iCC 2005

CAN in Automation

EMI/ESD protection solutions for the CAN bus

J. Lepkowski and B. Wolfe, ON Semiconductor CAN system designers are being challenged to meet stringent Electromagnetic Interference (EMI) and Electrostatic Discharge (ESD) standards while increasing reliability and reducing the size and cost of their products. To solve this dilemma, noise reduction techniques and bus protection devices can be implemented without significantly adding to the cost and complexity of the transceiver circuit. Introduction CAN transceivers must be able to survive the high energy surges produced by transient voltages. Transceivers are available that meet the minimum ISO 7637 specifications; however, a higher immunity level can be achieved using protection circuits. The increased immunity level provides for a more robust communication system. the ISO 115192 and ISO 118983 specifications are popular in automobiles [1]. The single wire bus is defined by SAE J2411 [10] and is typically implemented with an unshielded cable consisting of a signal and a ground wire. The advantages of single wire CAN are simplicity and low cost; however, the noise immunity of a single ended transmission is inherently less than a two-wire differential system.
3.5 V CAN_H 2.5 V

CAN Hardware The connection to the CAN bus is implemented with a transceiver IC that uses either a high-speed, fault tolerant or single wire physical layer protocol. Table 1 provides a summary of the key ISO and SAE physical layer specifications, while Figure 1 provides the waveforms. The ISO 118982 [7] high-speed protocol has excellent EMI immunity due to the noise cancellation characteristics of a differential receiver. The ISO 118982 bus consists of the CAN_H (high) and CAN_L (low) data lines and a common ground signal. A 120 termination resistor is located at each end of the bus to minimize the reflections and ringing on the waveforms. The fault tolerant system uses a two wire differential bus; however, the transceivers automatically switch to a single wire mode if either the CAN_H or CAN_L signal lines are shorted to ground or power. There are three different ISO specifications that are used to define the fault tolerant bus. ISO 11992 is widely used in trucks, while 02-16

V CAN_L 2.5 V

High Speed CAN (ISO11898-2)

Bus Logic States
Recessive: V 0.5 V Dominant: V 0.9 V

1.5 V Recessive Dominant Recessive

5.0 V 3.6 V CAN_H CAN_L CAN_H 1.4 V 0V Recessive Dominant

Fault Tolerant CAN (ISO11898-3)

Bus Logic States
Recessive: CAN_H > CAN_L Dominant: CAN_H < CAN_L

CAN_L

4.0 V

Single Wire CAN (SAE J2411)

0.1 V

CAN_Bus 0.1 V

Bus Logic States

Recessive: CAN_Bus < 1.6 V Dominant: CAN_Bus > 3.4 V

Recessive

Dominant

Recessive

Figure 1: CAN bus waveforms.

iCC 2005

CAN in Automation

Table 1: CAN Physical Layer and EMI Specifications

Parameter Physical Layer Spec. Speed Min. / Max. Supply Voltage Common Mode Voltage (V) Termination Resistance Conducted Power line EMI Req. Conducted Data line EMI Req. High Speed CAN ISO 11898-2 1 Mbits/s @ 40 m 125 kbits/s @ 500 m 12V System: -3 /16 V 24V System: -3 / 32 V min. / nom. / max. CAN_L: -2.0 / 2.5 / CAN_H: / 2.5 / 7.0 120 resistors located at each end of the bus Recommended tests: ISO 7637-1 pulse 1, 2, 3a, 3b, 5 Specified tests: ISO 7637-3, pulse a, b Recommended tests: ISO 7637-1, pulse 1, 2 Recommended level 8 kV (contact) 15 kV (air) Fault Tolerant CAN ISO 11519-2, ISO 11992, ISO-11898-3 125 kbits/s 12V System: -3 /16 V 24V System: -3 / 32 V min. / nom. / max. CAN_L: -2.0 / 2.5 / CAN_H: / 2.5 / 7.0 Separate resistors located at each node, value set by number of nodes Recommended tests: ISO 7637-1 pulse 1, 2, 3a, 3b, 5 Specified tests: ISO 7637-3, pulse a, b Recommended tests: ISO 7637-1, pulse 1, 2 Recommended level 8 kV (contact) 15 kV (air) Single Wire CAN SAE J2411 33.3 / 83.3 kbits/s Normal / Diag. mode 12 V System: -3 / 16 V CAN_Bus offset voltage = 1 V (max.) Resistor located at each node, value set by number of nodes Recommended tests: ISO 7637-1 pulse 1, 2, 3a, 3b, 5 Recommended tests: ISO 7637-1, pulse 1, 2 ISO 7637-3, pulse a, b Specified level: 8 kV (contact) 15 kV (air)

