Greg Meyers

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ida idayu muhamad

Universiti Teknologi Malaysia - UTM

Virginie Boucher

CSIC (Consejo Superior de Investigaciones Científicas-Spanish National Research Council)

Krishanu Saha

University of Wisconsin-Madison

DR.GIRISH JOSHI

VIT University

Sudheesh K Shukla, PhD

LOVELY PROFESSIONAL UNIVERSITY

Juan Antonio Gabaldón

Universitat de València

Muhammad Khusairy Bakri

Washington State University

Jana Javornik

University of East London

Gwen Robbins Schug

University of North Carolina at Greensboro

Gabriel Gutierrez-Alonso

University of Salamanca

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Papers by Greg Meyers

The area‐reconstruction h‐dome technique and its efficient Python implementation for improved particle size image analysis

Microscopy Research and Technique

Characterization of Multi-Phase and Multi-Component Polymer Systems Using the Atomic Force Microscope

Microscopy and Microanalysis, 1999

Recent advances have been made on two fronts regarding the capability of the atomic force microsc... more Recent advances have been made on two fronts regarding the capability of the atomic force microscope (AFM) to characterize the mechanical response of polymers. Phase imaging with the AFM has emerged as a powerful technique, providing contrast enhancement of topographic features in some cases and, in other cases, revealing heterogeneities in the polymer microstructure that are not apparent from the topographic image. The enhanced contrast provided by phase images often allows for identification of different material constituents. However, while the phase changes of the oscillating probe are associated with energy dissipation between the probe tip and the sample surface, the relationship between this energy dissipation and the sample properties is not well understood.As the popularity of phase imaging has grown, the capability of the AFM to measure nanoscale indentation response of polymers has also been explored. Both techniques are ideal for the evaluation of multi-phase and multi-c...

Tip-surface forces during imaging by scanning tunneling microscopy

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 1991

The effect of compressive and shear forces between tip and surface during the operation of the sc... more The effect of compressive and shear forces between tip and surface during the operation of the scanning tunneling microscope (STM) is illustrated with examples obtained both in air and vacuum environments. We show that at typical gap resistances used in STM (≤20 GΩ) these forces can have significant effects. Compressive or repulsive forces give rise to anomalous topographic corrugations (elastic deformations) as well as to permanent damage (inelastic or plastic deformation). These forces also cause the anomalously low values obtained in measurements of the tunneling barrier height. The effects of shear forces when imaging weakly bound material will also be demonstrated.

Greg Meyers

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