Motif Parameters of ISO 12085: '96

Motif parameters of ISO12085: 96
Motif
A portion of the primary profile between the highest points of two local peaks of the profile, which are not necessarily adjacent.
Hint of surface texture measurement

Roughness parameter conversion
The parameter ratio Ra/Rz (Rmax, Ry )=0.25 is applicable only to triangle profile. Actual profiles have different parameter ratios according to the form of profile.
0.64 3.2 16 80 2.5 2.5 8 25
Measuring condition
Default A=0.5mm, B=2.5mm, Rn=16mm
A (mm 0.02 0.1 0.5 2.5 B mm Rn mm s m 0.1 0.5 2.5 12.5
Motif depths H j & H j +1

Depth measured perpendicular to the general direction of the primary profile.
Rectangle: Ra/Rz =0.5 Sinusoidal: Ra/Rz =0.32 Triangle: Ra/Rz =0.25
Motif length Ar i or AWi

Length measured parallel to the general direction of the profile.
Indication of ISO1302: 02
local peak of profile local peak of profile
Lathed, Milled: Ra/Rz =0.16 to 0.26

limit value
Roughness motif
s
R n
R parameter
Ground, Sand blasted: Ra/Rz =0.10 to 0.17 Honing, Lapped: Ra/Rz =0.05 to 0.12
Hj
Hj + 1 AR i (AW i)
Waviness motif
R n
W parameter
limit value
(default value need not to be indicated)
Pulse (Duty ratio 5%): Ra/Rz =0.095
Roughness motif: Motif derived by using the ideal operator with limit value A. Limit value A: Maximum length of roughness motif to separate waviness motif. Upper envelope line of the primary profile (Waviness profile): Straight lines joining the highest points of peaks of the primary profile, after conventional discrimination of peaks. AR: Mean spacing of roughness motifs: The arithmetical mean value of the lengths AR i of roughness motifs, within the evaluation length, i.e.
Display aspect ratio & Stylus fall depth in valley

Roughness profile usually displayed as much magnified height deviations than wavelength. Displayed valley looks sharp but actually wide. Stylus can contact to bottom of valley. Depth error with stylus unable to contact on triangle valley is; = r tip (1/cos 1) <15, or H/L=0.1-0.01 on machined surface. r tip = 2m High magnification ratio profile on display 2000
AR = 1 R= 1
i=1
AR i
m
(n: Total number of roughness motifs)
R: Mean depth of roughness motifs: The arithmetical mean value of the depths Hj of roughness motifs, within the evaluation length, i.e.
j=1
Hj
m = 2n
Rx: Maximum depth of roughness motifs: The maximum value of the depths Hj of roughness motifs, within the evaluation length.
Primary profile Waviness profile
20 Actual magnification ratio profile on surface

Hj ARi Hj + 1
Rn
Roughness motif
Surface Texture Contour Measuring Instruments
2000
rtip = 2m
H
2000
Waviness motif: Motif derived on upper envelope line by using ideal operator with limit value B Limit value B: Maximum length of waviness motif AW: Mean spacing of waviness motifs: The arithmetical mean value of the lengths Awi of waviness motifs, within the evaluation length, i.e.
Profile distortion with cutoff

Roughness profile will have bigger profile distortion & smaller amplitude when cutoff c is short. Primary profile P
AW =
1 n
n
R= 1
AWi
(n: Total number of waviness motifs)
W: mean depth of waviness motifs: The arithmetical mean value of the depths HWj of waviness motifs, within the evaluation length, i.e.
W = m HW j j=1
m = 2n
Wx: Maximum depth of waviness: The largest depth HW j, within the evaluation length. Wte: Total depth of waviness: Distance between the highest point and the lowest point of waviness profile.
Waviness profile
Roughness profile R phase correct c 0.8mm
Roughness profile R phase correct c 0.25mm

HW j HW j + 1 Wx
Roughness profile with 2RC filter c 0.25mm have big distortion according to phase shift.
Waviness motif
AWi
Rn
303
Surface TextureContour Measuring Instruments
Explanation of Surface CharacteristicsStandards Comparison of national standards of surface texture measurement

ID. of national standard country Specification
Primary profile P Profile format Evaluation length Maximum height
JIS B0601-82 JIS B0031-82
ANSI B46.1-85
NF E05-015(84) NF E05-016(78) NF E05-017(72) former France

Analog signal without filtering not defined Pt Pp, Pa, (Tp)c, R, AR, Kr, W, Wmax, Wt, AW, Kw Pt 0.8 - 0.6
ISO468-'82 ISO4287/1-84 ISO4288-85 ISO1302-'78 former ISO

