATA
Row, column,
and DirectLink
routing
data4
ENA
CLRN
labclr1
labclr2
labpre/aload
Chip-Wide
Reset (DEV_CLRn)
Asynchronous
Clear/Preset/
Load Logic
Row, column,
and DirectLink
routing
Local routing
Register
Feedback
Clock and
Clock Enable
Select
Register chain
output
labclk1
labclk2
labclkena1
labclkena2
Carry-Out0
Carry-Out1
LAB Carry-Out
Each LEs programmable register can be configured for D, T, JK, or SR operation. Each
register has data, true asynchronous load data, clock, clock enable, clear, and
asynchronous load/preset inputs. Global signals, general-purpose I/O pins, or any
LE can drive the registers clock and clear control signals. Either general-purpose I/O
pins or LEs can drive the clock enable, preset, asynchronous load, and asynchronous
data. The asynchronous load data input comes from the data3 input of the LE. For
combinational functions, the LUT output bypasses the register and drives directly to
the LE outputs.
Each LE has three outputs that drive the local, row, and column routing resources. The
LUT or register output can drive these three outputs independently. Two LE outputs
drive column or row and DirectLink routing connections and one drives local
interconnect resources. This allows the LUT to drive one output while the register
drives another output. This register packing feature improves device utilization
because the device can use the register and the LUT for unrelated functions. Another
special packing mode allows the register output to feed back into the LUT of the same
LE so that the register is packed with its own fan-out LUT. This provides another
mechanism for improved fitting. The LE can also drive out registered and
unregistered versions of the LUT output.
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addnsub Signal
The LEs dynamic adder/subtractor feature saves logic resources by using one set of
LEs to implement both an adder and a subtractor. This feature is controlled by the
LAB-wide control signal addnsub. The addnsub signal sets the LAB to perform either
A + B or A B. The LUT computes addition; subtraction is computed by adding the
twos complement of the intended subtractor. The LAB-wide signal converts to twos
complement by inverting the B bits within the LAB and setting carry-in to 1, which
adds one to the least significant bit (LSB). The LSB of an adder/subtractor must be
placed in the first LE of the LAB, where the LAB-wide addnsub signal automatically
sets the carry-in to 1. The Quartus II Compiler automatically places and uses the
adder/subtractor feature when using adder/subtractor parameterized functions.
LE Operating Modes
The MAX II LE can operate in one of the following modes:
Normal Mode
Each mode uses LE resources differently. In each mode, eight available inputs to the
LE, the four data inputs from the LAB local interconnect, carry-in0 and carryin1 from the previous LE, the LAB carry-in from the previous carry-chain LAB, and
the register chain connection are directed to different destinations to implement the
desired logic function. LAB-wide signals provide clock, asynchronous clear,
asynchronous preset/load, synchronous clear, synchronous load, and clock enable
control for the register. These LAB-wide signals are available in all LE modes. The
addnsub control signal is allowed in arithmetic mode.
The Quartus II software, in conjunction with parameterized functions such as library
of parameterized modules (LPM) functions, automatically chooses the appropriate
mode for common functions such as counters, adders, subtractors, and arithmetic
functions.
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Normal Mode
The normal mode is suitable for general logic applications and combinational
functions. In normal mode, four data inputs from the LAB local interconnect are
inputs to a four-input LUT (see Figure 27). The Quartus II Compiler automatically
selects the carry-in or the data3 signal as one of the inputs to the LUT. Each LE can use
LUT chain connections to drive its combinational output directly to the next LE in the
LAB. Asynchronous load data for the register comes from the data3 input of the LE.
LEs in normal mode support packed registers.
Figure 27. LE in Normal Mode
sload
sclear
(LAB Wide) (LAB Wide)
aload
(LAB Wide)
Register chain
connection
(1)
data1
data2
data3
cin (from cout
of previous LE)
4-Input
LUT
ALD/PRE
ADATA Q
D
ENA
CLRN
data4
Register Feedback
Local routing
LUT chain
connection
Register
chain output
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The other two LUTs use the data1 and data2 signals to generate two possible carry-out
signals: one for a carry of 1 and the other for a carry of 0. The carry-in0 signal acts
as the carry-select for the carry-out0 output and carry-in1 acts as the carryselect for the carry-out1 output. LEs in arithmetic mode can drive out registered
and unregistered versions of the LUT output.
The dynamic arithmetic mode also offers clock enable, counter enable, synchronous
up/down control, synchronous clear, synchronous load, and dynamic
adder/subtractor options. The LAB local interconnect data inputs generate the
counter enable and synchronous up/down control signals. The synchronous clear
and synchronous load options are LAB-wide signals that affect all registers in the
LAB. The Quartus II software automatically places any registers that are not used by
the counter into other LABs. The addnsub LAB-wide signal controls whether the LE
acts as an adder or subtractor.
Figure 28. LE in Dynamic Arithmetic Mode
LAB Carry-In
sload
sclear
(LAB Wide) (LAB Wide)
Register chain
connection
Carry-In0
Carry-In1
addnsub
(LAB Wide)
(1)
data1
data2
data3
LUT
LUT
LUT
aload
(LAB Wide)
ALD/PRE
ADATA Q
D
ENA
CLRN
Local routing
LUT
Register
chain output
Register Feedback
Carry-Out0 Carry-Out1
Carry-Select Chain
The carry-select chain provides a very fast carry-select function between LEs in
dynamic arithmetic mode. The carry-select chain uses the redundant carry calculation
to increase the speed of carry functions. The LE is configured to calculate outputs for a
possible carry-in of 0 and carry-in of 1 in parallel. The carry-in0 and carry-in1
signals from a lower-order bit feed forward into the higher-order bit via the parallel
carry chain and feed into both the LUT and the next portion of the carry chain. Carryselect chains can begin in any LE within an LAB.
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LAB Carry-In
A1
B1
LE0
A2
B2
LE1
LAB Carry-In
Sum1
Carry-In0
Carry-In1
A3
B3
LE2
A4
B4
LE3
A5
B5
LE4
Sum2
LUT
data1
data2
Sum3
Sum
LUT
Sum4
LUT
Sum5
LUT
A6
B6
LE5
A7
B7
LE6
A8
B8
LE7
A9
B9
LE8
A10
B10
LE9
Carry-Out0
Sum6
Carry-Out1
Sum7
Sum8
Sum9
Sum10
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The Quartus II software automatically creates carry chain logic during design
processing, or you can create it manually during design entry. Parameterized
functions such as LPM functions automatically take advantage of carry chains for the
appropriate functions. The Quartus II software creates carry chains longer than 10 LEs
by linking adjacent LABs within the same row together automatically. A carry chain
can extend horizontally up to one full LAB row, but does not extend between LAB
rows.
MultiTrack Interconnect
In the MAX II architecture, connections between LEs, the UFM, and device I/O pins
are provided by the MultiTrack interconnect structure. The MultiTrack interconnect
consists of continuous, performance-optimized routing lines used for inter- and intradesign block connectivity. The Quartus II Compiler automatically places critical
design paths on faster interconnects to improve design performance.
The MultiTrack interconnect consists of row and column interconnects that span fixed
distances. A routing structure with fixed length resources for all devices allows
predictable and short delays between logic levels instead of large delays associated
with global or long routing lines. Dedicated row interconnects route signals to and
from LABs within the same row. These row resources include:
The DirectLink interconnect allows an LAB to drive into the local interconnect of its
left and right neighbors. The DirectLink interconnect provides fast communication
between adjacent LABs and/or blocks without using row interconnect resources.
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The R4 interconnects span four LABs and are used for fast row connections in a fourLAB region. Every LAB has its own set of R4 interconnects to drive either left or right.
Figure 210 shows R4 interconnect connections from an LAB. R4 interconnects can
drive and be driven by row IOEs. For LAB interfacing, a primary LAB or horizontal
LAB neighbor can drive a given R4 interconnect. For R4 interconnects that drive to the
right, the primary LAB and right neighbor can drive on to the interconnect. For R4
interconnects that drive to the left, the primary LAB and its left neighbor can drive on
to the interconnect. R4 interconnects can drive other R4 interconnects to extend the
range of LABs they can drive. R4 interconnects can also drive C4 interconnects for
connections from one row to another.
Figure 210. R4 Interconnect Connections
Adjacent LAB can
drive onto another
LABs R4 Interconnect
R4 Interconnect
Driving Right
R4 Interconnect
Driving Left
LAB
Neighbor
Primary
LAB (2)
LAB
Neighbor
The column interconnect operates similarly to the row interconnect. Each column of
LABs is served by a dedicated column interconnect, which vertically routes signals to
and from LABs and row and column IOEs. These column resources include:
MAX II devices include an enhanced interconnect structure within LABs for routing
LE output to LE input connections faster using LUT chain connections and register
chain connections. The LUT chain connection allows the combinational output of an
LE to directly drive the fast input of the LE right below it, bypassing the local
interconnect. These resources can be used as a high-speed connection for wide fan-in
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functions from LE 1 to LE 10 in the same LAB. The register chain connection allows
the register output of one LE to connect directly to the register input of the next LE in
the LAB for fast shift registers. The Quartus II Compiler automatically takes
advantage of these resources to improve utilization and performance. Figure 211
shows the LUT chain and register chain interconnects.
Figure 211. LUT Chain and Register Chain Interconnects
Local Interconnect
Routing Among LEs
in the LAB
LUT Chain
Routing to
Adjacent LE
LE0
Register Chain
Routing to Adjacent
LE's Register Input
LE1
Local
Interconnect
LE2
LE3
LE4
LE5
LE6
LE7
LE8
LE9
The C4 interconnects span four LABs up or down from a source LAB. Every LAB has
its own set of C4 interconnects to drive either up or down. Figure 212 shows the C4
interconnect connections from an LAB in a column. The C4 interconnects can drive
and be driven by column and row IOEs. For LAB interconnection, a primary LAB or
its vertical LAB neighbor can drive a given C4 interconnect. C4 interconnects can
drive each other to extend their range as well as drive row interconnects for columnto-column connections.
