A New Current-Source Converter Using A Symmetric Gate-Commutated Thyristor (SGCT)
A New Current-Source Converter Using A Symmetric Gate-Commutated Thyristor (SGCT)
A New Current-Source Converter Using A Symmetric Gate-Commutated Thyristor (SGCT)
AbstractIn recent years, extensive semiconductor development has gone into both bipolar and MOS structures for
medium-voltage (MV) applications. However, the progression of
MOS structures in MV applications has been difficult and the isand motor/bearing
sues of module isolation, reliability, and
life continue to limit its acceptance in these applications. A
more suitable device structure and the natural choice for MV
applications is the bipolar thyristor structure. The device that
has been in use for many years, the gate-turn-off thyristor, is
being replaced by the gate-commutated thyristor (GCT). So far,
the GCT has been only thought of as fulfilling the needs for the
voltage-source topology. However, the symmetric GCT (SGCT)
is viable and has significant advantages when implemented in a
pulsewidth-modulated current-source inverter (PWM-CSI). This
paper will describe the design and characteristics of an 800-A
6.5-kV SGCT and the effect of its implementation in a PWM-CSI.
These effects include operation at a higher switching frequency,
elimination/reduction and modification of the snubber circuitry,
reduction in size of the passive components, and a major impact
on the cost of the converter. The paper includes experimental
results on a 4160-V 1250-hp PWM-CSI ac drive.
Index
TermsCurrent-source
converter,
hard-driven
gate-turn-off thyristor, medium-voltage applications, power
semiconductor devices, symmetric gate-commuted thyristor,
variable-speed drives.
I. INTRODUCTION
Fig. 2.
897
Typical waveforms for a CSI. (a) Device current. (b) Device voltage. (c) Inverter output current. (d) Motor current and voltage.
Fig. 4.
Lin
V
nH
A/ s
898
lifetime near
is reduced,
becomes smaller. It is mainly
and with little influence from
influenced by the turn-off
. Fig. 7(b) shows the dependence of recovery characteristics
, maximum recovery
such as maximum recovery current
, recovery tail current
, and
on that
voltage
is reduced,
becomes
position. When the lifetime near
with little influence from
smaller. It is mainly influenced by
. It is seen by Fig. 7(b) that decreasing
is effective for
.
decreasing
Using these features as a basis, the MEPLT process is optimized for the 6.5-kV/800-A SGCT chip and results in dra, and
as compared with
matic improvement in
the conventional symmetrical GTO. The MEPLT technique is
quite suitable to the production of SGCTs with high turn-off
than can be achieved by
capability over a wider range of
conventional NPT structure and GCT technology.
Fig. 5.
C. Edge Termination
B. Wafer Design
The SGCT achieves voltage-blocking capability in both forward and reverse directions by nonpunchthrough (NPT) structure and nearly symmetrical p-n-p ( - - ) transistor in the
wafer (no anode shorts). Fig. 6 shows a unit cell structure in
the SGCT wafer. The NPT structure provides high turn-off and
capability, but its thick n base layer
increases
high
, the turn-off energy
, and the
the on-state voltage
. Increasing these values has a major inrecovery energy
fluence on system losses. In order to improve these parameters, multi energy proton lifetime control technology (MEPLT)
is adopted and the lifetime-controlling condition is optimized.
Using MEPLT, the chip is irradiated several times by various
accelerating energies. Proton irradiation makes it possible to locally reduce the life time at a fixed depth from the chip surface.
The depth of the reduced lifetime region is fixed by the accelerating energy value as shown in Fig. 6(b). That depth influences
both turn-off and recovery characteristics. Fig. 7(a) shows the
,
dependence of turn-off characteristics such as turn-off
, and
on that position. When the
turn-off tail current
The symmetrical device with high-voltage-blocking capabilities has a p-n-p transistor and double-positive bevel structure
at the edge termination. The double-positive bevel structure results in a higher local electric field at a given blocking voltage
than other edge termination structures such as positive bevel
structure. The p-n-p transistor structure has an amplification
function that makes the symmetrical device sensitive to edge
contamination. Therefore, it is important to reduce the electric
field at the edge termination in order to get high blocking stability. The surface electric field of the new double-positive bevel
structure is about 80% of that of the conventional double-positive bevel structure and is similar to that of the single-positive bevel structure adopted in high-voltage diodes. By this,
the new bevel structure achieves high-voltage-blocking stability.