ESD Req.

*SDS = Honeywell Smart Distribution System

CAN Transceiver Specifications The critical CAN transceiver specifications that must be evaluated in order to select a protection circuit include: 1. Maximum supply voltage 2. Common mode voltage 3. Maximum transmission speed 4. Coupled electrical disturbance 5. ESD rating Maximum Supply Voltage The turn-on voltage of the protection circuit should be greater than the supply voltage, but less than the CAN transceivers maximum input specification. For example, a TVS device with a breakdown voltage of approximately 30 V should be chosen for a 12 V system. This ensures that a surge voltage will not exceed the maximum input rating of most CAN transceivers. Also, a TVS device with this value will withstand an indefinite short between the power and signal lines, and will provide the ability to jump start a 12 V battery from a 24 V power source. Common Mode Voltage 02-17 A common mode voltage is created when there is a significant difference in the voltage potential between the ground reference of the transmitting and receiving nodes. ISO 118982 specifies that the data signal line voltage can be offset by as much as 2.0 V above or below their nominal voltage levels. Maximum Transmission Speed The transmission speed of the data line signals corresponds to a maximum capacitance specification on the CAN data lines. Minor distortion on the signal lines is acceptable if the capacitance on the CAN_H and CAN_L lines is identical. It is not possible to tightly match discrete capacitors or the capacitance of a TVS device; thus, the data line capacitance should be as small as possible. A design tradeoff exists because the energy absorption rating of a TVS device typically increases with capacitance. Coupled Electrical Disturbances A CAN module must be immune to survive the high energy transients that are generated on the power supply lines [2].

iCC 2005 Noise is coupled into the data line signals because the power and data lines are often located inside the same wire bundle. The coupled noise produces a surge voltage that can effect the operation and damage the transceiver. The Joffe study correlates the magnitude and source of transients on a bus to the ISO 7637 specification [8]. ESD Rating An ESD event occurs when a charged object such as a person touches or comes in close proximity to the connector pins or cable. CAN transceivers have a higher ESD rating than a standard IC; however, their ESD levels are typically below the rating of a TVS device. It is recommended that a CAN network should have a contact rating of at least 8.0 kV and a noncontact or air rating of 15 kV. Protection Devices In most applications a combination of multiple TVS protection devices are required to provide a robust system [9]. The options available to protect from EMI and ESD interference include: 1. Shielded twisted wire pair cables 2. Filters 3. TVS clamping devices Shielded Twisted Wire Pair Cables A shielded cable is an effective tool to prevent radiated interference from introducing a noise voltage on the signal wires. Shielded twisted-pair cables minimize the voltage induced on the signal lines. The noise on each wire will be essentially equal, which is the assumption needed for the common mode rejection ratio (CMRR) feature of the CAN receivers differential amplifier to cancel the interference. Filters Filters can be used to provide noise protection by attenuating the magnitude of the noise signal. Resistor-capacitor (RC), inductor-capacitor (LC), common mode chokes, ferrite beads and capacitive feedthrough filters are popular filter options. Filters offer the advantage of noise