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C4 Interconnect
Drives Local and R4
Interconnects
Up to Four Rows
C4 Interconnect
Driving Up
LAB
Row
Interconnect
Local
Interconnect
C4 Interconnect
Driving Down
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The UFM block communicates with the logic array similar to LAB-to-LAB interfaces.
The UFM block connects to row and column interconnects and has local interconnect
regions driven by row and column interconnects. This block also has DirectLink
interconnects for fast connections to and from a neighboring LAB. For more
information about the UFM interface to the logic array, see User Flash Memory
Block on page 218.
Table 22 shows the MAX II device routing scheme.
Table 22. MAX II Device Routing Scheme
Destination
LUT
Chain
Register
Chain
Local
(1)
DirectLink
(1)
R4 (1)
C4 (1)
LE
UFM
Block
Column
IOE
Row
IOE
Fast I/O
(1)
LUT Chain
Register Chain
Local
Interconnect
DirectLink
Interconnect
R4 Interconnect
C4 Interconnect
LE
UFM Block
Column IOE
Row IOE
Source
Global Signals
Each MAX II device has four dual-purpose dedicated clock pins (GCLK[3..0], two
pins on the left side and two pins on the right side) that drive the global clock network
for clocking, as shown in Figure 213. These four pins can also be used as generalpurpose I/O if they are not used to drive the global clock network.
The four global clock lines in the global clock network drive throughout the entire
device. The global clock network can provide clocks for all resources within the
device including LEs, LAB local interconnect, IOEs, and the UFM block. The global
clock lines can also be used for global control signals, such as clock enables,
synchronous or asynchronous clears, presets, output enables, or protocol control
signals such as TRDY and IRDY for PCI. Internal logic can drive the global clock
network for internally-generated global clocks and control signals. Figure 213 shows
the various sources that drive the global clock network.
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4
4
Global Clock
Network
The global clock network drives to individual LAB column signals, LAB column
clocks [3..0], that span an entire LAB column from the top to the bottom of the device.
Unused global clocks or control signals in a LAB column are turned off at the LAB
column clock buffers shown in Figure 214. The LAB column clocks [3..0] are
multiplexed down to two LAB clock signals and one LAB clear signal. Other control
signal types route from the global clock network into the LAB local interconnect. See
LAB Control Signals on page 25 for more information.
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LAB Column
clock[3..0]
CFM Block
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Auto-increment addressing
PROGRAM
Program
Erase
Control
ERASE
_: 4
OSC
OSC_ENA
RTP_BUSY
BUSY
OSC
UFM Sector 1
ARCLK
UFM Sector 0
Address
Register
16
16
ARSHFT
ARDin
Data Register
DRDin
DRDout
DRCLK
DRSHFT
UFM Storage
Each device stores up to 8,192 bits of data in the UFM block. Table 23 shows the data
size, sector, and address sizes for the UFM block.
Table 23. UFM Array Size
Device
EPM240
EPM570
Total Bits
Sectors
Address Bits
Data Width
8,192
2
(4,096 bits/sector)
16
EPM1270
EPM2210
There are 512 locations with 9-bit addressing ranging from 000h to 1FFh. Sector 0
address space is 000h to 0FFh and Sector 1 address space is from 100h to 1FFh. The
data width is up to 16 bits of data. The Quartus II software automatically creates logic
to accommodate smaller read or program data widths. Erasure of the UFM involves
individual sector erasing (that is, one erase of sector 0 and one erase of sector 1 is
required to erase the entire UFM block). Since sector erase is required before a
program or write, having two sectors enables a sector size of data to be left untouched
while the other sector is erased and programmed with new data.
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Internal Oscillator
As shown in Figure 215, the dedicated circuitry within the UFM block contains an
oscillator. The dedicated circuitry uses this internally for its read and program
operations. This oscillator's divide by 4 output can drive out of the UFM block as a
logic interface clock source or for general-purpose logic clocking. The typical OSC
output signal frequency ranges from 3.3 to 5.5 MHz, and its exact frequency of
operation is not programmable.
For more information about programming and erasing the UFM block, refer to the
Using User Flash Memory in MAX II Devices chapter in the MAX II Device Handbook.
Auto-Increment Addressing
The UFM block supports standard read or stream read operations. The stream read is
supported with an auto-increment address feature. Deasserting the ARSHIFT signal
while clocking the ARCLK signal increments the address register value to read
consecutive locations from the UFM array.
Serial Interface
The UFM block supports a serial interface with serial address and data signals. The
internal shift registers within the UFM block for address and data are 9 bits and 16 bits
wide, respectively. The Quartus II software automatically generates interface logic in
LEs for a parallel address and data interface to the UFM block. Other standard
protocol interfaces such as SPI are also automatically generated in LE logic by the
Quartus II software.
f
For more information about the UFM interface signals and the Quartus II LE-based
alternate interfaces, refer to the Using User Flash Memory in MAX II Devices chapter in
the MAX II Device Handbook.
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LAB
PROGRAM
ERASE
OSC_ENA
LAB
RTP_BUSY
DRDin
DRCLK
DRSHFT
ARin
ARCLK
ARSHFT
DRDout
OSC
BUSY
LAB
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Figure 217. EPM570, EPM1270, and EPM2210 UFM Block LAB Row Interface
CFM Block
RTP_BUSY
BUSY
OSC
DRDout
DRDin
DRDCLK
DRDSHFT
ARDin
PROGRAM
ERASE
OSC_ENA
ARCLK
ARSHFT
LAB
LAB
UFM Block
LAB
MultiVolt Core
The MAX II architecture supports the MultiVolt core feature, which allows MAX II
devices to support multiple VCC levels on the VCCINT supply. An internal linear voltage
regulator provides the necessary 1.8-V internal voltage supply to the device. The
voltage regulator supports 3.3-V or 2.5-V supplies on its inputs to supply the 1.8-V
internal voltage to the device, as shown in Figure 218. The voltage regulator is not
guaranteed for voltages that are between the maximum recommended 2.5-V
operating voltage and the minimum recommended 3.3-V operating voltage.
The MAX IIG and MAX IIZ devices use external 1.8-V supply. The 1.8-V VCC external
supply powers the device core directly.
Figure 218. MultiVolt Core Feature in MAX II Devices
3.3-V or 2.5-V on
VCCINT Pins
Voltage
Regulator
1.8-V on
VCCINT Pins
1.8-V Core
Voltage
1.8-V Core
Voltage
MAX II Device
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I/O Structure
IOEs support many features, including:
Slew-rate control
Bus-hold circuitry
Open-drain outputs
MAX II device IOEs contain a bidirectional I/O buffer. Figure 219 shows the MAX II
IOE structure. Registers from adjacent LABs can drive to or be driven from the IOEs
bidirectional I/O buffers. The Quartus II software automatically attempts to place
registers in the adjacent LAB with fast I/O connection to achieve the fastest possible
clock-to-output and registered output enable timing. For input registers, the
Quartus II software automatically routes the register to guarantee zero hold time.
You can set timing assignments in the Quartus II software to achieve desired I/O
timing.
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Data_out
OE
DEV_OE
Optional
PCI Clamp (1)
VCCIO
VCCIO
Programmable
Pull-Up
I/O Pin
Optional Bus-Hold
Circuit
Programmable
Input Delay
Optional Schmitt
Trigger Input
I/O Blocks
The IOEs are located in I/O blocks around the periphery of the MAX II device. There
are up to seven IOEs per row I/O block (5 maximum in the EPM240 device) and up to
four IOEs per column I/O block. Each column or row I/O block interfaces with its
adjacent LAB and MultiTrack interconnect to distribute signals throughout the device.
The row I/O blocks drive row, column, or DirectLink interconnects. The column I/O
blocks drive column interconnects.
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Figure 220 shows how a row I/O block connects to the logic array.
Figure 220. Row I/O Block Connection to the Interconnect (Note 1)
R4 Interconnects
C4 Interconnects
I/O Block Local
Interconnect
data_out
[6..0]
7
OE
[6..0]
LAB
fast_out
[6..0]
7
data_in[6..0]
Direct Link
Interconnect
to Adjacent LAB
LAB Local
Interconnect
Row
I/O Block
Direct Link
Interconnect
from Adjacent LAB
LAB Column
clock [3..0]
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Figure 221 shows how a column I/O block connects to the logic array.
Figure 221. Column I/O Block Connection to the Interconnect (Note 1)
Column I/O
Block Contains
Up To 4 IOEs
OE
[3..0]
data_out
[3..0]
4
data_in
[3..0]
fast_out
[3..0]
4
I/O Block
Local Interconnect
Fast I/O
Interconnect LAB Column
Path Clock [3..0]
R4 Interconnects
LAB
LAB
LAB
LAB Local
Interconnect
LAB Local
Interconnect
C4 Interconnects
LAB Local
Interconnect
C4 Interconnects
3.3-V LVTTL/LVCMOS
2.5-V LVTTL/LVCMOS
1.8-V LVTTL/LVCMOS
1.5-V LVCMOS
3.3-V PCI
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3.3-V LVTTL/LVCMOS
Single-ended
3.3
2.5-V LVTTL/LVCMOS
Single-ended
2.5
1.8-V LVTTL/LVCMOS
Single-ended
1.8
1.5-V LVCMOS
Single-ended
1.5
Single-ended
3.3
I/O Standard
The EPM240 and EPM570 devices support two I/O banks, as shown in Figure 222.
Each of these banks support all the LVTTL and LVCMOS standards shown in
Table 24. PCI compliant I/O is not supported in these devices and banks.
Figure 222. MAX II I/O Banks for EPM240 and EPM570 (Note 1), (2)
I/O Bank 1
I/O Bank 2
The EPM1270 and EPM2210 devices support four I/O banks, as shown in Figure 223.
Each of these banks support all of the LVTTL and LVCMOS standards shown in
Table 24. PCI compliant I/O is supported in Bank 3. Bank 3 supports the PCI
clamping diode on inputs and PCI drive compliance on outputs. You must use Bank 3
for designs requiring PCI compliant I/O pins. The Quartus II software automatically
places I/O pins in this bank if assigned with the PCI I/O standard.
