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    Geit 60004gb Vis

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    saleemut3
    The document discusses GE Inspection Technologies' VIS modular test electronics for ultrasonic testing systems. The VIS system allows for parallel operation of up to 12 channels per module and 5 modules in a system, enabling fast online inspection. It provides digital echo displays and hardware-based echo compression. Main applications include weld inspection, tube testing, and cleanliness examination.

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    Geit 60004gb Vis

    Uploaded by

    saleemut3
    17 views2 pages
    The document discusses GE Inspection Technologies' VIS modular test electronics for ultrasonic testing systems. The VIS system allows for parallel operation of up to 12 channels per module and 5 modules in a system, enabling fast online inspection. It provides digital echo displays and hardware-based echo compression. Main applications include weld inspection, tube testing, and cleanliness examination.

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    The document discusses GE Inspection Technologies' VIS modular test electronics for ultrasonic testing systems. The VIS system allows for parallel operation of up to 12 channels per module and 5 modules in a system, enabling fast online inspection. It provides digital echo displays and hardware-based echo compression. Main applications include weld inspection, tube testing, and cleanliness examination.

    Copyright:

    Attribution Non-Commercial (BY-NC)
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
    17 views2 pages

    Geit 60004gb Vis

    Uploaded by

    saleemut3
    The document discusses GE Inspection Technologies' VIS modular test electronics for ultrasonic testing systems. The VIS system allows for parallel operation of up to 12 channels per module and 5 modules in a system, enabling fast online inspection. It provides digital echo displays and hardware-based echo compression. Main applications include weld inspection, tube testing, and cleanliness examination.

    Copyright:

    Attribution Non-Commercial (BY-NC)
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
    of 2

    GE Inspection Technologies

    Ultrasonics

    Krautkramer Testing Machines


    VIS modular test electronics
    The name VIS stands for new modular test electronics for use in ultrasonic test systems. Set up on VME bus basis, the electronics is designed as 19" plug-in module. A maximum of twelve channels can be operated per ultrasonic module and a maximum of ve modules in a system. The parallel operation of all channels with 20kHz PRF per channel enables a very fast online inspection. The electronics is completely operated via the PC; Windows NT is available as a user-friendly operating system. The system provides a fully digital echo display with a high-resolution A-scan, plus a hardware-based compression of the individual A-scans (EchoMax function). This function ensures that even a short-term event (single shot) will not be overlooked. The test results (amplitudes, time of ight) are available as 8- or 16-bit information at the interfaces. Main elds of application of the VIS system: weld inspection tube testing quick online testing cleanliness examination

    user interface DAC generation

    user interface gates and threshold setting

    total view of the VIS electronics

    GE Inspection Technologies

    Ultrasonics

    Technical Data
    1 to 12 per ultrasonic module, extension possible to max. 40 channels Parallel: Yes, exible pulse cycle scheme is possible Multiplex: In the planning stage, prepared in the system

    Number of channels:

    Echo display
    Digitizing: 90 MHz with 8-bit resolution upsampling to 360 MHz is possible (no EchoMax function) 1x A-SCAN module per ultrasonic plug-in module EchoMax function: Recording of all A-scans with PRF and display of the Maximum scans Parameter assignment: Individual parameter assignment for each channel and cycle

    TDR: 8 per channel and additional 12 per system Path pulse: 2 for rotation and translation; integrated path pulse generator

    Operating modes:

    Interfaces
    VME, Ethernet, IC bus

    Max. pulse repetition frequency:


    20 kHz / channel

    Max. cycle number per channel: 16 Test modes:


    Dual (TR), through-transmission Pulser
    Pulse width: Amplitude: Rise time: < 8 ns Spike pulser 300Vp/50 ohms:

    Inputs

    Preamplier
    Gain: 0 to 110dB, variable Bandwidth: 0.5 to 25 MHz (-3dB), linear Dynamic range: 110 dB in 0.2dB steps Rectication: pos. half-wave, neg. half-wave, full-wave, RF

    DAC
    Dynamic range: 40 dB Slope: 6 dB/s Backwall echo attenuation: Yes

    Test range
    Calibration range: 17 mm to 4.3 m Delay: 0 to 6.4 m

    Operating frequency
    Narrow band: Broadband: 1, 2, 5, 10. 15 MHz 1.4-10; 2.5-18; 0.5-20 MHz
    Application example: cleanliness estimation

    Gates
    Number of gates: per channel 4, of which one gate can be used as echo-start gate (events, amplitude/time of ight) Number of thresholds per gate: 2, 1 with echo-start gate

    Echo evaluation
    Time-of-ight measurement: 16 bits Resolution: 4.17 ns Range: within the entire calibration range with PRF Amplitude: 8 bits Noise suppression: Dual-threshold noise suppression

    GEInspectionTechnologies.com
    We reserve the right to technical modications without prior notice. 2004 General Electric Company. All rights reserved. GEIT-60004GB (11/04)

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