CAN in Automation reduction; however, they may not limit the surge voltage to a safe value. TVS Clamping Devices An avalanche TVS diode or a Metal-OxideVaristor (MOV) can be used to absorb the transient energy of a surge event [3]. These devices have a fast turn-on time of less than 1.0 ns and can clamp the transient voltage to a value that will not exceed the transceivers voltage rating. Low capacitance bidirectional TVS diodes and MOVs minimize the signal distortion and will not clamp the data lines if the signals are offset by the common mode voltage. TVS diodes are similar to a zener diode; however, they have a larger junction area than a standard zener. They are designed to clamp a short duration transient surge pulse, while a zener is designed to regulate a lower steady state voltage. A bidirectional diode consists of two unidirectional diodes and has a clamping voltage equal to the breakdown voltage of the diode that is reversed biased plus the voltage drop of the second diode that is forward biased. MOVs function as a nonlinear resistor with electrical characteristics similar to a bidirectional zener diode. The main advantage of MOVs is that they provide clamping protection at a relatively low cost. The main disadvantage is that the clamping voltage is typically higher than a comparable zener diode. Also, the impedance and breakdown voltage of some MOVs decreases over the life of the part. Protection Circuits TVS Clamping Circuit Figure 2 provides an example of a TVS clamping circuit that can be created using either TVS diodes or MOVs. This circuit provides low cost surge protection; however, only minimal noise filtering is achieved due to the inherent capacitance of a diode or MOV. Additional noise filtering can be provided by using RC filters or a common mode choke. 02-18

iCC 2005

CAN in Automation A combination of a common mode choke, capacitors and TVS diodes can be used to solve the most stringent EMI emission and immunity requirements, as shown in Figure 5. Noise entering the CAN node is attenuated by the filters formed by the inductance of the choke filter and capacitors CH1 and CL1. In contrast, capacitors CH2 and CL2 provide a filter to reduce the emissions or noise that exits the transceiver. The TVS diodes are used to clamp the surge to a safe value.
Common Mode Choke 120
CAN Bus

CAN_H CAN Transceiver CAN_L 120 TVS Protection Device

Figure 2: TVS clamping circuit. Common Mode Choke Circuits The common mode choke circuit, shown in Figure 3, attenuates the noise that is common to both of the data lines. Chokes function by providing high impedance for common mode signals and low impedance for differential signals, which increases the CMRR of the transceiver. Chokes are an effective device to implement filtering without adding a large amount of distortion on high-speed data lines. TVS devices can be added to a choke to provide clamping protection.
Common Mode Choke 120 CAN Bus

CAN_H

CAN Transceiver CAN_L CH1 CL1 CH2 CL2

Figure 5: Multiple TVS device circuit. Single Wire Circuit Figure 6 shows the single wire protection circuit that is recommended in the SAE J2411 specification [10]. The circuit consists of a bidirectional TVS diode and a LC filter. The TVS diode provides overvoltage protection, while the LC filter attenuates the emissions exiting the CAN node.
CAN_Bus 47 H CAN Bus

CAN_H

CAN Transceiver CAN_L

Figure 3: Common mode choke circuit. Split Termination Circuit Figure 4 shows a split termination circuit. The termination circuit functions as a lowpass filter and is formed by two equal value resistors and a capacitor. A common mode signal is terminated through a capacitor that shunts the high frequency noise signal to ground. The TVS clamping devices provide the clamping protection.
CAN_H

CAN Transceiver

RLoad Load 220 pF

Figure 6: Single wire protection circuit. EMI Tests The ISO 7637-1 [5], -2 and -3 [6] specifications can be used to measure a networks immunity to transient noise sources. Also, the reliability of the system can be verified by repeating the surge voltage for an extended period. The power supply line tests are provided by ISO 76371 (12V systems) and -2 (24V systems), while the data line tests are given in -3. Other popular tests include the IEC 610004-4 Electrical Fast Transient (EFT) [4] and IEC 61000-4-5 surge test. Table 2 02-19