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Figure 223. MAX II I/O Banks for EPM1270 and EPM2210 (Note 1), (2)
I/O Bank 2
Also Supports
the 3.3-V PCI
I/O Standard
I/O Bank 3
I/O Bank 4
Each I/O bank has dedicated VCCIO pins that determine the voltage standard support
in that bank. A single device can support 1.5-V, 1.8-V, 2.5-V, and 3.3-V interfaces; each
individual bank can support a different standard. Each I/O bank can support
multiple standards with the same VCCIO for input and output pins. For example, when
VCCIO is 3.3 V, Bank 3 can support LVTTL, LVCMOS, and 3.3-V PCI. V CCIO powers both
the input and output buffers in MAX II devices.
The JTAG pins for MAX II devices are dedicated pins that cannot be used as regular
I/O pins. The pins TMS, TDI, TDO, and TCK support all the I/O standards shown in
Table 24 on page 227 except for PCI. These pins reside in Bank 1 for all MAX II
devices and their I/O standard support is controlled by the VCCIO setting for Bank 1.
PCI Compliance
The MAX II EPM1270 and EPM2210 devices are compliant with PCI applications as
well as all 3.3-V electrical specifications in the PCI Local Bus Specification Revision 2.2.
These devices are also large enough to support PCI intellectual property (IP) cores.
Table 25 shows the MAX II device speed grades that meet the PCI timing
specifications.
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Table 25. MAX II Devices and Speed Grades that Support 3.3-V PCI Electrical Specifications and
Meet PCI Timing
Device
33-MHz PCI
66-MHz PCI
EPM1270
3 Speed Grade
EPM2210
3 Speed Grade
Schmitt Trigger
The input buffer for each MAX II device I/O pin has an optional Schmitt trigger
setting for the 3.3-V and 2.5-V standards. The Schmitt trigger allows input buffers to
respond to slow input edge rates with a fast output edge rate. Most importantly,
Schmitt triggers provide hysteresis on the input buffer, preventing slow-rising noisy
input signals from ringing or oscillating on the input signal driven into the logic array.
This provides system noise tolerance on MAX II inputs, but adds a small, nominal
input delay.
The JTAG input pins (TMS, TCK, and TDI) have Schmitt trigger buffers that are always
enabled.
1
The TCK input is susceptible to high pulse glitches when the input signal fall time is
greater than 200 ns for all I/O standards.
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3.3-V LVCMOS
8
4
2.5-V LVTTL/LVCMOS
14
7
1.8-V LVTTL/LVCMOS
6
3
1.5-V LVCMOS
4
2
Slew-Rate Control
The output buffer for each MAX II device I/O pin has a programmable output slewrate control that can be configured for low noise or high-speed performance. A faster
slew rate provides high-speed transitions for high-performance systems. However,
these fast transitions may introduce noise transients into the system. A slow slew rate
reduces system noise, but adds a nominal output delay to rising and falling edges.
The lower the voltage standard (for example, 1.8-V LVTTL) the larger the output
delay when slow slew is enabled. Each I/O pin has an individual slew-rate control,
allowing the designer to specify the slew rate on a pin-by-pin basis. The slew-rate
control affects both the rising and falling edges.
Open-Drain Output
MAX II devices provide an optional open-drain (equivalent to open-collector) output
for each I/O pin. This open-drain output enables the device to provide system-level
control signals (for example, interrupt and write enable signals) that can be asserted
by any of several devices. This output can also provide an additional wired-OR plane.
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Bus Hold
Each MAX II device I/O pin provides an optional bus-hold feature. The bus-hold
circuitry can hold the signal on an I/O pin at its last-driven state. Since the bus-hold
feature holds the last-driven state of the pin until the next input signal is present, an
external pull-up or pull-down resistor is not necessary to hold a signal level when the
bus is tri-stated.
The bus-hold circuitry also pulls undriven pins away from the input threshold
voltage where noise can cause unintended high-frequency switching. The designer
can select this feature individually for each I/O pin. The bus-hold output will drive
no higher than VCCIO to prevent overdriving signals. If the bus-hold feature is enabled,
the device cannot use the programmable pull-up option.
The bus-hold circuitry uses a resistor to pull the signal level to the last driven state.
The DC and Switching Characteristics chapter in the MAX II Device Handbook gives the
specific sustaining current for each V CCIO voltage level driven through this resistor and
overdrive current used to identify the next-driven input level.
The bus-hold circuitry is only active after the device has fully initialized. The bus-hold
circuit captures the value on the pin present at the moment user mode is entered.
The programmable pull-up resistor feature should not be used at the same time as the
bus-hold feature on a given I/O pin.
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Connect VCCIO pins to either a 1.5-V, 1.8 V, 2.5-V, or 3.3-V power supply, depending
on the output requirements. The output levels are compatible with systems of the
same voltage as the power supply (that is, when VCCIO pins are connected to a 1.5-V
power supply, the output levels are compatible with 1.5-V systems). When VCCIO
pins are connected to a 3.3-V power supply, the output high is 3.3 V and is compatible
with 3.3-V or 5.0-V systems. Table 27 summarizes MAX II MultiVolt I/O support.
Table 27. MAX II MultiVolt I/O Support (Note 1)
Input Signal
Output Signal
VCCIO (V)
1.5 V
1.8 V
2.5 V
3.3 V
5.0 V
1.5 V
1.8 V
2.5 V
3.3 V
5.0 V
1.5
1.8
v (2)
2.5
v (3)
v (3)
3.3
v (4)
v (5)
v (6)
v (6)
v (6)
v (7)
For information about output pin source and sink current guidelines, refer to the AN
428: MAX II CPLD Design Guidelines.
Referenced Documents
This chapter referenced the following documents:
Hot Socketing and Power-On Reset in MAX II Devices chapter in the MAX II Device
Handbook
Using User Flash Memory in MAX II Devices chapter in the MAX II Device Handbook
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233
Changes Made
Summary of Changes
October 2008,
version 2.2
March 2008,
version 2.1
December 2007,
version 2.0
December 2006,
version 1.7
August 2006,
version 1.6
July 2006,
vervion 1.5
February 2006,
version 1.4
August 2005,
version 1.3
December 2004,
version 1.2
June 2004,
version 1.1
October 2008
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October 2008
Altera Corporation
MII51003-1.6
Introduction
This chapter discusses how to use the IEEE Standard 1149.1 Boundary-Scan Test (BST)
circuitry in MAX II devices and includes the following sections:
Instruction Code
Description
SAMPLE/PRELOAD
00 0000 0101
EXTEST (1)
00 0000 1111
BYPASS
11 1111 1111
Places the 1-bit bypass register between the TDI and TDO pins,
which allows the BST data to pass synchronously through selected
devices to adjacent devices during normal device operation.
USERCODE
00 0000 0111
IDCODE
00 0000 0110
Selects the IDCODE register and places it between TDI and TDO,
allowing the IDCODE to be serially shifted out of TDO.
HIGHZ (1)
00 0000 1011
Places the 1-bit bypass register between the TDI and TDO pins,
which allows the boundary scan test data to pass synchronously
through selected devices to adjacent devices during normal device
operation, while tri-stating all of the I/O pins.
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Altera Corporation
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Instruction Code
Description
CLAMP (1)
00 0000 1010
Places the 1-bit bypass register between the TDI and TDO pins,
which allows the boundary scan test data to pass synchronously
through selected devices to adjacent devices during normal device
operation, while holding I/O pins to a state defined by the data in the
boundary-scan register.
USER0
00 0000 1100
This instruction allows you to define the scan chain between TDI
and TDO in the MAX II logic array. This instruction is also used for
custom logic and JTAG interfaces.
USER1
00 0000 1110
This instruction allows you to define the scan chain between TDI
and TDO in the MAX II logic array. This instruction is also used for
custom logic and JTAG interfaces.
(2)
IEEE 1532
instructions
Notes to Table 31:
(1) HIGHZ, CLAMP, and EXTEST instructions do not disable weak pull-up resistors or bus hold features.
(2) These instructions are shown in the 1532 BSDL files, which will be posted on the Altera website at www.altera.com when they are available.
Unsupported JTAG instructions should not be issued to the MAX II device as this may
put the device into an unknown state, requiring a power cycle to recover device
operation.
The MAX II device instruction register length is 10 bits and the USERCODE register
length is 32 bits. Table 32 and Table 33 show the boundary-scan register length and
device IDCODE information for MAX II devices.
Table 32. MAX II Boundary-Scan Register Length
Device
EPM240
240
EPM570
480
EPM1270
636
EPM2210
816
Version
(4 Bits)
Part Number
Manufacturer
Identity (11 Bits)
LSB
(1 Bit) (2)
HEX IDCODE
0000
0x020A10DD
0000
0x020A20DD
0000
0x020A30DD
0000
0x020A40DD
EPM240G
EPM570
EPM570G
EPM1270
EPM1270G
EPM2210
EPM2210G
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Part Number
Manufacturer
Identity (11 Bits)
LSB
(1 Bit) (2)
HEX IDCODE
EPM240Z
0000
0x020A50DD
EPM570Z
0000
0x020A60DD
Device
For more information about JTAG BST, refer to the IEEE 1149.1 (JTAG) Boundary-Scan
Testing for MAX II Devices chapter in the MAX II Device Handbook.
JTAG Block
The MAX II JTAG block feature allows you to access the JTAG TAP and state signals
when either the USER0 or USER1 instruction is issued to the JTAG TAP. The USER0
and USER1 instructions bring the JTAG boundary-scan chain (TDI) through the user
logic instead of the MAX II devices boundary-scan cells. Each USER instruction
allows for one unique user-defined JTAG chain into the logic array.