The surface electric fields at 4800 V for this SGCT with the
new double-positive bevel structure, for this SGCT with the conventional double-positive bevel structure and for a conventional
diode with single-positive bevel structure are shown in Fig. 8.
The new double-positive bevel structure results in lower electric
field and nearly equal forward and reverse blocking capability.
Fig. 9 shows the actual symmetric blocking voltage characteristics of the new SGCT.
D. Device Characteristics
Fig. 10 shows the typical turn-off waveform at
kA on a 3000-V bus at
C. Storage time (defined
as from the input of the gate signal to the start of the fall of
the anode current) is about 2 s. It should be noted that the
turn-off current is well above the 800-A rating of the device.
Fig. 11 shows the typical reverse-recovery waveform at
(on-state current)
A,
kA/ s.
V and
C. Fig. 11 compares the reverse-recovery
waveforms of the new SGCT (with lifetime optimized by
MEPLT) to the conventional SGCT (without lifetime opti(on-state current)
A,
mization) at
kA/ s.
V and
C. It is seen that
the MELPT process reduces the peak recovery current
by about 33%. Moreover, the peak recovery voltage
is
is reduced along
decreased by about 1000 V as the
. By optimizing lifetime distribution using MEPLT,
with
Fig. 8.
V).
899
), and E
), and E
Surface electric field simulation for various bevel structures (at 4800
Fig. 10.
capability of the
The turn-on and reverse-recovery
SGCT are increased to 1000 A/ s. This allows for a significant
limiting reactor. In MV
reduction of the size of the
applications, often a series connection of two or more devices
are used. The series connection requires a resistor for static
voltage sharing which is calculated from
(1)
as
decreases with decreasing
and
, recovery
capability is enhanced. Therefore, the new SGCT achieves both
high turn-off and high recovery capability while maintaining
low losses. Some of the more important characteristics of the
6.5-kV/800-A SGCT are given in Table I.
900
(a)
Fig. 12.
(b)
(a) An inverter leg using GTO. (b) An inverter leg using SGCT.
TABLE II
DESIGN TABLE BASED ON PER-UNIT VALUES
TABLE I
MAJOR CHARACTERISTICS OF 6.5-kV/800-A SGCT
TABLE III
LOSS COMPARISON TABLE
by implementing a small
circuit. The values of and
are chosen by limiting several transient voltages to acceptable
levels. First is the effect of the turn-on and turn-off delay times
which is given by the following:
(2)
is the tolerance in the overall turn off delay time,
where
is the commutable current, and is the capacitor in the
circuit.
The recovery voltage unbalance has to be limited as well. This
adds another criterion for choosing the capacitance value, given
by
(3)
where
is the reverse-recovery charge. Since the switching
times of the SGCT have been much improved, only a small capacitor is required to meet the criteria given by (1)(3). The
same capacitor can also act as the snubber for the SGCT if the
following criteria are met.
time constant must be small enough to allow fast
The
charge and discharge for the capacitor and allow for high
switching frequency operation with short pulsewidths.
The voltage overshoot during turn-off and reverse recovery must be limited to acceptable values.
Proper damping in the snubber circuitry must be obtained.
Fig. 13.
901
Harmonic spectra of inverter output current for three different switching frequencies. (a) 300 Hz. (b) 420 Hz. (c) 540 Hz.
902
Fig. 14.
Fig. 15. Voltage and current waveform of SGCT with 420-Hz switching
frequency, full load, full speed, 1250 hp, 4160 V ac drive (200 A/div, 1000
V/div, 2 ms/div).
Fig. 16. Motor current and voltage waveforms, 4000 V, 1250-hp induction
motor (300 A/div, 5000 V/div, 5 ms/div).
903
Hideo Iwamoto was born in Japan in 1943. He received the B.E. degree in electrical engineering from
Osaka University, Osaka, Japan, and the Doctor of
Engineering degree from Yamaguchi University, Yamaguchi, Japan, in 1967 and 2001, respectively.
He was with Mitsubishi Electric Corporation from
1967 to 1991. He was with Powerex, Inc., Youngwood, PA, from 1992 to 1998 and then returned to
Mitsubishi Electric Corporation, Fukuoka, Japan, in
1999. He has been engaged in the design and development of power semiconductor devices.
Mr. Iwamoto is a member of the Institute of Electrical Engineers of Japan.