File:Simple-TEM-beam-path.jpg

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Description
English: This is a simple sketch of the beam path of the electrons in a TEM after the illumination system. A Parallel beam of electrons enters the speciemen and are scattered in varius directions. The objective lens is used to collect all scattered beams originating from the same point on the sample in one point in the image plane (bottom). Note also that in the back focal plane (marked 'diffraction pattern') electrons originating at different point on the sample, but scattered in the same direction, are collected. Observing the electrons in this plane gives the diffraction pattern, containing information on the angular scattering distribution of the electrons. The diffraction pattern and the image are related through a Fourier transform.
Date 20 October 2005 (original upload date)
Source Transferred from en.wikipedia to Commons. Transfer was stated to be made by User:gretana.
Author Oysteinp at English Wikipedia
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Oysteinp at the English-language Wikipedia, the copyright holder of this work, hereby publishes it under the following license:
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The original description page was here. All following user names refer to en.wikipedia.
  • 2005-10-20 06:21 Oysteinp 787×653×8 (103055 bytes) This is a simple sketch of the beam path of the electrons in a TEM after the illumination system. A Parallell beam of electrons enters the speciemen and are scattered in varius directions. The objective lens is used to collect all scattered beams originat

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current00:07, 7 December 2007Thumbnail for version as of 00:07, 7 December 2007787 × 653 (101 KB)Gretana (talk | contribs){{Information |Description={{en|This is a simple sketch of the beam path of the electrons in a TEM after the illumination system. A Parallel beam of electrons enters the speciemen and are scattered in varius directions. The objective lens is used to colle

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