October 2008
Altera Corporation
34
Altera FPGA
DQ[7..0]
A[20..0]
OE
WE
CE
RY/BY
DQ[7..0]
A[20..0]
OE
WE
CE
RY/BY
TDI
TMS
TCK
TDO
TDO_U
TDI_U
TMS_U
TCK_U
SHIFT_U
CLKDR_U
UPDATE_U
RUNIDLE_U
USER1_U
Parallel
Flash Loader
Configuration
Logic
CONF_DONE
nSTATUS
nCE
DATA0
nCONFIG
DCLK
(1), (2)
In System Programmability
MAX II devices can be programmed in-system via the industry standard 4-pin IEEE
Std. 1149.1 (JTAG) interface. In-system programmability (ISP) offers quick, efficient
iterations during design development and debugging cycles. The logic, circuitry, and
interconnects in the MAX II architecture are configured with flash-based SRAM
configuration elements. These SRAM elements require configuration data to be
loaded each time the device is powered. The process of loading the SRAM data is
called configuration. The on-chip configuration flash memory (CFM) block stores the
SRAM elements configuration data. The CFM block stores the designs configuration
pattern in a reprogrammable flash array. During ISP, the MAX II JTAG and ISP
circuitry programs the design pattern into the CFM blocks non-volatile flash array.
The MAX II JTAG and ISP controller internally generate the high programming
voltages required to program the CFM cells, allowing in-system programming with
any of the recommended operating external voltage supplies (that is, 3.3 V/2.5 V or
1.8 V for the MAX IIG and MAX IIZ devices). ISP can be performed anytime after
VCCINT and all VCCIO banks have been fully powered and the device has completed the
configuration power-up time. By default, during in-system programming, the I/O
pins are tri-stated and weakly pulled-up to VCCIO to eliminate board conflicts. The insystem programming clamp and real-time ISP feature allow user control of I/O state
or behavior during ISP.
For more information, refer to In-System Programming Clamp on page 36 and
Real-Time ISP on page 37.
These devices also offer an ISP_DONE bit that provides safe operation when insystem programming is interrupted. This ISP_DONE bit, which is the last bit
programmed, prevents all I/O pins from driving until the bit is programmed.
October 2008
Altera Corporation
35
For more information, refer to the Using Jam STAPL for ISP via an Embedded Processor
chapter in the MAX II Device Handbook.
Programming Sequence
During in-system programming, 1532 instructions, addresses, and data are shifted
into the MAX II device through the TDI input pin. Data is shifted out through the TDO
output pin and compared against the expected data. Programming a pattern into the
device requires the following six ISP steps. A stand-alone verification of a
programmed pattern involves only stages 1, 2, 5, and 6. These steps are automatically
executed by third-party programmers, the Quartus II software, or the Jam STAPL and
Jam Byte-Code Players.
1. Enter ISPThe enter ISP stage ensures that the I/O pins transition smoothly from
user mode to ISP mode.
2. Check IDBefore any program or verify process, the silicon ID is checked. The
time required to read this silicon ID is relatively small compared to the overall
programming time.
3. Sector EraseErasing the device in-system involves shifting in the instruction to
erase the device and applying an erase pulse(s). The erase pulse is automatically
generated internally by waiting in the run/test/idle state for the specified erase
pulse time of 500 ms for the CFM block and 500 ms for each sector of the UFM
block.
4. ProgramProgramming the device in-system involves shifting in the address,
data, and program instruction and generating the program pulse to program the
flash cells. The program pulse is automatically generated internally by waiting in
the run/test/idle state for the specified program pulse time of 75 s. This process
is repeated for each address in the CFM and UFM blocks.
5. VerifyVerifying a MAX II device in-system involves shifting in addresses,
applying the verify instruction to generate the read pulse, and shifting out the data
for comparison. This process is repeated for each CFM and UFM address.
6. Exit ISPAn exit ISP stage ensures that the I/O pins transition smoothly from ISP
mode to user mode.
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Table 34 shows the programming times for MAX II devices using in-circuit testers to
execute the algorithm vectors in hardware. Software-based programming tools used
with download cables are slightly slower because of data processing and transfer
limitations.
Table 34. MAX II Device Family Programming Times
EPM240
EPM240G
EPM240Z
EPM570
EPM570G
EPM570Z
EPM1270
EPM1270G
1.72
2.16
1.65
1.99
Verify (1 MHz)
0.09
EPM2210
EPM2210G
Unit
2.90
3.92
sec
2.58
3.40
sec
0.17
0.30
0.49
sec
0.01
0.02
0.03
0.05
sec
1.81
2.33
3.20
4.41
sec
1.66
2.01
2.61
3.45
sec
Description
UFM Programming
The Quartus II software, with the use of POF, Jam, or JBC files, supports
programming of the user flash memory (UFM) block independent of the logic array
design pattern stored in the CFM block. This allows updating or reading UFM
contents through ISP without altering the current logic array design, or vice versa. By
default, these programming files and methods will program the entire flash memory
contents, which includes the CFM block and UFM contents. The stand-alone
embedded Jam STAPL player and Jam Byte-Code Player provides action commands
for programming or reading the entire flash memory (UFM and CFM together) or
each independently.
f
For more information, refer to the Using Jam STAPL for ISP via an Embedded Processor
chapter in the MAX II Device Handbook.
For more information, refer to the Real-Time ISP and ISP Clamp for MAX II Devices
chapter in the MAX II Device Handbook.
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Real-Time ISP
For systems that require more than DC logic level control of I/O pins, the real-time
ISP feature allows you to update the CFM block with a new design image while the
current design continues to operate in the SRAM logic array and I/O pins. A new
programming file is updated into the MAX II device without halting the original
designs operation, saving down-time costs for remote or field upgrades. The updated
CFM block configures the new design into the SRAM upon the next power cycle. It is
also possible to execute an immediate configuration of the SRAM without a power
cycle by using a specific sequence of ISP commands. The configuration of SRAM
without a power cycle takes a specific amount of time (tCONFIG ). During this time, the
I/O pins are tri-stated and weakly pulled-up to V CCIO.
Design Security
All MAX II devices contain a programmable security bit that controls access to the
data programmed into the CFM block. When this bit is programmed, design
programming information, stored in the CFM block, cannot be copied or retrieved.
This feature provides a high level of design security because programmed data within
flash memory cells is invisible. The security bit that controls this function, as well as
all other programmed data, is reset only when the device is erased. The SRAM is also
invisible and cannot be accessed regardless of the security bit setting. The UFM block
data is not protected by the security bit and is accessible through JTAG or logic array
connections.
Referenced Documents
This chapter references the following documents:
October 2008
IEEE 1149.1 (JTAG) Boundary-Scan Testing for MAX II Devices chapter in the MAX II
Device Handbook
Real-Time ISP and ISP Clamp for MAX II Devices chapter in the MAX II Device
Handbook
Using Jam STAPL for ISP via an Embedded Processor chapter in the MAX II Device
Handbook
Altera Corporation
38
Changes Made
October 2008,
version 1.6
December 2007,
version 1.5
December 2006,
version 1.4
June 2005,
version 1.3
June 2005,
version 1.3
June 2004,
version 1.1
Summary of Changes
October 2008
Altera Corporation
Introduction
MAX II devices offer hot socketing, also known as hot plug-in or hot swap, and
power sequencing support. Designers can insert or remove a MAX II board in a
system during operation without undesirable effects to the system bus. The hot
socketing feature removes some of the difficulties designers face when using
components on printed circuit boards (PCBs) that contain a mixture of 3.3-, 2.5-, 1.8-,
and 1.5-V devices.
The MAX II device hot socketing feature provides:
The device can be driven before and during power-up or power-down without
any damage to the device itself.
I/O pins remain tri-stated during power-up. The device does not drive out before
or during power-up, thereby affecting other buses in operation.
Signal pins do not drive the V CCIO or V CCINT power supplies. External input signals
to device I/O pins do not power the device VCCIO or V CCINT power supplies via
internal paths. This is true if the VCCINT and the VCCIO supplies are held at GND.
Altera uses GND as reference for the hot-socketing and I/O buffers circuitry designs.
You must connect the GND between boards before connecting the V CCINT and the VCCIO
power supplies to ensure device reliability and compliance to the hot-socketing
specifications.
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Altera Corporation
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AC and DC Specifications
You can power up or power down the V CCIO and VCCINT pins in any sequence. During
hot socketing, the I/O pin capacitance is less than 8 pF. MAX II devices meet the
following hot socketing specifications:
MAX II devices are immune to latch-up when hot socketing. If the TCK JTAG input
pin is driven high during hot socketing, the current on that pin might exceed the
specifications above.
IIOPIN is the current at any user I/O pin on the device. The AC specification applies
when the device is being powered up or powered down. This specification takes into
account the pin capacitance but not board trace and external loading capacitance.
Additional capacitance for trace, connector, and loading must be taken into
consideration separately. The peak current duration due to power-up transients is
10 ns or less.
The DC specification applies when all VCC supplies to the device are stable in the
powered-up or powered-down conditions.
October 2008
Altera Corporation
43
Make sure that the V CCINT is within the recommended operating range even though
SRAM download has completed.
Each I/O and clock pin has the circuitry shown in Figure 41.
Figure 41. Hot Socketing Circuit Block Diagram for MAX II Devices
Power On
Reset
Monitor
VCCIO
Weak
Pull-Up
Resistor
PAD
Output Enable
Voltage
Tolerance
Control
Hot Socket
Input Buffer
to Logic Array
The POR circuit monitors VCCINT and VCCIO voltage levels and keeps I/O pins tri-stated
until the device has completed its flash memory configuration of the SRAM logic. The
weak pull-up resistor (R) from the I/O pin to VCCIO is enabled during download to
keep the I/O pins from floating. The 3.3-V tolerance control circuit permits the I/O
pins to be driven by 3.3 V before VCCIO and/or VCCINT are powered, and it prevents the
I/O pins from driving out when the device is not fully powered or operational. The
hot socket circuit prevents I/O pins from internally powering VCCIO and VCCINT when
driven by external signals before the device is powered.
f
For information about 5.0-V tolerance, refer to the Using MAX II Devices in MultiVoltage Systems chapter in the MAX II Device Handbook.
