Multiple-detect test sets have been shown to be ef- fective in lowering defect level. Other researchers have noted that observing the effects of a defect can be con- trolled by sensitizing affected sites to circuit outputs but defect excitation is inherently probabilistic given a de- fect's inherent, unknown nature. As a result, test sets that sensitize every signal line multiple
Kumar Narasimhan Dwarakanath hasn't uploaded this paper.
Let Kumar Narasimhan know you want this paper to be uploaded.