CAN Transceiver

RH 60 RL 60 CS 10 nF

CAN Bus

CAN_L

Figure 4: Split termination circuit. Multiple Suppression Device Circuit

iCC 2005

CAN in Automation

provides a summary of the conducted EMI the NUP2105L TVS diode. tests and the immunity level provided by Table 2: ISO 7637 and IEC 61000-4 Tests Test Pulse Specifications NUP2105L Test Noise Source
1 ISO 7637-1 12V Power Supply Lines Vs = 0 to -100 V, Imax = 10 A Test time = 5000 pulses, Ri = 10 , tr < 1 s, td_10% = 2000 s, t1 = 2.5 s, t2 = 200 ms, t3 = 100 s Vs = 0 to +100 V, Imax = 10 A Test time = 5000 pulses, Ri = 10 , tr < 1 s, td_10% = 50 s, t1 = 2.5 s, t2 = 200 ms Vs = -60 V, Imax = 1.2 A Test time = 10 minutes, Ri = 50 , tr = 5 ns, td_10% = 100 ns, t1 = 100 s, t2 = 10 ms, t3 = 90 ms Vs = +40 V, Imax = 0.8 A parameters same as a Vopen circuit = 2 kV, Ishort circuit = 40 A, (Level 4), Test time = 1 minute, Ri = 50 , tr < 5 ns, td_50% = 50 ns, tburst = 15 ms, fburst = 2 to 5 KHz, trepeat = 300 ms tr x td 10% Vopen circuit = 1.2 x 50 s, Ishort circuit = 8 x 20 s, Ri = 42 , Imax (Class 2) = 12 A Itest_max = 1.75 A Voc_test = 54.8 V Idestruct = 4.1 A DUT in parallel with disconnected inductive load

Itest_max = 10.2 A DUT in series Voc_test = 141.6 V with disconnected Idestruct = 12.1 A inductive load Itest_max = 50 A Voc_test = 2540 V Switching noise of inductive loads, relay and switch chatter

a ISO 7637-3 Data Line EFT b

IEC 61000-4-4 Data Line EFT

Fig. 12

Itest_max = 50 A Voc_test = 2540 V

Switching noise of inductive loads, relay and switch chatter

IEC 61000-4-5

Fig. 10

Itest_max = 10 A Lightning, power Voc_test = 461.3 V line and load switching Idestruct = 13.2 A

Notes: 1. DUT = Device Under Test 2. Rise time (tr) = pulse width from 10% to 90% 3. Voc_test = equivalent open circuit voltage 4. Itest_max = peak current used during surge test 5. Idestruct = current level that damages TVS device Non-repetitive Surge Immunity respectively. Figure 9 shows the ability of a TVS diode to clamp the ISO 7637-1 pulse 2 surge voltage.

Figure 7: ISO 7637-1, pulse 1 Figure 8: ISO 7637-1, pulse 2 A non-repetitive surge is tested by a transient voltage with a pulse width of typically 20 s to 2000 s and a repeat rate of usually one pulse per second. These tests are used to test a modules immunity from transients caused by power switching, sudden load changes or a short circuit fault in the power distribution system. The ISO 76371 test pulses 1 and 2 are shown in Figures 7 and 8, 02-20

iCC 2005

CAN in Automation

NUP2105 NUP2105L L ISO 7637 pulse - 1 -1 Pulse 2 ISO 7637 2 tr = 1 s

10 s/div . 10 s/div .

TVS Clamping Voltage TVS

Clamping

10.2 10.2 A

39.6 V 39.6

td = 50 s t = 50 s 1 CurrentsTest Pulse s x 50 Wavefor m

Figure 9: ISO 7637-1, pulse 2 test. The ISO 6100045 specification serves as a standard test to verify the immunity of a system to a non-repetitive surge. The surge voltage waveform, shown in Figure 10, is defined by a double exponential pulse with a specified rise time (tr) of 8 s and a duration (td) of 20 s. The 8 s x 20 s test is also often used to quantify the power rating of a TVS device.