Figure 42 shows a transistor-level cross section of the MAX II device I/O buffers.
This design ensures that the output buffers do not drive when VCCIO is powered before
VCCINT or if the I/O pad voltage is higher than VCCIO. This also applies for sudden
voltage spikes during hot insertion. The VPAD leakage current charges the 3.3-V
tolerant circuit capacitance.
October 2008
Altera Corporation
44
IOE Signal
The Larger of
VCCIO or VPAD
Ensures 3.3-V
Tolerance and
Hot-Socket
Protection
VCCIO
p+
n+
n+
n+
p+
n - well
p - well
p - substrate
The CMOS output drivers in the I/O pins intrinsically provide electrostatic discharge
(ESD) protection. There are two cases to consider for ESD voltage strikes: positive
voltage zap and negative voltage zap.
A positive ESD voltage zap occurs when a positive voltage is present on an I/O pin
due to an ESD charge event. This can cause the N+ (Drain)/ P-Substrate junction of
the N-channel drain to break down and the N+ (Drain)/P-Substrate/N+ (Source)
intrinsic bipolar transistor turn on to discharge ESD current from I/O pin to GND.
The dashed line (see Figure 43) shows the ESD current discharge path during a
positive ESD zap.
Figure 43. ESD Protection During Positive Voltage Zap
I/O
Source
PMOS
Gate
N+
Drain
P-Substrate
I/O
Drain
NMOS
Gate
N+
Source
GND
GND
October 2008
Altera Corporation
45
When the I/O pin receives a negative ESD zap at the pin that is less than 0.7 V (0.7 V
is the voltage drop across a diode), the intrinsic
P-Substrate/N+ drain diode is forward biased. Therefore, the discharge ESD current
path is from GND to the I/O pin, as shown in Figure 44.
Figure 44. ESD Protection During Negative Voltage Zap
I/O
Source
PMOS
Gate
N+
Drain
G
P-Substrate
I/O
Drain
NMOS
Gate
N+
Source
GND
GND
October 2008
Altera Corporation
46
Power-Up Characteristics
When power is applied to a MAX II device, the POR circuit monitors VCCINT and
begins SRAM download at an approximate voltage of 1.7 V or 1.55 V for MAX IIG and
MAX IIZ devices. From this voltage reference, SRAM download and entry into user
mode takes 200 to 450 s maximum, depending on device density. This period of time
is specified as tCONFIG in the power-up timing section of the DC and Switching
Characteristics chapter in the MAX II Device Handbook.
Entry into user mode is gated by whether all V CCIO banks are powered with sufficient
operating voltage. If VCCINT and VCCIO are powered simultaneously, the device enters
user mode within the t CONFIG specifications. If VCCIO is powered more than tCONFIG after
VCCINT, the device does not enter user mode until 2 s after all VCCIO banks are powered.
For MAX II and MAX IIG devices, when in user mode, the POR circuitry continues to
monitor the VCCINT (but not VCCIO ) voltage level to detect a brown-out condition. If
there is a VCCINT voltage sag at or below 1.4 V during user mode, the POR circuit resets
the SRAM and tri-states the I/O pins. Once V CCINT rises back to approximately 1.7 V
(or 1.55 V for MAX IIG devices), the SRAM download restarts and the device begins
to operate after tCONFIG time has passed.
For MAX IIZ devices, the POR circuitry does not monitor the VCCINT and VCCIO voltage
levels after the device enters user mode. If there is a VCCINT voltage sag below 1.4 V
during user mode, the functionality of the device will not be guaranteed and you
must power down the VCCINT to 0 V for a minimum of 10 s before powering the VCCINT
and VCCIO up again. Once VCCINT rises from 0 V back to approximately 1.55 V, the
SRAM download restarts and the device begins to operate after tCONFIG time has
passed.
Figure 45 shows the voltages for POR of MAX II, MAX IIG, and MAX IIZ devices
during power-up into user mode and from user mode to power-down or brown-out.
1
All VCCINT and VCCIO pins of all banks must be powered on MAX II devices before
entering user mode.
October 2008
Altera Corporation
47
Figure 45. Power-Up Characteristics for MAX II, MAX IIG, and MAX IIZ Devices (Note 1), (2)
MAX II Device
VCCINT
Approximate Voltage
for SRAM Download Start
3.3 V
2.5 V
Device Resets
the SRAM and
Tri-States I/O Pins
1.7 V
1.4 V
tCONFIG
0V
User Mode
Operation
Tri-State
Tri-State
VCCINT
3.3 V
Approximate Voltage
for SRAM Download Start
Device Resets
the SRAM and
Tri-States I/O Pins
1.8 V
1.55 V
1.4 V
tCONFIG
0V
User Mode
Operation
Tri-State
Tri-State
VCCINT
3.3 V
Approximate Voltage
for SRAM Download Start
1.8 V
1.55 V
1.4 V
minimum 10 s
tCONFIG
0V
Tri-State
User Mode
Operation
tCONFIG
Tri-State
User Mode
Operation
October 2008
After SRAM configuration, all registers in the device are cleared and released into
user function before I/O tri-states are released. To release clears after tri-states are
released, use the DEV_CLRn pin option. To hold the tri-states beyond the power-up
configuration time, use the DEV_OE pin option.
Altera Corporation
48
Referenced Documents
This chapter refereces the following documents:
Changes Made
October 2008,
December 2006,
version 1.5
February 2006,
version 1.4
June 2005,
version 1.3
December 2004,
version 1.2
June 2004,
version 1.1
version2.1
December 2007,
version 2.0
Summary of Changes
October 2008
Altera Corporation
MII51005-2.5
Introduction
System designers must consider the recommended DC and switching conditions
discussed in this chapter to maintain the highest possible performance and reliability
of the MAX II devices. This chapter contains the following sections:
Operating Conditions
Table 51 through Table 512 provide information about absolute maximum ratings,
recommended operating conditions, DC electrical characteristics, and other
specifications for MAX II devices.
Parameter
Conditions
Minimum
Maximum
Unit
0.5
4.6
VCCINT
VCCIO
0.5
4.6
VI
DC input voltage
0.5
4.6
IOUT
25
25
mA
TSTG
Storage temperature
No bias
65
150
TAMB
Ambient temperature
65
135
TJ
Junction temperature
135
August 2009
Altera Corporation
52
VCCIO (1)
Parameter
Conditions
Minimum
Maximum
Unit
MAX II devices
3.00
3.60
MAX II devices
2.375
2.625
1.71
1.89
3.00
3.60
2.375
2.625
1.71
1.89
1.425
1.575
0.5
4.0
VC CIO
85
Industrial range
40
100
40
125
VI
Input voltage
VO
Output voltage
TJ
Commercial range
August 2009
Altera Corporation
53
Programming/Erasure Specifications
Table 53 shows the MAX II device family programming/erasure specifications.
Table 53. MAX II Device Programming/Erasure Specifications
Parameter
Minimum
Typical
Maximum
Unit
100 (1)
Cycles
DC Electrical Characteristics
Table 54 shows the MAX II device family DC electrical characteristics.
Table 54. MAX II Device DC Electrical Characteristics (Note 1) (Part 1 of 2)
Symbol
Parameter
Conditions
Minimum
Typical
Maximum
Unit
II
10
10
IOZ
10
10
ICCSTANDBY
MAX II devices
12
mA
mA
EPM240Z (Commercial
grade) (4)
25
90
EPM240Z (Industrial
grade) (5)
25
139
EPM570Z (Commercial
grade) (4)
27
96
EPM570Z (Industrial
grade) (5)
27
152
VC CIO = 3.3 V
400
mV
VC CIO = 2.5 V
190
mV
MAX II devices
55
mA
40
mA
25
10
40
25
60
45
95
VSCHMITT (6)
ICCPOWERUP
RPULLUP
August 2009
Altera Corporation
54
Parameter
Conditions
Minimum
Typical
Maximum
Unit
IPULLUP
300
CIO
pF
CGCLK
pF
August 2009
Altera Corporation
55
70
3.3-V VCCIO
3.3-V VCCIO
Typical IO Output Current (mA)
60
50
2.5-V VCCIO
40
30
1.8-V VCCIO
20
1.5-V VCCIO
10
50
40
2.5-V VCCIO
30
1.8-V VCCIO
20
1.5-V VCCIO
10
0
0.0
0.5
1.0
1.5
2.0
2.5
3.0
0.0
3.5
0.5
1.0
1.5
2.0
2.5
30
3.3-V VCCIO
3.3-V VCCIO
30
25
2.5-V VCCIO
15
1.8-V VCCIO
10
1.5-V VCCIO
3.5
20
3.0
Voltage (V)
Voltage (V)
25
20
2.5-V VCCIO
15
1.8-V VCCIO
10
1.5-V VCCIO
5
0
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
0.0
0.5
Voltage (V)
1.0
1.5
2.0
2.5
3.0
3.5
Voltage (V)
Parameter
Conditions
Minimum
Maximum
Unit
VCCIO
3.0
3.6
VIH
1.7
4.0
VIL
0.5
0.8
VOH
IOH = 4 mA (1)
2.4
VOL
IOL = 4 mA (1)
0.45
Parameter
Conditions
Minimum
Maximum
Unit
VCCIO
3.0
3.6
VIH
1.7
4.0
VIL
0.5
0.8
August 2009
Altera Corporation
56
Parameter
Conditions
Minimum
Maximum
Unit
VOH
VC CIO = 3.0,
IOH = 0.1 mA (1)
VC CIO 0.2
VOL
VC CIO = 3.0,
IOL = 0.1 mA (1)
0.2
Parameter
Conditions
Minimum
Maximum
Unit
VCCIO
2.375
2.625
VIH
1.7
4.0
VIL
0.5
0.7
VOH
2.1
IOH = 1 mA (1)
2.0
VOL
IOH = 2 mA (1)
1.7
0.2
IOL = 1 mA (1)
0.4
IOL = 2 mA (1)
0.7
Parameter
Conditions
Minimum
Maximum
Unit
VC CIO
1.71
1.89
VIH
0.65 VCCIO
2.25 (2)
VIL
0.3
0.35 VC CIO
VOH
IOH = 2 mA (1)
VC CIO 0.45
VOL
IOL = 2 mA (1)
0.45
Conditions
Minimum
Maximum
Unit
Parameter
VC CIO
1.425
1.575
VIH
0.65 VC CIO
VIL
0.3
0.35 VC CIO
VOH
IOH = 2 mA (1)
0.75 VC CIO
VOL
IOL = 2 mA (1)
0.25 VC CIO
August 2009
Altera Corporation
57
Parameter
Conditions
Minimum
Typical
Maximum
Unit
VC CIO
I/O supply
voltage
3.0
3.3
3.6
VIH
High-level input
voltage
0.5 VC CIO
VCC IO + 0.5
VIL
Low-level input
voltage
0.5
0.3 VCC IO
VOH
High-level
output voltage
IOH = 500 A
0.9 VC CIO
VOL
Low-level
output voltage
IOL = 1.5 mA
0.1 VCC IO
1.8 V
2.5 V
3.3 V
Conditions
Min
Max
Min
Max
Min
Max
Min
Max
Unit
Low sustaining
current
20
30
50
70
High sustaining
current
20
30
50
70
Low overdrive
current
160
200
300
500
High overdrive
current
160
200
300
500
Parameter
August 2009
Altera Corporation
58
Power-Up Timing
Table 512 shows the power-up timing characteristics for MAX II devices.
