File:Micron 45 nm NOR Flash Data Retention.png
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Summary
| Description |
English: Data (stored as threshold voltage) is lost at an exponential rate, dependent on temperature.[1] |
| Date | |
| Source | Own work |
| Author | Naturalion |
Licensing
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Reference
- ↑ M. Calabrese et al., ICICDT 2013.
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 13:50, 23 June 2022 | | 481 × 288 (8 KB) | Naturalion | Uploaded own work with UploadWizard |
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