Figure 11: ISO 7637-3 pulse b test. The ISO 76373 test pulses a and b, along with the IEC 6100044 specification can be used to define the repetitive surge immunity of the system. Repetitive surges are also identified as the electrical fast transients (EFT) and are modeled by a recurring pattern of a burst of high voltage spikes. Figures 11 shows the ISO 76373 pulse b test waveform. The ISO 7637-1 pulse 3a and 3b, and ISO 7637-3 a and b tests are similar, except that the ISO7637-1 test waveforms are offset by the battery voltage. The IEC 61000-4-4 test waveform is shown in Figure 12.
Voltage
90%

Figure 10: IEC 61000-4-5 test results. Repetitive Surge Immunity Repetitive surges are represented by 50 ns transient pulses in bursts of 15 to 300 ms long. These tests are used to test a modules immunity from noise sources such as inductive load switching, relay contact chatter and ignition system noise. Repetitive switching transients are coupled into the data line cables because of the parasitic capacitance and inductance inherent in the wiring harness.

50% 10%

td

Voltage

tr

Time

tburst = 15 ms trepeat = 300 ms

Time

Figure 12: IEC 61000-4-4 EFT test ESD Tests The ESD immunity level can be specified by several different tests. The human body model (HBM) test is typically listed on IC datasheets, while the IEC 61000-4-2 specification is often used for system level 02-21

iCC 2005 tests. Both ESD specifications are designed to simulate the direct contact of a person to an object such as the I/O pin of a connector. ESD can produce gradual changes to the impedance of an I/O circuit that can be difficult to quantify. Often, the circuit may continue to operate and the complete failure may not show up until after an extended time. The NUP2105L TVS diode has an IEC contact rating of 30 kV, a level which will improve the reliability of the system. Surge Protection Test Specifications Test Setup System level surge tests typically use a coupling clamp and the Input/Output (I/O) cable is placed between two parallel metal plates. The test voltage is applied to the plates, which induces a surge voltage on the wires. In contrast, CAN transceivers use a capacitor or resistor to couple the noise signal to the IC pins, while TVS devices are connected directly to the signal generator. Figure 13 shows that the IC and TVS device test setups remove the cable as a test variable; however, the results of the test must be carefully analyzed. The impedance of the coupling capacitor has an effect on the transceivers surge specification. All capacitors block DC; however, the equivalent series resistance (ESR) and inductance (ESL), and the magnitude of the capacitor may limit the transfer of the high frequency energy of a surge pulse. The impedance of a capacitor (Zc) can be calculated from the equation listed below, which assumes that the ESR and ESL terms are negligible.
System Test Setup R
i

CAN in Automation

VS

CAN Module

Coupling Clamp

CAN Module

Signal Generator IC Test Setup Ri 1 nF VS Signal Generator TVS Device Test Setup R
i

1 nF CAN_H CAN Transceiver CAN_L

Vout

VS Signal Generator

Figure 13: Surge test configurations. The frequency of a surge waveform can be estimated from the rise time (tr) of the pulse as shown below.

EMI Frequency "

1 # ! tr

ZC "

1 1 " $ ! C 2# ! f ! C

The ISO 7637-1 pulse 1 and 2 tests have a rise time of 1s, which corresponds to a frequency of 318 kHz, while the 5 ns rise time of the ISO 7637-3 pulse a and b tests has a frequency of 63.7 MHz. If a 1 nF capacitor is used to couple the surge, the capacitors impedance will equal 500 at 318 kHz and 50 at 63.7 MHz. The capacitor impedance must be added to the voltage generators source impedance (Ri) to determine the maximum current. Internal Transceiver Protection Circuits Many of the CAN transceivers are built with a BiCMOS process. Bipolar transistors (BJTs) typically have a higher breakdown voltage than a CMOS device; thus, the BJTs are used in the circuits that connect to the I/O pins. The BJTs provide protection by having a breakdown voltage that exceeds the amplitude of some transients, such as the high energy, long duration test pulses. The negative of using 02-22