Table 512. MAX II Power-Up Timing
Symbol
tCONF IG (1)
Parameter
The amount of time from when
minimum VC CINT is reached until
the device enters user mode (2)
Device
Min
Typ
Max
Unit
EPM240
200
EPM570
300
EPM1270
300
EPM2210
450
Power Consumption
Designers can use the Altera PowerPlay Early Power Estimator and PowerPlay
Power Analyzer to estimate the device power.
f
For more information about these power analysis tools, refer to the Understanding and
Evaluating Power in MAX II Devices chapter in the MAX II Device Handbook and the
PowerPlay Power Analysis chapter in volume 3 of the Quartus II Handbook.
August 2009
Altera Corporation
59
t R4
tIODR
tIOE
Data-In/LUT Chain
User
Flash
Memory
I/O Pin
t LOCAL
Input Routing
Delay
tDL
Logic Element
t LUT
tCOMB
Register Control
Delay
tC
t FASTIO
tCO
tSU
tH
tPRE
tCLR
Output
Delay
t OD
t XZ
t ZX
I/O Pin
From Adjacent LE
t GLOB
INPUT
Output Routing
Delay
t C4
LUT Delay
Register Delays
Data-Out
The timing characteristics of any signal path can be derived from the timing model
and parameters of a particular device. External timing parameters, which represent
pin-to-pin timing delays, can be calculated as the sum of internal parameters.
f
Refer to the Understanding Timing in MAX II Devices chapter in the MAX II Device
Handbook for more information.
This section describes and specifies the performance, internal, external, and UFM
timing specifications. All specifications are representative of the worst-case supply
voltage and junction temperature conditions.
August 2009
(Part 1 of 2)
Preliminary
Final
EPM240
EPM240Z (1)
EPM570
EPM570Z (1)
Altera Corporation
510
(Part 2 of 2)
Preliminary
Final
EPM1270
EPM2210
Performance
Table 514 shows the MAX II device performance for some common designs. All
performance values were obtained with the Quartus II software compilation of
megafunctions. Performance values for 3, 4, and 5 speed grades are based on an
EPM1270 device target, while 6, 7, and 8 speed grades are based on an EPM570Z
device target.
Table 514. MAX II Device Performance
Performance
Resources Used
Resource
Used
LE
UFM
MAX IIZ
3
Speed
Grade
4
Speed
Grade
5
Speed
Grade
6
Speed
Grade
7
Speed
Grade
8
Speed
Grade
Mode
LEs
UFM
Blocks
16
304.0
247.5
201.1
184.1
123.5
118.3
MHz
64
201.5
154.8
125.8
83.2
83.2
80.5
MHz
16-to-1 multiplexer
11
6.0
8.0
9.3
17.4
17.3
20.4
ns
32-to-1 multiplexer
24
7.1
9.0
11.4
12.5
22.8
25.3
ns
5.1
6.6
8.2
9.0
15.0
16.1
ns
5.2
6.6
8.2
9.2
15.0
16.1
ns
None
10.0
10.0
10.0
10.0
10.0
10.0
MHz
512 16
Unit
512 16
SPI (2)
37
8.0
8.0
8.0
9.7
9.7
9.7
MHz
512 8
Parallel
(3)
73
(4)
(4)
(4)
(4)
(4)
(4)
MHz
512 16
I2C (3)
142
100
(5)
100
(5)
100
(5)
100
(5)
100
(5)
100
(5)
kHz
August 2009
Altera Corporation
511
For more explanations and descriptions about each internal timing microparameters
symbol, refer to the Understanding Timing in MAX II Devices chapter in the MAX II
Device Handbook.
4 Speed
Grade
MAX IIZ
5 Speed
Grade
6 Speed
Grade
7 Speed
Grade
8 Speed
Grade
Parameter
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Unit
tLUT
LE combinational
LUT delay
571
742
914
1,215
2,247
2,247
ps
tCOM B
Combinational
path delay
147
192
236
243
305
309
ps
tCLR
LE register clear
delay
238
309
381
401
541
545
ps
tPRE
LE register preset
delay
238
309
381
401
541
545
ps
tSU
LE register setup
time before clock
208
271
333
260
319
321
ps
tH
LE register hold
time after clock
ps
tCO
235
305
376
380
489
494
ps
tCLK HL
Minimum clock
high or low time
166
216
266
253
335
339
ps
tC
Register control
delay
857
1,114
1,372
1,356
1,722
1,741
ps
August 2009
Altera Corporation
512
Parameter
MAX IIZ
4 Speed
Grade
5 Speed
Grade
6 Speed
Grade
7 Speed
Grade
8 Speed
Grade
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Unit
tFAS TIO
159
207
254
170
348
428
ps
tIN
708
920
1,132
907
970
986
ps
tGLOB (1)
1,519
1,974
2,430
2,261
2,670
3,322
ps
tIOE
Internally
generated output
enable delay
354
374
460
530
966
1,410
ps
tDL
224
291
358
318
410
509
ps
tOD (2)
1,064
1,383
1,702
1,319
1,526
1,543
ps
tXZ (3)
Output buffer
disable delay
756
982
1,209
1,045
1,264
1,276
ps
tZX (4)
Output buffer
enable delay
1,003
1,303
1,604
1,160
1,325
1,353
ps
Table 517 through Table 520 show the adder delays for t ZX and tXZ microparameters
when using an I/O standard other than 3.3-V LVTTL with 16 mA drive strength.
Table 517. t ZX IOE Microparameter Adders for Fast Slew Rate
(Part 1 of 2)
4 Speed
Grade
MAX IIZ
5 Speed
Grade
6 Speed
Grade
7 Speed
Grade
8 Speed
Grade
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Unit
16 mA
ps
8 mA
28
37
45
72
71
74
ps
8 mA
ps
4 mA
28
37
45
72
71
74
ps
2.5-V LVTTL /
LVCMOS
14 mA
14
19
23
75
87
90
ps
7 mA
314
409
503
162
174
177
ps
1.8-V LVTTL /
LVCMOS
6 mA
450
585
720
279
289
291
ps
3 mA
1,443
1,876
2,309
499
508
512
ps
3.3-V LVTTL
3.3-V LVCMOS
August 2009
Altera Corporation
513
(Part 2 of 2)
4 Speed
Grade
5 Speed
Grade
6 Speed
Grade
7 Speed
Grade
8 Speed
Grade
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Unit
4 mA
1,118
1,454
1,789
580
588
588
ps
2 mA
2,410
3,133
3,856
915
923
923
ps
20 mA
19
25
31
72
71
74
ps
1.5-V LVCMOS
3.3-V PCI
MAX IIZ
MAX IIZ
4 Speed
Grade
5 Speed
Grade
6 Speed
Grade
7 Speed
Grade
8 Speed
Grade
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Unit
16 mA
6,350
6,050
5,749
5,951
5,952
6,063
ps
8 mA
9,383
9,083
8,782
6,534
6,533
6,662
ps
8 mA
6,350
6,050
5,749
5,951
5,952
6,063
ps
4 mA
9,383
9,083
8,782
6,534
6,533
6,662
ps
2.5-V LVTTL /
LVCMOS
14 mA
10,412
10,112
9,811
9,110
9,105
9,237
ps
7 mA
13,613
13,313
13,012
9,830
9,835
9,977
ps
3.3-V PCI
20 mA
75
97
120
6,534
6,533
6,662
ps
4 Speed
Grade
MAX IIZ
5 Speed
Grade
6 Speed
Grade
7 Speed
Grade
8 Speed
Grade
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Unit
16 mA
ps
8 mA
56
72
89
69
69
69
ps
8 mA
ps
4 mA
56
72
89
69
69
69
ps
2.5-V LVTTL /
LVCMOS
14 mA
11
11
ps
7 mA
47
61
75
66
70
70
ps
1.8-V LVTTL /
LVCMOS
6 mA
119
155
191
45
34
37
ps
3 mA
207
269
331
34
22
25
ps
1.5-V LVCMOS
4 mA
606
788
970
166
154
155
ps
2 mA
673
875
1,077
190
177
179
ps
20 mA
71
93
114
69
69
69
ps
3.3-V LVTTL
3.3-V LVCMOS
3.3-V PCI
August 2009
Altera Corporation
514
4 Speed
Grade
MAX IIZ
5 Speed
Grade
6 Speed
Grade
7 Speed
Grade
8 Speed
Grade
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Unit
16 mA
206
20
247
1,433
1,446
1,454
ps
8 mA
891
665
438
1,332
1,345
1,348
ps
8 mA
206
20
247
1,433
1,446
1,454
ps
4 mA
891
665
438
1,332
1,345
1,348
ps
2.5-V LVTTL /
LVCMOS
14 mA
222
231
213
208
213
ps
7 mA
943
717
490
166
161
166
ps
3.3-V PCI
20 mA
161
210
258
1,332
1,345
1,348
ps
3.3-V LVTTL
3.3-V LVCMOS
The default slew rate setting for MAX II devices in the Quartus II design software is
fast.
