Academia.eduAcademia.edu
paper cover icon
High-speed electrical testing of multichip ceramic modules

High-speed electrical testing of multichip ceramic modules

IBM Journal of Research and Development, 2000
Abstract
This paper reports on the successful application of very-high-performance robotics in the electrical testing of multichip modules using only two probes, breaking with the old traditional array of probes as the primary test method. Complete production line tools include two high-speed Hummingbirdt probing robots and precise x-y tables to carry them and a fast, accurate opens-shorts test. To ensure fast

D. Manzer hasn't uploaded this paper.

Let D. know you want this paper to be uploaded.

Ask for this paper to be uploaded.