Analog signal without filtering
former Japan
Analog signal without filtering 1 sampling length 0.25, 0.8, 2.5, 8, & 25 Rmax (S indication) Rz (Z indication) Rmax=1.6 Rmax=0.8 m mm 2RC c L=3 c or over TL=L=3 c or over Rmax, Rz 0.8m 0.8 < Rmax, Rz 6.3m 6.3 < Rmax, Rz 25m Ra (a indication) optional Ra 12.5m 12.5 < Ra 100m 3.2 1.6
former U.S.A.
Analog signal with low pass filtering
P profile parameter
Ten point height Other P parameters Motif parameters Indication of maximum height < 1.5m Unit of height Unit of length Filter
m or in. mm or in. 2RC B cutoff value 2.5m L:1.3-5mm@B 0.25 L:2.4-8mm@B 0.8 L:5-15mm @B 2.5 Peak-to-Valley Height (Rmax, Ry ) (Rz ) (Rp )
m mm 2RC c R L=nR Ry Rmax Rz Rp not defined not defined not defined Rmac 1.6
m mm 2RC c R Rn = n R
Roughness profile R
Long cutoff Short cutoff Sampling length Evaluation length Maximum height
Ry Ry max Rz Ry 5 Rp, Rp max, Rp 5, Rm, Rc

0,1 < Rz, Ry 0,5m 0,5 < Rz, Ry 10m 10 < Rz, Ry 50m
R profile Height parameter
Maximum peak to valley height Ten point height Average peak to valley height Other peak height parameters 0.25mm
Rr & c for peak height parameter

Surface Texture Contour Measuring Instruments
0.8mm 2.5mm
Indication of Maximum height in case of Rz < 1.5m Arithmetic average root mean square Skewness, kurtosis 0.25mm Rr & c for Ra on non-periodic profile 0.8mm 2.5mm Indication of Ra in case of 1.5 < Ra < 3.1m Mean spacing
Ry = 1.6
R profile averaging parameter
Ra
(Rq ) (Skewness, Kurtosis) 0.0063 < Sm 0.05m 0.02 < Sm 0.16m 0.063 < Sm 0.5m 125 63
Ra Rq Sk, Ek not defined not defined not defined Ra 1.6 - 3.2
Ra Rq Sk
0,02 < Ra 0,1m 0,1 < Ra 2m 2 < Ra 10m 3.2 1.6 N8 N7
average value of all sampling lengths
Roughness spacing (tp) (Peak count Pc ) average value of all sampling lengths
Sm q S, a, a, q not defined not defined not defined
Sm
q
R profile other parameter
RMS slope material ratio Other parameters Average 16% rule Maximum rule
tp S, a, a, q, Lo, D
16% rule default Max rule for parameter with suffix "max"
Comparison rule of measured value with tolerance limits
304

Motif Parameters of ISO 12085: '96

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Motif Parameters of ISO 12085: '96

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Motif parameters of ISO12085: 96

Hint of surface texture measurement

Motif depths H j & H j +1

Rectangle: Ra/Rz =0.5 Sinusoidal: Ra/Rz =0.32 Triangle: Ra/Rz =0.25

Motif length Ar i or AWi

Lathed, Milled: Ra/Rz =0.16 to 0.26

(default value need not to be indicated)

Pulse (Duty ratio 5%): Ra/Rz =0.095

Display aspect ratio & Stylus fall depth in valley

(n: Total number of roughness motifs)

20 Actual magnification ratio profile on surface

Surface Texture Contour Measuring Instruments

Profile distortion with cutoff

(n: Total number of waviness motifs)

Roughness profile R phase correct c 0.8mm

Roughness profile R phase correct c 0.25mm

Surface TextureContour Measuring Instruments

Explanation of Surface CharacteristicsStandards Comparison of national standards of surface texture measurement

JIS B0601-82 JIS B0031-82

NF E05-015(84) NF E05-016(78) NF E05-017(72) former France

ISO468-'82 ISO4287/1-84 ISO4288-85 ISO1302-'78 former ISO

Ry Ry max Rz Ry 5 Rp, Rp max, Rp 5, Rm, Rc

R profile Height parameter

Rr & c for peak height parameter

R profile averaging parameter

Ra Rq Sk, Ek not defined not defined not defined Ra 1.6 - 3.2

average value of all sampling lengths

Sm q S, a, a, q not defined not defined not defined

R profile other parameter

Comparison rule of measured value with tolerance limits

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