MAX IIZ
3 Speed
Grade
4 Speed
Grade
5 Speed
Grade
6 Speed
Grade
7 Speed
Grade
Parameter
Min
Max
Min
Max
Min
Max
Min Max
Min
tAC LK
100
100
100
100
100
100
ns
tAS U
20
20
20
20
20
20
ns
tAH
20
20
20
20
20
20
ns
tADS
20
20
20
20
20
20
ns
tADH
20
20
20
20
20
20
ns
tDCLK
100
100
100
100
100
100
ns
tDSS
60
60
60
60
60
60
ns
tDSH
20
20
20
20
20
20
ns
Symbol
8 Speed
Grade
Max Min
August 2009
Max Unit
Altera Corporation
515
MAX IIZ
3 Speed
Grade
4 Speed
Grade
5 Speed
Grade
6 Speed
Grade
7 Speed
Grade
Parameter
Min
Max
Min
Max
Min
Max
Min Max
Min
tDDS
20
20
20
20
20
20
ns
tDDH
20
20
20
20
20
20
ns
tDP
Program signal to
data clock hold time
ns
tPB
Maximum delay
between program
rising edge to UFM
busy signal rising
edge
960
960
960
960
960
960
ns
tBP
Minimum delay
allowed from UFM
busy signal going low
to program signal
going low
20
20
20
20
20
20
ns
tPP M X
Maximum length of
busy pulse during a
program
100
100
100
100
100
100
tAE
ns
tEB
Maximum delay
between the erase
rising edge to the
UFM busy signal
rising edge
960
960
960
960
960
960
ns
tBE
Minimum delay
allowed from the UFM
busy signal going low
to erase signal going
low
20
20
20
20
20
20
ns
tEPM X
Maximum length of
busy pulse during an
erase
500
500
500
500
500
500
ms
tDCO
ns
Symbol
August 2009
Altera Corporation
8 Speed
Grade
Max Min
Max Unit
516
MAX IIZ
3 Speed
Grade
4 Speed
Grade
5 Speed
Grade
6 Speed
Grade
7 Speed
Grade
Parameter
Min
Max
Min
Max
Min
Max
Min Max
Min
tOE
180
180
180
180
180
180
ns
tRA
Maximum read
access time
65
65
65
65
65
65
ns
tOSC S
Maximum delay
between the
OSC_ENA rising
edge to the
erase/program signal
rising edge
250
250
250
250
250
250
ns
tOSC H
Minimum delay
allowed from the
erase/program signal
going low to
OSC_ENA signal
going low
250
250
250
250
250
250
ns
Symbol
8 Speed
Grade
Max Min
Max Unit
Figure 53 through Figure 55 show the read, program, and erase waveforms for
UFM block timing parameters shown in Table 521.
Figure 53. UFM Read Waveforms
ARShft
tASU
ARClk
tACLK
ARDin
DRShft
DRClk
DRDin
DRDout
tADS
tDSS
tDSH
tDCO
OSC_ENA
Program
Erase
Busy
August 2009
Altera Corporation
517
tASU
9 Address Bits
tACLK
tAH
ARClk
tADH
ARDin
DRShft
tADS
tDSS
16 Data Bits
tDCLK
tDSH
DRClk
DRDin
tDDH
tDDS
DRDout
tOSCS
tOSCH
OSC_ENA
Program
tPB
Erase
tBP
Busy
tPPMX
tASU
tACLK
9 Address Bits
ARClk
tAH
tADH
ARDin
tADS
DRShft
DRClk
DRDin
DRDout
OSC_ENA
tOSCS
Program
tOSCH
Erase
tEB
Busy
tBE
tEPMX
4 Speed
Grade
MAX IIZ
5 Speed
Grade
6 Speed
Grade
7 Speed
Grade
8 Speed
Grade
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Unit
tC4
429
556
687
(1)
(1)
(1)
ps
tR4
326
423
521
(1)
(1)
(1)
ps
tLOCA L
330
429
529
(1)
(1)
(1)
ps
August 2009
Altera Corporation
518
For more information about each external timing parameters symbol, refer to the
Understanding Timing in MAX II Devices chapter in the MAX II Device Handbook.
Table 523 shows the external I/O timing parameters for EPM240 devices.
(Part 1 of 2)
Parameter
Condition Min
4 Speed
Grade
MAX IIZ
5 Speed
Grade
6 Speed
Grade
7 Speed
Grade
8 Speed
Grade
Max
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Unit
tPD1
Worst case
pin-to-pin
delay
through 1
look-up table
(LUT)
10 pF
4.7
6.1
7.5
7.9
12.0
14.0
ns
tPD2
Best case
pin-to-pin
delay
through
1 LUT
10 pF
3.7
4.8
5.9
5.8
7.8
8.5
ns
tSU
Global clock
setup time
1.7
2.2
2.7
2.4
4.1
4.6
ns
tH
Global clock
hold time
ns
tCO
Global clock
to output
delay
10 pF
2.0
4.3
2.0
5.6
2.0
6.9
2.0
6.6
2.0
8.1
2.0
8.6
ns
tCH
Global clock
high time
166
216
266
253
335
339
ps
tCL
Global clock
low time
166
216
266
253
335
339
ps
tCNT
Minimum
global clock
period for
16-bit
counter
3.3
4.0
5.0
5.4
8.1
8.4
ns
August 2009
Altera Corporation
519
(Part 2 of 2)
Parameter
Condition Min
Maximum
global clock
frequency for
16-bit
counter
4 Speed
Grade
MAX IIZ
5 Speed
Grade
6 Speed
Grade
7 Speed
Grade
8 Speed
Grade
Max
Min
Max
Min
Max
Min
Max
Min
Max
Min
304.0
(1)
247.5
201.1
184.1
123.5
Max
Unit
118.3 MHz
Table 524 shows the external I/O timing parameters for EPM570 devices.
Table 524. EPM570 Global Clock External I/O Timing Parameters
(Part 1 of 2)
Parameter
Condition Min
4 Speed
Grade
MAX IIZ
5 Speed
Grade
6 Speed
Grade
7 Speed
Grade
8 Speed
Grade
Max
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Unit
tPD1
10 pF
5.4
7.0
8.7
9.5
15.1
17.7
ns
tPD2
10 pF
3.7
4.8
5.9
5.7
7.7
8.5
ns
tSU
Global clock
setup time
1.2
1.5
1.9
2.2
3.9
4.4
ns
tH
Global clock
hold time
ns
tCO
Global clock to
output delay
10 pF
2.0
4.5
2.0
5.8
2.0
7.1
2.0
6.7
2.0
8.2
2.0
8.7
ns
tCH
Global clock
high time
166
216
266
253
335
339
ps
tCL
Global clock
low time
166
216
266
253
335
339
ps
tCNT
Minimum
global clock
period for
16-bit counter
3.3
4.0
5.0
5.4
8.1
8.4
ns
August 2009
Altera Corporation
520
(Part 2 of 2)
Parameter
Condition Min
Maximum
global clock
frequency for
16-bit counter
4 Speed
Grade
MAX IIZ
5 Speed
Grade
6 Speed
Grade
7 Speed
Grade
8 Speed
Grade
Max
Min
Max
Min
Max
Min
Max
Min
Max
Min
304.0
(1)
247.5
201.1
184.1
123.5
Max
Unit
118.3 MHz
Table 525 shows the external I/O timing parameters for EPM1270 devices.
Table 525. EPM1270 Global Clock External I/O Timing Parameters
MAX II / MAX IIG
3 Speed Grade
Symbol
Parameter
Condition
Min
Max
Min
Max
Min
Max
Unit
tPD1
10 pF
6.2
8.1
10.0
ns
tPD2
10 pF
3.7
4.8
5.9
ns
tSU
1.2
1.5
1.9
ns
tH
ns
tCO
10 pF
2.0
4.6
2.0
5.9
2.0
7.3
ns
tCH
166
216
266
ps
tCL
166
216
266
ps
tCNT
3.3
4.0
5.0
ns
fCNT
304.0 (1)
247.5
201.1
MHz
August 2009
Altera Corporation
521
Table 526 shows the external I/O timing parameters for EPM2210 devices.