iCC 2005 the breakdown voltage as the protection method is that the amplitude of the short duration pulses often will exceed the BJTs specification. Internal zener diodes and clamping diodes can be used to provide surge protection. The zeners will clamp the surge voltage; however, they are relatively large and increase the die size. A diode array can be used to connect the I/O pin to the power supply (VDD) and ground (VSS) pins through a diode. The diode clamp limits a surge voltage to a voltage that is equal to the diodes forward voltage drop above VDD or below VSS. The power energy absorption capability of zeners and clamping diodes is directly proportional to size; therefore, it usually is not practical to have an integrated device that can absorb the energy of the ISO 7637 pulses.

CAN in Automation

IC is determined by both voltage and current, and most data sheets provide limited information on the maximum current rating. Also, the transceiver transient ratings are typically specified for a single transient event, while protection circuits provide immunity for an indefinite amount of surges. A combination of filters and TVS clamping devices will provide noise attenuation and clamp a surge voltage to a safe level. Filter circuits help prevent failed transmissions due to noise, while the TVS devices protect against damaging transient surge voltages. These protection circuits are relatively inexpensive and provide for a simple solution that supplements the immunity level of a CAN transceiver.
References [1] [2] Application Hints Fault-tolerant CAN Transceiver, Version 3.1, Philips Semiconductors, 2001. Cherniak, S., AN843 A Review of Transients and Their Means of Suppression, ON Semiconductor, 1982. Durham, M., Durham, K. and Durham, R., A Performance Evaluation of Transient Voltage Suppression Devices, IEEE Industry Applications Magazine, Sept. / Oct., 2002. IEC 61000-4-4, EMC - Part 4-4: Testing and Measurement Techniques Electrical Fast Transient/Burst Immunity Test, International Electromechanical Commission (IEC), 2004. ISO 7637-1, Electrical Disturbance by Conduction and Coupling Passenger Cars and Light Commercial Vehicles with Nominal 12 V Supply Voltage Electrical Transient Conduction along Supply Lines Only, International Standard Organization (ISO), 2002. ISO 7637-3, Electrical Disturbance by Conduction and Coupling Electrical Transient Transmission by

PCB Layout Recommendations The PCB layout is critical to maximize the effectiveness of the CAN protection circuit. The following PCB guidelines are recommended: 1. Locate the protection devices close to the I/O connector. This allows the devices to absorb the energy of the transient voltage before it can be coupled into the adjacent traces on the PCB. 2. Minimize the loop area for the highspeed data lines, as well as the power and ground lines to reduce the radiated emissions and the susceptibility to RF noise. 3. Use ground planes to reduce the parasitic capacitance and inductance of the PCB. Conclusion

[3]

[4]

[5]

Many CAN transceivers have transient voltage ratings that exceed the ISO 7637 specifications; however, external protection circuit still should be used. The maximum voltage of an IC is specified at the destructive point and latent damage may occur at a level well below the ICs transient rating. The surge capability of an
02-23

[6]

iCC 2005 Capacitive and Inductive Coupling via Lines Other Than Supply Lines, ISO, 1995. [7] ISO 11898-2, Road Vehicles Controller Area Network (CAN), Part 2: High-Speed Medium Access Unit, ISO, 2003 [8] Joffe, E., Power Line Transients on a Bus due to the Operation of the Electrical Systems, International Symposium on EMC, pages 758761, 1999 [9] Lepkowski, J., AND8169 - EMI/ESD Protection Solutions for the CAN Bus, ON Semiconductor, 2004. [10] SAE J2411, Single Wire CAN Network for Vehicle Applications, February 2002.

CAN in Automation

Jim Lepkowski ON Semiconductor 5005 East McDowell Road Phoenix, AZ 85008 (602) 244 - 5473 [email protected] Brandon Wolfe ON Semiconductor 5005 East McDowell Road Phoenix, AZ 85008 (602) 244 - 3280 [email protected]

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