Table 526. EPM2210 Global Clock External I/O Timing Parameters
MAX II / MAX IIG
3 Speed Grade
Symbol
4 Speed Grade
5 Speed Grade
Parameter
Condition
Min
Max
Min
Max
Min
Max
Unit
tPD1
10 pF
7.0
9.1
11.2
ns
tPD2
10 pF
3.7
4.8
5.9
ns
tSU
1.2
1.5
1.9
ns
tH
ns
tCO
10 pF
2.0
4.6
2.0
6.0
2.0
7.4
ns
tCH
166
216
266
ps
tCL
166
216
266
ps
tCNT
3.3
4.0
5.0
ns
fCNT
304.0
(1)
247.5
201.1
MHz
August 2009
4 Speed
Grade
MAX IIZ
5 Speed
Grade
6 Speed
Grade
7 Speed
Grade
8 Speed
Grade
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Unit
Without Schmitt
Trigger
ps
With Schmitt
Trigger
334
434
535
387
434
442
ps
Altera Corporation
522
MAX IIZ
4 Speed
Grade
5 Speed
Grade
6 Speed
Grade
7 Speed
Grade
8 Speed
Grade
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Unit
Without Schmitt
Trigger
ps
With Schmitt
Trigger
334
434
535
387
434
442
ps
Without Schmitt
Trigger
23
30
37
42
43
43
ps
With Schmitt
Trigger
339
441
543
429
476
483
ps
1.8-V LVTTL /
LVCMOS
Without Schmitt
Trigger
291
378
466
378
373
373
ps
1.5-V LVCMOS
Without Schmitt
Trigger
681
885
1,090
681
622
658
ps
3.3-V PCI
Without Schmitt
Trigger
ps
3.3-V LVCMOS
2.5-V LVTTL /
LVCMOS
Table 528. External Timing Input Delay tGLOB Adders for GCLK Pins
MAX II / MAX IIG
3 Speed
Grade
I/O Standard
4 Speed
Grade
MAX IIZ
5 Speed
Grade
6 Speed
Grade
7 Speed
Grade
8 Speed
Grade
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Unit
Without Schmitt
Trigger
ps
With Schmitt
Trigger
308
400
493
387
434
442
ps
Without Schmitt
Trigger
ps
With Schmitt
Trigger
308
400
493
387
434
442
ps
Without Schmitt
Trigger
21
27
33
42
43
43
ps
With Schmitt
Trigger
423
550
677
429
476
483
ps
1.8-V LVTTL /
LVCMOS
Without Schmitt
Trigger
353
459
565
378
373
373
ps
1.5-V LVCMOS
Without Schmitt
Trigger
855
1,111
1,368
681
622
658
ps
3.3-V PCI
Without Schmitt
Trigger
ps
3.3-V LVTTL
3.3-V LVCMOS
2.5-V LVTTL /
LVCMOS
August 2009
Altera Corporation
523
Table 529. External Timing Output Delay and t OD Adders for Fast Slew Rate
MAX II / MAX IIG
3 Speed
Grade
I/O Standard
3.3-V LVTTL
3.3-V LVCMOS
4 Speed
Grade
MAX IIZ
5 Speed
Grade
6 Speed
Grade
7 Speed
Grade
8 Speed
Grade
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Unit
16 mA
ps
8 mA
65
84
104
ps
8 mA
ps
4 mA
65
84
104
ps
2.5-V LVTTL /
LVCMOS
14 mA
122
158
195
63
71
88
ps
7 mA
193
251
309
10
ps
1.8-V LVTTL /
LVCMOS
6 mA
568
738
909
128
118
118
ps
3 mA
654
850
1,046
352
327
332
ps
1.5-V LVCMOS
4 mA
1,059
1,376
1,694
421
400
400
ps
2 mA
1,167
1,517
1,867
757
743
743
ps
20 mA
ps
3.3-V PCI
Table 530. External Timing Output Delay and t OD Adders for Slow Slew Rate
MAX II / MAX IIG
3 Speed
Grade
I/O Standard
3.3-V LVTTL
3.3-V LVCMOS
4 Speed
Grade
MAX IIZ
5 Speed
Grade
6 Speed
Grade
7 Speed
Grade
8 Speed
Grade
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Unit
16 mA
7,064
6,745
6,426
5,966
5,992
6,118
ps
8 mA
7,946
7,627
7,308
6,541
6,570
6,720
ps
8 mA
7,064
6,745
6,426
5,966
5,992
6,118
ps
4 mA
7,946
7,627
7,308
6,541
6,570
6,720
ps
2.5-V LVTTL /
LVCMOS
14 mA
10,434
10,115
9,796
9,141
9,154
9,297
ps
7 mA
11,548
11,229
10,910
9,861
9,874
10,037
ps
1.8-V LVTTL /
LVCMOS
6 mA
22,927
22,608
22,289
21,811
21,854
21,857
ps
3 mA
24,731
24,412
24,093
23,081
23,034
23,107
ps
1.5-V LVCMOS
4 mA
38,723
38,404
38,085
39,121
39,124
39,124
ps
2 mA
41,330
41,011
40,692
40,631
40,634
40,634
ps
20 mA
261
339
418
6,644
6,627
6,914
ps
3.3-V PCI
August 2009
Altera Corporation
524
4 Speed
Grade
MAX IIZ
5 Speed
Grade
6 Speed
Grade
7 Speed
Grade
8 Speed
Grade
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Unit
1,225
1,592
1,960
1,858
2,171
2,214
ps
89
115
142
569
609
616
ps
MAX IIZ
3 Speed
Grade
4 Speed
Grade
5 Speed
Grade
6 Speed
Grade
7 Speed
Grade
8 Speed
Grade
Unit
Without Schmitt
Trigger
304
304
304
304
304
304
MHz
With Schmitt
Trigger
250
250
250
250
250
250
MHz
Without Schmitt
Trigger
304
304
304
304
304
304
MHz
With Schmitt
Trigger
250
250
250
250
250
250
MHz
Without Schmitt
Trigger
220
220
220
220
220
220
MHz
With Schmitt
Trigger
188
188
188
188
188
188
MHz
Without Schmitt
Trigger
220
220
220
220
220
220
MHz
With Schmitt
Trigger
188
188
188
188
188
188
MHz
1.8-V LVTTL
Without Schmitt
Trigger
200
200
200
200
200
200
MHz
1.8-V LVCMOS
Without Schmitt
Trigger
200
200
200
200
200
200
MHz
1.5-V LVCMOS
Without Schmitt
Trigger
150
150
150
150
150
150
MHz
3.3-V PCI
Without Schmitt
Trigger
304
304
304
304
304
304
MHz
I/O Standard
3.3-V LVTTL
3.3-V LVCMOS
2.5-V LVTTL
2.5-V LVCMOS
August 2009
Altera Corporation
525
MAX IIZ
3 Speed
Grade
4 Speed
Grade
5 Speed
Grade
6 Speed
Grade
7 Speed
Grade
8 Speed
Grade
3.3-V LVTTL
304
304
304
304
304
304
MHz
3.3-V LVCMOS
304
304
304
304
304
304
MHz
2.5-V LVTTL
220
220
220
220
220
220
MHz
2.5-V LVCMOS
220
220
220
220
220
220
MHz
1.8-V LVTTL
200
200
200
200
200
200
MHz
1.8-V LVCMOS
200
200
200
200
200
200
MHz
1.5-V LVCMOS
150
150
150
150
150
150
MHz
3.3-V PCI
304
304
304
304
304
304
MHz
TDI
tJCP
tJCH
tJPH
tJPSU
tJCL
TCK
tJPZX
tJPCO
tJPXZ
TDO
tJSSU
Signal
to be
Captured
tJSH
tJSZX
tJSCO
tJSXZ
Signal
to be
Driven
Table 534 shows the JTAG Timing parameters and values for MAX II devices.
Table 534. MAX II JTAG Timing Parameters (Part 1 of 2)
Symbol
Min
Max
Unit
55.5
ns
62.5
ns
100
ns
143
ns
tJC H
20
ns
tJC L
20
ns
tJC P (1)
August 2009
Parameter
Altera Corporation
526
Parameter
Min
Max
Unit
tJP SU
ns
tJP H
10
ns
tJP CO
15
ns
tJP ZX
15
ns
tJP XZ
15
ns
tJS SU
ns
tJS H
10
ns
tJS CO
25
ns
tJS ZX
25
ns
tJS XZ
25
ns
Referenced Documents
This chapter references the following documents:
I/O Structure section in the MAX II Architecture chapter in the MAX II Device
Handbook
Hot Socketing and Power-On Reset in MAX II Devices chapter in the MAX II Device
Handbook
Understanding and Evaluating Power in MAX II Devices chapter in the MAX II Device
Handbook
August 2009
Altera Corporation
527
Changes Made
Summary of Changes
Added information for
speed grade 8
August 2009,
version 2.5
Updated Table 52, Table 54, Table 514, Table 515, Table 516,
Table 517, Table 518, Table 519, Table 520, Table 521,
Table 522, Table 523, Table 524, Table 527, Table 531,
Table 532, and Table 533.
November 2008,
version 2.4
October 2008,
version 2.3
July 2008,
version 2.2
March 2008,
version 2.1
December 2007,
version 2.0
Updated Table 513 through Table 524, and Table 527 through
Table 530.
December 2006,
version 1.8
July 2006,
version 1.7
February 2006,
version 1.6
November 2005,
version 1.5
August 2005,
version 1.4
August 2009
Altera Corporation
528
Changes Made
Summary of Changes
December 2004,
version 1.2
Updated timing Tables 5-2, 5-4, 5-12, and Tables 15-14 through 5-34.
June 2004,
version 1.1
August 2009
Altera Corporation
MII51006-1.6
Software
MAX II devices are supported by the Altera Quartus II design software with new,
optional MAX+PLUS II look and feel, which provides HDL and schematic design
entry, compilation and logic synthesis, full simulation and advanced timing analysis,
and device programming. Refer to the Design Software Selector Guide for more
details about the Quartus II software features.
The Quartus II software supports the Windows XP/2000/NT, Sun Solaris, Linux Red
Hat v8.0, and HP-UX operating systems. It also supports seamless integration with
industry-leading EDA tools through the NativeLink interface.
Device Pin-Outs
Printed device pin-outs for MAX II devices are available on the Altera website
(www.altera.com).
Ordering Information
Figure 61 describes the ordering codes for MAX II devices. For more information
about a specific package, refer to the Package Information chapter in the MAX II Device
Handbook.
Figure 61. MAX II Device Packaging Ordering Information
EPM
240
100
ES
Family Signature
EPM:
Optional Suffix
MAX II
Device Type
240:
570:
1270:
2210:
Speed Grade
3, 4, 5, 6, 7, or 8, with 3 being the fastest
Product-Line Suffix
Operating Temperature
Indicates device type
G:
1.8-V VCCINT low-power device
Z:
1.8-V VCCINT zero-power device
2.5-V or 3.3-V VCCINT device
Blank (no identifier):
C:
I:
A:
Package Type
T: Thin quad flat pack (TQFP)
F: FineLine BGA
M: Micro FineLine BGA
Pin Count
Number of pins for a particular package
August 2009
Altera Corporation
62
Referenced Documents
This chapter references the following document:
Changes Made
Summary of Changes
August 2009,
version 1.6
October 2008,
version 1.5
December 2007,
version 1.4
December 2006,
version 1.3
October 2006,
version 1.2
June 2005,
version 1.1
August 2009
Altera Corporation